Search

Ryan F. Pitaro

Examiner (ID: 9132, Phone: (571)272-4071 , Office: P/2171 )

Most Active Art Unit
2171
Art Unit(s)
2174, 2171, 2188, 2198, 2100
Total Applications
754
Issued Applications
507
Pending Applications
20
Abandoned Applications
230

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 6123147 [patent_doc_number] => 20020074522 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-06-20 [patent_title] => 'Scene projector apparatus' [patent_app_type] => new [patent_app_number] => 09/736806 [patent_app_country] => US [patent_app_date] => 2000-12-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 1716 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 94 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0074/20020074522.pdf [firstpage_image] =>[orig_patent_app_number] => 09736806 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/736806
Scene projector apparatus Dec 14, 2000 Abandoned
Array ( [id] => 6867614 [patent_doc_number] => 20030080303 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-05-01 [patent_title] => 'Radioprotective materials and utilization thereof' [patent_app_type] => new [patent_app_number] => 10/149333 [patent_app_country] => US [patent_app_date] => 2002-06-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 6620 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 46 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0080/20030080303.pdf [firstpage_image] =>[orig_patent_app_number] => 10149333 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/149333
Radioprotective materials and utilization thereof Dec 7, 2000 Issued
Array ( [id] => 1502132 [patent_doc_number] => 06486468 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-11-26 [patent_title] => 'High resolution, high pressure xenon gamma ray spectroscopy using primary and stimulated light emission' [patent_app_type] => B1 [patent_app_number] => 09/722846 [patent_app_country] => US [patent_app_date] => 2000-11-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2932 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/486/06486468.pdf [firstpage_image] =>[orig_patent_app_number] => 09722846 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/722846
High resolution, high pressure xenon gamma ray spectroscopy using primary and stimulated light emission Nov 26, 2000 Issued
Array ( [id] => 1455280 [patent_doc_number] => 06462346 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-10-08 [patent_title] => 'Mask inspecting apparatus and mask inspecting method which can inspect mask by using electron beam exposure system without independently mounting another mask inspecting apparatus' [patent_app_type] => B1 [patent_app_number] => 09/721945 [patent_app_country] => US [patent_app_date] => 2000-11-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 9 [patent_no_of_words] => 5150 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 62 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/462/06462346.pdf [firstpage_image] =>[orig_patent_app_number] => 09721945 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/721945
Mask inspecting apparatus and mask inspecting method which can inspect mask by using electron beam exposure system without independently mounting another mask inspecting apparatus Nov 26, 2000 Issued
Array ( [id] => 1374677 [patent_doc_number] => 06570655 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-05-27 [patent_title] => 'Process and apparatus for measuring the opacity in gases' [patent_app_type] => B1 [patent_app_number] => 09/721693 [patent_app_country] => US [patent_app_date] => 2000-11-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 8 [patent_no_of_words] => 4693 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 67 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/570/06570655.pdf [firstpage_image] =>[orig_patent_app_number] => 09721693 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/721693
Process and apparatus for measuring the opacity in gases Nov 23, 2000 Issued
Array ( [id] => 1351104 [patent_doc_number] => 06580069 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-06-17 [patent_title] => 'Atom probe' [patent_app_type] => B1 [patent_app_number] => 09/508912 [patent_app_country] => US [patent_app_date] => 2000-11-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 2854 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 119 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/580/06580069.pdf [firstpage_image] =>[orig_patent_app_number] => 09508912 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/508912
Atom probe Nov 15, 2000 Issued
Array ( [id] => 1407659 [patent_doc_number] => 06545765 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-04-08 [patent_title] => 'Method and apparatus for measuring thickness of transparent films' [patent_app_type] => B1 [patent_app_number] => 09/708778 [patent_app_country] => US [patent_app_date] => 2000-11-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 3626 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 146 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/545/06545765.pdf [firstpage_image] =>[orig_patent_app_number] => 09708778 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/708778
Method and apparatus for measuring thickness of transparent films Nov 7, 2000 Issued
Array ( [id] => 1547210 [patent_doc_number] => 06444980 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-09-03 [patent_title] => 'Apparatus for production and extraction of charged particles' [patent_app_type] => B1 [patent_app_number] => 09/647250 [patent_app_country] => US [patent_app_date] => 2000-11-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 15 [patent_no_of_words] => 4631 [patent_no_of_claims] => 29 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 164 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/444/06444980.pdf [firstpage_image] =>[orig_patent_app_number] => 09647250 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/647250
Apparatus for production and extraction of charged particles Nov 6, 2000 Issued
Array ( [id] => 1423282 [patent_doc_number] => 06529380 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-03-04 [patent_title] => 'Structure of power module radiation' [patent_app_type] => B1 [patent_app_number] => 09/699934 [patent_app_country] => US [patent_app_date] => 2000-10-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2107 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 69 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/529/06529380.pdf [firstpage_image] =>[orig_patent_app_number] => 09699934 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/699934
Structure of power module radiation Oct 29, 2000 Issued
Array ( [id] => 1135962 [patent_doc_number] => 06784419 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-08-31 [patent_title] => 'Electromagnetic wave absorber' [patent_app_type] => B1 [patent_app_number] => 09/695974 [patent_app_country] => US [patent_app_date] => 2000-10-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 4808 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 85 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/784/06784419.pdf [firstpage_image] =>[orig_patent_app_number] => 09695974 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/695974
Electromagnetic wave absorber Oct 25, 2000 Issued
Array ( [id] => 1420830 [patent_doc_number] => 06509569 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-01-21 [patent_title] => 'Deflection arrangement for separating two particle beams' [patent_app_type] => B1 [patent_app_number] => 09/690425 [patent_app_country] => US [patent_app_date] => 2000-10-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 2147 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 85 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/509/06509569.pdf [firstpage_image] =>[orig_patent_app_number] => 09690425 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/690425
Deflection arrangement for separating two particle beams Oct 16, 2000 Issued
Array ( [id] => 1309652 [patent_doc_number] => 06617595 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-09-09 [patent_title] => 'Multi-lens type electrostatic lens, electron beam exposure apparatus and charged beam applied apparatus using the lens, and device manufacturing method using these apparatuses' [patent_app_type] => B1 [patent_app_number] => 09/688223 [patent_app_country] => US [patent_app_date] => 2000-10-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 15 [patent_no_of_words] => 5261 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 75 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/617/06617595.pdf [firstpage_image] =>[orig_patent_app_number] => 09688223 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/688223
Multi-lens type electrostatic lens, electron beam exposure apparatus and charged beam applied apparatus using the lens, and device manufacturing method using these apparatuses Oct 15, 2000 Issued
Array ( [id] => 1420062 [patent_doc_number] => 06521889 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-02-18 [patent_title] => 'Dust particle inspection apparatus, and device manufacturing method using the same' [patent_app_type] => B1 [patent_app_number] => 09/689860 [patent_app_country] => US [patent_app_date] => 2000-10-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 23 [patent_no_of_words] => 7111 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 88 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/521/06521889.pdf [firstpage_image] =>[orig_patent_app_number] => 09689860 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/689860
Dust particle inspection apparatus, and device manufacturing method using the same Oct 12, 2000 Issued
Array ( [id] => 1140573 [patent_doc_number] => 06781114 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-08-24 [patent_title] => 'Radiographic camera' [patent_app_type] => B1 [patent_app_number] => 09/687554 [patent_app_country] => US [patent_app_date] => 2000-10-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 36 [patent_no_of_words] => 6291 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 78 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/781/06781114.pdf [firstpage_image] =>[orig_patent_app_number] => 09687554 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/687554
Radiographic camera Oct 12, 2000 Issued
Array ( [id] => 1373655 [patent_doc_number] => 06566658 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-05-20 [patent_title] => 'Charged particle beam control element, method of fabricating charged particle beam control element, and charged beam apparatus' [patent_app_type] => B1 [patent_app_number] => 09/689782 [patent_app_country] => US [patent_app_date] => 2000-10-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 18 [patent_no_of_words] => 9002 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 69 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/566/06566658.pdf [firstpage_image] =>[orig_patent_app_number] => 09689782 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/689782
Charged particle beam control element, method of fabricating charged particle beam control element, and charged beam apparatus Oct 12, 2000 Issued
Array ( [id] => 1390066 [patent_doc_number] => 06552337 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-04-22 [patent_title] => 'Methods and systems for measuring microroughness of a substrate combining particle counter and atomic force microscope measurements' [patent_app_type] => B1 [patent_app_number] => 09/688283 [patent_app_country] => US [patent_app_date] => 2000-10-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 4022 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 121 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/552/06552337.pdf [firstpage_image] =>[orig_patent_app_number] => 09688283 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/688283
Methods and systems for measuring microroughness of a substrate combining particle counter and atomic force microscope measurements Oct 12, 2000 Issued
Array ( [id] => 1381537 [patent_doc_number] => 06567157 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-05-20 [patent_title] => 'Fast mixing condensation nucleus counter' [patent_app_type] => B1 [patent_app_number] => 09/688411 [patent_app_country] => US [patent_app_date] => 2000-10-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 8665 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 185 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/567/06567157.pdf [firstpage_image] =>[orig_patent_app_number] => 09688411 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/688411
Fast mixing condensation nucleus counter Oct 11, 2000 Issued
Array ( [id] => 1418497 [patent_doc_number] => 06525327 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-02-25 [patent_title] => 'Ion implanter and beam stop therefor' [patent_app_type] => B1 [patent_app_number] => 09/686803 [patent_app_country] => US [patent_app_date] => 2000-10-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 7755 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 106 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/525/06525327.pdf [firstpage_image] =>[orig_patent_app_number] => 09686803 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/686803
Ion implanter and beam stop therefor Oct 11, 2000 Issued
Array ( [id] => 1390123 [patent_doc_number] => 06552340 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-04-22 [patent_title] => 'Autoadjusting charged-particle probe-forming apparatus' [patent_app_type] => B1 [patent_app_number] => 09/686805 [patent_app_country] => US [patent_app_date] => 2000-10-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5384 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 87 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/552/06552340.pdf [firstpage_image] =>[orig_patent_app_number] => 09686805 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/686805
Autoadjusting charged-particle probe-forming apparatus Oct 11, 2000 Issued
Array ( [id] => 1518636 [patent_doc_number] => 06501076 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-12-31 [patent_title] => 'Electron analyzer having an integrated low pass filter' [patent_app_type] => B1 [patent_app_number] => 09/687261 [patent_app_country] => US [patent_app_date] => 2000-10-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3227 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/501/06501076.pdf [firstpage_image] =>[orig_patent_app_number] => 09687261 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/687261
Electron analyzer having an integrated low pass filter Oct 10, 2000 Issued
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