Search

Russell Marc Kobert

Examiner (ID: 14392)

Most Active Art Unit
2858
Art Unit(s)
2858, 2829, 2213
Total Applications
684
Issued Applications
583
Pending Applications
38
Abandoned Applications
63

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 6723715 [patent_doc_number] => 20030206027 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-11-06 [patent_title] => 'Method of inspecting circuit pattern and inspecting instrument' [patent_app_type] => new [patent_app_number] => 10/430188 [patent_app_country] => US [patent_app_date] => 2003-05-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 23 [patent_figures_cnt] => 23 [patent_no_of_words] => 16781 [patent_no_of_claims] => 31 [patent_no_of_ind_claims] => 27 [patent_words_short_claim] => 30 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0206/20030206027.pdf [firstpage_image] =>[orig_patent_app_number] => 10430188 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/430188
Method of inspecting circuit pattern and inspecting instrument May 6, 2003 Issued
Array ( [id] => 1002871 [patent_doc_number] => 06909274 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-06-21 [patent_title] => 'Signal pin tester for AC defects in integrated circuits' [patent_app_type] => utility [patent_app_number] => 10/420431 [patent_app_country] => US [patent_app_date] => 2003-04-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 3605 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 232 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/909/06909274.pdf [firstpage_image] =>[orig_patent_app_number] => 10420431 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/420431
Signal pin tester for AC defects in integrated circuits Apr 20, 2003 Issued
Array ( [id] => 1114034 [patent_doc_number] => 06803772 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-10-12 [patent_title] => 'Inductance measuring method' [patent_app_type] => B2 [patent_app_number] => 10/396350 [patent_app_country] => US [patent_app_date] => 2003-03-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 8074 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 236 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/803/06803772.pdf [firstpage_image] =>[orig_patent_app_number] => 10396350 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/396350
Inductance measuring method Mar 25, 2003 Issued
Array ( [id] => 6728138 [patent_doc_number] => 20030184328 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-10-02 [patent_title] => 'Near-field probe for use in scanning system' [patent_app_type] => new [patent_app_number] => 10/395284 [patent_app_country] => US [patent_app_date] => 2003-03-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 5754 [patent_no_of_claims] => 39 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 161 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0184/20030184328.pdf [firstpage_image] =>[orig_patent_app_number] => 10395284 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/395284
Near-field probe for use in scanning system Mar 24, 2003 Issued
Array ( [id] => 1133377 [patent_doc_number] => 06788088 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-09-07 [patent_title] => 'Semiconductor device equipped with current detection function' [patent_app_type] => B2 [patent_app_number] => 10/394029 [patent_app_country] => US [patent_app_date] => 2003-03-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3998 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 295 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/788/06788088.pdf [firstpage_image] =>[orig_patent_app_number] => 10394029 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/394029
Semiconductor device equipped with current detection function Mar 23, 2003 Issued
Array ( [id] => 677394 [patent_doc_number] => 07088117 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-08-08 [patent_title] => 'Wafer burn-in and test employing detachable cartridge' [patent_app_type] => utility [patent_app_number] => 10/396170 [patent_app_country] => US [patent_app_date] => 2003-03-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 27 [patent_no_of_words] => 13867 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 140 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/088/07088117.pdf [firstpage_image] =>[orig_patent_app_number] => 10396170 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/396170
Wafer burn-in and test employing detachable cartridge Mar 23, 2003 Issued
Array ( [id] => 7423710 [patent_doc_number] => 20040183560 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-09-23 [patent_title] => 'Method and integrated circuit for capacitor measurement with digital readout' [patent_app_type] => new [patent_app_number] => 10/392206 [patent_app_country] => US [patent_app_date] => 2003-03-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 3801 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 41 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0183/20040183560.pdf [firstpage_image] =>[orig_patent_app_number] => 10392206 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/392206
Method and integrated circuit for capacitor measurement with digital readout Mar 18, 2003 Issued
Array ( [id] => 779905 [patent_doc_number] => 06995580 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-02-07 [patent_title] => 'Power detectors for measuring power coupling' [patent_app_type] => utility [patent_app_number] => 10/390927 [patent_app_country] => US [patent_app_date] => 2003-03-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 8 [patent_no_of_words] => 3138 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 148 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/995/06995580.pdf [firstpage_image] =>[orig_patent_app_number] => 10390927 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/390927
Power detectors for measuring power coupling Mar 18, 2003 Issued
Array ( [id] => 1151712 [patent_doc_number] => 06774661 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-08-10 [patent_title] => 'Initial contact method of preventing an integrated circuit chip from being thermally destroyed, in a tester, due to a defective pressed joint' [patent_app_type] => B1 [patent_app_number] => 10/391887 [patent_app_country] => US [patent_app_date] => 2003-03-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 13 [patent_no_of_words] => 9352 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 149 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/774/06774661.pdf [firstpage_image] =>[orig_patent_app_number] => 10391887 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/391887
Initial contact method of preventing an integrated circuit chip from being thermally destroyed, in a tester, due to a defective pressed joint Mar 17, 2003 Issued
Array ( [id] => 1109514 [patent_doc_number] => 06809543 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-10-26 [patent_title] => 'Abrupt power change method of preventing an integrated circuit chip from being thermally destroyed, in a tester, due to a defective pressed joint' [patent_app_type] => B1 [patent_app_number] => 10/391884 [patent_app_country] => US [patent_app_date] => 2003-03-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 13 [patent_no_of_words] => 9330 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 133 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/809/06809543.pdf [firstpage_image] =>[orig_patent_app_number] => 10391884 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/391884
Abrupt power change method of preventing an integrated circuit chip from being thermally destroyed, in a tester, due to a defective pressed joint Mar 17, 2003 Issued
Array ( [id] => 1050956 [patent_doc_number] => 06861862 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2005-03-01 [patent_title] => 'Test socket' [patent_app_type] => utility [patent_app_number] => 10/387841 [patent_app_country] => US [patent_app_date] => 2003-03-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 10 [patent_no_of_words] => 2981 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 152 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/861/06861862.pdf [firstpage_image] =>[orig_patent_app_number] => 10387841 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/387841
Test socket Mar 16, 2003 Issued
Array ( [id] => 1273617 [patent_doc_number] => 06649430 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-11-18 [patent_title] => 'Characteristic evaluation apparatus for insulated gate type transistors' [patent_app_type] => B2 [patent_app_number] => 10/350059 [patent_app_country] => US [patent_app_date] => 2003-01-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 25 [patent_figures_cnt] => 29 [patent_no_of_words] => 16033 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 432 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/649/06649430.pdf [firstpage_image] =>[orig_patent_app_number] => 10350059 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/350059
Characteristic evaluation apparatus for insulated gate type transistors Jan 23, 2003 Issued
Array ( [id] => 6849686 [patent_doc_number] => 20030141888 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-07-31 [patent_title] => 'Method for in-line testing of flip-chip semiconductor assemblies' [patent_app_type] => new [patent_app_number] => 10/338530 [patent_app_country] => US [patent_app_date] => 2003-01-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 2723 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 10 [patent_words_short_claim] => 55 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0141/20030141888.pdf [firstpage_image] =>[orig_patent_app_number] => 10338530 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/338530
Method for in-line testing of flip-chip semiconductor assemblies Jan 7, 2003 Issued
Array ( [id] => 7286959 [patent_doc_number] => 20040108868 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-06-10 [patent_title] => 'Device speed alteration by electron-hole pair injection and device heating' [patent_app_type] => new [patent_app_number] => 10/313933 [patent_app_country] => US [patent_app_date] => 2002-12-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 6218 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 116 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0108/20040108868.pdf [firstpage_image] =>[orig_patent_app_number] => 10313933 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/313933
Device speed alteration by electron-hole pair injection and device heating Dec 4, 2002 Issued
Array ( [id] => 1041239 [patent_doc_number] => 06870357 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2005-03-22 [patent_title] => 'Method and apparatus for determining the temperature of a junction using voltage responses of the junction and a correction factor' [patent_app_type] => utility [patent_app_number] => 10/301831 [patent_app_country] => US [patent_app_date] => 2002-11-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 9 [patent_no_of_words] => 5633 [patent_no_of_claims] => 33 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 49 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/870/06870357.pdf [firstpage_image] =>[orig_patent_app_number] => 10301831 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/301831
Method and apparatus for determining the temperature of a junction using voltage responses of the junction and a correction factor Nov 20, 2002 Issued
Array ( [id] => 1172345 [patent_doc_number] => 06750070 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-06-15 [patent_title] => 'Process for manufacturing flip-chip semiconductor assembly' [patent_app_type] => B2 [patent_app_number] => 10/282604 [patent_app_country] => US [patent_app_date] => 2002-10-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2719 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 136 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/750/06750070.pdf [firstpage_image] =>[orig_patent_app_number] => 10282604 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/282604
Process for manufacturing flip-chip semiconductor assembly Oct 28, 2002 Issued
Array ( [id] => 6649383 [patent_doc_number] => 20030076127 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-04-24 [patent_title] => 'Method for testing a plurality of devices' [patent_app_type] => new [patent_app_number] => 10/278227 [patent_app_country] => US [patent_app_date] => 2002-10-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3149 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 69 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0076/20030076127.pdf [firstpage_image] =>[orig_patent_app_number] => 10278227 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/278227
Method for testing a plurality of devices disposed on a wafer and connected by a common data line Oct 22, 2002 Issued
Array ( [id] => 6695196 [patent_doc_number] => 20030107390 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-06-12 [patent_title] => 'Structure of a wire clip for integrated circuit' [patent_app_type] => new [patent_app_number] => 10/274925 [patent_app_country] => US [patent_app_date] => 2002-10-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 1467 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 160 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0107/20030107390.pdf [firstpage_image] =>[orig_patent_app_number] => 10274925 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/274925
Structure of a wire clip for integrated circuit Oct 21, 2002 Abandoned
Array ( [id] => 6709313 [patent_doc_number] => 20030169062 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-09-11 [patent_title] => 'Apparatus and method for positioning an integrated circuit for test' [patent_app_type] => new [patent_app_number] => 10/274433 [patent_app_country] => US [patent_app_date] => 2002-10-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3634 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 154 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0169/20030169062.pdf [firstpage_image] =>[orig_patent_app_number] => 10274433 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/274433
Apparatus and method for positioning an integrated circuit for test Oct 16, 2002 Issued
Array ( [id] => 972862 [patent_doc_number] => 06937004 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-08-30 [patent_title] => 'Test mark and electronic device incorporating the same' [patent_app_type] => utility [patent_app_number] => 10/263832 [patent_app_country] => US [patent_app_date] => 2002-10-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 15 [patent_no_of_words] => 4752 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 29 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/937/06937004.pdf [firstpage_image] =>[orig_patent_app_number] => 10263832 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/263832
Test mark and electronic device incorporating the same Oct 3, 2002 Issued
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