Ryan F. Pitaro

Array ( [id] => 5750801 [patent_doc_number] => 20060219950 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-10-05 [patent_title] => 'Lithographic apparatus and device manufacturing method' [patent_app_type] => utility [patent_app_number] => 11/094490 [patent_app_country] => US [patent_app_date] => 2005-03-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 7169 [patent_no_of_claims] => 37 [patent_no_of_ind_claims] => 10 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0219/20060219950.pdf [firstpage_image] =>[orig_patent_app_number] => 11094490 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7016289 [patent_doc_number] => 20050218336 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-10-06 [patent_title] => 'Wafer scanning device' [patent_app_type] => utility [patent_app_number] => 11/093326 [patent_app_country] => US [patent_app_date] => 2005-03-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 8307 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0218/20050218336.pdf [firstpage_image] =>[orig_patent_app_number] => 11093326 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 547281 [patent_doc_number] => 07170067 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-01-30 [patent_title] => 'Ion beam measurement apparatus and method' [patent_app_type] => utility [patent_app_number] => 11/093930 [patent_app_country] => US [patent_app_date] => 2005-03-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 2 [patent_no_of_words] => 1186 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 67 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/170/07170067.pdf [firstpage_image] =>[orig_patent_app_number] => 11093930 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 534976 [patent_doc_number] => 07180076 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-02-20 [patent_title] => 'Photoionization detectors, ionization chambers for use in photoionization detectors, and methods of use of photoionization detectors' [patent_app_type] => utility [patent_app_number] => 11/093992 [patent_app_country] => US [patent_app_date] => 2005-03-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 24 [patent_no_of_words] => 7869 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 63 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/180/07180076.pdf [firstpage_image] =>[orig_patent_app_number] => 11093992 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7050439 [patent_doc_number] => 20050186326 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-08-25 [patent_title] => 'High activity, spatially distributed radiation source for accurately simulating semiconductor device radiation environments' [patent_app_type] => utility [patent_app_number] => 11/087288 [patent_app_country] => US [patent_app_date] => 2005-03-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 10459 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0186/20050186326.pdf [firstpage_image] =>[orig_patent_app_number] => 11087288 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 408707 [patent_doc_number] => 07285792 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-10-23 [patent_title] => 'Scratch repairing processing method and scanning probe microscope (SPM) used therefor' [patent_app_type] => utility [patent_app_number] => 11/086812 [patent_app_country] => US [patent_app_date] => 2005-03-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 12 [patent_no_of_words] => 2518 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 56 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/285/07285792.pdf [firstpage_image] =>[orig_patent_app_number] => 11086812 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7111316 [patent_doc_number] => 20050208772 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-09-22 [patent_title] => 'Method of producing electron beam writing data, program of producing electron beam writing data, and electron beam writing apparatus' [patent_app_type] => utility [patent_app_number] => 11/082797 [patent_app_country] => US [patent_app_date] => 2005-03-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 6782 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0208/20050208772.pdf [firstpage_image] =>[orig_patent_app_number] => 11082797 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 676982 [patent_doc_number] => 07087899 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-08-08 [patent_title] => 'Sample electrification measurement method and charged particle beam apparatus' [patent_app_type] => utility [patent_app_number] => 11/077130 [patent_app_country] => US [patent_app_date] => 2005-03-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 23 [patent_figures_cnt] => 28 [patent_no_of_words] => 11938 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 70 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/087/07087899.pdf [firstpage_image] =>[orig_patent_app_number] => 11077130 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 473833 [patent_doc_number] => 07230237 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-06-12 [patent_title] => 'Mass spectrometer' [patent_app_type] => utility [patent_app_number] => 11/075719 [patent_app_country] => US [patent_app_date] => 2005-03-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 9 [patent_no_of_words] => 3156 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 96 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/230/07230237.pdf [firstpage_image] =>[orig_patent_app_number] => 11075719 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7072523 [patent_doc_number] => 20050145789 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-07-07 [patent_title] => 'Method and apparatus for electrospray augmented high field asymmetric ion mobility spectrometry' [patent_app_type] => utility [patent_app_number] => 11/070904 [patent_app_country] => US [patent_app_date] => 2005-03-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 34 [patent_figures_cnt] => 34 [patent_no_of_words] => 16053 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0145/20050145789.pdf [firstpage_image] =>[orig_patent_app_number] => 11070904 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 729757 [patent_doc_number] => 07041969 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-05-09 [patent_title] => 'Method and apparatus for selecting inlets of a multiple inlet FAIMS' [patent_app_type] => utility [patent_app_number] => 11/068764 [patent_app_country] => US [patent_app_date] => 2005-03-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 19 [patent_no_of_words] => 8515 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 161 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/041/07041969.pdf [firstpage_image] =>[orig_patent_app_number] => 11068764 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 546700 [patent_doc_number] => 07166837 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-01-23 [patent_title] => 'Apparatus and method for ion fragmentation cut-off' [patent_app_type] => utility [patent_app_number] => 11/069629 [patent_app_country] => US [patent_app_date] => 2005-02-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4583 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 63 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/166/07166837.pdf [firstpage_image] =>[orig_patent_app_number] => 11069629 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7048371 [patent_doc_number] => 20050184258 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-08-25 [patent_title] => 'Method of exposing using electron beam' [patent_app_type] => utility [patent_app_number] => 11/066187 [patent_app_country] => US [patent_app_date] => 2005-02-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 5722 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0184/20050184258.pdf [firstpage_image] =>[orig_patent_app_number] => 11066187 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 529633 [patent_doc_number] => 07183548 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2007-02-27 [patent_title] => 'Apparatus for modifying and measuring diamond and other workpiece surfaces with nanoscale precision' [patent_app_type] => utility [patent_app_number] => 11/067609 [patent_app_country] => US [patent_app_date] => 2005-02-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 7 [patent_no_of_words] => 5211 [patent_no_of_claims] => 29 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 52 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/183/07183548.pdf [firstpage_image] =>[orig_patent_app_number] => 11067609 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7072522 [patent_doc_number] => 20050145788 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-07-07 [patent_title] => 'High dynamic range mass spectrometer' [patent_app_type] => utility [patent_app_number] => 11/056530 [patent_app_country] => US [patent_app_date] => 2005-02-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 3061 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0145/20050145788.pdf [firstpage_image] =>[orig_patent_app_number] => 11056530 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 449658 [patent_doc_number] => 07250617 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-07-31 [patent_title] => 'Ion beam neutral detection' [patent_app_type] => utility [patent_app_number] => 11/056445 [patent_app_country] => US [patent_app_date] => 2005-02-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2055 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 74 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/250/07250617.pdf [firstpage_image] =>[orig_patent_app_number] => 11056445 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6964169 [patent_doc_number] => 20050231066 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-10-20 [patent_title] => 'Fine-adjustment mechanism for scanning probe microscopy' [patent_app_type] => utility [patent_app_number] => 11/045916 [patent_app_country] => US [patent_app_date] => 2005-01-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 22 [patent_figures_cnt] => 22 [patent_no_of_words] => 7815 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0231/20050231066.pdf [firstpage_image] =>[orig_patent_app_number] => 11045916 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 664022 [patent_doc_number] => 07102139 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-09-05 [patent_title] => 'Source arc chamber for ion implanter having repeller electrode mounted to external insulator' [patent_app_type] => utility [patent_app_number] => 11/044659 [patent_app_country] => US [patent_app_date] => 2005-01-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2925 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 167 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/102/07102139.pdf [firstpage_image] =>[orig_patent_app_number] => 11044659 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5868874 [patent_doc_number] => 20060163491 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-07-27 [patent_title] => 'FLUORESCENT COATING VOID DETECTION SYSTEM AND METHOD' [patent_app_type] => utility [patent_app_number] => 11/040143 [patent_app_country] => US [patent_app_date] => 2005-01-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4636 [patent_no_of_claims] => 31 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0163/20060163491.pdf [firstpage_image] =>[orig_patent_app_number] => 11040143 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 487279 [patent_doc_number] => 07217921 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-05-15 [patent_title] => 'Method and apparatus for FAIMS for in-line analysis of multiple samples' [patent_app_type] => utility [patent_app_number] => 11/040303 [patent_app_country] => US [patent_app_date] => 2005-01-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 11 [patent_no_of_words] => 7128 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 145 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/217/07217921.pdf [firstpage_image] =>[orig_patent_app_number] => 11040303 [rel_patent_id] =>[rel_patent_doc_number] =>)