Search

Russell Marc Kobert

Examiner (ID: 14392)

Most Active Art Unit
2858
Art Unit(s)
2858, 2829, 2213
Total Applications
684
Issued Applications
583
Pending Applications
38
Abandoned Applications
63

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 7417134 [patent_doc_number] => 20040160239 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-08-19 [patent_title] => 'Integrated circuit early life failure detection by monitoring changes in current signatures' [patent_app_type] => new [patent_app_number] => 10/777250 [patent_app_country] => US [patent_app_date] => 2004-02-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 12427 [patent_no_of_claims] => 42 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 56 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0160/20040160239.pdf [firstpage_image] =>[orig_patent_app_number] => 10777250 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/777250
Integrated circuit early life failure detection by monitoring changes in current signatures Feb 11, 2004 Issued
Array ( [id] => 7292328 [patent_doc_number] => 20040212379 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-10-28 [patent_title] => 'Probe module and a testing apparatus' [patent_app_type] => new [patent_app_number] => 10/776033 [patent_app_country] => US [patent_app_date] => 2004-02-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3814 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 110 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0212/20040212379.pdf [firstpage_image] =>[orig_patent_app_number] => 10776033 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/776033
Probe module and a testing apparatus Feb 9, 2004 Issued
Array ( [id] => 692350 [patent_doc_number] => 07075318 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2006-07-11 [patent_title] => 'Methods for imperfect insulating film electrical thickness/capacitance measurement' [patent_app_type] => utility [patent_app_number] => 10/754332 [patent_app_country] => US [patent_app_date] => 2004-01-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 9 [patent_no_of_words] => 6909 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 88 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/075/07075318.pdf [firstpage_image] =>[orig_patent_app_number] => 10754332 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/754332
Methods for imperfect insulating film electrical thickness/capacitance measurement Jan 8, 2004 Issued
Array ( [id] => 7073082 [patent_doc_number] => 20050146348 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-07-07 [patent_title] => 'Method and apparatus for determining the dielectric constant of a low permittivity dielectric on a semiconductor wafer' [patent_app_type] => utility [patent_app_number] => 10/749031 [patent_app_country] => US [patent_app_date] => 2003-12-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4169 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0146/20050146348.pdf [firstpage_image] =>[orig_patent_app_number] => 10749031 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/749031
Method and apparatus for determining the dielectric constant of a low permittivity dielectric on a semiconductor wafer Dec 29, 2003 Issued
Array ( [id] => 7335049 [patent_doc_number] => 20040189335 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-09-30 [patent_title] => 'Apparatus and method for detecting photon emissions from transistors' [patent_app_type] => new [patent_app_number] => 10/728522 [patent_app_country] => US [patent_app_date] => 2003-12-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 27 [patent_figures_cnt] => 27 [patent_no_of_words] => 19162 [patent_no_of_claims] => 63 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 55 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0189/20040189335.pdf [firstpage_image] =>[orig_patent_app_number] => 10728522 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/728522
Apparatus and method for detecting photon emissions from transistors Dec 4, 2003 Issued
Array ( [id] => 1083703 [patent_doc_number] => 06833696 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-12-21 [patent_title] => 'Methods and apparatus for creating a high speed connection between a device under test and automatic test equipment' [patent_app_type] => B2 [patent_app_number] => 10/725966 [patent_app_country] => US [patent_app_date] => 2003-12-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 20 [patent_no_of_words] => 4880 [patent_no_of_claims] => 43 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 255 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/833/06833696.pdf [firstpage_image] =>[orig_patent_app_number] => 10725966 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/725966
Methods and apparatus for creating a high speed connection between a device under test and automatic test equipment Nov 30, 2003 Issued
Array ( [id] => 7614860 [patent_doc_number] => 06897668 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2005-05-24 [patent_title] => 'Double-faced detecting devices for an electronic substrate' [patent_app_type] => utility [patent_app_number] => 10/724512 [patent_app_country] => US [patent_app_date] => 2003-11-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 1364 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 151 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/897/06897668.pdf [firstpage_image] =>[orig_patent_app_number] => 10724512 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/724512
Double-faced detecting devices for an electronic substrate Nov 27, 2003 Issued
Array ( [id] => 783654 [patent_doc_number] => 06992475 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-01-31 [patent_title] => 'Circuit and method for determining at least one voltage, current and/or power value for an integrated circuit' [patent_app_type] => utility [patent_app_number] => 10/723905 [patent_app_country] => US [patent_app_date] => 2003-11-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 14 [patent_no_of_words] => 7086 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 128 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/992/06992475.pdf [firstpage_image] =>[orig_patent_app_number] => 10723905 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/723905
Circuit and method for determining at least one voltage, current and/or power value for an integrated circuit Nov 25, 2003 Issued
Array ( [id] => 6936936 [patent_doc_number] => 20050110497 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-05-26 [patent_title] => 'Spark detection apparatus and method that senses the battery voltage' [patent_app_type] => utility [patent_app_number] => 10/721024 [patent_app_country] => US [patent_app_date] => 2003-11-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 893 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0110/20050110497.pdf [firstpage_image] =>[orig_patent_app_number] => 10721024 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/721024
Spark detection apparatus and method that senses the battery voltage Nov 23, 2003 Abandoned
Array ( [id] => 944060 [patent_doc_number] => 06967113 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-11-22 [patent_title] => 'Method for in-line testing of flip-chip semiconductor assemblies' [patent_app_type] => utility [patent_app_number] => 10/721110 [patent_app_country] => US [patent_app_date] => 2003-11-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2724 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 78 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/967/06967113.pdf [firstpage_image] =>[orig_patent_app_number] => 10721110 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/721110
Method for in-line testing of flip-chip semiconductor assemblies Nov 23, 2003 Issued
Array ( [id] => 6956155 [patent_doc_number] => 20050212525 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-09-29 [patent_title] => 'Advanced 24/7 differential oscilloscope with remote access and security features for detection of neutral to earth voltage' [patent_app_type] => utility [patent_app_number] => 10/718932 [patent_app_country] => US [patent_app_date] => 2003-11-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 3119 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0212/20050212525.pdf [firstpage_image] =>[orig_patent_app_number] => 10718932 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/718932
Advanced 24/7 differential oscilloscope with remote access and security features for detection of neutral to earth voltage Nov 20, 2003 Abandoned
Array ( [id] => 7461462 [patent_doc_number] => 20040095127 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-05-20 [patent_title] => 'Apparatus for measuring current density of fuel cell' [patent_app_type] => new [patent_app_number] => 10/694505 [patent_app_country] => US [patent_app_date] => 2003-10-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 3839 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 116 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0095/20040095127.pdf [firstpage_image] =>[orig_patent_app_number] => 10694505 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/694505
Apparatus for measuring current density of fuel cell Oct 26, 2003 Issued
Array ( [id] => 1028698 [patent_doc_number] => 06882169 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-04-19 [patent_title] => 'Semiconductor testing device' [patent_app_type] => utility [patent_app_number] => 10/685542 [patent_app_country] => US [patent_app_date] => 2003-10-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 32 [patent_figures_cnt] => 80 [patent_no_of_words] => 20342 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 264 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/882/06882169.pdf [firstpage_image] =>[orig_patent_app_number] => 10685542 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/685542
Semiconductor testing device Oct 15, 2003 Issued
Array ( [id] => 788463 [patent_doc_number] => 06987397 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-01-17 [patent_title] => 'Method and probe structure for implementing a single probe location for multiple signals' [patent_app_type] => utility [patent_app_number] => 10/682132 [patent_app_country] => US [patent_app_date] => 2003-10-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 1422 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 170 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/987/06987397.pdf [firstpage_image] =>[orig_patent_app_number] => 10682132 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/682132
Method and probe structure for implementing a single probe location for multiple signals Oct 8, 2003 Issued
Array ( [id] => 6989153 [patent_doc_number] => 20050088190 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-04-28 [patent_title] => 'Modularized probe head' [patent_app_type] => utility [patent_app_number] => 10/680230 [patent_app_country] => US [patent_app_date] => 2003-10-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 1861 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0088/20050088190.pdf [firstpage_image] =>[orig_patent_app_number] => 10680230 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/680230
Modularized probe head Oct 7, 2003 Issued
Array ( [id] => 996980 [patent_doc_number] => 06914422 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-07-05 [patent_title] => 'Current monitoring/control circuit' [patent_app_type] => utility [patent_app_number] => 10/680707 [patent_app_country] => US [patent_app_date] => 2003-10-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 5213 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 171 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/914/06914422.pdf [firstpage_image] =>[orig_patent_app_number] => 10680707 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/680707
Current monitoring/control circuit Oct 6, 2003 Issued
Array ( [id] => 7114750 [patent_doc_number] => 20050068051 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-03-31 [patent_title] => 'Capacitive sensor measurement method for discrete time sampled system for in-circuit test' [patent_app_type] => utility [patent_app_number] => 10/672804 [patent_app_country] => US [patent_app_date] => 2003-09-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 9193 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0068/20050068051.pdf [firstpage_image] =>[orig_patent_app_number] => 10672804 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/672804
Capacitive sensor measurement method for discrete time sampled system for in-circuit test Sep 26, 2003 Issued
Array ( [id] => 7114757 [patent_doc_number] => 20050068058 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-03-31 [patent_title] => 'METHOD AND APPARATUS DETECTING SHORTED TURNS IN AN ELECTRIC GENERATOR' [patent_app_type] => utility [patent_app_number] => 10/672770 [patent_app_country] => US [patent_app_date] => 2003-09-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2645 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0068/20050068058.pdf [firstpage_image] =>[orig_patent_app_number] => 10672770 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/672770
Method and apparatus detecting shorted turns in an electric generator Sep 25, 2003 Issued
Array ( [id] => 779898 [patent_doc_number] => 06995577 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-02-07 [patent_title] => 'Contact for semiconductor components' [patent_app_type] => utility [patent_app_number] => 10/666292 [patent_app_country] => US [patent_app_date] => 2003-09-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 42 [patent_no_of_words] => 9022 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 76 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/995/06995577.pdf [firstpage_image] =>[orig_patent_app_number] => 10666292 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/666292
Contact for semiconductor components Sep 17, 2003 Issued
Array ( [id] => 7612275 [patent_doc_number] => 06903562 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2005-06-07 [patent_title] => 'Integrated micromachine relay for automated test equipment applications' [patent_app_type] => utility [patent_app_number] => 10/664381 [patent_app_country] => US [patent_app_date] => 2003-09-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 18 [patent_no_of_words] => 5125 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 18 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/903/06903562.pdf [firstpage_image] =>[orig_patent_app_number] => 10664381 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/664381
Integrated micromachine relay for automated test equipment applications Sep 15, 2003 Issued
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