Search

Russell Marc Kobert

Examiner (ID: 14392)

Most Active Art Unit
2858
Art Unit(s)
2858, 2829, 2213
Total Applications
684
Issued Applications
583
Pending Applications
38
Abandoned Applications
63

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 1015176 [patent_doc_number] => 06894481 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-05-17 [patent_title] => 'Method and apparatus for bringing laser chips to a measurement position' [patent_app_type] => utility [patent_app_number] => 10/480030 [patent_app_country] => US [patent_app_date] => 2002-06-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 1142 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 160 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/894/06894481.pdf [firstpage_image] =>[orig_patent_app_number] => 10480030 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/480030
Method and apparatus for bringing laser chips to a measurement position Jun 3, 2002 Issued
Array ( [id] => 6417858 [patent_doc_number] => 20020125909 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-09-12 [patent_title] => 'Testing of BGA and other CSP packages using probing techniques' [patent_app_type] => new [patent_app_number] => 10/140573 [patent_app_country] => US [patent_app_date] => 2002-05-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 4434 [patent_no_of_claims] => 56 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 116 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0125/20020125909.pdf [firstpage_image] =>[orig_patent_app_number] => 10140573 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/140573
Testing of BGA and other CSP packages using probing techniques May 7, 2002 Issued
Array ( [id] => 1412977 [patent_doc_number] => 06535004 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-03-18 [patent_title] => 'Testing of BGA and other CSP packages using probing techniques' [patent_app_type] => B2 [patent_app_number] => 10/140572 [patent_app_country] => US [patent_app_date] => 2002-05-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 14 [patent_no_of_words] => 4361 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 197 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/535/06535004.pdf [firstpage_image] =>[orig_patent_app_number] => 10140572 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/140572
Testing of BGA and other CSP packages using probing techniques May 7, 2002 Issued
Array ( [id] => 6110212 [patent_doc_number] => 20020172579 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-11-21 [patent_title] => 'Docking device, more particularly for a probe and a tester' [patent_app_type] => new [patent_app_number] => 10/138619 [patent_app_country] => US [patent_app_date] => 2002-05-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 3170 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 136 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0172/20020172579.pdf [firstpage_image] =>[orig_patent_app_number] => 10138619 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/138619
Docking device, more particularly for a probe and a tester May 5, 2002 Issued
Array ( [id] => 6044165 [patent_doc_number] => 20020166964 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-11-14 [patent_title] => 'Detection of defects in patterned substrates' [patent_app_type] => new [patent_app_number] => 10/134210 [patent_app_country] => US [patent_app_date] => 2002-04-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 9332 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 76 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0166/20020166964.pdf [firstpage_image] =>[orig_patent_app_number] => 10134210 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/134210
Detection of defects in patterned substrates Apr 28, 2002 Issued
Array ( [id] => 6807575 [patent_doc_number] => 20030197514 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-10-23 [patent_title] => 'System and method for testing a printed circuit board by employing a ceramic substrate with micro-probes formed on the ceramic substrate' [patent_app_type] => new [patent_app_number] => 10/126628 [patent_app_country] => US [patent_app_date] => 2002-04-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 1766 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 221 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0197/20030197514.pdf [firstpage_image] =>[orig_patent_app_number] => 10126628 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/126628
System and method for testing a printed circuit board by employing a ceramic substrate with micro-probes formed on the ceramic substrate Apr 21, 2002 Abandoned
Array ( [id] => 1387225 [patent_doc_number] => 06559672 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-05-06 [patent_title] => 'Characteristic evaluation apparatus for insulated gate type transistors' [patent_app_type] => B2 [patent_app_number] => 10/093936 [patent_app_country] => US [patent_app_date] => 2002-03-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 25 [patent_figures_cnt] => 29 [patent_no_of_words] => 16005 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 417 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/559/06559672.pdf [firstpage_image] =>[orig_patent_app_number] => 10093936 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/093936
Characteristic evaluation apparatus for insulated gate type transistors Mar 10, 2002 Issued
Array ( [id] => 5840947 [patent_doc_number] => 20020130679 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-09-19 [patent_title] => 'Characteristic evaluation apparatus for insulated gate type transistors' [patent_app_type] => new [patent_app_number] => 10/093933 [patent_app_country] => US [patent_app_date] => 2002-03-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 26 [patent_figures_cnt] => 26 [patent_no_of_words] => 16097 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 361 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0130/20020130679.pdf [firstpage_image] =>[orig_patent_app_number] => 10093933 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/093933
Characteristic evaluation apparatus for insulated gate type transistors Mar 10, 2002 Issued
Array ( [id] => 1006285 [patent_doc_number] => 06906506 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2005-06-14 [patent_title] => 'Method and apparatus for simultaneous measurement of electric field and temperature using an electrooptic semiconductor probe' [patent_app_type] => utility [patent_app_number] => 10/092157 [patent_app_country] => US [patent_app_date] => 2002-03-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 24 [patent_no_of_words] => 8505 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 82 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/906/06906506.pdf [firstpage_image] =>[orig_patent_app_number] => 10092157 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/092157
Method and apparatus for simultaneous measurement of electric field and temperature using an electrooptic semiconductor probe Mar 5, 2002 Issued
Array ( [id] => 1456143 [patent_doc_number] => 06462571 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-10-08 [patent_title] => 'Engagement probes' [patent_app_type] => B1 [patent_app_number] => 10/087427 [patent_app_country] => US [patent_app_date] => 2002-02-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 19 [patent_no_of_words] => 4021 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 75 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/462/06462571.pdf [firstpage_image] =>[orig_patent_app_number] => 10087427 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/087427
Engagement probes Feb 25, 2002 Issued
Array ( [id] => 1094177 [patent_doc_number] => 06825650 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-11-30 [patent_title] => 'Current measuring probe and electrical energy meter for use therewith' [patent_app_type] => B1 [patent_app_number] => 09/890126 [patent_app_country] => US [patent_app_date] => 2002-02-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 9 [patent_no_of_words] => 4358 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 111 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/825/06825650.pdf [firstpage_image] =>[orig_patent_app_number] => 09890126 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/890126
Current measuring probe and electrical energy meter for use therewith Feb 19, 2002 Issued
Array ( [id] => 6738571 [patent_doc_number] => 20030155939 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-08-21 [patent_title] => 'Hot/cold chuck system' [patent_app_type] => new [patent_app_number] => 10/079329 [patent_app_country] => US [patent_app_date] => 2002-02-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 4001 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 66 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0155/20030155939.pdf [firstpage_image] =>[orig_patent_app_number] => 10079329 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/079329
Semiconductor wafer electrical testing with a mobile chiller plate for rapid and precise test temperature control Feb 18, 2002 Issued
Array ( [id] => 752539 [patent_doc_number] => 07023227 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2006-04-04 [patent_title] => 'Apparatus for socketing and testing integrated circuits and methods of operating the same' [patent_app_type] => utility [patent_app_number] => 10/075832 [patent_app_country] => US [patent_app_date] => 2002-02-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 2939 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 96 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/023/07023227.pdf [firstpage_image] =>[orig_patent_app_number] => 10075832 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/075832
Apparatus for socketing and testing integrated circuits and methods of operating the same Feb 11, 2002 Issued
Array ( [id] => 1190235 [patent_doc_number] => 06734660 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-05-11 [patent_title] => 'Current sensor arrangement with test current generator' [patent_app_type] => B1 [patent_app_number] => 10/072033 [patent_app_country] => US [patent_app_date] => 2002-02-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 15 [patent_no_of_words] => 6023 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 330 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/734/06734660.pdf [firstpage_image] =>[orig_patent_app_number] => 10072033 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/072033
Current sensor arrangement with test current generator Feb 6, 2002 Issued
Array ( [id] => 1171038 [patent_doc_number] => 06756797 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-06-29 [patent_title] => 'Planarizing interposer for thermal compensation of a probe card' [patent_app_type] => B2 [patent_app_number] => 10/059677 [patent_app_country] => US [patent_app_date] => 2002-01-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 3605 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 151 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/756/06756797.pdf [firstpage_image] =>[orig_patent_app_number] => 10059677 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/059677
Planarizing interposer for thermal compensation of a probe card Jan 28, 2002 Issued
Array ( [id] => 1254795 [patent_doc_number] => 06670819 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-12-30 [patent_title] => 'Methods of engaging electrically conductive pads on a semiconductor substrate' [patent_app_type] => B2 [patent_app_number] => 10/057711 [patent_app_country] => US [patent_app_date] => 2002-01-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 19 [patent_no_of_words] => 4023 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 81 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/670/06670819.pdf [firstpage_image] =>[orig_patent_app_number] => 10057711 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/057711
Methods of engaging electrically conductive pads on a semiconductor substrate Jan 23, 2002 Issued
Array ( [id] => 6786050 [patent_doc_number] => 20030137289 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-07-24 [patent_title] => 'Comparator circuit for differential swing comparison and common-mode voltage comparison' [patent_app_type] => new [patent_app_number] => 10/057134 [patent_app_country] => US [patent_app_date] => 2002-01-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4515 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 143 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0137/20030137289.pdf [firstpage_image] =>[orig_patent_app_number] => 10057134 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/057134
Comparator circuit for differential swing comparison and common-mode voltage comparison Jan 23, 2002 Issued
Array ( [id] => 1074232 [patent_doc_number] => 06838898 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-01-04 [patent_title] => 'Apparatus and method for testing high current circuit assemblies' [patent_app_type] => utility [patent_app_number] => 10/053135 [patent_app_country] => US [patent_app_date] => 2002-01-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 10 [patent_no_of_words] => 2393 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/838/06838898.pdf [firstpage_image] =>[orig_patent_app_number] => 10053135 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/053135
Apparatus and method for testing high current circuit assemblies Jan 16, 2002 Issued
Array ( [id] => 6526919 [patent_doc_number] => 20020109523 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-08-15 [patent_title] => 'Reduced cost, high speed integrated circuit test arrangement' [patent_app_type] => new [patent_app_number] => 10/047877 [patent_app_country] => US [patent_app_date] => 2002-01-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4272 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 105 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0109/20020109523.pdf [firstpage_image] =>[orig_patent_app_number] => 10047877 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/047877
Reduced cost, high speed integrated circuit test arrangement Jan 13, 2002 Issued
Array ( [id] => 6656482 [patent_doc_number] => 20030132743 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-07-17 [patent_title] => 'Modular test adapter for rapid action engagement interface' [patent_app_type] => new [patent_app_number] => 10/042332 [patent_app_country] => US [patent_app_date] => 2002-01-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 3063 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 53 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0132/20030132743.pdf [firstpage_image] =>[orig_patent_app_number] => 10042332 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/042332
Modular test adapter for rapid action engagement interface Jan 10, 2002 Issued
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