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Scott L. Jarrett

Examiner (ID: 7055)

Most Active Art Unit
3623
Art Unit(s)
3623, 3683, 2615, 3624, 3625
Total Applications
1034
Issued Applications
475
Pending Applications
99
Abandoned Applications
474

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 19384556 [patent_doc_number] => 20240274426 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-08-15 [patent_title] => Automated Mass Spectrometry Sampling of Material Surfaces [patent_app_type] => utility [patent_app_number] => 18/567841 [patent_app_country] => US [patent_app_date] => 2022-06-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7259 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -28 [patent_words_short_claim] => 128 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18567841 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/567841
Automated Mass Spectrometry Sampling of Material Surfaces Jun 9, 2022 Pending
Array ( [id] => 19382327 [patent_doc_number] => 20240272197 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-08-15 [patent_title] => METHOD AND DEVICE FOR INTERFERENCE VARIABLE COMPENSATION DURING THE POSITIONING OF A SAMPLE SUPPORT [patent_app_type] => utility [patent_app_number] => 18/567274 [patent_app_country] => US [patent_app_date] => 2022-06-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4857 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -13 [patent_words_short_claim] => 150 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18567274 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/567274
METHOD AND DEVICE FOR INTERFERENCE VARIABLE COMPENSATION DURING THE POSITIONING OF A SAMPLE SUPPORT Jun 6, 2022 Pending
Array ( [id] => 19361889 [patent_doc_number] => 20240263923 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-08-08 [patent_title] => A THERMAL TRACE ENHANCER SYSTEM [patent_app_type] => utility [patent_app_number] => 18/565713 [patent_app_country] => US [patent_app_date] => 2022-06-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4178 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -13 [patent_words_short_claim] => 236 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18565713 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/565713
A THERMAL TRACE ENHANCER SYSTEM Jun 5, 2022 Pending
Array ( [id] => 19333639 [patent_doc_number] => 20240248069 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-07-25 [patent_title] => AN ANALYZER SYSTEM [patent_app_type] => utility [patent_app_number] => 18/566548 [patent_app_country] => US [patent_app_date] => 2022-05-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 14928 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -13 [patent_words_short_claim] => 130 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18566548 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/566548
AN ANALYZER SYSTEM May 30, 2022 Pending
Array ( [id] => 19515642 [patent_doc_number] => 20240347328 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-10-17 [patent_title] => Mass Spectrometer and Mass Spectrometry Method [patent_app_type] => utility [patent_app_number] => 18/294930 [patent_app_country] => US [patent_app_date] => 2022-03-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9983 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 150 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18294930 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/294930
Mass Spectrometer and Mass Spectrometry Method Mar 24, 2022 Pending
Array ( [id] => 19390736 [patent_doc_number] => 20240280606 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-08-22 [patent_title] => DETECTION PROBE, PROBE MICROSCOPE, AND SAMPLE TEMPERATURE MEASURING METHOD [patent_app_type] => utility [patent_app_number] => 18/567158 [patent_app_country] => US [patent_app_date] => 2022-02-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5188 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 59 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18567158 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/567158
DETECTION PROBE, PROBE MICROSCOPE, AND SAMPLE TEMPERATURE MEASURING METHOD Feb 2, 2022 Pending
Array ( [id] => 20103008 [patent_doc_number] => 20250232944 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-07-17 [patent_title] => MULTIPOLE LENS AND CHARGED PARTICLE BEAM DEVICE [patent_app_type] => utility [patent_app_number] => 18/699609 [patent_app_country] => US [patent_app_date] => 2021-12-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3791 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -15 [patent_words_short_claim] => 239 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18699609 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/699609
MULTIPOLE LENS AND CHARGED PARTICLE BEAM DEVICE Dec 6, 2021 Pending
Array ( [id] => 19589601 [patent_doc_number] => 20240387158 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-11-21 [patent_title] => Mass Spectrometry Data Analysis Method and Imaging Mass Spectrometer [patent_app_type] => utility [patent_app_number] => 18/691405 [patent_app_country] => US [patent_app_date] => 2021-10-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6000 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -2 [patent_words_short_claim] => 212 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18691405 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/691405
Mass Spectrometry Data Analysis Method and Imaging Mass Spectrometer Oct 7, 2021 Pending
Array ( [id] => 19575031 [patent_doc_number] => 20240379323 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-11-14 [patent_title] => CONTROL METHOD, CHARGED PARTICLE BEAM DEVICE, AND PROGRAM [patent_app_type] => utility [patent_app_number] => 18/692789 [patent_app_country] => US [patent_app_date] => 2021-09-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7417 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -3 [patent_words_short_claim] => 126 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18692789 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/692789
CONTROL METHOD, CHARGED PARTICLE BEAM DEVICE, AND PROGRAM Sep 27, 2021 Pending
Array ( [id] => 19189139 [patent_doc_number] => 20240168052 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-05-23 [patent_title] => Scanning Probe Microscope, Sample Observation Processing System, and Electric Characteristic Evaluation Device [patent_app_type] => utility [patent_app_number] => 18/283932 [patent_app_country] => US [patent_app_date] => 2021-03-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8060 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 176 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18283932 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/283932
Scanning Probe Microscope, Sample Observation Processing System, and Electric Characteristic Evaluation Device Mar 25, 2021 Pending
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