
Ryan F. Pitaro
Examiner (ID: 9132, Phone: (571)272-4071 , Office: P/2171 )
| Most Active Art Unit | 2171 |
| Art Unit(s) | 2174, 2171, 2188, 2198, 2100 |
| Total Applications | 754 |
| Issued Applications | 507 |
| Pending Applications | 20 |
| Abandoned Applications | 230 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 664033
[patent_doc_number] => 07102145
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-09-05
[patent_title] => 'System and method for improving spatial resolution of electron holography'
[patent_app_type] => utility
[patent_app_number] => 10/972696
[patent_app_country] => US
[patent_app_date] => 2004-10-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
[patent_figures_cnt] => 14
[patent_no_of_words] => 4899
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 142
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/102/07102145.pdf
[firstpage_image] =>[orig_patent_app_number] => 10972696
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/972696 | System and method for improving spatial resolution of electron holography | Oct 24, 2004 | Issued |
Array
(
[id] => 5863015
[patent_doc_number] => 20060097145
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-05-11
[patent_title] => 'Nanowire capillaries for mass spectrometry'
[patent_app_type] => utility
[patent_app_number] => 10/971173
[patent_app_country] => US
[patent_app_date] => 2004-10-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 6205
[patent_no_of_claims] => 23
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0097/20060097145.pdf
[firstpage_image] =>[orig_patent_app_number] => 10971173
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/971173 | Nanowire capillaries for mass spectrometry | Oct 21, 2004 | Issued |
Array
(
[id] => 460916
[patent_doc_number] => 07241990
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-07-10
[patent_title] => 'Laser device'
[patent_app_type] => utility
[patent_app_number] => 10/969461
[patent_app_country] => US
[patent_app_date] => 2004-10-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 12
[patent_no_of_words] => 9490
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 109
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/241/07241990.pdf
[firstpage_image] =>[orig_patent_app_number] => 10969461
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/969461 | Laser device | Oct 18, 2004 | Issued |
Array
(
[id] => 7219779
[patent_doc_number] => 20050077461
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-04-14
[patent_title] => 'Mass spectrometer'
[patent_app_type] => utility
[patent_app_number] => 10/957642
[patent_app_country] => US
[patent_app_date] => 2004-10-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 2438
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0077/20050077461.pdf
[firstpage_image] =>[orig_patent_app_number] => 10957642
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/957642 | Mass spectrometer | Oct 4, 2004 | Issued |
Array
(
[id] => 6936377
[patent_doc_number] => 20050109938
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-05-26
[patent_title] => 'Circuit pattern inspection method and its apparatus'
[patent_app_type] => utility
[patent_app_number] => 10/957748
[patent_app_country] => US
[patent_app_date] => 2004-10-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 4306
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0109/20050109938.pdf
[firstpage_image] =>[orig_patent_app_number] => 10957748
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/957748 | Circuit pattern inspection method and its apparatus | Oct 4, 2004 | Issued |
Array
(
[id] => 7240031
[patent_doc_number] => 20050140531
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-06-30
[patent_title] => 'Method of verifying proximity effect correction in electron beam lithography'
[patent_app_type] => utility
[patent_app_number] => 10/957333
[patent_app_country] => US
[patent_app_date] => 2004-10-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 5096
[patent_no_of_claims] => 5
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0140/20050140531.pdf
[firstpage_image] =>[orig_patent_app_number] => 10957333
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/957333 | Method of verifying proximity effect correction in electron beam lithography | Sep 30, 2004 | Issued |
Array
(
[id] => 702816
[patent_doc_number] => 07064322
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-06-20
[patent_title] => 'Mass spectrometer multipole device'
[patent_app_type] => utility
[patent_app_number] => 10/956585
[patent_app_country] => US
[patent_app_date] => 2004-10-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 8
[patent_no_of_words] => 8738
[patent_no_of_claims] => 28
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 34
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/064/07064322.pdf
[firstpage_image] =>[orig_patent_app_number] => 10956585
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/956585 | Mass spectrometer multipole device | Sep 30, 2004 | Issued |
Array
(
[id] => 7139884
[patent_doc_number] => 20050116180
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-06-02
[patent_title] => 'Charged-particle beam lithographic system'
[patent_app_type] => utility
[patent_app_number] => 10/956620
[patent_app_country] => US
[patent_app_date] => 2004-10-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 6980
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 7
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0116/20050116180.pdf
[firstpage_image] =>[orig_patent_app_number] => 10956620
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/956620 | Charged-particle beam lithographic system | Sep 30, 2004 | Issued |
Array
(
[id] => 938579
[patent_doc_number] => 06972408
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2005-12-06
[patent_title] => 'Ultra high mass range mass spectrometer systems'
[patent_app_type] => utility
[patent_app_number] => 10/955302
[patent_app_country] => US
[patent_app_date] => 2004-09-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 10
[patent_no_of_words] => 8391
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 318
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/972/06972408.pdf
[firstpage_image] =>[orig_patent_app_number] => 10955302
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/955302 | Ultra high mass range mass spectrometer systems | Sep 29, 2004 | Issued |
Array
(
[id] => 491242
[patent_doc_number] => 07214935
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-05-08
[patent_title] => 'Transmission electron microscopy sample preparation method for electron holography'
[patent_app_type] => utility
[patent_app_number] => 10/711690
[patent_app_country] => US
[patent_app_date] => 2004-09-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 2184
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 58
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/214/07214935.pdf
[firstpage_image] =>[orig_patent_app_number] => 10711690
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/711690 | Transmission electron microscopy sample preparation method for electron holography | Sep 29, 2004 | Issued |
Array
(
[id] => 655658
[patent_doc_number] => 07109498
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-09-19
[patent_title] => 'Radiation source, lithographic apparatus, and device manufacturing method'
[patent_app_type] => utility
[patent_app_number] => 10/953472
[patent_app_country] => US
[patent_app_date] => 2004-09-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 4
[patent_no_of_words] => 4581
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 38
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/109/07109498.pdf
[firstpage_image] =>[orig_patent_app_number] => 10953472
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/953472 | Radiation source, lithographic apparatus, and device manufacturing method | Sep 29, 2004 | Issued |
Array
(
[id] => 7241161
[patent_doc_number] => 20050072917
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-04-07
[patent_title] => 'Methods of making substrates for mass spectrometry analysis and related devices'
[patent_app_type] => utility
[patent_app_number] => 10/953855
[patent_app_country] => US
[patent_app_date] => 2004-09-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 10034
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0072/20050072917.pdf
[firstpage_image] =>[orig_patent_app_number] => 10953855
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/953855 | Methods of making substrates for mass spectrometry analysis and related devices | Sep 28, 2004 | Issued |
Array
(
[id] => 7241188
[patent_doc_number] => 20050072920
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-04-07
[patent_title] => 'Electron microscope'
[patent_app_type] => utility
[patent_app_number] => 10/951892
[patent_app_country] => US
[patent_app_date] => 2004-09-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 24
[patent_figures_cnt] => 24
[patent_no_of_words] => 14154
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0072/20050072920.pdf
[firstpage_image] =>[orig_patent_app_number] => 10951892
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/951892 | Electron microscope | Sep 28, 2004 | Issued |
Array
(
[id] => 664026
[patent_doc_number] => 07102141
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-09-05
[patent_title] => 'Flash lamp annealing apparatus to generate electromagnetic radiation having selective wavelengths'
[patent_app_type] => utility
[patent_app_number] => 10/952969
[patent_app_country] => US
[patent_app_date] => 2004-09-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 3292
[patent_no_of_claims] => 26
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 59
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/102/07102141.pdf
[firstpage_image] =>[orig_patent_app_number] => 10952969
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/952969 | Flash lamp annealing apparatus to generate electromagnetic radiation having selective wavelengths | Sep 27, 2004 | Issued |
Array
(
[id] => 630689
[patent_doc_number] => 07132650
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2006-11-07
[patent_title] => 'High throughput multi-dimensional sample analysis'
[patent_app_type] => utility
[patent_app_number] => 10/951255
[patent_app_country] => US
[patent_app_date] => 2004-09-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 18
[patent_figures_cnt] => 29
[patent_no_of_words] => 15652
[patent_no_of_claims] => 65
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 106
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/132/07132650.pdf
[firstpage_image] =>[orig_patent_app_number] => 10951255
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/951255 | High throughput multi-dimensional sample analysis | Sep 24, 2004 | Issued |
Array
(
[id] => 5634855
[patent_doc_number] => 20060065828
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-03-30
[patent_title] => 'Target support with pattern recognition sites'
[patent_app_type] => utility
[patent_app_number] => 10/949688
[patent_app_country] => US
[patent_app_date] => 2004-09-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 3988
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 8
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0065/20060065828.pdf
[firstpage_image] =>[orig_patent_app_number] => 10949688
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/949688 | Target support with pattern recognition sites | Sep 23, 2004 | Issued |
Array
(
[id] => 7132705
[patent_doc_number] => 20050178980
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-08-18
[patent_title] => 'Method, system and device for microscopic examination employing fib-prepared sample grasping element'
[patent_app_type] => utility
[patent_app_number] => 10/948385
[patent_app_country] => US
[patent_app_date] => 2004-09-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 13368
[patent_no_of_claims] => 69
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0178/20050178980.pdf
[firstpage_image] =>[orig_patent_app_number] => 10948385
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/948385 | Method, system and device for microscopic examination employing fib-prepared sample grasping element | Sep 22, 2004 | Issued |
Array
(
[id] => 7138619
[patent_doc_number] => 20050115498
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-06-02
[patent_title] => 'Reflector for UV curing systems'
[patent_app_type] => utility
[patent_app_number] => 10/948091
[patent_app_country] => US
[patent_app_date] => 2004-09-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 2613
[patent_no_of_claims] => 31
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0115/20050115498.pdf
[firstpage_image] =>[orig_patent_app_number] => 10948091
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/948091 | Reflector for UV curing systems | Sep 22, 2004 | Abandoned |
Array
(
[id] => 668795
[patent_doc_number] => 07095038
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-08-22
[patent_title] => 'EUV source'
[patent_app_type] => utility
[patent_app_number] => 10/946109
[patent_app_country] => US
[patent_app_date] => 2004-09-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 4100
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 201
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/095/07095038.pdf
[firstpage_image] =>[orig_patent_app_number] => 10946109
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/946109 | EUV source | Sep 21, 2004 | Issued |
Array
(
[id] => 7114264
[patent_doc_number] => 20050067564
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-03-31
[patent_title] => 'Method and apparatus for providing two-dimensional substantially quadrupole fields having selected hexapole components'
[patent_app_type] => utility
[patent_app_number] => 10/943069
[patent_app_country] => US
[patent_app_date] => 2004-09-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 34
[patent_figures_cnt] => 34
[patent_no_of_words] => 19503
[patent_no_of_claims] => 62
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0067/20050067564.pdf
[firstpage_image] =>[orig_patent_app_number] => 10943069
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/943069 | Method and apparatus for providing two-dimensional substantially quadrupole fields having selected hexapole components | Sep 16, 2004 | Issued |