Scott R. Kastler

Array ( [id] => 5783478 [patent_doc_number] => 20020158655 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-10-31 [patent_title] => 'Method and apparatus for testing bumped die' [patent_app_type] => new [patent_app_number] => 10/173957 [patent_app_country] => US [patent_app_date] => 2002-06-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2752 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 110 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0158/20020158655.pdf [firstpage_image] =>[orig_patent_app_number] => 10173957 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1169008 [patent_doc_number] => 06759841 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-07-06 [patent_title] => 'Hall-effect current detector' [patent_app_type] => B2 [patent_app_number] => 10/172200 [patent_app_country] => US [patent_app_date] => 2002-06-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 23 [patent_no_of_words] => 8320 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 126 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/759/06759841.pdf [firstpage_image] =>[orig_patent_app_number] => 10172200 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6743409 [patent_doc_number] => 20030020592 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-01-30 [patent_title] => 'Current detection resistor, mounting structure thereof and method of measuring effective inductance' [patent_app_type] => new [patent_app_number] => 10/170200 [patent_app_country] => US [patent_app_date] => 2002-06-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 7817 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 68 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0020/20030020592.pdf [firstpage_image] =>[orig_patent_app_number] => 10170200 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1273593 [patent_doc_number] => 06653856 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-11-25 [patent_title] => 'Method of determining reliability of semiconductor products' [patent_app_type] => B1 [patent_app_number] => 10/064111 [patent_app_country] => US [patent_app_date] => 2002-06-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 1403 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 138 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/653/06653856.pdf [firstpage_image] =>[orig_patent_app_number] => 10064111 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7624964 [patent_doc_number] => 06724206 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-04-20 [patent_title] => 'Device carrier and autohandler' [patent_app_type] => B2 [patent_app_number] => 10/171303 [patent_app_country] => US [patent_app_date] => 2002-06-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 5505 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 51 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/724/06724206.pdf [firstpage_image] =>[orig_patent_app_number] => 10171303 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6498101 [patent_doc_number] => 20020190703 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-12-19 [patent_title] => 'Hall-effect current detector' [patent_app_type] => new [patent_app_number] => 10/166203 [patent_app_country] => US [patent_app_date] => 2002-06-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 23 [patent_figures_cnt] => 23 [patent_no_of_words] => 9103 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 160 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0190/20020190703.pdf [firstpage_image] =>[orig_patent_app_number] => 10166203 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1057216 [patent_doc_number] => 06856160 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2005-02-15 [patent_title] => 'Maximum VCC calculation method for hot carrier qualification' [patent_app_type] => utility [patent_app_number] => 10/166105 [patent_app_country] => US [patent_app_date] => 2002-06-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3197 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 119 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/856/06856160.pdf [firstpage_image] =>[orig_patent_app_number] => 10166105 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1064041 [patent_doc_number] => 06850081 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2005-02-01 [patent_title] => 'Semiconductor die analysis via fiber optic communication' [patent_app_type] => utility [patent_app_number] => 10/164506 [patent_app_country] => US [patent_app_date] => 2002-06-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 2303 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 85 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/850/06850081.pdf [firstpage_image] =>[orig_patent_app_number] => 10164506 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6672385 [patent_doc_number] => 20030057988 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-03-27 [patent_title] => 'Semiconductor device inspecting method using conducting AFM' [patent_app_type] => new [patent_app_number] => 10/160006 [patent_app_country] => US [patent_app_date] => 2002-06-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 5962 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 173 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0057/20030057988.pdf [firstpage_image] =>[orig_patent_app_number] => 10160006 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6388717 [patent_doc_number] => 20020180478 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-12-05 [patent_title] => 'Device power supply and IC test apparatus' [patent_app_type] => new [patent_app_number] => 10/154503 [patent_app_country] => US [patent_app_date] => 2002-05-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2770 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 48 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0180/20020180478.pdf [firstpage_image] =>[orig_patent_app_number] => 10154503 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1038138 [patent_doc_number] => 06873172 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-03-29 [patent_title] => 'Automated laser diode test system' [patent_app_type] => utility [patent_app_number] => 10/146709 [patent_app_country] => US [patent_app_date] => 2002-05-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 11 [patent_no_of_words] => 2802 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 53 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/873/06873172.pdf [firstpage_image] =>[orig_patent_app_number] => 10146709 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 7423725 [patent_doc_number] => 20040183562 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-09-23 [patent_title] => 'Device for measuring a b-component of a magnetic field, a magnetic field sensor and an ammeter' [patent_app_type] => new [patent_app_number] => 10/478555 [patent_app_country] => US [patent_app_date] => 2004-05-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 4534 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 24 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0183/20040183562.pdf [firstpage_image] =>[orig_patent_app_number] => 10478555 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1057213 [patent_doc_number] => 06856158 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-02-15 [patent_title] => 'Comparator circuit for semiconductor test system' [patent_app_type] => utility [patent_app_number] => 10/136506 [patent_app_country] => US [patent_app_date] => 2002-05-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 12 [patent_no_of_words] => 4765 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 158 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/856/06856158.pdf [firstpage_image] =>[orig_patent_app_number] => 10136506 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6368199 [patent_doc_number] => 20020118009 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-08-29 [patent_title] => 'Wafer probe station' [patent_app_type] => new [patent_app_number] => 10/134908 [patent_app_country] => US [patent_app_date] => 2002-04-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 20 [patent_no_of_words] => 7633 [patent_no_of_claims] => 37 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 80 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0118/20020118009.pdf [firstpage_image] =>[orig_patent_app_number] => 10134908 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5783477 [patent_doc_number] => 20020158654 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-10-31 [patent_title] => 'Apparatus and method for determining a current through a power semiconductor component' [patent_app_type] => new [patent_app_number] => 10/134010 [patent_app_country] => US [patent_app_date] => 2002-04-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 9153 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 44 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0158/20020158654.pdf [firstpage_image] =>[orig_patent_app_number] => 10134010 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1214740 [patent_doc_number] => 06710611 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-03-23 [patent_title] => 'Test plate for ceramic surface mount devices and other electronic components' [patent_app_type] => B2 [patent_app_number] => 10/126004 [patent_app_country] => US [patent_app_date] => 2002-04-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 14 [patent_no_of_words] => 5785 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 167 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/710/06710611.pdf [firstpage_image] =>[orig_patent_app_number] => 10126004 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6873044 [patent_doc_number] => 20030193341 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-10-16 [patent_title] => 'Systems and methods for wideband differential probing of variably spaced probe points' [patent_app_type] => new [patent_app_number] => 10/123610 [patent_app_country] => US [patent_app_date] => 2002-04-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 13976 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 77 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0193/20030193341.pdf [firstpage_image] =>[orig_patent_app_number] => 10123610 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1086755 [patent_doc_number] => 06831452 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-12-14 [patent_title] => 'Systems and methods for wideband single-end probing of variabily spaced probe points' [patent_app_type] => B2 [patent_app_number] => 10/123288 [patent_app_country] => US [patent_app_date] => 2002-04-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 22 [patent_no_of_words] => 13784 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 142 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/831/06831452.pdf [firstpage_image] =>[orig_patent_app_number] => 10123288 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1181160 [patent_doc_number] => 06744268 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-06-01 [patent_title] => 'High resolution analytical probe station' [patent_app_type] => B2 [patent_app_number] => 10/119346 [patent_app_country] => US [patent_app_date] => 2002-04-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 37 [patent_figures_cnt] => 60 [patent_no_of_words] => 33772 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 105 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/744/06744268.pdf [firstpage_image] =>[orig_patent_app_number] => 10119346 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1190233 [patent_doc_number] => 06734658 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-05-11 [patent_title] => 'Wireless alternating current phasing voltmeter multimeter' [patent_app_type] => B1 [patent_app_number] => 10/117000 [patent_app_country] => US [patent_app_date] => 2002-04-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 10 [patent_no_of_words] => 7913 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 158 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/734/06734658.pdf [firstpage_image] =>[orig_patent_app_number] => 10117000 [rel_patent_id] =>[rel_patent_doc_number] =>)