
Russell Marc Kobert
Examiner (ID: 14392)
| Most Active Art Unit | 2858 |
| Art Unit(s) | 2858, 2829, 2213 |
| Total Applications | 684 |
| Issued Applications | 583 |
| Pending Applications | 38 |
| Abandoned Applications | 63 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 7417134
[patent_doc_number] => 20040160239
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-08-19
[patent_title] => 'Integrated circuit early life failure detection by monitoring changes in current signatures'
[patent_app_type] => new
[patent_app_number] => 10/777250
[patent_app_country] => US
[patent_app_date] => 2004-02-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 12427
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[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0160/20040160239.pdf
[firstpage_image] =>[orig_patent_app_number] => 10777250
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/777250 | Integrated circuit early life failure detection by monitoring changes in current signatures | Feb 11, 2004 | Issued |
Array
(
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[patent_doc_number] => 20040212379
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[patent_kind] => A1
[patent_issue_date] => 2004-10-28
[patent_title] => 'Probe module and a testing apparatus'
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[patent_app_date] => 2004-02-10
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[firstpage_image] =>[orig_patent_app_number] => 10776033
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/776033 | Probe module and a testing apparatus | Feb 9, 2004 | Issued |
Array
(
[id] => 692350
[patent_doc_number] => 07075318
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2006-07-11
[patent_title] => 'Methods for imperfect insulating film electrical thickness/capacitance measurement'
[patent_app_type] => utility
[patent_app_number] => 10/754332
[patent_app_country] => US
[patent_app_date] => 2004-01-09
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[firstpage_image] =>[orig_patent_app_number] => 10754332
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/754332 | Methods for imperfect insulating film electrical thickness/capacitance measurement | Jan 8, 2004 | Issued |
Array
(
[id] => 7073082
[patent_doc_number] => 20050146348
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-07-07
[patent_title] => 'Method and apparatus for determining the dielectric constant of a low permittivity dielectric on a semiconductor wafer'
[patent_app_type] => utility
[patent_app_number] => 10/749031
[patent_app_country] => US
[patent_app_date] => 2003-12-30
[patent_effective_date] => 0000-00-00
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[firstpage_image] =>[orig_patent_app_number] => 10749031
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/749031 | Method and apparatus for determining the dielectric constant of a low permittivity dielectric on a semiconductor wafer | Dec 29, 2003 | Issued |
Array
(
[id] => 7335049
[patent_doc_number] => 20040189335
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[patent_issue_date] => 2004-09-30
[patent_title] => 'Apparatus and method for detecting photon emissions from transistors'
[patent_app_type] => new
[patent_app_number] => 10/728522
[patent_app_country] => US
[patent_app_date] => 2003-12-05
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0189/20040189335.pdf
[firstpage_image] =>[orig_patent_app_number] => 10728522
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/728522 | Apparatus and method for detecting photon emissions from transistors | Dec 4, 2003 | Issued |
Array
(
[id] => 1083703
[patent_doc_number] => 06833696
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[patent_issue_date] => 2004-12-21
[patent_title] => 'Methods and apparatus for creating a high speed connection between a device under test and automatic test equipment'
[patent_app_type] => B2
[patent_app_number] => 10/725966
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[pdf_file] => patents/06/833/06833696.pdf
[firstpage_image] =>[orig_patent_app_number] => 10725966
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/725966 | Methods and apparatus for creating a high speed connection between a device under test and automatic test equipment | Nov 30, 2003 | Issued |
Array
(
[id] => 7614860
[patent_doc_number] => 06897668
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[patent_title] => 'Double-faced detecting devices for an electronic substrate'
[patent_app_type] => utility
[patent_app_number] => 10/724512
[patent_app_country] => US
[patent_app_date] => 2003-11-28
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[pdf_file] => patents/06/897/06897668.pdf
[firstpage_image] =>[orig_patent_app_number] => 10724512
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/724512 | Double-faced detecting devices for an electronic substrate | Nov 27, 2003 | Issued |
Array
(
[id] => 783654
[patent_doc_number] => 06992475
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-01-31
[patent_title] => 'Circuit and method for determining at least one voltage, current and/or power value for an integrated circuit'
[patent_app_type] => utility
[patent_app_number] => 10/723905
[patent_app_country] => US
[patent_app_date] => 2003-11-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
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[pdf_file] => patents/06/992/06992475.pdf
[firstpage_image] =>[orig_patent_app_number] => 10723905
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/723905 | Circuit and method for determining at least one voltage, current and/or power value for an integrated circuit | Nov 25, 2003 | Issued |
Array
(
[id] => 6936936
[patent_doc_number] => 20050110497
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-05-26
[patent_title] => 'Spark detection apparatus and method that senses the battery voltage'
[patent_app_type] => utility
[patent_app_number] => 10/721024
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[patent_app_date] => 2003-11-24
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[pdf_file] => publications/A1/0110/20050110497.pdf
[firstpage_image] =>[orig_patent_app_number] => 10721024
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/721024 | Spark detection apparatus and method that senses the battery voltage | Nov 23, 2003 | Abandoned |
Array
(
[id] => 944060
[patent_doc_number] => 06967113
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2005-11-22
[patent_title] => 'Method for in-line testing of flip-chip semiconductor assemblies'
[patent_app_type] => utility
[patent_app_number] => 10/721110
[patent_app_country] => US
[patent_app_date] => 2003-11-24
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[firstpage_image] =>[orig_patent_app_number] => 10721110
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/721110 | Method for in-line testing of flip-chip semiconductor assemblies | Nov 23, 2003 | Issued |
Array
(
[id] => 6956155
[patent_doc_number] => 20050212525
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-09-29
[patent_title] => 'Advanced 24/7 differential oscilloscope with remote access and security features for detection of neutral to earth voltage'
[patent_app_type] => utility
[patent_app_number] => 10/718932
[patent_app_country] => US
[patent_app_date] => 2003-11-21
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/718932 | Advanced 24/7 differential oscilloscope with remote access and security features for detection of neutral to earth voltage | Nov 20, 2003 | Abandoned |
Array
(
[id] => 7461462
[patent_doc_number] => 20040095127
[patent_country] => US
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[patent_issue_date] => 2004-05-20
[patent_title] => 'Apparatus for measuring current density of fuel cell'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/694505 | Apparatus for measuring current density of fuel cell | Oct 26, 2003 | Issued |
Array
(
[id] => 1028698
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[patent_title] => 'Semiconductor testing device'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/685542 | Semiconductor testing device | Oct 15, 2003 | Issued |
Array
(
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[patent_title] => 'Method and probe structure for implementing a single probe location for multiple signals'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/682132 | Method and probe structure for implementing a single probe location for multiple signals | Oct 8, 2003 | Issued |
Array
(
[id] => 6989153
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[patent_title] => 'Modularized probe head'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/680230 | Modularized probe head | Oct 7, 2003 | Issued |
Array
(
[id] => 996980
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[patent_issue_date] => 2005-07-05
[patent_title] => 'Current monitoring/control circuit'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/680707 | Current monitoring/control circuit | Oct 6, 2003 | Issued |
Array
(
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[patent_title] => 'Capacitive sensor measurement method for discrete time sampled system for in-circuit test'
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Array
(
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[patent_title] => 'METHOD AND APPARATUS DETECTING SHORTED TURNS IN AN ELECTRIC GENERATOR'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/672770 | Method and apparatus detecting shorted turns in an electric generator | Sep 25, 2003 | Issued |
Array
(
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[patent_title] => 'Contact for semiconductor components'
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Array
(
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/664381 | Integrated micromachine relay for automated test equipment applications | Sep 15, 2003 | Issued |