Search

Scott R. Kastler

Examiner (ID: 10250, Phone: (571)272-1243 , Office: P/1733 )

Most Active Art Unit
1733
Art Unit(s)
1101, 1733, 2899, 1742, 1793, 1308, 1311
Total Applications
4528
Issued Applications
3615
Pending Applications
164
Abandoned Applications
754

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 104186 [patent_doc_number] => 07724010 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-05-25 [patent_title] => 'Torsion spring probe contactor design' [patent_app_type] => utility [patent_app_number] => 11/983521 [patent_app_country] => US [patent_app_date] => 2007-11-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 30 [patent_no_of_words] => 6547 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 71 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/724/07724010.pdf [firstpage_image] =>[orig_patent_app_number] => 11983521 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/983521
Torsion spring probe contactor design Nov 8, 2007 Issued
Array ( [id] => 225411 [patent_doc_number] => 07605597 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-10-20 [patent_title] => 'Intra-chip power and test signal generation for use with test structures on wafers' [patent_app_type] => utility [patent_app_number] => 11/935297 [patent_app_country] => US [patent_app_date] => 2007-11-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 30 [patent_no_of_words] => 24092 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 173 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/605/07605597.pdf [firstpage_image] =>[orig_patent_app_number] => 11935297 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/935297
Intra-chip power and test signal generation for use with test structures on wafers Nov 4, 2007 Issued
Array ( [id] => 4897303 [patent_doc_number] => 20080116916 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-05-22 [patent_title] => 'HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF' [patent_app_type] => utility [patent_app_number] => 11/929924 [patent_app_country] => US [patent_app_date] => 2007-10-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 5005 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0116/20080116916.pdf [firstpage_image] =>[orig_patent_app_number] => 11929924 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/929924
HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF Oct 29, 2007 Abandoned
Array ( [id] => 4897301 [patent_doc_number] => 20080116914 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-05-22 [patent_title] => 'HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF' [patent_app_type] => utility [patent_app_number] => 11/929806 [patent_app_country] => US [patent_app_date] => 2007-10-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 5004 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0116/20080116914.pdf [firstpage_image] =>[orig_patent_app_number] => 11929806 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/929806
HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF Oct 29, 2007 Abandoned
Array ( [id] => 4891227 [patent_doc_number] => 20080100324 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-05-01 [patent_title] => 'HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF' [patent_app_type] => utility [patent_app_number] => 11/929736 [patent_app_country] => US [patent_app_date] => 2007-10-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 5005 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0100/20080100324.pdf [firstpage_image] =>[orig_patent_app_number] => 11929736 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/929736
HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF Oct 29, 2007 Abandoned
Array ( [id] => 4897302 [patent_doc_number] => 20080116915 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-05-22 [patent_title] => 'HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF' [patent_app_type] => utility [patent_app_number] => 11/929821 [patent_app_country] => US [patent_app_date] => 2007-10-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 5005 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0116/20080116915.pdf [firstpage_image] =>[orig_patent_app_number] => 11929821 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/929821
HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF Oct 29, 2007 Abandoned
Array ( [id] => 4891219 [patent_doc_number] => 20080100316 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-05-01 [patent_title] => 'HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF' [patent_app_type] => utility [patent_app_number] => 11/929634 [patent_app_country] => US [patent_app_date] => 2007-10-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 5005 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0100/20080100316.pdf [firstpage_image] =>[orig_patent_app_number] => 11929634 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/929634
HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF Oct 29, 2007 Abandoned
Array ( [id] => 4902155 [patent_doc_number] => 20080111568 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-05-15 [patent_title] => 'HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF' [patent_app_type] => utility [patent_app_number] => 11/929676 [patent_app_country] => US [patent_app_date] => 2007-10-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 5005 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0111/20080111568.pdf [firstpage_image] =>[orig_patent_app_number] => 11929676 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/929676
HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF Oct 29, 2007 Abandoned
Array ( [id] => 4897300 [patent_doc_number] => 20080116913 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-05-22 [patent_title] => 'HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF' [patent_app_type] => utility [patent_app_number] => 11/929768 [patent_app_country] => US [patent_app_date] => 2007-10-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 5005 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0116/20080116913.pdf [firstpage_image] =>[orig_patent_app_number] => 11929768 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/929768
HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF Oct 29, 2007 Abandoned
Array ( [id] => 4902157 [patent_doc_number] => 20080111570 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-05-15 [patent_title] => 'HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF' [patent_app_type] => utility [patent_app_number] => 11/929911 [patent_app_country] => US [patent_app_date] => 2007-10-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 5005 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0111/20080111570.pdf [firstpage_image] =>[orig_patent_app_number] => 11929911 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/929911
HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF Oct 29, 2007 Abandoned
Array ( [id] => 4731669 [patent_doc_number] => 20080048647 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-02-28 [patent_title] => 'Chuck for holding a device under test' [patent_app_type] => utility [patent_app_number] => 11/977050 [patent_app_country] => US [patent_app_date] => 2007-10-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 5704 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0048/20080048647.pdf [firstpage_image] =>[orig_patent_app_number] => 11977050 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/977050
Chuck for holding a device under test Oct 22, 2007 Issued
Array ( [id] => 4731670 [patent_doc_number] => 20080048648 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-02-28 [patent_title] => 'Chuck for holding a device under test' [patent_app_type] => utility [patent_app_number] => 11/977052 [patent_app_country] => US [patent_app_date] => 2007-10-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 5704 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0048/20080048648.pdf [firstpage_image] =>[orig_patent_app_number] => 11977052 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/977052
Chuck for holding a device under test Oct 22, 2007 Issued
Array ( [id] => 4769226 [patent_doc_number] => 20080054884 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-03-06 [patent_title] => 'Chuck for holding a device under test' [patent_app_type] => utility [patent_app_number] => 11/977054 [patent_app_country] => US [patent_app_date] => 2007-10-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 5700 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0054/20080054884.pdf [firstpage_image] =>[orig_patent_app_number] => 11977054 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/977054
Chuck for holding a device under test Oct 22, 2007 Abandoned
Array ( [id] => 4769227 [patent_doc_number] => 20080054885 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-03-06 [patent_title] => 'Chuck for holding a device under test' [patent_app_type] => utility [patent_app_number] => 11/977130 [patent_app_country] => US [patent_app_date] => 2007-10-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 5702 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0054/20080054885.pdf [firstpage_image] =>[orig_patent_app_number] => 11977130 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/977130
Chuck for holding a device under test Oct 22, 2007 Abandoned
Array ( [id] => 803713 [patent_doc_number] => 07423419 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-09-09 [patent_title] => 'Chuck for holding a device under test' [patent_app_type] => utility [patent_app_number] => 11/975929 [patent_app_country] => US [patent_app_date] => 2007-10-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 16 [patent_no_of_words] => 5707 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 177 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/423/07423419.pdf [firstpage_image] =>[orig_patent_app_number] => 11975929 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/975929
Chuck for holding a device under test Oct 22, 2007 Issued
Array ( [id] => 323124 [patent_doc_number] => 07518358 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-04-14 [patent_title] => 'Chuck for holding a device under test' [patent_app_type] => utility [patent_app_number] => 11/977051 [patent_app_country] => US [patent_app_date] => 2007-10-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 16 [patent_no_of_words] => 5707 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 169 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/518/07518358.pdf [firstpage_image] =>[orig_patent_app_number] => 11977051 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/977051
Chuck for holding a device under test Oct 22, 2007 Issued
Array ( [id] => 4667582 [patent_doc_number] => 20080042642 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-02-21 [patent_title] => 'Chuck for holding a device under test' [patent_app_type] => utility [patent_app_number] => 11/977053 [patent_app_country] => US [patent_app_date] => 2007-10-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 5701 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0042/20080042642.pdf [firstpage_image] =>[orig_patent_app_number] => 11977053 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/977053
Chuck for holding a device under test Oct 22, 2007 Abandoned
Array ( [id] => 4667618 [patent_doc_number] => 20080042678 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-02-21 [patent_title] => 'Wafer probe' [patent_app_type] => utility [patent_app_number] => 11/975176 [patent_app_country] => US [patent_app_date] => 2007-10-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3398 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0042/20080042678.pdf [firstpage_image] =>[orig_patent_app_number] => 11975176 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/975176
Wafer probe Oct 17, 2007 Issued
Array ( [id] => 4884380 [patent_doc_number] => 20080258712 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-10-23 [patent_title] => 'MODULAR INTERFACE' [patent_app_type] => utility [patent_app_number] => 11/874575 [patent_app_country] => US [patent_app_date] => 2007-10-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 33 [patent_figures_cnt] => 33 [patent_no_of_words] => 9603 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0258/20080258712.pdf [firstpage_image] =>[orig_patent_app_number] => 11874575 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/874575
Modular interface Oct 17, 2007 Issued
Array ( [id] => 4884381 [patent_doc_number] => 20080258713 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-10-23 [patent_title] => 'MODULAR INTERFACE' [patent_app_type] => utility [patent_app_number] => 11/874603 [patent_app_country] => US [patent_app_date] => 2007-10-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 33 [patent_figures_cnt] => 33 [patent_no_of_words] => 9603 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0258/20080258713.pdf [firstpage_image] =>[orig_patent_app_number] => 11874603 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/874603
Modular interface Oct 17, 2007 Issued
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