
Russell Marc Kobert
Examiner (ID: 14392)
| Most Active Art Unit | 2858 |
| Art Unit(s) | 2858, 2829, 2213 |
| Total Applications | 684 |
| Issued Applications | 583 |
| Pending Applications | 38 |
| Abandoned Applications | 63 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 6714140
[patent_doc_number] => 20030025488
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-02-06
[patent_title] => 'Power sensing RF termination apparatus including temperature compensation means'
[patent_app_type] => new
[patent_app_number] => 10/263007
[patent_app_country] => US
[patent_app_date] => 2002-10-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 3486
[patent_no_of_claims] => 20
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[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0025/20030025488.pdf
[firstpage_image] =>[orig_patent_app_number] => 10263007
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/263007 | Power sensing RF termination apparatus including temperature compensation means | Sep 30, 2002 | Abandoned |
Array
(
[id] => 1035403
[patent_doc_number] => 06876211
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2005-04-05
[patent_title] => 'Printed circuit board test fixture that supports a PCB to be tested'
[patent_app_type] => utility
[patent_app_number] => 10/246233
[patent_app_country] => US
[patent_app_date] => 2002-09-18
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/06/876/06876211.pdf
[firstpage_image] =>[orig_patent_app_number] => 10246233
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/246233 | Printed circuit board test fixture that supports a PCB to be tested | Sep 17, 2002 | Issued |
Array
(
[id] => 7361032
[patent_doc_number] => 20040049711
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-03-11
[patent_title] => 'Oscillation based access time measurement'
[patent_app_type] => new
[patent_app_number] => 10/236328
[patent_app_country] => US
[patent_app_date] => 2002-09-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
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[pdf_file] => publications/A1/0049/20040049711.pdf
[firstpage_image] =>[orig_patent_app_number] => 10236328
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/236328 | Oscillation based access time measurement | Sep 5, 2002 | Issued |
Array
(
[id] => 1018946
[patent_doc_number] => 06891363
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2005-05-10
[patent_title] => 'Apparatus and method for detecting photon emissions from transistors'
[patent_app_type] => utility
[patent_app_number] => 10/234231
[patent_app_country] => US
[patent_app_date] => 2002-09-03
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[pdf_file] => patents/06/891/06891363.pdf
[firstpage_image] =>[orig_patent_app_number] => 10234231
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/234231 | Apparatus and method for detecting photon emissions from transistors | Sep 2, 2002 | Issued |
Array
(
[id] => 1074228
[patent_doc_number] => 06838894
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2005-01-04
[patent_title] => 'Stress relieved contact array'
[patent_app_type] => utility
[patent_app_number] => 10/233727
[patent_app_country] => US
[patent_app_date] => 2002-09-03
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[pdf_file] => patents/06/838/06838894.pdf
[firstpage_image] =>[orig_patent_app_number] => 10233727
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/233727 | Stress relieved contact array | Sep 2, 2002 | Issued |
Array
(
[id] => 747323
[patent_doc_number] => 07026835
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-04-11
[patent_title] => 'Engagement probe having a grouping of projecting apexes for engaging a conductive pad'
[patent_app_type] => utility
[patent_app_number] => 10/232295
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[pdf_file] => patents/07/026/07026835.pdf
[firstpage_image] =>[orig_patent_app_number] => 10232295
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/232295 | Engagement probe having a grouping of projecting apexes for engaging a conductive pad | Aug 29, 2002 | Issued |
Array
(
[id] => 1015171
[patent_doc_number] => 06894479
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2005-05-17
[patent_title] => 'Connector cable and method for probing vacuum-sealable electronic nodes of an electrical testing device'
[patent_app_type] => utility
[patent_app_number] => 10/228026
[patent_app_country] => US
[patent_app_date] => 2002-08-26
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[pdf_file] => patents/06/894/06894479.pdf
[firstpage_image] =>[orig_patent_app_number] => 10228026
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/228026 | Connector cable and method for probing vacuum-sealable electronic nodes of an electrical testing device | Aug 25, 2002 | Issued |
Array
(
[id] => 6812097
[patent_doc_number] => 20030071647
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-04-17
[patent_title] => 'Method and arrangement for determining the high-frequency behavior of active circuit elements'
[patent_app_type] => new
[patent_app_number] => 10/227232
[patent_app_country] => US
[patent_app_date] => 2002-08-23
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[pdf_file] => publications/A1/0071/20030071647.pdf
[firstpage_image] =>[orig_patent_app_number] => 10227232
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/227232 | Method and arrangement for determining the high-frequency behavior of active circuit elements | Aug 22, 2002 | Abandoned |
Array
(
[id] => 6781470
[patent_doc_number] => 20030062917
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-04-03
[patent_title] => 'Semiconductor inspection device'
[patent_app_type] => new
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/225124 | Semiconductor inspection device capable of performing various inspections on a semiconductor device | Aug 21, 2002 | Issued |
Array
(
[id] => 1097948
[patent_doc_number] => 06822465
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2004-11-23
[patent_title] => 'Method of regulating the temperature of integrated circuit modules, using a heat exchanger with a face of a solid malleable metal and a release agent'
[patent_app_type] => B1
[patent_app_number] => 10/215993
[patent_app_country] => US
[patent_app_date] => 2002-08-09
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[pdf_file] => patents/06/822/06822465.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/215993 | Method of regulating the temperature of integrated circuit modules, using a heat exchanger with a face of a solid malleable metal and a release agent | Aug 8, 2002 | Issued |
Array
(
[id] => 6748404
[patent_doc_number] => 20030042924
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[patent_issue_date] => 2003-03-06
[patent_title] => 'Inspection terminal for inspecting electronic chip component, and inspection method and inspection apparatus using the same'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/215025 | Inspection terminal for inspecting electronic chip component, and inspection method and inspection apparatus using the same | Aug 8, 2002 | Issued |
Array
(
[id] => 1254792
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[patent_title] => 'Method for aligning and connecting semiconductor components to substrates'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/208335 | Method for aligning and connecting semiconductor components to substrates | Jul 29, 2002 | Issued |
Array
(
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[patent_title] => 'Efficient parallel testing of semiconductor devices using a known good device to generate expected responses'
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Array
(
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[patent_title] => 'Semiconductor device testing apparatus having timing hold function'
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Array
(
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Array
(
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[patent_title] => 'Test interconnect having suspended contacts for bumped semiconductor components'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/198895 | Test interconnect having suspended contacts for bumped semiconductor components | Jul 17, 2002 | Issued |
Array
(
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Array
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Array
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Array
(
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/164454 | Method of characterizing free-space radiation using a chirped optical pulse | Jun 5, 2002 | Issued |