Search

Scott R. Kastler

Examiner (ID: 10250, Phone: (571)272-1243 , Office: P/1733 )

Most Active Art Unit
1733
Art Unit(s)
1101, 1733, 2899, 1742, 1793, 1308, 1311
Total Applications
4528
Issued Applications
3615
Pending Applications
164
Abandoned Applications
754

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 1190236 [patent_doc_number] => 06734661 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-05-11 [patent_title] => 'Current Sensor' [patent_app_type] => B2 [patent_app_number] => 10/112905 [patent_app_country] => US [patent_app_date] => 2002-04-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 0 [patent_no_of_words] => 10981 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 314 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/734/06734661.pdf [firstpage_image] =>[orig_patent_app_number] => 10112905 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/112905
Current Sensor Mar 31, 2002 Issued
Array ( [id] => 5901852 [patent_doc_number] => 20020140415 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-10-03 [patent_title] => 'Method of setting gribs and/or markers in measuring apparatus' [patent_app_type] => new [patent_app_number] => 10/113607 [patent_app_country] => US [patent_app_date] => 2002-04-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4319 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 79 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0140/20020140415.pdf [firstpage_image] =>[orig_patent_app_number] => 10113607 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/113607
Method of setting gribs and/or markers in measuring apparatus Mar 31, 2002 Issued
Array ( [id] => 5901897 [patent_doc_number] => 20020140449 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-10-03 [patent_title] => 'Apparatus and method for disabling and re-enabling access to IC test functions' [patent_app_type] => new [patent_app_number] => 10/113995 [patent_app_country] => US [patent_app_date] => 2002-03-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5772 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 45 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0140/20020140449.pdf [firstpage_image] =>[orig_patent_app_number] => 10113995 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/113995
Method for disabling and re-enabling access to IC test functions Mar 28, 2002 Issued
Array ( [id] => 1081620 [patent_doc_number] => 06836132 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-12-28 [patent_title] => 'High resolution heat exchange' [patent_app_type] => B1 [patent_app_number] => 10/113604 [patent_app_country] => US [patent_app_date] => 2002-03-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 2984 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 73 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/836/06836132.pdf [firstpage_image] =>[orig_patent_app_number] => 10113604 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/113604
High resolution heat exchange Mar 28, 2002 Issued
Array ( [id] => 6176930 [patent_doc_number] => 20020155736 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-10-24 [patent_title] => 'Probe pin assembly' [patent_app_type] => new [patent_app_number] => 10/112109 [patent_app_country] => US [patent_app_date] => 2002-03-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 5067 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 251 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0155/20020155736.pdf [firstpage_image] =>[orig_patent_app_number] => 10112109 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/112109
Probe pin assembly Mar 27, 2002 Issued
Array ( [id] => 6447992 [patent_doc_number] => 20020149412 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-10-17 [patent_title] => 'Circuit configuration for generating square wave pulses' [patent_app_type] => new [patent_app_number] => 10/089209 [patent_app_country] => US [patent_app_date] => 2002-03-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2735 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 22 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0149/20020149412.pdf [firstpage_image] =>[orig_patent_app_number] => 10089209 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/089209
Circuit arrangement for generating square pulses and improved compensation current sensor using same Mar 25, 2002 Issued
Array ( [id] => 6430262 [patent_doc_number] => 20020175695 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-11-28 [patent_title] => 'Micro probing techniques for testing electronic assemblies' [patent_app_type] => new [patent_app_number] => 10/103525 [patent_app_country] => US [patent_app_date] => 2002-03-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 23 [patent_figures_cnt] => 23 [patent_no_of_words] => 9616 [patent_no_of_claims] => 51 [patent_no_of_ind_claims] => 15 [patent_words_short_claim] => 24 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0175/20020175695.pdf [firstpage_image] =>[orig_patent_app_number] => 10103525 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/103525
Micro probing techniques for testing electronic assemblies Mar 20, 2002 Abandoned
Array ( [id] => 1181180 [patent_doc_number] => 06744272 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-06-01 [patent_title] => 'Test circuit' [patent_app_type] => B2 [patent_app_number] => 10/100504 [patent_app_country] => US [patent_app_date] => 2002-03-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3768 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 206 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/744/06744272.pdf [firstpage_image] =>[orig_patent_app_number] => 10100504 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/100504
Test circuit Mar 17, 2002 Issued
Array ( [id] => 387116 [patent_doc_number] => 07304486 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-12-04 [patent_title] => 'Nano-drive for high resolution positioning and for positioning of a multi-point probe' [patent_app_type] => utility [patent_app_number] => 10/098969 [patent_app_country] => US [patent_app_date] => 2002-03-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 26 [patent_no_of_words] => 16835 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 125 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/304/07304486.pdf [firstpage_image] =>[orig_patent_app_number] => 10098969 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/098969
Nano-drive for high resolution positioning and for positioning of a multi-point probe Mar 13, 2002 Issued
Array ( [id] => 1106725 [patent_doc_number] => 06812722 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-11-02 [patent_title] => 'On-chip temperature detection device' [patent_app_type] => B2 [patent_app_number] => 10/091305 [patent_app_country] => US [patent_app_date] => 2002-03-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 10 [patent_no_of_words] => 6293 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/812/06812722.pdf [firstpage_image] =>[orig_patent_app_number] => 10091305 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/091305
On-chip temperature detection device Mar 5, 2002 Issued
Array ( [id] => 6845549 [patent_doc_number] => 20030164716 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-09-04 [patent_title] => 'Alignment apparatus for an IC test handler' [patent_app_type] => new [patent_app_number] => 10/090309 [patent_app_country] => US [patent_app_date] => 2002-03-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2327 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 199 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0164/20030164716.pdf [firstpage_image] =>[orig_patent_app_number] => 10090309 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/090309
Alignment apparatus for an IC test handler Mar 3, 2002 Abandoned
Array ( [id] => 1311651 [patent_doc_number] => 06617862 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-09-09 [patent_title] => 'Laser intrusive technique for locating specific integrated circuit current paths' [patent_app_type] => B1 [patent_app_number] => 10/084100 [patent_app_country] => US [patent_app_date] => 2002-02-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 5340 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 146 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/617/06617862.pdf [firstpage_image] =>[orig_patent_app_number] => 10084100 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/084100
Laser intrusive technique for locating specific integrated circuit current paths Feb 26, 2002 Issued
Array ( [id] => 6043806 [patent_doc_number] => 20020166777 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-11-14 [patent_title] => 'Method for measuring product parameters of components formed on a wafer and device for performing the method' [patent_app_type] => new [patent_app_number] => 10/078146 [patent_app_country] => US [patent_app_date] => 2002-02-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3707 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 10 [patent_words_short_claim] => 25 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0166/20020166777.pdf [firstpage_image] =>[orig_patent_app_number] => 10078146 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/078146
Method for measuring product parameters of components formed on a wafer and device for performing the method Feb 18, 2002 Issued
Array ( [id] => 1211231 [patent_doc_number] => 06713999 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-03-30 [patent_title] => 'Current sensor working in accordance with the compensation principle' [patent_app_type] => B1 [patent_app_number] => 10/030009 [patent_app_country] => US [patent_app_date] => 2002-02-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 8 [patent_no_of_words] => 3096 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 213 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/713/06713999.pdf [firstpage_image] =>[orig_patent_app_number] => 10030009 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/030009
Current sensor working in accordance with the compensation principle Feb 14, 2002 Issued
Array ( [id] => 6447725 [patent_doc_number] => 20020149386 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-10-17 [patent_title] => 'Blade-like connecting needle' [patent_app_type] => new [patent_app_number] => 10/074202 [patent_app_country] => US [patent_app_date] => 2002-02-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 5162 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 50 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0149/20020149386.pdf [firstpage_image] =>[orig_patent_app_number] => 10074202 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/074202
Blade-like connecting needle Feb 11, 2002 Issued
Array ( [id] => 1502776 [patent_doc_number] => 06486687 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2002-11-26 [patent_title] => 'Wafer probe station having environment control enclosure' [patent_app_type] => B2 [patent_app_number] => 10/068728 [patent_app_country] => US [patent_app_date] => 2002-02-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 12 [patent_no_of_words] => 4129 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 111 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/486/06486687.pdf [firstpage_image] =>[orig_patent_app_number] => 10068728 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/068728
Wafer probe station having environment control enclosure Feb 5, 2002 Issued
Array ( [id] => 1121451 [patent_doc_number] => 06798224 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-09-28 [patent_title] => 'Method for testing semiconductor wafers' [patent_app_type] => B1 [patent_app_number] => 10/072734 [patent_app_country] => US [patent_app_date] => 2002-02-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 26 [patent_no_of_words] => 8959 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 76 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/798/06798224.pdf [firstpage_image] =>[orig_patent_app_number] => 10072734 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/072734
Method for testing semiconductor wafers Feb 4, 2002 Issued
Array ( [id] => 1133344 [patent_doc_number] => 06788079 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-09-07 [patent_title] => 'Indexing multiple test probe system and method' [patent_app_type] => B1 [patent_app_number] => 10/066394 [patent_app_country] => US [patent_app_date] => 2002-02-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 13 [patent_no_of_words] => 4630 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 196 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/788/06788079.pdf [firstpage_image] =>[orig_patent_app_number] => 10066394 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/066394
Indexing multiple test probe system and method Jan 31, 2002 Issued
Array ( [id] => 1273579 [patent_doc_number] => 06653853 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-11-25 [patent_title] => 'Multiple test probe system and method' [patent_app_type] => B1 [patent_app_number] => 10/066391 [patent_app_country] => US [patent_app_date] => 2002-02-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 14 [patent_no_of_words] => 3692 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 132 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/653/06653853.pdf [firstpage_image] =>[orig_patent_app_number] => 10066391 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/066391
Multiple test probe system and method Jan 31, 2002 Issued
Array ( [id] => 6656562 [patent_doc_number] => 20030132772 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-07-17 [patent_title] => 'Piercer combined prober for CU interconnect wafer-level preliminary electrical test' [patent_app_type] => new [patent_app_number] => 10/044011 [patent_app_country] => US [patent_app_date] => 2002-01-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 3019 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 55 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0132/20030132772.pdf [firstpage_image] =>[orig_patent_app_number] => 10044011 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/044011
Piercer combined prober for CU interconnect water-level preliminary electrical test Jan 10, 2002 Issued
Menu