
Scott R. Kastler
Examiner (ID: 10250, Phone: (571)272-1243 , Office: P/1733 )
| Most Active Art Unit | 1733 |
| Art Unit(s) | 1101, 1733, 2899, 1742, 1793, 1308, 1311 |
| Total Applications | 4528 |
| Issued Applications | 3615 |
| Pending Applications | 164 |
| Abandoned Applications | 754 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 1190236
[patent_doc_number] => 06734661
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2004-05-11
[patent_title] => 'Current Sensor'
[patent_app_type] => B2
[patent_app_number] => 10/112905
[patent_app_country] => US
[patent_app_date] => 2002-04-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 15
[patent_figures_cnt] => 0
[patent_no_of_words] => 10981
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 314
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/734/06734661.pdf
[firstpage_image] =>[orig_patent_app_number] => 10112905
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/112905 | Current Sensor | Mar 31, 2002 | Issued |
Array
(
[id] => 5901852
[patent_doc_number] => 20020140415
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-10-03
[patent_title] => 'Method of setting gribs and/or markers in measuring apparatus'
[patent_app_type] => new
[patent_app_number] => 10/113607
[patent_app_country] => US
[patent_app_date] => 2002-04-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 4319
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 79
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0140/20020140415.pdf
[firstpage_image] =>[orig_patent_app_number] => 10113607
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/113607 | Method of setting gribs and/or markers in measuring apparatus | Mar 31, 2002 | Issued |
Array
(
[id] => 5901897
[patent_doc_number] => 20020140449
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-10-03
[patent_title] => 'Apparatus and method for disabling and re-enabling access to IC test functions'
[patent_app_type] => new
[patent_app_number] => 10/113995
[patent_app_country] => US
[patent_app_date] => 2002-03-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 5772
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 45
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0140/20020140449.pdf
[firstpage_image] =>[orig_patent_app_number] => 10113995
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/113995 | Method for disabling and re-enabling access to IC test functions | Mar 28, 2002 | Issued |
Array
(
[id] => 1081620
[patent_doc_number] => 06836132
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2004-12-28
[patent_title] => 'High resolution heat exchange'
[patent_app_type] => B1
[patent_app_number] => 10/113604
[patent_app_country] => US
[patent_app_date] => 2002-03-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 4
[patent_no_of_words] => 2984
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 73
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/836/06836132.pdf
[firstpage_image] =>[orig_patent_app_number] => 10113604
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/113604 | High resolution heat exchange | Mar 28, 2002 | Issued |
Array
(
[id] => 6176930
[patent_doc_number] => 20020155736
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-10-24
[patent_title] => 'Probe pin assembly'
[patent_app_type] => new
[patent_app_number] => 10/112109
[patent_app_country] => US
[patent_app_date] => 2002-03-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 13
[patent_no_of_words] => 5067
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 251
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0155/20020155736.pdf
[firstpage_image] =>[orig_patent_app_number] => 10112109
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/112109 | Probe pin assembly | Mar 27, 2002 | Issued |
Array
(
[id] => 6447992
[patent_doc_number] => 20020149412
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-10-17
[patent_title] => 'Circuit configuration for generating square wave pulses'
[patent_app_type] => new
[patent_app_number] => 10/089209
[patent_app_country] => US
[patent_app_date] => 2002-03-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 2735
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 22
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0149/20020149412.pdf
[firstpage_image] =>[orig_patent_app_number] => 10089209
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/089209 | Circuit arrangement for generating square pulses and improved compensation current sensor using same | Mar 25, 2002 | Issued |
Array
(
[id] => 6430262
[patent_doc_number] => 20020175695
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-11-28
[patent_title] => 'Micro probing techniques for testing electronic assemblies'
[patent_app_type] => new
[patent_app_number] => 10/103525
[patent_app_country] => US
[patent_app_date] => 2002-03-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 23
[patent_figures_cnt] => 23
[patent_no_of_words] => 9616
[patent_no_of_claims] => 51
[patent_no_of_ind_claims] => 15
[patent_words_short_claim] => 24
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0175/20020175695.pdf
[firstpage_image] =>[orig_patent_app_number] => 10103525
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/103525 | Micro probing techniques for testing electronic assemblies | Mar 20, 2002 | Abandoned |
Array
(
[id] => 1181180
[patent_doc_number] => 06744272
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2004-06-01
[patent_title] => 'Test circuit'
[patent_app_type] => B2
[patent_app_number] => 10/100504
[patent_app_country] => US
[patent_app_date] => 2002-03-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 3768
[patent_no_of_claims] => 11
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 206
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/744/06744272.pdf
[firstpage_image] =>[orig_patent_app_number] => 10100504
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/100504 | Test circuit | Mar 17, 2002 | Issued |
Array
(
[id] => 387116
[patent_doc_number] => 07304486
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-12-04
[patent_title] => 'Nano-drive for high resolution positioning and for positioning of a multi-point probe'
[patent_app_type] => utility
[patent_app_number] => 10/098969
[patent_app_country] => US
[patent_app_date] => 2002-03-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 15
[patent_figures_cnt] => 26
[patent_no_of_words] => 16835
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 125
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/304/07304486.pdf
[firstpage_image] =>[orig_patent_app_number] => 10098969
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/098969 | Nano-drive for high resolution positioning and for positioning of a multi-point probe | Mar 13, 2002 | Issued |
Array
(
[id] => 1106725
[patent_doc_number] => 06812722
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2004-11-02
[patent_title] => 'On-chip temperature detection device'
[patent_app_type] => B2
[patent_app_number] => 10/091305
[patent_app_country] => US
[patent_app_date] => 2002-03-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 10
[patent_no_of_words] => 6293
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 112
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/812/06812722.pdf
[firstpage_image] =>[orig_patent_app_number] => 10091305
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/091305 | On-chip temperature detection device | Mar 5, 2002 | Issued |
Array
(
[id] => 6845549
[patent_doc_number] => 20030164716
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-09-04
[patent_title] => 'Alignment apparatus for an IC test handler'
[patent_app_type] => new
[patent_app_number] => 10/090309
[patent_app_country] => US
[patent_app_date] => 2002-03-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 2327
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 199
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0164/20030164716.pdf
[firstpage_image] =>[orig_patent_app_number] => 10090309
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/090309 | Alignment apparatus for an IC test handler | Mar 3, 2002 | Abandoned |
Array
(
[id] => 1311651
[patent_doc_number] => 06617862
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-09-09
[patent_title] => 'Laser intrusive technique for locating specific integrated circuit current paths'
[patent_app_type] => B1
[patent_app_number] => 10/084100
[patent_app_country] => US
[patent_app_date] => 2002-02-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 5
[patent_no_of_words] => 5340
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 146
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/617/06617862.pdf
[firstpage_image] =>[orig_patent_app_number] => 10084100
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/084100 | Laser intrusive technique for locating specific integrated circuit current paths | Feb 26, 2002 | Issued |
Array
(
[id] => 6043806
[patent_doc_number] => 20020166777
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-11-14
[patent_title] => 'Method for measuring product parameters of components formed on a wafer and device for performing the method'
[patent_app_type] => new
[patent_app_number] => 10/078146
[patent_app_country] => US
[patent_app_date] => 2002-02-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 3707
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 10
[patent_words_short_claim] => 25
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0166/20020166777.pdf
[firstpage_image] =>[orig_patent_app_number] => 10078146
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/078146 | Method for measuring product parameters of components formed on a wafer and device for performing the method | Feb 18, 2002 | Issued |
Array
(
[id] => 1211231
[patent_doc_number] => 06713999
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2004-03-30
[patent_title] => 'Current sensor working in accordance with the compensation principle'
[patent_app_type] => B1
[patent_app_number] => 10/030009
[patent_app_country] => US
[patent_app_date] => 2002-02-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 8
[patent_no_of_words] => 3096
[patent_no_of_claims] => 5
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 213
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/713/06713999.pdf
[firstpage_image] =>[orig_patent_app_number] => 10030009
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/030009 | Current sensor working in accordance with the compensation principle | Feb 14, 2002 | Issued |
Array
(
[id] => 6447725
[patent_doc_number] => 20020149386
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2002-10-17
[patent_title] => 'Blade-like connecting needle'
[patent_app_type] => new
[patent_app_number] => 10/074202
[patent_app_country] => US
[patent_app_date] => 2002-02-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 11
[patent_no_of_words] => 5162
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 50
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0149/20020149386.pdf
[firstpage_image] =>[orig_patent_app_number] => 10074202
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/074202 | Blade-like connecting needle | Feb 11, 2002 | Issued |
Array
(
[id] => 1502776
[patent_doc_number] => 06486687
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2002-11-26
[patent_title] => 'Wafer probe station having environment control enclosure'
[patent_app_type] => B2
[patent_app_number] => 10/068728
[patent_app_country] => US
[patent_app_date] => 2002-02-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 12
[patent_no_of_words] => 4129
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 111
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/486/06486687.pdf
[firstpage_image] =>[orig_patent_app_number] => 10068728
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/068728 | Wafer probe station having environment control enclosure | Feb 5, 2002 | Issued |
Array
(
[id] => 1121451
[patent_doc_number] => 06798224
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2004-09-28
[patent_title] => 'Method for testing semiconductor wafers'
[patent_app_type] => B1
[patent_app_number] => 10/072734
[patent_app_country] => US
[patent_app_date] => 2002-02-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 26
[patent_no_of_words] => 8959
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 76
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/798/06798224.pdf
[firstpage_image] =>[orig_patent_app_number] => 10072734
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/072734 | Method for testing semiconductor wafers | Feb 4, 2002 | Issued |
Array
(
[id] => 1133344
[patent_doc_number] => 06788079
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2004-09-07
[patent_title] => 'Indexing multiple test probe system and method'
[patent_app_type] => B1
[patent_app_number] => 10/066394
[patent_app_country] => US
[patent_app_date] => 2002-02-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 13
[patent_no_of_words] => 4630
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 196
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/788/06788079.pdf
[firstpage_image] =>[orig_patent_app_number] => 10066394
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/066394 | Indexing multiple test probe system and method | Jan 31, 2002 | Issued |
Array
(
[id] => 1273579
[patent_doc_number] => 06653853
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2003-11-25
[patent_title] => 'Multiple test probe system and method'
[patent_app_type] => B1
[patent_app_number] => 10/066391
[patent_app_country] => US
[patent_app_date] => 2002-02-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 14
[patent_no_of_words] => 3692
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 132
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/06/653/06653853.pdf
[firstpage_image] =>[orig_patent_app_number] => 10066391
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/066391 | Multiple test probe system and method | Jan 31, 2002 | Issued |
Array
(
[id] => 6656562
[patent_doc_number] => 20030132772
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2003-07-17
[patent_title] => 'Piercer combined prober for CU interconnect wafer-level preliminary electrical test'
[patent_app_type] => new
[patent_app_number] => 10/044011
[patent_app_country] => US
[patent_app_date] => 2002-01-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 2
[patent_no_of_words] => 3019
[patent_no_of_claims] => 26
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 55
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0132/20030132772.pdf
[firstpage_image] =>[orig_patent_app_number] => 10044011
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/044011 | Piercer combined prober for CU interconnect water-level preliminary electrical test | Jan 10, 2002 | Issued |