
Ryan F. Pitaro
Examiner (ID: 9132, Phone: (571)272-4071 , Office: P/2171 )
| Most Active Art Unit | 2171 |
| Art Unit(s) | 2174, 2171, 2188, 2198, 2100 |
| Total Applications | 754 |
| Issued Applications | 507 |
| Pending Applications | 20 |
| Abandoned Applications | 230 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 928711
[patent_doc_number] => 07315021
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-01-01
[patent_title] => 'Charged droplet spray probe'
[patent_app_type] => utility
[patent_app_number] => 11/132956
[patent_app_country] => US
[patent_app_date] => 2005-05-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 4927
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 12
[patent_words_short_claim] => 26
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/315/07315021.pdf
[firstpage_image] =>[orig_patent_app_number] => 11132956
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/132956 | Charged droplet spray probe | May 18, 2005 | Issued |
Array
(
[id] => 7205468
[patent_doc_number] => 20050258356
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-11-24
[patent_title] => 'Bipolar ion detector'
[patent_app_type] => utility
[patent_app_number] => 11/132685
[patent_app_country] => US
[patent_app_date] => 2005-05-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 1680
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0258/20050258356.pdf
[firstpage_image] =>[orig_patent_app_number] => 11132685
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/132685 | Bipolar ion detector | May 18, 2005 | Issued |
Array
(
[id] => 484191
[patent_doc_number] => 07220964
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2007-05-22
[patent_title] => 'Film thickness and composition measurement via auger electron spectroscopy and electron probe microanalysis'
[patent_app_type] => utility
[patent_app_number] => 11/132152
[patent_app_country] => US
[patent_app_date] => 2005-05-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 4333
[patent_no_of_claims] => 23
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 85
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/220/07220964.pdf
[firstpage_image] =>[orig_patent_app_number] => 11132152
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/132152 | Film thickness and composition measurement via auger electron spectroscopy and electron probe microanalysis | May 17, 2005 | Issued |
Array
(
[id] => 7227631
[patent_doc_number] => 20050269505
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-12-08
[patent_title] => 'Compact time-of-flight mass spectrometer'
[patent_app_type] => utility
[patent_app_number] => 11/129921
[patent_app_country] => US
[patent_app_date] => 2005-05-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 9150
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0269/20050269505.pdf
[firstpage_image] =>[orig_patent_app_number] => 11129921
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/129921 | Compact time-of-flight mass spectrometer | May 15, 2005 | Issued |
Array
(
[id] => 5730180
[patent_doc_number] => 20060255294
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-11-16
[patent_title] => 'Ion optical mounting assemblies'
[patent_app_type] => utility
[patent_app_number] => 11/129022
[patent_app_country] => US
[patent_app_date] => 2005-05-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 20
[patent_figures_cnt] => 20
[patent_no_of_words] => 27490
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0255/20060255294.pdf
[firstpage_image] =>[orig_patent_app_number] => 11129022
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/129022 | Ion optical mounting assemblies | May 12, 2005 | Issued |
Array
(
[id] => 5703059
[patent_doc_number] => 20060192106
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-08-31
[patent_title] => 'Ion sources for mass spectrometry'
[patent_app_type] => utility
[patent_app_number] => 11/129658
[patent_app_country] => US
[patent_app_date] => 2005-05-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 20
[patent_figures_cnt] => 20
[patent_no_of_words] => 27526
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0192/20060192106.pdf
[firstpage_image] =>[orig_patent_app_number] => 11129658
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/129658 | Ion sources for mass spectrometry | May 12, 2005 | Issued |
Array
(
[id] => 5767481
[patent_doc_number] => 20050264775
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-12-01
[patent_title] => 'Lithographic apparatus, device manufacturing method and radiation system'
[patent_app_type] => utility
[patent_app_number] => 11/127312
[patent_app_country] => US
[patent_app_date] => 2005-05-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 5043
[patent_no_of_claims] => 39
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0264/20050264775.pdf
[firstpage_image] =>[orig_patent_app_number] => 11127312
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/127312 | Lithographic apparatus, device manufacturing method and radiation system | May 11, 2005 | Issued |
Array
(
[id] => 668776
[patent_doc_number] => 07095019
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2006-08-22
[patent_title] => 'Remote reagent chemical ionization source'
[patent_app_type] => utility
[patent_app_number] => 11/120363
[patent_app_country] => US
[patent_app_date] => 2005-05-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 4226
[patent_no_of_claims] => 40
[patent_no_of_ind_claims] => 8
[patent_words_short_claim] => 53
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/095/07095019.pdf
[firstpage_image] =>[orig_patent_app_number] => 11120363
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/120363 | Remote reagent chemical ionization source | May 1, 2005 | Issued |
Array
(
[id] => 5790702
[patent_doc_number] => 20060011868
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-01-19
[patent_title] => 'Method and apparatus for sample formation and microanalysis in a vacuum chamber'
[patent_app_type] => utility
[patent_app_number] => 11/119207
[patent_app_country] => US
[patent_app_date] => 2005-04-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 39
[patent_figures_cnt] => 39
[patent_no_of_words] => 13703
[patent_no_of_claims] => 25
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0011/20060011868.pdf
[firstpage_image] =>[orig_patent_app_number] => 11119207
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/119207 | Method and apparatus for sample formation and microanalysis in a vacuum chamber | Apr 27, 2005 | Issued |
Array
(
[id] => 774710
[patent_doc_number] => 07002165
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-02-21
[patent_title] => 'Apparatus and method for repairing resist latent images'
[patent_app_type] => utility
[patent_app_number] => 11/119061
[patent_app_country] => US
[patent_app_date] => 2005-04-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 12
[patent_no_of_words] => 2847
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 93
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/002/07002165.pdf
[firstpage_image] =>[orig_patent_app_number] => 11119061
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/119061 | Apparatus and method for repairing resist latent images | Apr 27, 2005 | Issued |
Array
(
[id] => 6923780
[patent_doc_number] => 20050237035
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-10-27
[patent_title] => 'Control system for a power supply'
[patent_app_type] => utility
[patent_app_number] => 11/108471
[patent_app_country] => US
[patent_app_date] => 2005-04-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 6227
[patent_no_of_claims] => 30
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0237/20050237035.pdf
[firstpage_image] =>[orig_patent_app_number] => 11108471
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/108471 | Control system for a power supply | Apr 17, 2005 | Issued |
Array
(
[id] => 6963724
[patent_doc_number] => 20050230621
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-10-20
[patent_title] => 'Apparatus and method for investigating or modifying a surface with a beam of charged particles'
[patent_app_type] => utility
[patent_app_number] => 11/106368
[patent_app_country] => US
[patent_app_date] => 2005-04-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 4729
[patent_no_of_claims] => 26
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0230/20050230621.pdf
[firstpage_image] =>[orig_patent_app_number] => 11106368
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/106368 | Apparatus and method for investigating or modifying a surface with a beam of charged particles | Apr 13, 2005 | Issued |
Array
(
[id] => 5854426
[patent_doc_number] => 20060226359
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-10-12
[patent_title] => 'Method and apparatus for quantitative three-dimensional reconstruction in scanning electron microscopy'
[patent_app_type] => utility
[patent_app_number] => 11/099489
[patent_app_country] => US
[patent_app_date] => 2005-04-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 3692
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0226/20060226359.pdf
[firstpage_image] =>[orig_patent_app_number] => 11099489
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/099489 | Method and apparatus for quantitative three-dimensional reconstruction in scanning electron microscopy | Apr 5, 2005 | Issued |
Array
(
[id] => 428078
[patent_doc_number] => 07267520
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-09-11
[patent_title] => 'Wafer scanning system with reciprocating rotary motion utilizing springs and counterweights'
[patent_app_type] => utility
[patent_app_number] => 11/099022
[patent_app_country] => US
[patent_app_date] => 2005-04-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 7428
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 51
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/267/07267520.pdf
[firstpage_image] =>[orig_patent_app_number] => 11099022
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/099022 | Wafer scanning system with reciprocating rotary motion utilizing springs and counterweights | Apr 4, 2005 | Issued |
Array
(
[id] => 5750787
[patent_doc_number] => 20060219936
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-10-05
[patent_title] => 'Methods and apparatus for ion beam angle measurement in two dimensions'
[patent_app_type] => utility
[patent_app_number] => 11/099119
[patent_app_country] => US
[patent_app_date] => 2005-04-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 7935
[patent_no_of_claims] => 27
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0219/20060219936.pdf
[firstpage_image] =>[orig_patent_app_number] => 11099119
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/099119 | Methods and apparatus for ion beam angle measurement in two dimensions | Apr 4, 2005 | Issued |
Array
(
[id] => 495495
[patent_doc_number] => 07211797
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-05-01
[patent_title] => 'Inspection method and inspection system using charged particle beam'
[patent_app_type] => utility
[patent_app_number] => 11/098699
[patent_app_country] => US
[patent_app_date] => 2005-04-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 16
[patent_figures_cnt] => 24
[patent_no_of_words] => 9564
[patent_no_of_claims] => 15
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 100
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/211/07211797.pdf
[firstpage_image] =>[orig_patent_app_number] => 11098699
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/098699 | Inspection method and inspection system using charged particle beam | Apr 4, 2005 | Issued |
Array
(
[id] => 6965852
[patent_doc_number] => 20050232749
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-10-20
[patent_title] => 'Method for reciprocating a workpiece through an ion beam'
[patent_app_type] => utility
[patent_app_number] => 11/099062
[patent_app_country] => US
[patent_app_date] => 2005-04-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 9277
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0232/20050232749.pdf
[firstpage_image] =>[orig_patent_app_number] => 11099062
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/099062 | Method for reciprocating a workpiece through an ion beam | Apr 4, 2005 | Issued |
Array
(
[id] => 6963746
[patent_doc_number] => 20050230643
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-10-20
[patent_title] => 'Reciprocating drive for scanning a workpiece through an ion beam'
[patent_app_type] => utility
[patent_app_number] => 11/098942
[patent_app_country] => US
[patent_app_date] => 2005-04-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 9277
[patent_no_of_claims] => 63
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0230/20050230643.pdf
[firstpage_image] =>[orig_patent_app_number] => 11098942
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/098942 | Reciprocating drive for scanning a workpiece through an ion beam | Apr 4, 2005 | Issued |
Array
(
[id] => 655625
[patent_doc_number] => 07109486
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2006-09-19
[patent_title] => 'Layered electron beam column and method of use thereof'
[patent_app_type] => utility
[patent_app_number] => 10/907525
[patent_app_country] => US
[patent_app_date] => 2005-04-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 7
[patent_no_of_words] => 3976
[patent_no_of_claims] => 23
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 14
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/109/07109486.pdf
[firstpage_image] =>[orig_patent_app_number] => 10907525
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/907525 | Layered electron beam column and method of use thereof | Apr 3, 2005 | Issued |
Array
(
[id] => 5854430
[patent_doc_number] => 20060226363
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-10-12
[patent_title] => 'Ultra-thin sample preparation for transmission electron microscopy'
[patent_app_type] => utility
[patent_app_number] => 11/094443
[patent_app_country] => US
[patent_app_date] => 2005-03-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 2
[patent_no_of_words] => 2534
[patent_no_of_claims] => 23
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0226/20060226363.pdf
[firstpage_image] =>[orig_patent_app_number] => 11094443
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/094443 | Ultra-thin sample preparation for transmission electron microscopy | Mar 30, 2005 | Issued |