
Russell Marc Kobert
Examiner (ID: 14392)
| Most Active Art Unit | 2858 |
| Art Unit(s) | 2858, 2829, 2213 |
| Total Applications | 684 |
| Issued Applications | 583 |
| Pending Applications | 38 |
| Abandoned Applications | 63 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4363996
[patent_doc_number] => 06175228
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-01-16
[patent_title] => 'Electronic probe for measuring high impedance tri-state logic circuits'
[patent_app_type] => 1
[patent_app_number] => 9/183468
[patent_app_country] => US
[patent_app_date] => 1998-10-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 1154
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 180
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/175/06175228.pdf
[firstpage_image] =>[orig_patent_app_number] => 183468
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/183468 | Electronic probe for measuring high impedance tri-state logic circuits | Oct 29, 1998 | Issued |
Array
(
[id] => 4366689
[patent_doc_number] => 06191599
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-02-20
[patent_title] => 'IC device under test temperature control fixture'
[patent_app_type] => 1
[patent_app_number] => 9/169073
[patent_app_country] => US
[patent_app_date] => 1998-10-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
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[patent_no_of_claims] => 9
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[patent_words_short_claim] => 180
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/191/06191599.pdf
[firstpage_image] =>[orig_patent_app_number] => 169073
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/169073 | IC device under test temperature control fixture | Oct 8, 1998 | Issued |
Array
(
[id] => 4284537
[patent_doc_number] => 06281692
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-08-28
[patent_title] => 'Interposer for maintaining temporary contact between a substrate and a test bed'
[patent_app_type] => 1
[patent_app_number] => 9/166468
[patent_app_country] => US
[patent_app_date] => 1998-10-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[patent_no_of_words] => 2476
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[pdf_file] => patents/06/281/06281692.pdf
[firstpage_image] =>[orig_patent_app_number] => 166468
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/166468 | Interposer for maintaining temporary contact between a substrate and a test bed | Oct 4, 1998 | Issued |
Array
(
[id] => 4333707
[patent_doc_number] => 06329832
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-12-11
[patent_title] => 'Method for in-line testing of flip-chip semiconductor assemblies'
[patent_app_type] => 1
[patent_app_number] => 9/166369
[patent_app_country] => US
[patent_app_date] => 1998-10-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
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[patent_no_of_words] => 2633
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/329/06329832.pdf
[firstpage_image] =>[orig_patent_app_number] => 166369
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/166369 | Method for in-line testing of flip-chip semiconductor assemblies | Oct 4, 1998 | Issued |
Array
(
[id] => 4163519
[patent_doc_number] => 06104201
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2000-08-15
[patent_title] => 'Method and apparatus for passive characterization of semiconductor substrates subjected to high energy (MEV) ion implementation using high-injection surface photovoltage'
[patent_app_type] => 1
[patent_app_number] => 9/162474
[patent_app_country] => US
[patent_app_date] => 1998-09-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
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[pdf_file] => patents/06/104/06104201.pdf
[firstpage_image] =>[orig_patent_app_number] => 162474
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/162474 | Method and apparatus for passive characterization of semiconductor substrates subjected to high energy (MEV) ion implementation using high-injection surface photovoltage | Sep 27, 1998 | Issued |
Array
(
[id] => 4311866
[patent_doc_number] => 06252390
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-06-26
[patent_title] => 'Magnetically coupled signal isolator'
[patent_app_type] => 1
[patent_app_number] => 9/153665
[patent_app_country] => US
[patent_app_date] => 1998-09-15
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/06/252/06252390.pdf
[firstpage_image] =>[orig_patent_app_number] => 153665
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/153665 | Magnetically coupled signal isolator | Sep 14, 1998 | Issued |
Array
(
[id] => 4165084
[patent_doc_number] => 06114867
[patent_country] => US
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[patent_issue_date] => 2000-09-05
[patent_title] => 'Device testing apparatus'
[patent_app_type] => 1
[patent_app_number] => 9/150561
[patent_app_country] => US
[patent_app_date] => 1998-09-10
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/06/114/06114867.pdf
[firstpage_image] =>[orig_patent_app_number] => 150561
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/150561 | Device testing apparatus | Sep 9, 1998 | Issued |
Array
(
[id] => 5886326
[patent_doc_number] => 20020011865
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-01-31
[patent_title] => 'A TEST BOARD FOR TESTING A SEMICONDUCTOR DEVICE UTILIZING FIRST AND SECOND DELAY ELEMENTS IN A SIGNAL-TRANSMISSION-PATH'
[patent_app_type] => new
[patent_app_number] => 09/146173
[patent_app_country] => US
[patent_app_date] => 1998-09-03
[patent_effective_date] => 0000-00-00
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0011/20020011865.pdf
[firstpage_image] =>[orig_patent_app_number] => 09146173
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/146173 | Test board for testing a semiconductor device utilizing first and second delay elements in a signal-transmission-path | Sep 2, 1998 | Issued |
Array
(
[id] => 4362857
[patent_doc_number] => 06218851
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-04-17
[patent_title] => 'Method and apparatus for testing a printed circuit'
[patent_app_type] => 1
[patent_app_number] => 9/043565
[patent_app_country] => US
[patent_app_date] => 1998-08-07
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[pdf_file] => patents/06/218/06218851.pdf
[firstpage_image] =>[orig_patent_app_number] => 043565
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/043565 | Method and apparatus for testing a printed circuit | Aug 6, 1998 | Issued |
Array
(
[id] => 4365091
[patent_doc_number] => 06169414
[patent_country] => US
[patent_kind] => NA
[patent_issue_date] => 2001-01-02
[patent_title] => 'Measuring apparatus and method for measuring characteristic of solar cell'
[patent_app_type] => 1
[patent_app_number] => 9/106469
[patent_app_country] => US
[patent_app_date] => 1998-06-30
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/06/169/06169414.pdf
[firstpage_image] =>[orig_patent_app_number] => 106469
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/106469 | Measuring apparatus and method for measuring characteristic of solar cell | Jun 29, 1998 | Issued |
Array
(
[id] => 4103838
[patent_doc_number] => 06097206
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[patent_kind] => NA
[patent_issue_date] => 2000-08-01
[patent_title] => 'Memory tester and method of switching the tester to RAM test mode and ROM test mode'
[patent_app_type] => 1
[patent_app_number] => 9/077961
[patent_app_country] => US
[patent_app_date] => 1998-06-11
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[pdf_file] => patents/06/097/06097206.pdf
[firstpage_image] =>[orig_patent_app_number] => 077961
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/077961 | Memory tester and method of switching the tester to RAM test mode and ROM test mode | Jun 10, 1998 | Issued |
Array
(
[id] => 1580881
[patent_doc_number] => 06448801
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[patent_title] => 'Method and device for supporting flip chip circuitry in analysis'
[patent_app_type] => B2
[patent_app_number] => 09/092674
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/092674 | Method and device for supporting flip chip circuitry in analysis | Jun 4, 1998 | Issued |
Array
(
[id] => 7639621
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[patent_title] => 'System and method for combining integrated circuit final test and marking'
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Array
(
[id] => 4245964
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/086072 | Method for testing a semiconductor device and semiconductor device tested thereby | May 27, 1998 | Issued |
Array
(
[id] => 4160514
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Array
(
[id] => 4165110
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[patent_title] => 'Method and apparatus for interfacing between automatic wafer probe machines, automatic testers, and probe cards'
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[patent_app_number] => 9/082896
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Array
(
[id] => 4163148
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[patent_title] => 'Test board having a plurality of power supply wiring patterns'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/081563 | Test board having a plurality of power supply wiring patterns | May 18, 1998 | Issued |
Array
(
[id] => 4423779
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/082291 | Socket test probe and method of making | May 18, 1998 | Issued |
Array
(
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Array
(
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[pdf_file] => patents/06/417/06417681.pdf
[firstpage_image] =>[orig_patent_app_number] => 09078969
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/078969 | Enhanced probe device for use in high density applications | May 13, 1998 | Issued |