
Scott R. Kastler
Examiner (ID: 10250, Phone: (571)272-1243 , Office: P/1733 )
| Most Active Art Unit | 1733 |
| Art Unit(s) | 1101, 1733, 2899, 1742, 1793, 1308, 1311 |
| Total Applications | 4528 |
| Issued Applications | 3615 |
| Pending Applications | 164 |
| Abandoned Applications | 754 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 537611
[patent_doc_number] => 07180317
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-02-20
[patent_title] => 'High resolution analytical probe station'
[patent_app_type] => utility
[patent_app_number] => 10/816114
[patent_app_country] => US
[patent_app_date] => 2004-04-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 37
[patent_figures_cnt] => 60
[patent_no_of_words] => 33806
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 79
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/180/07180317.pdf
[firstpage_image] =>[orig_patent_app_number] => 10816114
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/816114 | High resolution analytical probe station | Mar 31, 2004 | Issued |
Array
(
[id] => 496588
[patent_doc_number] => 07211995
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-05-01
[patent_title] => 'Method and system for detecting electronic component failures'
[patent_app_type] => utility
[patent_app_number] => 10/814855
[patent_app_country] => US
[patent_app_date] => 2004-03-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[patent_no_of_words] => 3381
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/211/07211995.pdf
[firstpage_image] =>[orig_patent_app_number] => 10814855
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/814855 | Method and system for detecting electronic component failures | Mar 29, 2004 | Issued |
Array
(
[id] => 911717
[patent_doc_number] => 07330042
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-02-12
[patent_title] => 'Substrate inspection system, substrate inspection method, and substrate inspection apparatus'
[patent_app_type] => utility
[patent_app_number] => 10/807262
[patent_app_country] => US
[patent_app_date] => 2004-03-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 9
[patent_no_of_words] => 7284
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 1
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/330/07330042.pdf
[firstpage_image] =>[orig_patent_app_number] => 10807262
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/807262 | Substrate inspection system, substrate inspection method, and substrate inspection apparatus | Mar 23, 2004 | Issued |
Array
(
[id] => 7237980
[patent_doc_number] => 20040257064
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-12-23
[patent_title] => 'Device for automatically detecting harmful electromagnetic wave'
[patent_app_type] => new
[patent_app_number] => 10/489624
[patent_app_country] => US
[patent_app_date] => 2004-03-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 2
[patent_no_of_words] => 663
[patent_no_of_claims] => 1
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0257/20040257064.pdf
[firstpage_image] =>[orig_patent_app_number] => 10489624
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/489624 | Device for automatically detecting harmful electromagnetic wave | Mar 14, 2004 | Abandoned |
Array
(
[id] => 405119
[patent_doc_number] => 07288953
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-10-30
[patent_title] => 'Method for testing using a universal wafer carrier for wafer level die burn-in'
[patent_app_type] => utility
[patent_app_number] => 10/799258
[patent_app_country] => US
[patent_app_date] => 2004-03-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
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[patent_no_of_words] => 3762
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/288/07288953.pdf
[firstpage_image] =>[orig_patent_app_number] => 10799258
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/799258 | Method for testing using a universal wafer carrier for wafer level die burn-in | Mar 11, 2004 | Issued |
Array
(
[id] => 7429811
[patent_doc_number] => 20040209524
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-10-21
[patent_title] => 'In-head converter with display'
[patent_app_type] => new
[patent_app_number] => 10/797744
[patent_app_country] => US
[patent_app_date] => 2004-03-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 3027
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0209/20040209524.pdf
[firstpage_image] =>[orig_patent_app_number] => 10797744
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/797744 | In-head converter with display | Mar 9, 2004 | Issued |
Array
(
[id] => 994094
[patent_doc_number] => 06917195
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2005-07-12
[patent_title] => 'Wafer probe station'
[patent_app_type] => utility
[patent_app_number] => 10/794777
[patent_app_country] => US
[patent_app_date] => 2004-03-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 23
[patent_figures_cnt] => 35
[patent_no_of_words] => 7622
[patent_no_of_claims] => 5
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 147
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/917/06917195.pdf
[firstpage_image] =>[orig_patent_app_number] => 10794777
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/794777 | Wafer probe station | Mar 4, 2004 | Issued |
Array
(
[id] => 762526
[patent_doc_number] => 07012440
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-03-14
[patent_title] => 'Wafer test apparatus including optical elements and method of using the test apparatus'
[patent_app_type] => utility
[patent_app_number] => 10/791067
[patent_app_country] => US
[patent_app_date] => 2004-03-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 8
[patent_no_of_words] => 5064
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 2
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/012/07012440.pdf
[firstpage_image] =>[orig_patent_app_number] => 10791067
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/791067 | Wafer test apparatus including optical elements and method of using the test apparatus | Mar 1, 2004 | Issued |
Array
(
[id] => 412126
[patent_doc_number] => 07282931
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-10-16
[patent_title] => 'Full wafer contacter and applications thereof'
[patent_app_type] => utility
[patent_app_number] => 10/789305
[patent_app_country] => US
[patent_app_date] => 2004-02-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
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[patent_no_of_words] => 4225
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[pdf_file] => patents/07/282/07282931.pdf
[firstpage_image] =>[orig_patent_app_number] => 10789305
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/789305 | Full wafer contacter and applications thereof | Feb 26, 2004 | Issued |
Array
(
[id] => 7175560
[patent_doc_number] => 20050189342
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-09-01
[patent_title] => 'Miniature fluid-cooled heat sink with integral heater'
[patent_app_type] => utility
[patent_app_number] => 10/785204
[patent_app_country] => US
[patent_app_date] => 2004-02-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
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[patent_no_of_words] => 5232
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[pdf_file] => publications/A1/0189/20050189342.pdf
[firstpage_image] =>[orig_patent_app_number] => 10785204
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/785204 | Miniature fluid-cooled heat sink with integral heater | Feb 22, 2004 | Abandoned |
Array
(
[id] => 739641
[patent_doc_number] => 07034559
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-04-25
[patent_title] => 'Integrated test circuit in an integrated circuit'
[patent_app_type] => utility
[patent_app_number] => 10/780104
[patent_app_country] => US
[patent_app_date] => 2004-02-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
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[pdf_file] => patents/07/034/07034559.pdf
[firstpage_image] =>[orig_patent_app_number] => 10780104
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/780104 | Integrated test circuit in an integrated circuit | Feb 16, 2004 | Issued |
Array
(
[id] => 944440
[patent_doc_number] => 06967494
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2005-11-22
[patent_title] => 'Wafer-interposer assembly'
[patent_app_type] => utility
[patent_app_number] => 10/772951
[patent_app_country] => US
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[firstpage_image] =>[orig_patent_app_number] => 10772951
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/772951 | Wafer-interposer assembly | Feb 4, 2004 | Issued |
Array
(
[id] => 810680
[patent_doc_number] => 07417419
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-08-26
[patent_title] => 'Method and arrangement for connecting electrical components in an electricity meter'
[patent_app_type] => utility
[patent_app_number] => 10/772160
[patent_app_country] => US
[patent_app_date] => 2004-02-03
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[pdf_file] => patents/07/417/07417419.pdf
[firstpage_image] =>[orig_patent_app_number] => 10772160
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/772160 | Method and arrangement for connecting electrical components in an electricity meter | Feb 2, 2004 | Issued |
Array
(
[id] => 620576
[patent_doc_number] => 07141994
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-11-28
[patent_title] => 'Air socket for testing integrated circuits'
[patent_app_type] => utility
[patent_app_number] => 10/766371
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/141/07141994.pdf
[firstpage_image] =>[orig_patent_app_number] => 10766371
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/766371 | Air socket for testing integrated circuits | Jan 26, 2004 | Issued |
Array
(
[id] => 881597
[patent_doc_number] => 07355428
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-04-08
[patent_title] => 'Active thermal control system with miniature liquid-cooled temperature control device for electronic device testing'
[patent_app_type] => utility
[patent_app_number] => 10/758209
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[pdf_file] => patents/07/355/07355428.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/758209 | Active thermal control system with miniature liquid-cooled temperature control device for electronic device testing | Jan 13, 2004 | Issued |
Array
(
[id] => 7305447
[patent_doc_number] => 20040140823
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-07-22
[patent_title] => 'Test system, test contactor, and test method for electronic modules'
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[pdf_file] => publications/A1/0140/20040140823.pdf
[firstpage_image] =>[orig_patent_app_number] => 10754129
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/754129 | Test system and test contactor for electronic modules | Jan 8, 2004 | Issued |
Array
(
[id] => 7073054
[patent_doc_number] => 20050146320
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-07-07
[patent_title] => 'Differential active load'
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[pdf_file] => publications/A1/0146/20050146320.pdf
[firstpage_image] =>[orig_patent_app_number] => 10749600
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/749600 | Differential active load | Dec 30, 2003 | Abandoned |
Array
(
[id] => 954203
[patent_doc_number] => 06958618
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2005-10-25
[patent_title] => 'Transporting mechanism, movable probe card transporting apparatus using transporting mechanism, and prober'
[patent_app_type] => utility
[patent_app_number] => 10/742905
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/742905 | Transporting mechanism, movable probe card transporting apparatus using transporting mechanism, and prober | Dec 22, 2003 | Issued |
Array
(
[id] => 7342446
[patent_doc_number] => 20040246757
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Array
(
[id] => 1031869
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[firstpage_image] =>[orig_patent_app_number] => 10745101
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/745101 | Measuring current on a die | Dec 21, 2003 | Issued |