Scott R. Kastler

Array ( [id] => 7310439 [patent_doc_number] => 20040032247 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-02-19 [patent_title] => 'Modified construct of testing fixture to improve hermetic seal' [patent_app_type] => new [patent_app_number] => 10/217610 [patent_app_country] => US [patent_app_date] => 2002-08-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 1617 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 98 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0032/20040032247.pdf [firstpage_image] =>[orig_patent_app_number] => 10217610 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6318442 [patent_doc_number] => 20020196041 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-12-26 [patent_title] => 'Method and apparatus for testing bumped die' [patent_app_type] => new [patent_app_number] => 10/218278 [patent_app_country] => US [patent_app_date] => 2002-08-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2771 [patent_no_of_claims] => 35 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 134 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0196/20020196041.pdf [firstpage_image] =>[orig_patent_app_number] => 10218278 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1203803 [patent_doc_number] => 06720788 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-04-13 [patent_title] => 'High resolution current measurement method' [patent_app_type] => B2 [patent_app_number] => 10/212500 [patent_app_country] => US [patent_app_date] => 2002-08-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 2397 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 171 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/720/06720788.pdf [firstpage_image] =>[orig_patent_app_number] => 10212500 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7387874 [patent_doc_number] => 20040021474 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-02-05 [patent_title] => 'Thin film probe card contact drive system' [patent_app_type] => new [patent_app_number] => 10/208900 [patent_app_country] => US [patent_app_date] => 2002-07-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3588 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 51 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0021/20040021474.pdf [firstpage_image] =>[orig_patent_app_number] => 10208900 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6759189 [patent_doc_number] => 20030122550 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-07-03 [patent_title] => 'Semiconductor device testing apparatus and method for manufacturing the same' [patent_app_type] => new [patent_app_number] => 10/207145 [patent_app_country] => US [patent_app_date] => 2002-07-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 7627 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 59 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0122/20030122550.pdf [firstpage_image] =>[orig_patent_app_number] => 10207145 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6646588 [patent_doc_number] => 20030075716 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-04-24 [patent_title] => 'Semiconductor device with high speed switching of test modes' [patent_app_type] => new [patent_app_number] => 10/201002 [patent_app_country] => US [patent_app_date] => 2002-07-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 4276 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 81 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0075/20030075716.pdf [firstpage_image] =>[orig_patent_app_number] => 10201002 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6742832 [patent_doc_number] => 20030020015 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-01-30 [patent_title] => 'Charge amount measurement method, shift value measurement method of charged beam, charge amount measuring device and shift value measuring device of charged beam' [patent_app_type] => new [patent_app_number] => 10/200503 [patent_app_country] => US [patent_app_date] => 2002-07-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 6847 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 37 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0020/20030020015.pdf [firstpage_image] =>[orig_patent_app_number] => 10200503 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1277764 [patent_doc_number] => 06650132 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-11-18 [patent_title] => 'Method and apparatus for temperature control of a device during testing' [patent_app_type] => B2 [patent_app_number] => 10/197890 [patent_app_country] => US [patent_app_date] => 2002-07-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 3451 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 88 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/650/06650132.pdf [firstpage_image] =>[orig_patent_app_number] => 10197890 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7349759 [patent_doc_number] => 20040012403 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-01-22 [patent_title] => 'Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component' [patent_app_type] => new [patent_app_number] => 10/197104 [patent_app_country] => US [patent_app_date] => 2002-07-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 20 [patent_no_of_words] => 4429 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 129 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0012/20040012403.pdf [firstpage_image] =>[orig_patent_app_number] => 10197104 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6686732 [patent_doc_number] => 20030030455 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-02-13 [patent_title] => 'Test probe having a sheet body' [patent_app_type] => new [patent_app_number] => 10/195878 [patent_app_country] => US [patent_app_date] => 2002-07-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 3472 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 70 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0030/20030030455.pdf [firstpage_image] =>[orig_patent_app_number] => 10195878 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7429557 [patent_doc_number] => 20040008048 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-01-15 [patent_title] => 'MICRO COMPLIANT INTERCONNECT APPARATUS FOR INTEGRATED CIRCUIT DEVICES' [patent_app_type] => new [patent_app_number] => 10/193006 [patent_app_country] => US [patent_app_date] => 2002-07-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2539 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 54 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0008/20040008048.pdf [firstpage_image] =>[orig_patent_app_number] => 10193006 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7339520 [patent_doc_number] => 20040245982 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-12-09 [patent_title] => 'Handling device, especially for positioning a test head on a testing device' [patent_app_type] => new [patent_app_number] => 10/482001 [patent_app_country] => US [patent_app_date] => 2004-06-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 3330 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 110 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0245/20040245982.pdf [firstpage_image] =>[orig_patent_app_number] => 10482001 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6638208 [patent_doc_number] => 20030006751 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-01-09 [patent_title] => 'Hall-effect current detector' [patent_app_type] => new [patent_app_number] => 10/188504 [patent_app_country] => US [patent_app_date] => 2002-07-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 5269 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 190 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0006/20030006751.pdf [firstpage_image] =>[orig_patent_app_number] => 10188504 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7252078 [patent_doc_number] => 20040239355 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-12-02 [patent_title] => 'Conductive contact' [patent_app_type] => new [patent_app_number] => 10/482301 [patent_app_country] => US [patent_app_date] => 2004-07-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 4465 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 60 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0239/20040239355.pdf [firstpage_image] =>[orig_patent_app_number] => 10482301 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7252082 [patent_doc_number] => 20040239356 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-12-02 [patent_title] => 'Conductive contact' [patent_app_type] => new [patent_app_number] => 10/482303 [patent_app_country] => US [patent_app_date] => 2004-07-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4778 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0239/20040239356.pdf [firstpage_image] =>[orig_patent_app_number] => 10482303 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6753830 [patent_doc_number] => 20030001606 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-01-02 [patent_title] => 'Probes for probe cards used for testing semiconductor devices, manufacturing method and positioning method' [patent_app_type] => new [patent_app_number] => 10/180308 [patent_app_country] => US [patent_app_date] => 2002-06-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3585 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 166 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0001/20030001606.pdf [firstpage_image] =>[orig_patent_app_number] => 10180308 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1159723 [patent_doc_number] => 06765400 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-07-20 [patent_title] => 'Inspection apparatus and probe card' [patent_app_type] => B2 [patent_app_number] => 10/088100 [patent_app_country] => US [patent_app_date] => 2002-06-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 13689 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 21 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/765/06765400.pdf [firstpage_image] =>[orig_patent_app_number] => 10088100 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6044992 [patent_doc_number] => 20020167330 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-11-14 [patent_title] => 'Fixture-less bare board tester' [patent_app_type] => new [patent_app_number] => 10/180788 [patent_app_country] => US [patent_app_date] => 2002-06-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2499 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 75 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0167/20020167330.pdf [firstpage_image] =>[orig_patent_app_number] => 10180788 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5783463 [patent_doc_number] => 20020158646 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-10-31 [patent_title] => 'Spiral leaf spring contacts' [patent_app_type] => new [patent_app_number] => 10/177035 [patent_app_country] => US [patent_app_date] => 2002-06-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 6941 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 45 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0158/20020158646.pdf [firstpage_image] =>[orig_patent_app_number] => 10177035 [rel_patent_id] =>[rel_patent_doc_number] =>)