
Russell Marc Kobert
Examiner (ID: 14392)
| Most Active Art Unit | 2858 |
| Art Unit(s) | 2858, 2829, 2213 |
| Total Applications | 684 |
| Issued Applications | 583 |
| Pending Applications | 38 |
| Abandoned Applications | 63 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 1580888
[patent_doc_number] => 06448804
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2002-09-10
[patent_title] => 'Contactless total charge measurement with corona'
[patent_app_type] => B2
[patent_app_number] => 09/964944
[patent_app_country] => US
[patent_app_date] => 2001-09-27
[patent_effective_date] => 0000-00-00
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[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/448/06448804.pdf
[firstpage_image] =>[orig_patent_app_number] => 09964944
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/964944 | Contactless total charge measurement with corona | Sep 26, 2001 | Issued |
Array
(
[id] => 6721894
[patent_doc_number] => 20030055584
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-03-20
[patent_title] => 'Demagnetization for a motor in an electric or partially electric motor vehicle'
[patent_app_type] => new
[patent_app_number] => 09/682531
[patent_app_country] => US
[patent_app_date] => 2001-09-17
[patent_effective_date] => 0000-00-00
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[patent_maintenance] => 1
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[pdf_file] => publications/A1/0055/20030055584.pdf
[firstpage_image] =>[orig_patent_app_number] => 09682531
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/682531 | Detection of demagnetization in a motor in an electric or partially electric motor vehicle | Sep 16, 2001 | Issued |
Array
(
[id] => 6777031
[patent_doc_number] => 20030048111
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-03-13
[patent_title] => 'Test Fixture Comprising Drilled and Etched Pin holes and Related Methods.'
[patent_app_type] => new
[patent_app_number] => 09/952685
[patent_app_country] => US
[patent_app_date] => 2001-09-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
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[pdf_file] => publications/A1/0048/20030048111.pdf
[firstpage_image] =>[orig_patent_app_number] => 09952685
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/952685 | Test Fixture Comprising Drilled and Etched Pin holes and Related Methods. | Sep 12, 2001 | Abandoned |
Array
(
[id] => 1074230
[patent_doc_number] => 06838896
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2005-01-04
[patent_title] => 'Method and system for probing, testing, burn-in, repairing and programming of integrated circuits in a closed environment using a single apparatus'
[patent_app_type] => utility
[patent_app_number] => 09/946552
[patent_app_country] => US
[patent_app_date] => 2001-09-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
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[pdf_file] => patents/06/838/06838896.pdf
[firstpage_image] =>[orig_patent_app_number] => 09946552
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/946552 | Method and system for probing, testing, burn-in, repairing and programming of integrated circuits in a closed environment using a single apparatus | Sep 5, 2001 | Issued |
Array
(
[id] => 7645072
[patent_doc_number] => 06472901
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2002-10-29
[patent_title] => 'Method for in-line testing of flip-chip semiconductor assemblies'
[patent_app_type] => B2
[patent_app_number] => 09/944507
[patent_app_country] => US
[patent_app_date] => 2001-08-30
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/06/472/06472901.pdf
[firstpage_image] =>[orig_patent_app_number] => 09944507
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/944507 | Method for in-line testing of flip-chip semiconductor assemblies | Aug 29, 2001 | Issued |
Array
(
[id] => 1128840
[patent_doc_number] => 06791314
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2004-09-14
[patent_title] => 'Device and method for measuring weak current signals using a floating amplifier'
[patent_app_type] => B1
[patent_app_number] => 09/913931
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[pdf_file] => patents/06/791/06791314.pdf
[firstpage_image] =>[orig_patent_app_number] => 09913931
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/913931 | Device and method for measuring weak current signals using a floating amplifier | Aug 19, 2001 | Issued |
Array
(
[id] => 6743272
[patent_doc_number] => 20030020455
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-01-30
[patent_title] => 'Method and apparatus for measuring electrical energy consumption for multiple consumers'
[patent_app_type] => new
[patent_app_number] => 09/917333
[patent_app_country] => US
[patent_app_date] => 2001-07-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
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[pdf_file] => publications/A1/0020/20030020455.pdf
[firstpage_image] =>[orig_patent_app_number] => 09917333
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/917333 | Method and apparatus for measuring electrical energy consumption for multiple consumers | Jul 29, 2001 | Abandoned |
Array
(
[id] => 1544787
[patent_doc_number] => 06373273
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2002-04-16
[patent_title] => 'Test insert containing vias for interfacing a device containing contact bumps with a test substrate'
[patent_app_type] => B1
[patent_app_number] => 09/916771
[patent_app_country] => US
[patent_app_date] => 2001-07-27
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[pdf_file] => patents/06/373/06373273.pdf
[firstpage_image] =>[orig_patent_app_number] => 09916771
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/916771 | Test insert containing vias for interfacing a device containing contact bumps with a test substrate | Jul 26, 2001 | Issued |
Array
(
[id] => 5856844
[patent_doc_number] => 20020121912
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-09-05
[patent_title] => 'Method for making a card with multiple contact tips for testing microsphere integrated circuits, and testing device using said card'
[patent_app_type] => new
[patent_app_number] => 10/070833
[patent_app_country] => US
[patent_app_date] => 2002-03-11
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[pdf_file] => publications/A1/0121/20020121912.pdf
[firstpage_image] =>[orig_patent_app_number] => 10070833
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/070833 | Method for making a card with multiple contact tips for testing microsphere integrated circuits, and testing device using said card | Jul 23, 2001 | Issued |
Array
(
[id] => 6547128
[patent_doc_number] => 20020110939
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-08-15
[patent_title] => 'Semiconductor device and method of inspecting the same'
[patent_app_type] => new
[patent_app_number] => 09/906724
[patent_app_country] => US
[patent_app_date] => 2001-07-18
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0110/20020110939.pdf
[firstpage_image] =>[orig_patent_app_number] => 09906724
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/906724 | Semiconductor device with phase comparator comparing phases between internal signal and external signal | Jul 17, 2001 | Issued |
Array
(
[id] => 6735705
[patent_doc_number] => 20030013340
[patent_country] => US
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[patent_issue_date] => 2003-01-16
[patent_title] => 'Fiducial alignment marks on microelectronic spring contacts'
[patent_app_type] => new
[patent_app_number] => 09/906999
[patent_app_country] => US
[patent_app_date] => 2001-07-16
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[firstpage_image] =>[orig_patent_app_number] => 09906999
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/906999 | Fiducial alignment marks on microelectronic spring contacts | Jul 15, 2001 | Issued |
Array
(
[id] => 5799094
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[patent_title] => 'High density, area array probe card apparatus'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/905426 | High density, area array probe card apparatus | Jul 13, 2001 | Issued |
Array
(
[id] => 1246914
[patent_doc_number] => 06677774
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[patent_issue_date] => 2004-01-13
[patent_title] => 'Method for locating IDDQ defects using multiple controlled collapse chip connections current measurement on an automatic tester'
[patent_app_type] => B2
[patent_app_number] => 09/681917
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/681917 | Method for locating IDDQ defects using multiple controlled collapse chip connections current measurement on an automatic tester | Jun 25, 2001 | Issued |
Array
(
[id] => 6879265
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[patent_issue_date] => 2001-10-18
[patent_title] => 'Methods of forming apparatuses and a method of engaging electrically conductive test pads on a semiconductor substrate'
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Array
(
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[patent_title] => 'Scanning electromagnetic-field imager with optical-fiber-based electro-optic field-mapping system'
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Array
(
[id] => 1060430
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[patent_issue_date] => 2005-02-08
[patent_title] => 'Integrated circuit leadframes patterned for measuring the accurate amplitude of changing currents'
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Array
(
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Array
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Array
(
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Array
(
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[patent_issue_date] => 2004-03-02
[patent_title] => 'Integrated micromachine relay for automated test equipment applications'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/859842 | Integrated micromachine relay for automated test equipment applications | May 15, 2001 | Issued |