Search

Russell Marc Kobert

Examiner (ID: 14392)

Most Active Art Unit
2858
Art Unit(s)
2858, 2829, 2213
Total Applications
684
Issued Applications
583
Pending Applications
38
Abandoned Applications
63

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 958755 [patent_doc_number] => 06953700 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-10-11 [patent_title] => 'Method for in-line testing of flip-chip semiconductor assemblies' [patent_app_type] => utility [patent_app_number] => 10/927546 [patent_app_country] => US [patent_app_date] => 2004-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2724 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 114 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/953/06953700.pdf [firstpage_image] =>[orig_patent_app_number] => 10927546 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/927546
Method for in-line testing of flip-chip semiconductor assemblies Aug 24, 2004 Issued
Array ( [id] => 643120 [patent_doc_number] => 07123037 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-10-17 [patent_title] => 'Integrated circuit temperature sensing device and method' [patent_app_type] => utility [patent_app_number] => 10/920531 [patent_app_country] => US [patent_app_date] => 2004-08-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 1755 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 106 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/123/07123037.pdf [firstpage_image] =>[orig_patent_app_number] => 10920531 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/920531
Integrated circuit temperature sensing device and method Aug 16, 2004 Issued
Array ( [id] => 7192900 [patent_doc_number] => 20050040840 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-02-24 [patent_title] => 'METHOD FOR MONITORING QUALITY OF AN INSULATION LAYER' [patent_app_type] => utility [patent_app_number] => 10/710724 [patent_app_country] => US [patent_app_date] => 2004-07-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 6481 [patent_no_of_claims] => 42 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0040/20050040840.pdf [firstpage_image] =>[orig_patent_app_number] => 10710724 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/710724
Method for monitoring quality of an insulation layer Jul 29, 2004 Issued
Array ( [id] => 770620 [patent_doc_number] => 07005878 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-02-28 [patent_title] => 'Method for in-line testing of flip-chip semiconductor assemblies' [patent_app_type] => utility [patent_app_number] => 10/900610 [patent_app_country] => US [patent_app_date] => 2004-07-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2769 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 114 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/005/07005878.pdf [firstpage_image] =>[orig_patent_app_number] => 10900610 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/900610
Method for in-line testing of flip-chip semiconductor assemblies Jul 26, 2004 Issued
Array ( [id] => 958754 [patent_doc_number] => 06953699 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-10-11 [patent_title] => 'Method for in-line testing of flip-chip semiconductor assemblies' [patent_app_type] => utility [patent_app_number] => 10/900602 [patent_app_country] => US [patent_app_date] => 2004-07-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2740 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 214 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/953/06953699.pdf [firstpage_image] =>[orig_patent_app_number] => 10900602 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/900602
Method for in-line testing of flip-chip semiconductor assemblies Jul 26, 2004 Issued
Array ( [id] => 793132 [patent_doc_number] => 06982177 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-01-03 [patent_title] => 'Method for in-line testing of flip-chip semiconductor assemblies' [patent_app_type] => utility [patent_app_number] => 10/900776 [patent_app_country] => US [patent_app_date] => 2004-07-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2739 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 90 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/982/06982177.pdf [firstpage_image] =>[orig_patent_app_number] => 10900776 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/900776
Method for in-line testing of flip-chip semiconductor assemblies Jul 26, 2004 Issued
Array ( [id] => 7087029 [patent_doc_number] => 20050007141 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-01-13 [patent_title] => 'Method for in-line testing of flip-chip semiconductor assemblies' [patent_app_type] => utility [patent_app_number] => 10/900609 [patent_app_country] => US [patent_app_date] => 2004-07-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2740 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0007/20050007141.pdf [firstpage_image] =>[orig_patent_app_number] => 10900609 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/900609
Method for in-line testing of flip-chip semiconductor assemblies Jul 26, 2004 Issued
Array ( [id] => 948790 [patent_doc_number] => 06962826 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-11-08 [patent_title] => 'Method for in-line testing of flip-chip semiconductor assemblies' [patent_app_type] => utility [patent_app_number] => 10/900771 [patent_app_country] => US [patent_app_date] => 2004-07-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2740 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 156 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/962/06962826.pdf [firstpage_image] =>[orig_patent_app_number] => 10900771 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/900771
Method for in-line testing of flip-chip semiconductor assemblies Jul 26, 2004 Issued
Array ( [id] => 7126262 [patent_doc_number] => 20050058006 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-03-17 [patent_title] => 'Semiconductor device, method for testing the same and IC card' [patent_app_type] => utility [patent_app_number] => 10/897032 [patent_app_country] => US [patent_app_date] => 2004-07-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 4424 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0058/20050058006.pdf [firstpage_image] =>[orig_patent_app_number] => 10897032 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/897032
Semiconductor device, method for testing the same and IC card Jul 22, 2004 Issued
Array ( [id] => 944442 [patent_doc_number] => 06967496 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-11-22 [patent_title] => 'AC testing of leakage current in integrated circuits using RC time constant' [patent_app_type] => utility [patent_app_number] => 10/889417 [patent_app_country] => US [patent_app_date] => 2004-07-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 8 [patent_no_of_words] => 5436 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 42 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/967/06967496.pdf [firstpage_image] =>[orig_patent_app_number] => 10889417 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/889417
AC testing of leakage current in integrated circuits using RC time constant Jul 11, 2004 Issued
Array ( [id] => 7086490 [patent_doc_number] => 20050006602 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-01-13 [patent_title] => 'Spatial and temporal selective laser assisted fault localization' [patent_app_type] => utility [patent_app_number] => 10/888840 [patent_app_country] => US [patent_app_date] => 2004-07-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 5274 [patent_no_of_claims] => 48 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0006/20050006602.pdf [firstpage_image] =>[orig_patent_app_number] => 10888840 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/888840
Spatial and temporal selective laser assisted fault localization Jul 8, 2004 Issued
Array ( [id] => 7087022 [patent_doc_number] => 20050007134 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-01-13 [patent_title] => 'Probe card' [patent_app_type] => utility [patent_app_number] => 10/885721 [patent_app_country] => US [patent_app_date] => 2004-07-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2540 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0007/20050007134.pdf [firstpage_image] =>[orig_patent_app_number] => 10885721 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/885721
Probe card Jul 7, 2004 Abandoned
Array ( [id] => 1019008 [patent_doc_number] => 06891387 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-05-10 [patent_title] => 'System for probing, testing, burn-in, repairing and programming of integrated circuits' [patent_app_type] => utility [patent_app_number] => 10/865579 [patent_app_country] => US [patent_app_date] => 2004-06-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5648 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 113 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/891/06891387.pdf [firstpage_image] =>[orig_patent_app_number] => 10865579 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/865579
System for probing, testing, burn-in, repairing and programming of integrated circuits Jun 8, 2004 Issued
Array ( [id] => 5766553 [patent_doc_number] => 20050264276 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-12-01 [patent_title] => 'ATTACHABLE/DETACHABLE VARIABLE SPACING PROBING TIP SYSTEM' [patent_app_type] => utility [patent_app_number] => 10/856376 [patent_app_country] => US [patent_app_date] => 2004-05-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 5560 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0264/20050264276.pdf [firstpage_image] =>[orig_patent_app_number] => 10856376 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/856376
Attachable/detachable variable spacing probing tip system May 26, 2004 Issued
Array ( [id] => 7175799 [patent_doc_number] => 20040201390 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-10-14 [patent_title] => 'Test interconnect for bumped semiconductor components and method of fabrication' [patent_app_type] => new [patent_app_number] => 10/832483 [patent_app_country] => US [patent_app_date] => 2004-04-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 8603 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 3 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0201/20040201390.pdf [firstpage_image] =>[orig_patent_app_number] => 10832483 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/832483
Test system for bumped semiconductor components Apr 25, 2004 Issued
Array ( [id] => 664423 [patent_doc_number] => 07102370 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-09-05 [patent_title] => 'Compliant micro-browser for a hand held probe' [patent_app_type] => utility [patent_app_number] => 10/829725 [patent_app_country] => US [patent_app_date] => 2004-04-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3354 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 252 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/102/07102370.pdf [firstpage_image] =>[orig_patent_app_number] => 10829725 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/829725
Compliant micro-browser for a hand held probe Apr 21, 2004 Issued
Array ( [id] => 7243885 [patent_doc_number] => 20050073328 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-04-07 [patent_title] => 'OBIRCH dual power circuit' [patent_app_type] => utility [patent_app_number] => 10/822524 [patent_app_country] => US [patent_app_date] => 2004-04-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2132 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0073/20050073328.pdf [firstpage_image] =>[orig_patent_app_number] => 10822524 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/822524
OBIRCH dual power circuit Apr 11, 2004 Issued
Array ( [id] => 643126 [patent_doc_number] => 07123041 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-10-17 [patent_title] => 'LSI inspection method and defect inspection data analysis apparatus' [patent_app_type] => utility [patent_app_number] => 10/809322 [patent_app_country] => US [patent_app_date] => 2004-03-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 7018 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 275 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/123/07123041.pdf [firstpage_image] =>[orig_patent_app_number] => 10809322 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/809322
LSI inspection method and defect inspection data analysis apparatus Mar 25, 2004 Issued
Array ( [id] => 7395300 [patent_doc_number] => 20040174178 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-09-09 [patent_title] => 'Method and apparatus for testing semiconductor circuitry for operability and method of forming apparatus for testing semiconductor circuitry for operability' [patent_app_type] => new [patent_app_number] => 10/803294 [patent_app_country] => US [patent_app_date] => 2004-03-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 3811 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 86 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0174/20040174178.pdf [firstpage_image] =>[orig_patent_app_number] => 10803294 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/803294
Method and apparatus for testing semiconductor circuitry for operability and method of forming apparatus for testing semiconductor circuitry for operability Mar 16, 2004 Issued
Array ( [id] => 988493 [patent_doc_number] => 06922048 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-07-26 [patent_title] => 'Integrated circuit leadframes patterned for measuring the accurate amplitude of changing currents' [patent_app_type] => utility [patent_app_number] => 10/789642 [patent_app_country] => US [patent_app_date] => 2004-03-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 8 [patent_no_of_words] => 3932 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 96 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/922/06922048.pdf [firstpage_image] =>[orig_patent_app_number] => 10789642 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/789642
Integrated circuit leadframes patterned for measuring the accurate amplitude of changing currents Feb 29, 2004 Issued
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