
Ryan F. Pitaro
Examiner (ID: 9132, Phone: (571)272-4071 , Office: P/2171 )
| Most Active Art Unit | 2171 |
| Art Unit(s) | 2174, 2171, 2188, 2198, 2100 |
| Total Applications | 754 |
| Issued Applications | 507 |
| Pending Applications | 20 |
| Abandoned Applications | 230 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 6123147
[patent_doc_number] => 20020074522
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-06-20
[patent_title] => 'Scene projector apparatus'
[patent_app_type] => new
[patent_app_number] => 09/736806
[patent_app_country] => US
[patent_app_date] => 2000-12-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 1716
[patent_no_of_claims] => 9
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[patent_words_short_claim] => 94
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0074/20020074522.pdf
[firstpage_image] =>[orig_patent_app_number] => 09736806
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/736806 | Scene projector apparatus | Dec 14, 2000 | Abandoned |
Array
(
[id] => 6867614
[patent_doc_number] => 20030080303
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-05-01
[patent_title] => 'Radioprotective materials and utilization thereof'
[patent_app_type] => new
[patent_app_number] => 10/149333
[patent_app_country] => US
[patent_app_date] => 2002-06-06
[patent_effective_date] => 0000-00-00
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[firstpage_image] =>[orig_patent_app_number] => 10149333
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/149333 | Radioprotective materials and utilization thereof | Dec 7, 2000 | Issued |
Array
(
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[patent_doc_number] => 06486468
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[patent_kind] => B1
[patent_issue_date] => 2002-11-26
[patent_title] => 'High resolution, high pressure xenon gamma ray spectroscopy using primary and stimulated light emission'
[patent_app_type] => B1
[patent_app_number] => 09/722846
[patent_app_country] => US
[patent_app_date] => 2000-11-27
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Array
(
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[patent_issue_date] => 2002-10-08
[patent_title] => 'Mask inspecting apparatus and mask inspecting method which can inspect mask by using electron beam exposure system without independently mounting another mask inspecting apparatus'
[patent_app_type] => B1
[patent_app_number] => 09/721945
[patent_app_country] => US
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/721945 | Mask inspecting apparatus and mask inspecting method which can inspect mask by using electron beam exposure system without independently mounting another mask inspecting apparatus | Nov 26, 2000 | Issued |
Array
(
[id] => 1374677
[patent_doc_number] => 06570655
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[patent_kind] => B1
[patent_issue_date] => 2003-05-27
[patent_title] => 'Process and apparatus for measuring the opacity in gases'
[patent_app_type] => B1
[patent_app_number] => 09/721693
[patent_app_country] => US
[patent_app_date] => 2000-11-24
[patent_effective_date] => 0000-00-00
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/721693 | Process and apparatus for measuring the opacity in gases | Nov 23, 2000 | Issued |
Array
(
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[patent_issue_date] => 2003-06-17
[patent_title] => 'Atom probe'
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[patent_app_number] => 09/508912
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Array
(
[id] => 1407659
[patent_doc_number] => 06545765
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[patent_kind] => B1
[patent_issue_date] => 2003-04-08
[patent_title] => 'Method and apparatus for measuring thickness of transparent films'
[patent_app_type] => B1
[patent_app_number] => 09/708778
[patent_app_country] => US
[patent_app_date] => 2000-11-08
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[firstpage_image] =>[orig_patent_app_number] => 09708778
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/708778 | Method and apparatus for measuring thickness of transparent films | Nov 7, 2000 | Issued |
Array
(
[id] => 1547210
[patent_doc_number] => 06444980
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[patent_kind] => B1
[patent_issue_date] => 2002-09-03
[patent_title] => 'Apparatus for production and extraction of charged particles'
[patent_app_type] => B1
[patent_app_number] => 09/647250
[patent_app_country] => US
[patent_app_date] => 2000-11-07
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/647250 | Apparatus for production and extraction of charged particles | Nov 6, 2000 | Issued |
Array
(
[id] => 1423282
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[patent_issue_date] => 2003-03-04
[patent_title] => 'Structure of power module radiation'
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[firstpage_image] =>[orig_patent_app_number] => 09699934
[rel_patent_id] =>[rel_patent_doc_number] =>) 09/699934 | Structure of power module radiation | Oct 29, 2000 | Issued |
Array
(
[id] => 1135962
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[patent_issue_date] => 2004-08-31
[patent_title] => 'Electromagnetic wave absorber'
[patent_app_type] => B1
[patent_app_number] => 09/695974
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/695974 | Electromagnetic wave absorber | Oct 25, 2000 | Issued |
Array
(
[id] => 1420830
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[patent_title] => 'Deflection arrangement for separating two particle beams'
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Array
(
[id] => 1309652
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[patent_issue_date] => 2003-09-09
[patent_title] => 'Multi-lens type electrostatic lens, electron beam exposure apparatus and charged beam applied apparatus using the lens, and device manufacturing method using these apparatuses'
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Array
(
[id] => 1420062
[patent_doc_number] => 06521889
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[patent_issue_date] => 2003-02-18
[patent_title] => 'Dust particle inspection apparatus, and device manufacturing method using the same'
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Array
(
[id] => 1140573
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[patent_issue_date] => 2004-08-24
[patent_title] => 'Radiographic camera'
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Array
(
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[patent_title] => 'Charged particle beam control element, method of fabricating charged particle beam control element, and charged beam apparatus'
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Array
(
[id] => 1390066
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[patent_issue_date] => 2003-04-22
[patent_title] => 'Methods and systems for measuring microroughness of a substrate combining particle counter and atomic force microscope measurements'
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Array
(
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[patent_title] => 'Fast mixing condensation nucleus counter'
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Array
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Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 09/687261 | Electron analyzer having an integrated low pass filter | Oct 10, 2000 | Issued |