
Russell Marc Kobert
Examiner (ID: 14392)
| Most Active Art Unit | 2858 |
| Art Unit(s) | 2858, 2829, 2213 |
| Total Applications | 684 |
| Issued Applications | 583 |
| Pending Applications | 38 |
| Abandoned Applications | 63 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 1015176
[patent_doc_number] => 06894481
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2005-05-17
[patent_title] => 'Method and apparatus for bringing laser chips to a measurement position'
[patent_app_type] => utility
[patent_app_number] => 10/480030
[patent_app_country] => US
[patent_app_date] => 2002-06-04
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[pdf_file] => patents/06/894/06894481.pdf
[firstpage_image] =>[orig_patent_app_number] => 10480030
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/480030 | Method and apparatus for bringing laser chips to a measurement position | Jun 3, 2002 | Issued |
Array
(
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[patent_doc_number] => 20020125909
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[patent_kind] => A1
[patent_issue_date] => 2002-09-12
[patent_title] => 'Testing of BGA and other CSP packages using probing techniques'
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Array
(
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[patent_issue_date] => 2003-03-18
[patent_title] => 'Testing of BGA and other CSP packages using probing techniques'
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Array
(
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[patent_issue_date] => 2002-11-21
[patent_title] => 'Docking device, more particularly for a probe and a tester'
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Array
(
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[patent_title] => 'Detection of defects in patterned substrates'
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Array
(
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[patent_issue_date] => 2003-10-23
[patent_title] => 'System and method for testing a printed circuit board by employing a ceramic substrate with micro-probes formed on the ceramic substrate'
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[patent_app_number] => 10/126628
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/126628 | System and method for testing a printed circuit board by employing a ceramic substrate with micro-probes formed on the ceramic substrate | Apr 21, 2002 | Abandoned |
Array
(
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[patent_title] => 'Characteristic evaluation apparatus for insulated gate type transistors'
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Array
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[patent_title] => 'Characteristic evaluation apparatus for insulated gate type transistors'
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Array
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[patent_title] => 'Method and apparatus for simultaneous measurement of electric field and temperature using an electrooptic semiconductor probe'
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Array
(
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[patent_title] => 'Engagement probes'
[patent_app_type] => B1
[patent_app_number] => 10/087427
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Array
(
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[patent_doc_number] => 06825650
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[patent_title] => 'Current measuring probe and electrical energy meter for use therewith'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/890126 | Current measuring probe and electrical energy meter for use therewith | Feb 19, 2002 | Issued |
Array
(
[id] => 6738571
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/079329 | Semiconductor wafer electrical testing with a mobile chiller plate for rapid and precise test temperature control | Feb 18, 2002 | Issued |
Array
(
[id] => 752539
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[patent_title] => 'Apparatus for socketing and testing integrated circuits and methods of operating the same'
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Array
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Array
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Array
(
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Array
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