
Saad A. Waqas
Examiner (ID: 18873, Phone: (571)270-5642 , Office: P/2468 )
| Most Active Art Unit | 2468 |
| Art Unit(s) | 2446, 2468, 2478 |
| Total Applications | 603 |
| Issued Applications | 425 |
| Pending Applications | 61 |
| Abandoned Applications | 139 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 45516
[patent_doc_number] => 07777504
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-08-17
[patent_title] => 'Sensor for determining the electric properties of a sample'
[patent_app_type] => utility
[patent_app_number] => 11/254454
[patent_app_country] => US
[patent_app_date] => 2005-10-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 10
[patent_no_of_words] => 2350
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 139
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/777/07777504.pdf
[firstpage_image] =>[orig_patent_app_number] => 11254454
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/254454 | Sensor for determining the electric properties of a sample | Oct 19, 2005 | Issued |
Array
(
[id] => 527376
[patent_doc_number] => 07187179
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2007-03-06
[patent_title] => 'Wiring test structures for determining open and short circuits in semiconductor devices'
[patent_app_type] => utility
[patent_app_number] => 11/163450
[patent_app_country] => US
[patent_app_date] => 2005-10-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 8
[patent_no_of_words] => 3695
[patent_no_of_claims] => 13
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[patent_words_short_claim] => 140
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/187/07187179.pdf
[firstpage_image] =>[orig_patent_app_number] => 11163450
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/163450 | Wiring test structures for determining open and short circuits in semiconductor devices | Oct 18, 2005 | Issued |
Array
(
[id] => 5741583
[patent_doc_number] => 20060087306
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-04-27
[patent_title] => 'Gem tester using electrical photo conductivity'
[patent_app_type] => utility
[patent_app_number] => 11/252686
[patent_app_country] => US
[patent_app_date] => 2005-10-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
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[patent_no_of_words] => 3646
[patent_no_of_claims] => 30
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0087/20060087306.pdf
[firstpage_image] =>[orig_patent_app_number] => 11252686
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/252686 | Gem tester using electrical photoconductivity | Oct 17, 2005 | Issued |
Array
(
[id] => 4537424
[patent_doc_number] => 07872466
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-01-18
[patent_title] => 'Resistive particle sensors having measuring electrodes'
[patent_app_type] => utility
[patent_app_number] => 10/582546
[patent_app_country] => US
[patent_app_date] => 2005-10-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 5
[patent_no_of_words] => 1855
[patent_no_of_claims] => 6
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[patent_words_short_claim] => 137
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/872/07872466.pdf
[firstpage_image] =>[orig_patent_app_number] => 10582546
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/582546 | Resistive particle sensors having measuring electrodes | Oct 16, 2005 | Issued |
Array
(
[id] => 331008
[patent_doc_number] => 07511507
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-03-31
[patent_title] => 'Integrated circuit and circuit board'
[patent_app_type] => utility
[patent_app_number] => 11/247647
[patent_app_country] => US
[patent_app_date] => 2005-10-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 16
[patent_figures_cnt] => 21
[patent_no_of_words] => 8737
[patent_no_of_claims] => 14
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[patent_maintenance] => 1
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/511/07511507.pdf
[firstpage_image] =>[orig_patent_app_number] => 11247647
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/247647 | Integrated circuit and circuit board | Oct 10, 2005 | Issued |
Array
(
[id] => 5716690
[patent_doc_number] => 20060080053
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-04-13
[patent_title] => 'Method of measuring unnecessary electromagnetic radiation, apparatus and system for measuring unnecessary electromagnetic radiation'
[patent_app_type] => utility
[patent_app_number] => 11/227139
[patent_app_country] => US
[patent_app_date] => 2005-09-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[patent_no_of_words] => 2781
[patent_no_of_claims] => 9
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[patent_maintenance] => 1
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0080/20060080053.pdf
[firstpage_image] =>[orig_patent_app_number] => 11227139
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/227139 | Method of measuring unnecessary electromagnetic radiation, apparatus and system for measuring unnecessary electromagnetic radiation | Sep 15, 2005 | Abandoned |
Array
(
[id] => 429126
[patent_doc_number] => 07268563
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-09-11
[patent_title] => 'Measurement of point contact Andreev-reflection characteristics of half-metallic thin films'
[patent_app_type] => utility
[patent_app_number] => 11/162057
[patent_app_country] => US
[patent_app_date] => 2005-08-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 11
[patent_no_of_words] => 6649
[patent_no_of_claims] => 16
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[patent_words_short_claim] => 812
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/268/07268563.pdf
[firstpage_image] =>[orig_patent_app_number] => 11162057
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/162057 | Measurement of point contact Andreev-reflection characteristics of half-metallic thin films | Aug 25, 2005 | Issued |
Array
(
[id] => 5797710
[patent_doc_number] => 20060034029
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-02-16
[patent_title] => 'Current detector with improved resistance adjustable range and heat dissipation'
[patent_app_type] => utility
[patent_app_number] => 11/204566
[patent_app_country] => US
[patent_app_date] => 2005-08-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
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[patent_no_of_words] => 2636
[patent_no_of_claims] => 3
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0034/20060034029.pdf
[firstpage_image] =>[orig_patent_app_number] => 11204566
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/204566 | Current detector with improved resistance adjustable range and heat dissipation | Aug 14, 2005 | Abandoned |
Array
(
[id] => 4686016
[patent_doc_number] => 20080030197
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-02-07
[patent_title] => 'Ion Current Detecting Apparatus for Internal Combustion Engine'
[patent_app_type] => utility
[patent_app_number] => 11/632928
[patent_app_country] => US
[patent_app_date] => 2005-08-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
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[patent_no_of_words] => 4428
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[pdf_file] => publications/A1/0030/20080030197.pdf
[firstpage_image] =>[orig_patent_app_number] => 11632928
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/632928 | Ion current detecting apparatus for internal combustion engine | Aug 8, 2005 | Issued |
Array
(
[id] => 5202812
[patent_doc_number] => 20070024291
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-02-01
[patent_title] => 'Programmable pin electronics driver'
[patent_app_type] => utility
[patent_app_number] => 11/193035
[patent_app_country] => US
[patent_app_date] => 2005-07-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 3607
[patent_no_of_claims] => 20
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0024/20070024291.pdf
[firstpage_image] =>[orig_patent_app_number] => 11193035
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/193035 | Programmable pin electronics driver | Jul 28, 2005 | Abandoned |
Array
(
[id] => 5073413
[patent_doc_number] => 20070013388
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-01-18
[patent_title] => 'Method and system for calibrating measurement tools for semiconductor device manufacturing'
[patent_app_type] => utility
[patent_app_number] => 11/193016
[patent_app_country] => US
[patent_app_date] => 2005-07-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0013/20070013388.pdf
[firstpage_image] =>[orig_patent_app_number] => 11193016
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/193016 | Method and system for calibrating measurement tools for semiconductor device manufacturing | Jul 28, 2005 | Issued |
Array
(
[id] => 5881099
[patent_doc_number] => 20060030182
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-02-09
[patent_title] => 'Patient presence monitoring system and method'
[patent_app_type] => utility
[patent_app_number] => 11/192328
[patent_app_country] => US
[patent_app_date] => 2005-07-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
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[pdf_file] => publications/A1/0030/20060030182.pdf
[firstpage_image] =>[orig_patent_app_number] => 11192328
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/192328 | Patient presence monitoring system and method | Jul 27, 2005 | Abandoned |
Array
(
[id] => 5818366
[patent_doc_number] => 20060022679
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-02-02
[patent_title] => 'Apparatus for partial discharge detection of turn to turn insulation in motor'
[patent_app_type] => utility
[patent_app_number] => 11/190080
[patent_app_country] => US
[patent_app_date] => 2005-07-27
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[patent_drawing_sheets_cnt] => 32
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[pdf_file] => publications/A1/0022/20060022679.pdf
[firstpage_image] =>[orig_patent_app_number] => 11190080
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/190080 | Apparatus and method for detecting partial discharge at turn-to-turn insulation in motor | Jul 26, 2005 | Issued |
Array
(
[id] => 4655256
[patent_doc_number] => 20080024116
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-01-31
[patent_title] => 'Coupling Electrode for Capacitive Voltage Tapping within the Insulating Body of a Bushing or of a Post Insulator'
[patent_app_type] => utility
[patent_app_number] => 11/632603
[patent_app_country] => US
[patent_app_date] => 2005-07-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
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[pdf_file] => publications/A1/0024/20080024116.pdf
[firstpage_image] =>[orig_patent_app_number] => 11632603
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/632603 | Coupling Electrode for Capacitive Voltage Tapping within the Insulating Body of a Bushing or of a Post Insulator | Jul 13, 2005 | Abandoned |
Array
(
[id] => 5909731
[patent_doc_number] => 20060125465
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-06-15
[patent_title] => 'Evanescent microwave probe with enhanced resolution and sensitivity'
[patent_app_type] => utility
[patent_app_number] => 11/180045
[patent_app_country] => US
[patent_app_date] => 2005-07-11
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0125/20060125465.pdf
[firstpage_image] =>[orig_patent_app_number] => 11180045
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/180045 | Evanescent microwave probe with enhanced resolution and sensitivity | Jul 10, 2005 | Issued |
Array
(
[id] => 203633
[patent_doc_number] => 07633283
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-12-15
[patent_title] => 'Method for lightning strike protection and verification of magnetizable dielectric inserts'
[patent_app_type] => utility
[patent_app_number] => 11/174140
[patent_app_country] => US
[patent_app_date] => 2005-07-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/633/07633283.pdf
[firstpage_image] =>[orig_patent_app_number] => 11174140
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/174140 | Method for lightning strike protection and verification of magnetizable dielectric inserts | Jun 30, 2005 | Issued |
Array
(
[id] => 5143835
[patent_doc_number] => 20070006051
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-01-04
[patent_title] => 'Fault diagnosis for power switch using existing current sense outputs'
[patent_app_type] => utility
[patent_app_number] => 11/170882
[patent_app_country] => US
[patent_app_date] => 2005-06-30
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0006/20070006051.pdf
[firstpage_image] =>[orig_patent_app_number] => 11170882
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/170882 | Fault diagnosis for power switch using existing current sense outputs | Jun 29, 2005 | Abandoned |
Array
(
[id] => 8470592
[patent_doc_number] => 08299775
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-10-30
[patent_title] => 'Current-aligned auto-generated non-equiaxial hole shape for wiring'
[patent_app_type] => utility
[patent_app_number] => 11/160428
[patent_app_country] => US
[patent_app_date] => 2005-06-23
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[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 11160428
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/160428 | Current-aligned auto-generated non-equiaxial hole shape for wiring | Jun 22, 2005 | Issued |
Array
(
[id] => 5600016
[patent_doc_number] => 20060290361
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-12-28
[patent_title] => 'A semiconductor integrated circuit tester channel with selective bypass circuitry'
[patent_app_type] => utility
[patent_app_number] => 11/166855
[patent_app_country] => US
[patent_app_date] => 2005-06-23
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0290/20060290361.pdf
[firstpage_image] =>[orig_patent_app_number] => 11166855
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/166855 | A semiconductor integrated circuit tester channel with selective bypass circuitry | Jun 22, 2005 | Abandoned |
Array
(
[id] => 304091
[patent_doc_number] => 07535232
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-05-19
[patent_title] => 'Field-effect device for the detection of small quantities of electric charge, such as those generated in bio-molecular process, bound in the vicinity of the surface'
[patent_app_type] => utility
[patent_app_number] => 11/570255
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[patent_effective_date] => 0000-00-00
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/535/07535232.pdf
[firstpage_image] =>[orig_patent_app_number] => 11570255
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/570255 | Field-effect device for the detection of small quantities of electric charge, such as those generated in bio-molecular process, bound in the vicinity of the surface | Jun 8, 2005 | Issued |