
Saad A. Waqas
Examiner (ID: 18873, Phone: (571)270-5642 , Office: P/2468 )
| Most Active Art Unit | 2468 |
| Art Unit(s) | 2446, 2468, 2478 |
| Total Applications | 603 |
| Issued Applications | 425 |
| Pending Applications | 61 |
| Abandoned Applications | 139 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 5099163
[patent_doc_number] => 20070182423
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-08-09
[patent_title] => 'Delay line calibration circuit comprising asynchronous arbiter element'
[patent_app_type] => utility
[patent_app_number] => 11/546888
[patent_app_country] => US
[patent_app_date] => 2006-10-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[pdf_file] => publications/A1/0182/20070182423.pdf
[firstpage_image] =>[orig_patent_app_number] => 11546888
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/546888 | Delay line calibration circuit comprising asynchronous arbiter element | Oct 11, 2006 | Issued |
Array
(
[id] => 345631
[patent_doc_number] => 07498821
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-03-03
[patent_title] => 'Non-linear observers in electric power networks'
[patent_app_type] => utility
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[patent_app_date] => 2006-10-06
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/544305 | Non-linear observers in electric power networks | Oct 5, 2006 | Issued |
Array
(
[id] => 8446979
[patent_doc_number] => 08289036
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-10-16
[patent_title] => 'Device for neutralizing an electric switching unit'
[patent_app_type] => utility
[patent_app_number] => 12/067866
[patent_app_country] => US
[patent_app_date] => 2006-09-21
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/067866 | Device for neutralizing an electric switching unit | Sep 20, 2006 | Issued |
Array
(
[id] => 4942112
[patent_doc_number] => 20080079435
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-04-03
[patent_title] => 'Electrostatic Voltmeter With Spacing-Independent Speed of Response'
[patent_app_type] => utility
[patent_app_number] => 11/530238
[patent_app_country] => US
[patent_app_date] => 2006-09-08
[patent_effective_date] => 0000-00-00
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[firstpage_image] =>[orig_patent_app_number] => 11530238
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/530238 | Electrostatic Voltmeter With Spacing-Independent Speed of Response | Sep 7, 2006 | Abandoned |
Array
(
[id] => 5054740
[patent_doc_number] => 20070057661
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-03-15
[patent_title] => 'Sampling apparatus and test apparatus'
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[patent_app_number] => 11/517187
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[firstpage_image] =>[orig_patent_app_number] => 11517187
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/517187 | Sampling apparatus and test apparatus | Sep 6, 2006 | Abandoned |
Array
(
[id] => 5032175
[patent_doc_number] => 20070096714
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-05-03
[patent_title] => 'Electricians phase tester'
[patent_app_type] => utility
[patent_app_number] => 11/515269
[patent_app_country] => US
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[firstpage_image] =>[orig_patent_app_number] => 11515269
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/515269 | Electricians phase tester | Aug 31, 2006 | Abandoned |
Array
(
[id] => 4942119
[patent_doc_number] => 20080079442
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-04-03
[patent_title] => 'Quantum tunneling biometric identification methods and apparatuses'
[patent_app_type] => utility
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[pdf_file] => publications/A1/0079/20080079442.pdf
[firstpage_image] =>[orig_patent_app_number] => 11513967
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/513967 | Quantum tunneling biometric identification methods and apparatuses | Aug 30, 2006 | Abandoned |
Array
(
[id] => 349328
[patent_doc_number] => 07495447
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-02-24
[patent_title] => 'Benchtop test system for testing spark plug durability'
[patent_app_type] => utility
[patent_app_number] => 11/513547
[patent_app_country] => US
[patent_app_date] => 2006-08-31
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[pdf_file] => patents/07/495/07495447.pdf
[firstpage_image] =>[orig_patent_app_number] => 11513547
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/513547 | Benchtop test system for testing spark plug durability | Aug 30, 2006 | Issued |
Array
(
[id] => 4986341
[patent_doc_number] => 20070152679
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-07-05
[patent_title] => 'Apparatus and methods for linearizing piezoresistive wheatstone bridges'
[patent_app_type] => utility
[patent_app_number] => 11/512598
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/512598 | Apparatus and methods for linearizing piezoresistive wheatstone bridges | Aug 29, 2006 | Issued |
Array
(
[id] => 4480278
[patent_doc_number] => 07906973
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2011-03-15
[patent_title] => 'Cable tester'
[patent_app_type] => utility
[patent_app_number] => 11/510007
[patent_app_country] => US
[patent_app_date] => 2006-08-25
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[pdf_file] => patents/07/906/07906973.pdf
[firstpage_image] =>[orig_patent_app_number] => 11510007
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/510007 | Cable tester | Aug 24, 2006 | Issued |
Array
(
[id] => 5105595
[patent_doc_number] => 20070064470
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[patent_issue_date] => 2007-03-22
[patent_title] => 'Semiconductor device'
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[firstpage_image] =>[orig_patent_app_number] => 11508287
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/508287 | Semiconductor device | Aug 22, 2006 | Issued |
Array
(
[id] => 4975146
[patent_doc_number] => 20070216376
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[patent_title] => 'Semiconductor integrated circuit and system guaranteeing proper operation under low-temperature condition'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/505439 | Semiconductor integrated circuit and system guaranteeing proper operation under low-temperature condition | Aug 16, 2006 | Abandoned |
Array
(
[id] => 5146220
[patent_doc_number] => 20070046274
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[patent_title] => 'Failure detecting device for a load driving system'
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Array
(
[id] => 4649218
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[patent_title] => 'Dual-slope charging relaxation oscillator for measuring capacitance'
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Array
(
[id] => 5152431
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Array
(
[id] => 4655287
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[patent_title] => 'NON-LINEAR SENSOR TEMPERATURE COMPENSATION USING SUMMED TEMPERATURE COMPENSATION SIGNALS'
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[pdf_file] => publications/A1/0024/20080024147.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/460948 | Non-linear sensor temperature compensation using summed temperature compensation signals | Jul 27, 2006 | Issued |
Array
(
[id] => 5049469
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[patent_title] => 'Noise measurement semiconductor apparatus'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/494699 | Noise measurement semiconductor apparatus | Jul 27, 2006 | Abandoned |
Array
(
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[patent_title] => 'Power failure detection circuit of swithching source'
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Array
(
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/459889 | System and method for testing a clock circuit | Jul 24, 2006 | Issued |
Array
(
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[firstpage_image] =>[orig_patent_app_number] => 11459287
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/459287 | RF Bridge Circuit Without Balun Transformer | Jul 20, 2006 | Abandoned |