Search

Scott R. Kastler

Examiner (ID: 10250, Phone: (571)272-1243 , Office: P/1733 )

Most Active Art Unit
1733
Art Unit(s)
1101, 1733, 2899, 1742, 1793, 1308, 1311
Total Applications
4528
Issued Applications
3615
Pending Applications
164
Abandoned Applications
754

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 537611 [patent_doc_number] => 07180317 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-02-20 [patent_title] => 'High resolution analytical probe station' [patent_app_type] => utility [patent_app_number] => 10/816114 [patent_app_country] => US [patent_app_date] => 2004-04-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 37 [patent_figures_cnt] => 60 [patent_no_of_words] => 33806 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 79 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/180/07180317.pdf [firstpage_image] =>[orig_patent_app_number] => 10816114 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/816114
High resolution analytical probe station Mar 31, 2004 Issued
Array ( [id] => 496588 [patent_doc_number] => 07211995 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-05-01 [patent_title] => 'Method and system for detecting electronic component failures' [patent_app_type] => utility [patent_app_number] => 10/814855 [patent_app_country] => US [patent_app_date] => 2004-03-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 3381 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/211/07211995.pdf [firstpage_image] =>[orig_patent_app_number] => 10814855 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/814855
Method and system for detecting electronic component failures Mar 29, 2004 Issued
Array ( [id] => 911717 [patent_doc_number] => 07330042 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-02-12 [patent_title] => 'Substrate inspection system, substrate inspection method, and substrate inspection apparatus' [patent_app_type] => utility [patent_app_number] => 10/807262 [patent_app_country] => US [patent_app_date] => 2004-03-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 9 [patent_no_of_words] => 7284 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 125 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/330/07330042.pdf [firstpage_image] =>[orig_patent_app_number] => 10807262 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/807262
Substrate inspection system, substrate inspection method, and substrate inspection apparatus Mar 23, 2004 Issued
Array ( [id] => 7237980 [patent_doc_number] => 20040257064 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-12-23 [patent_title] => 'Device for automatically detecting harmful electromagnetic wave' [patent_app_type] => new [patent_app_number] => 10/489624 [patent_app_country] => US [patent_app_date] => 2004-03-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 663 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 87 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0257/20040257064.pdf [firstpage_image] =>[orig_patent_app_number] => 10489624 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/489624
Device for automatically detecting harmful electromagnetic wave Mar 14, 2004 Abandoned
Array ( [id] => 405119 [patent_doc_number] => 07288953 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-10-30 [patent_title] => 'Method for testing using a universal wafer carrier for wafer level die burn-in' [patent_app_type] => utility [patent_app_number] => 10/799258 [patent_app_country] => US [patent_app_date] => 2004-03-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 3762 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 196 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/288/07288953.pdf [firstpage_image] =>[orig_patent_app_number] => 10799258 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/799258
Method for testing using a universal wafer carrier for wafer level die burn-in Mar 11, 2004 Issued
Array ( [id] => 7429811 [patent_doc_number] => 20040209524 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-10-21 [patent_title] => 'In-head converter with display' [patent_app_type] => new [patent_app_number] => 10/797744 [patent_app_country] => US [patent_app_date] => 2004-03-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3027 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 66 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0209/20040209524.pdf [firstpage_image] =>[orig_patent_app_number] => 10797744 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/797744
In-head converter with display Mar 9, 2004 Issued
Array ( [id] => 994094 [patent_doc_number] => 06917195 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-07-12 [patent_title] => 'Wafer probe station' [patent_app_type] => utility [patent_app_number] => 10/794777 [patent_app_country] => US [patent_app_date] => 2004-03-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 23 [patent_figures_cnt] => 35 [patent_no_of_words] => 7622 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 147 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/917/06917195.pdf [firstpage_image] =>[orig_patent_app_number] => 10794777 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/794777
Wafer probe station Mar 4, 2004 Issued
Array ( [id] => 762526 [patent_doc_number] => 07012440 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-03-14 [patent_title] => 'Wafer test apparatus including optical elements and method of using the test apparatus' [patent_app_type] => utility [patent_app_number] => 10/791067 [patent_app_country] => US [patent_app_date] => 2004-03-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 8 [patent_no_of_words] => 5064 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 66 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/012/07012440.pdf [firstpage_image] =>[orig_patent_app_number] => 10791067 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/791067
Wafer test apparatus including optical elements and method of using the test apparatus Mar 1, 2004 Issued
Array ( [id] => 412126 [patent_doc_number] => 07282931 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-10-16 [patent_title] => 'Full wafer contacter and applications thereof' [patent_app_type] => utility [patent_app_number] => 10/789305 [patent_app_country] => US [patent_app_date] => 2004-02-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 4225 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 226 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/282/07282931.pdf [firstpage_image] =>[orig_patent_app_number] => 10789305 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/789305
Full wafer contacter and applications thereof Feb 26, 2004 Issued
Array ( [id] => 7175560 [patent_doc_number] => 20050189342 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-09-01 [patent_title] => 'Miniature fluid-cooled heat sink with integral heater' [patent_app_type] => utility [patent_app_number] => 10/785204 [patent_app_country] => US [patent_app_date] => 2004-02-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 5232 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0189/20050189342.pdf [firstpage_image] =>[orig_patent_app_number] => 10785204 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/785204
Miniature fluid-cooled heat sink with integral heater Feb 22, 2004 Abandoned
Array ( [id] => 739641 [patent_doc_number] => 07034559 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-04-25 [patent_title] => 'Integrated test circuit in an integrated circuit' [patent_app_type] => utility [patent_app_number] => 10/780104 [patent_app_country] => US [patent_app_date] => 2004-02-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 2697 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 96 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/034/07034559.pdf [firstpage_image] =>[orig_patent_app_number] => 10780104 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/780104
Integrated test circuit in an integrated circuit Feb 16, 2004 Issued
Array ( [id] => 944440 [patent_doc_number] => 06967494 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-11-22 [patent_title] => 'Wafer-interposer assembly' [patent_app_type] => utility [patent_app_number] => 10/772951 [patent_app_country] => US [patent_app_date] => 2004-02-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 16 [patent_no_of_words] => 6709 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 130 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/967/06967494.pdf [firstpage_image] =>[orig_patent_app_number] => 10772951 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/772951
Wafer-interposer assembly Feb 4, 2004 Issued
Array ( [id] => 810680 [patent_doc_number] => 07417419 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-08-26 [patent_title] => 'Method and arrangement for connecting electrical components in an electricity meter' [patent_app_type] => utility [patent_app_number] => 10/772160 [patent_app_country] => US [patent_app_date] => 2004-02-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 16 [patent_no_of_words] => 7088 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 162 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/417/07417419.pdf [firstpage_image] =>[orig_patent_app_number] => 10772160 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/772160
Method and arrangement for connecting electrical components in an electricity meter Feb 2, 2004 Issued
Array ( [id] => 620576 [patent_doc_number] => 07141994 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-11-28 [patent_title] => 'Air socket for testing integrated circuits' [patent_app_type] => utility [patent_app_number] => 10/766371 [patent_app_country] => US [patent_app_date] => 2004-01-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 5375 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 146 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/141/07141994.pdf [firstpage_image] =>[orig_patent_app_number] => 10766371 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/766371
Air socket for testing integrated circuits Jan 26, 2004 Issued
Array ( [id] => 881597 [patent_doc_number] => 07355428 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-04-08 [patent_title] => 'Active thermal control system with miniature liquid-cooled temperature control device for electronic device testing' [patent_app_type] => utility [patent_app_number] => 10/758209 [patent_app_country] => US [patent_app_date] => 2004-01-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 10 [patent_no_of_words] => 5125 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 125 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/355/07355428.pdf [firstpage_image] =>[orig_patent_app_number] => 10758209 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/758209
Active thermal control system with miniature liquid-cooled temperature control device for electronic device testing Jan 13, 2004 Issued
Array ( [id] => 7305447 [patent_doc_number] => 20040140823 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-07-22 [patent_title] => 'Test system, test contactor, and test method for electronic modules' [patent_app_type] => new [patent_app_number] => 10/754129 [patent_app_country] => US [patent_app_date] => 2004-01-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 4950 [patent_no_of_claims] => 50 [patent_no_of_ind_claims] => 11 [patent_words_short_claim] => 70 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0140/20040140823.pdf [firstpage_image] =>[orig_patent_app_number] => 10754129 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/754129
Test system and test contactor for electronic modules Jan 8, 2004 Issued
Array ( [id] => 7073054 [patent_doc_number] => 20050146320 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-07-07 [patent_title] => 'Differential active load' [patent_app_type] => utility [patent_app_number] => 10/749600 [patent_app_country] => US [patent_app_date] => 2003-12-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3260 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0146/20050146320.pdf [firstpage_image] =>[orig_patent_app_number] => 10749600 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/749600
Differential active load Dec 30, 2003 Abandoned
Array ( [id] => 954203 [patent_doc_number] => 06958618 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-10-25 [patent_title] => 'Transporting mechanism, movable probe card transporting apparatus using transporting mechanism, and prober' [patent_app_type] => utility [patent_app_number] => 10/742905 [patent_app_country] => US [patent_app_date] => 2003-12-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 15 [patent_no_of_words] => 8310 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 28 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/958/06958618.pdf [firstpage_image] =>[orig_patent_app_number] => 10742905 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/742905
Transporting mechanism, movable probe card transporting apparatus using transporting mechanism, and prober Dec 22, 2003 Issued
Array ( [id] => 7342446 [patent_doc_number] => 20040246757 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-12-09 [patent_title] => 'Semiconductor device, driving method and inspection method thereof' [patent_app_type] => new [patent_app_number] => 10/740605 [patent_app_country] => US [patent_app_date] => 2003-12-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 9079 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 10 [patent_words_short_claim] => 46 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0246/20040246757.pdf [firstpage_image] =>[orig_patent_app_number] => 10740605 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/740605
Semiconductor device, driving method and inspection method thereof Dec 21, 2003 Issued
Array ( [id] => 1031869 [patent_doc_number] => 06879178 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2005-04-12 [patent_title] => 'Measuring current on a die' [patent_app_type] => utility [patent_app_number] => 10/745101 [patent_app_country] => US [patent_app_date] => 2003-12-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 5494 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 69 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/879/06879178.pdf [firstpage_image] =>[orig_patent_app_number] => 10745101 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/745101
Measuring current on a die Dec 21, 2003 Issued
Menu