Search

Russell Marc Kobert

Examiner (ID: 14392)

Most Active Art Unit
2858
Art Unit(s)
2858, 2829, 2213
Total Applications
684
Issued Applications
583
Pending Applications
38
Abandoned Applications
63

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 4363996 [patent_doc_number] => 06175228 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-01-16 [patent_title] => 'Electronic probe for measuring high impedance tri-state logic circuits' [patent_app_type] => 1 [patent_app_number] => 9/183468 [patent_app_country] => US [patent_app_date] => 1998-10-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 1154 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 180 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/175/06175228.pdf [firstpage_image] =>[orig_patent_app_number] => 183468 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/183468
Electronic probe for measuring high impedance tri-state logic circuits Oct 29, 1998 Issued
Array ( [id] => 4366689 [patent_doc_number] => 06191599 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-02-20 [patent_title] => 'IC device under test temperature control fixture' [patent_app_type] => 1 [patent_app_number] => 9/169073 [patent_app_country] => US [patent_app_date] => 1998-10-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 2227 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 180 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/191/06191599.pdf [firstpage_image] =>[orig_patent_app_number] => 169073 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/169073
IC device under test temperature control fixture Oct 8, 1998 Issued
Array ( [id] => 4284537 [patent_doc_number] => 06281692 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-08-28 [patent_title] => 'Interposer for maintaining temporary contact between a substrate and a test bed' [patent_app_type] => 1 [patent_app_number] => 9/166468 [patent_app_country] => US [patent_app_date] => 1998-10-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 2476 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 148 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/281/06281692.pdf [firstpage_image] =>[orig_patent_app_number] => 166468 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/166468
Interposer for maintaining temporary contact between a substrate and a test bed Oct 4, 1998 Issued
Array ( [id] => 4333707 [patent_doc_number] => 06329832 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-12-11 [patent_title] => 'Method for in-line testing of flip-chip semiconductor assemblies' [patent_app_type] => 1 [patent_app_number] => 9/166369 [patent_app_country] => US [patent_app_date] => 1998-10-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2633 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 166 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/329/06329832.pdf [firstpage_image] =>[orig_patent_app_number] => 166369 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/166369
Method for in-line testing of flip-chip semiconductor assemblies Oct 4, 1998 Issued
Array ( [id] => 4163519 [patent_doc_number] => 06104201 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-08-15 [patent_title] => 'Method and apparatus for passive characterization of semiconductor substrates subjected to high energy (MEV) ion implementation using high-injection surface photovoltage' [patent_app_type] => 1 [patent_app_number] => 9/162474 [patent_app_country] => US [patent_app_date] => 1998-09-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 13 [patent_no_of_words] => 3178 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 130 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/104/06104201.pdf [firstpage_image] =>[orig_patent_app_number] => 162474 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/162474
Method and apparatus for passive characterization of semiconductor substrates subjected to high energy (MEV) ion implementation using high-injection surface photovoltage Sep 27, 1998 Issued
Array ( [id] => 4311866 [patent_doc_number] => 06252390 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-06-26 [patent_title] => 'Magnetically coupled signal isolator' [patent_app_type] => 1 [patent_app_number] => 9/153665 [patent_app_country] => US [patent_app_date] => 1998-09-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 11 [patent_no_of_words] => 7080 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 139 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/252/06252390.pdf [firstpage_image] =>[orig_patent_app_number] => 153665 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/153665
Magnetically coupled signal isolator Sep 14, 1998 Issued
Array ( [id] => 4165084 [patent_doc_number] => 06114867 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-09-05 [patent_title] => 'Device testing apparatus' [patent_app_type] => 1 [patent_app_number] => 9/150561 [patent_app_country] => US [patent_app_date] => 1998-09-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4403 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 230 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/114/06114867.pdf [firstpage_image] =>[orig_patent_app_number] => 150561 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/150561
Device testing apparatus Sep 9, 1998 Issued
Array ( [id] => 5886326 [patent_doc_number] => 20020011865 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-01-31 [patent_title] => 'A TEST BOARD FOR TESTING A SEMICONDUCTOR DEVICE UTILIZING FIRST AND SECOND DELAY ELEMENTS IN A SIGNAL-TRANSMISSION-PATH' [patent_app_type] => new [patent_app_number] => 09/146173 [patent_app_country] => US [patent_app_date] => 1998-09-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 18 [patent_no_of_words] => 13808 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 130 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0011/20020011865.pdf [firstpage_image] =>[orig_patent_app_number] => 09146173 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/146173
Test board for testing a semiconductor device utilizing first and second delay elements in a signal-transmission-path Sep 2, 1998 Issued
Array ( [id] => 4362857 [patent_doc_number] => 06218851 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-04-17 [patent_title] => 'Method and apparatus for testing a printed circuit' [patent_app_type] => 1 [patent_app_number] => 9/043565 [patent_app_country] => US [patent_app_date] => 1998-08-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 3 [patent_no_of_words] => 1836 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 218 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/218/06218851.pdf [firstpage_image] =>[orig_patent_app_number] => 043565 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/043565
Method and apparatus for testing a printed circuit Aug 6, 1998 Issued
Array ( [id] => 4365091 [patent_doc_number] => 06169414 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-01-02 [patent_title] => 'Measuring apparatus and method for measuring characteristic of solar cell' [patent_app_type] => 1 [patent_app_number] => 9/106469 [patent_app_country] => US [patent_app_date] => 1998-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 15 [patent_no_of_words] => 7213 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 128 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/169/06169414.pdf [firstpage_image] =>[orig_patent_app_number] => 106469 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/106469
Measuring apparatus and method for measuring characteristic of solar cell Jun 29, 1998 Issued
Array ( [id] => 4103838 [patent_doc_number] => 06097206 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-08-01 [patent_title] => 'Memory tester and method of switching the tester to RAM test mode and ROM test mode' [patent_app_type] => 1 [patent_app_number] => 9/077961 [patent_app_country] => US [patent_app_date] => 1998-06-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 7175 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 278 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/097/06097206.pdf [firstpage_image] =>[orig_patent_app_number] => 077961 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/077961
Memory tester and method of switching the tester to RAM test mode and ROM test mode Jun 10, 1998 Issued
Array ( [id] => 1580881 [patent_doc_number] => 06448801 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2002-09-10 [patent_title] => 'Method and device for supporting flip chip circuitry in analysis' [patent_app_type] => B2 [patent_app_number] => 09/092674 [patent_app_country] => US [patent_app_date] => 1998-06-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 6 [patent_no_of_words] => 3111 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 50 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/448/06448801.pdf [firstpage_image] =>[orig_patent_app_number] => 09092674 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/092674
Method and device for supporting flip chip circuitry in analysis Jun 4, 1998 Issued
Array ( [id] => 7639621 [patent_doc_number] => 06396295 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-05-28 [patent_title] => 'System and method for combining integrated circuit final test and marking' [patent_app_type] => B1 [patent_app_number] => 09/088961 [patent_app_country] => US [patent_app_date] => 1998-06-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 11 [patent_no_of_words] => 2896 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 10 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/396/06396295.pdf [firstpage_image] =>[orig_patent_app_number] => 09088961 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/088961
System and method for combining integrated circuit final test and marking Jun 1, 1998 Issued
Array ( [id] => 4245964 [patent_doc_number] => 06166556 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-12-26 [patent_title] => 'Method for testing a semiconductor device and semiconductor device tested thereby' [patent_app_type] => 1 [patent_app_number] => 9/086072 [patent_app_country] => US [patent_app_date] => 1998-05-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 7 [patent_no_of_words] => 4694 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 150 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/166/06166556.pdf [firstpage_image] =>[orig_patent_app_number] => 086072 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/086072
Method for testing a semiconductor device and semiconductor device tested thereby May 27, 1998 Issued
Array ( [id] => 4160514 [patent_doc_number] => 06124724 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-09-26 [patent_title] => 'Method of increasing AC testing accuracy through linear extrapolation' [patent_app_type] => 1 [patent_app_number] => 9/085983 [patent_app_country] => US [patent_app_date] => 1998-05-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 3409 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 246 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/124/06124724.pdf [firstpage_image] =>[orig_patent_app_number] => 085983 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/085983
Method of increasing AC testing accuracy through linear extrapolation May 26, 1998 Issued
Array ( [id] => 4165110 [patent_doc_number] => 06114869 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-09-05 [patent_title] => 'Method and apparatus for interfacing between automatic wafer probe machines, automatic testers, and probe cards' [patent_app_type] => 1 [patent_app_number] => 9/082896 [patent_app_country] => US [patent_app_date] => 1998-05-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 9 [patent_no_of_words] => 4446 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 266 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/114/06114869.pdf [firstpage_image] =>[orig_patent_app_number] => 082896 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/082896
Method and apparatus for interfacing between automatic wafer probe machines, automatic testers, and probe cards May 20, 1998 Issued
Array ( [id] => 4163148 [patent_doc_number] => 06107792 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-08-22 [patent_title] => 'Test board having a plurality of power supply wiring patterns' [patent_app_type] => 1 [patent_app_number] => 9/081563 [patent_app_country] => US [patent_app_date] => 1998-05-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 2141 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 187 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/107/06107792.pdf [firstpage_image] =>[orig_patent_app_number] => 081563 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/081563
Test board having a plurality of power supply wiring patterns May 18, 1998 Issued
Array ( [id] => 4423779 [patent_doc_number] => 06194904 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-02-27 [patent_title] => 'Socket test probe and method of making' [patent_app_type] => 1 [patent_app_number] => 9/082291 [patent_app_country] => US [patent_app_date] => 1998-05-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 14 [patent_no_of_words] => 3600 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 252 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/194/06194904.pdf [firstpage_image] =>[orig_patent_app_number] => 082291 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/082291
Socket test probe and method of making May 18, 1998 Issued
Array ( [id] => 4255381 [patent_doc_number] => 06137295 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2000-10-24 [patent_title] => 'Method of detecting defect of integrated circuit and apparatus thereof' [patent_app_type] => 1 [patent_app_number] => 9/079283 [patent_app_country] => US [patent_app_date] => 1998-05-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 13 [patent_no_of_words] => 5398 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 92 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/137/06137295.pdf [firstpage_image] =>[orig_patent_app_number] => 079283 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/079283
Method of detecting defect of integrated circuit and apparatus thereof May 14, 1998 Issued
Array ( [id] => 1492208 [patent_doc_number] => 06417681 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-07-09 [patent_title] => 'Enhanced probe device for use in high density applications' [patent_app_type] => B1 [patent_app_number] => 09/078969 [patent_app_country] => US [patent_app_date] => 1998-05-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 1313 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 122 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/417/06417681.pdf [firstpage_image] =>[orig_patent_app_number] => 09078969 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/078969
Enhanced probe device for use in high density applications May 13, 1998 Issued
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