Search

Scott R. Kastler

Examiner (ID: 10250, Phone: (571)272-1243 , Office: P/1733 )

Most Active Art Unit
1733
Art Unit(s)
1101, 1733, 2899, 1742, 1793, 1308, 1311
Total Applications
4528
Issued Applications
3615
Pending Applications
164
Abandoned Applications
754

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 6816336 [patent_doc_number] => 20030067294 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-04-10 [patent_title] => 'Electric power meter - optical reading device' [patent_app_type] => new [patent_app_number] => 09/682700 [patent_app_country] => US [patent_app_date] => 2001-10-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 72 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 120 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0067/20030067294.pdf [firstpage_image] =>[orig_patent_app_number] => 09682700 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/682700
Electric power meter - optical reading device Oct 6, 2001 Abandoned
Array ( [id] => 1230333 [patent_doc_number] => 06696849 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-02-24 [patent_title] => 'Fabrication method of semiconductor integrated circuit device and its testing apparatus' [patent_app_type] => B2 [patent_app_number] => 09/964708 [patent_app_country] => US [patent_app_date] => 2001-09-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 11 [patent_no_of_words] => 11302 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 110 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/696/06696849.pdf [firstpage_image] =>[orig_patent_app_number] => 09964708 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/964708
Fabrication method of semiconductor integrated circuit device and its testing apparatus Sep 27, 2001 Issued
Array ( [id] => 6781460 [patent_doc_number] => 20030062907 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-04-03 [patent_title] => 'System and method for detecting the proximity of a body' [patent_app_type] => new [patent_app_number] => 09/968346 [patent_app_country] => US [patent_app_date] => 2001-09-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4150 [patent_no_of_claims] => 35 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 85 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0062/20030062907.pdf [firstpage_image] =>[orig_patent_app_number] => 09968346 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/968346
System and method for detecting the proximity of a body Sep 27, 2001 Issued
Array ( [id] => 5886317 [patent_doc_number] => 20020011863 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-01-31 [patent_title] => 'IC chip tester with heating element for preventing condensation' [patent_app_type] => new [patent_app_number] => 09/956958 [patent_app_country] => US [patent_app_date] => 2001-09-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 9477 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 59 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0011/20020011863.pdf [firstpage_image] =>[orig_patent_app_number] => 09956958 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/956958
IC chip tester with heating element for preventing condensation Sep 20, 2001 Abandoned
Array ( [id] => 1267019 [patent_doc_number] => 06661243 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-12-09 [patent_title] => 'Semiconductor device evaluation apparatus and semiconductor device evaluation program product' [patent_app_type] => B2 [patent_app_number] => 09/949762 [patent_app_country] => US [patent_app_date] => 2001-09-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 16 [patent_no_of_words] => 10181 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 194 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/661/06661243.pdf [firstpage_image] =>[orig_patent_app_number] => 09949762 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/949762
Semiconductor device evaluation apparatus and semiconductor device evaluation program product Sep 11, 2001 Issued
Array ( [id] => 6301635 [patent_doc_number] => 20020093352 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-07-18 [patent_title] => 'Contactor of the device for testing semiconductor device' [patent_app_type] => new [patent_app_number] => 09/946676 [patent_app_country] => US [patent_app_date] => 2001-09-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 2965 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 66 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0093/20020093352.pdf [firstpage_image] =>[orig_patent_app_number] => 09946676 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/946676
Contactor of the device for testing semiconductor device Sep 5, 2001 Issued
Array ( [id] => 1159762 [patent_doc_number] => 06765404 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-07-20 [patent_title] => 'On-chip substrate regulator test mode' [patent_app_type] => B2 [patent_app_number] => 09/934784 [patent_app_country] => US [patent_app_date] => 2001-08-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3198 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 91 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/765/06765404.pdf [firstpage_image] =>[orig_patent_app_number] => 09934784 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/934784
On-chip substrate regulator test mode Aug 21, 2001 Issued
Array ( [id] => 1529942 [patent_doc_number] => 06480015 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2002-11-12 [patent_title] => 'Circuit probing methods' [patent_app_type] => B2 [patent_app_number] => 09/935402 [patent_app_country] => US [patent_app_date] => 2001-08-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2073 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 71 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/480/06480015.pdf [firstpage_image] =>[orig_patent_app_number] => 09935402 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/935402
Circuit probing methods Aug 21, 2001 Issued
Array ( [id] => 1082844 [patent_doc_number] => 06833281 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-12-21 [patent_title] => 'On-chip substrate regulator test mode' [patent_app_type] => B2 [patent_app_number] => 09/935086 [patent_app_country] => US [patent_app_date] => 2001-08-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3201 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 9 [patent_words_short_claim] => 21 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/833/06833281.pdf [firstpage_image] =>[orig_patent_app_number] => 09935086 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/935086
On-chip substrate regulator test mode Aug 21, 2001 Issued
Array ( [id] => 1097965 [patent_doc_number] => 06822470 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-11-23 [patent_title] => 'On-chip substrate regulator test mode' [patent_app_type] => B2 [patent_app_number] => 09/935232 [patent_app_country] => US [patent_app_date] => 2001-08-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3206 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 83 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/822/06822470.pdf [firstpage_image] =>[orig_patent_app_number] => 09935232 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/935232
On-chip substrate regulator test mode Aug 21, 2001 Issued
Array ( [id] => 6691220 [patent_doc_number] => 20030038652 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-02-27 [patent_title] => 'Motor component test arrangement including multiple test stations' [patent_app_type] => new [patent_app_number] => 09/935210 [patent_app_country] => US [patent_app_date] => 2001-08-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2560 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 87 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0038/20030038652.pdf [firstpage_image] =>[orig_patent_app_number] => 09935210 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/935210
Motor component test arrangement including multiple test stations Aug 21, 2001 Issued
Array ( [id] => 1460271 [patent_doc_number] => 06426644 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-07-30 [patent_title] => 'Apparatus and method for determining the active dopant profile in a semiconductor wafer' [patent_app_type] => B1 [patent_app_number] => 09/935128 [patent_app_country] => US [patent_app_date] => 2001-08-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 29 [patent_no_of_words] => 21169 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 115 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/426/06426644.pdf [firstpage_image] =>[orig_patent_app_number] => 09935128 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/935128
Apparatus and method for determining the active dopant profile in a semiconductor wafer Aug 20, 2001 Issued
Array ( [id] => 1398436 [patent_doc_number] => 06548999 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-04-15 [patent_title] => 'RMS power sensor with 84 dB dynamic range' [patent_app_type] => B2 [patent_app_number] => 09/933477 [patent_app_country] => US [patent_app_date] => 2001-08-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3093 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 127 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/548/06548999.pdf [firstpage_image] =>[orig_patent_app_number] => 09933477 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/933477
RMS power sensor with 84 dB dynamic range Aug 16, 2001 Issued
Array ( [id] => 1194060 [patent_doc_number] => 06731122 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-05-04 [patent_title] => 'Wafer test apparatus including optical elements and method of using the test apparatus' [patent_app_type] => B2 [patent_app_number] => 09/682287 [patent_app_country] => US [patent_app_date] => 2001-08-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 8 [patent_no_of_words] => 5031 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 75 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/731/06731122.pdf [firstpage_image] =>[orig_patent_app_number] => 09682287 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/682287
Wafer test apparatus including optical elements and method of using the test apparatus Aug 13, 2001 Issued
Array ( [id] => 1588441 [patent_doc_number] => 06359456 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-03-19 [patent_title] => 'Probe card and test system for semiconductor wafers' [patent_app_type] => B1 [patent_app_number] => 09/929388 [patent_app_country] => US [patent_app_date] => 2001-08-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 26 [patent_no_of_words] => 8941 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 95 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/359/06359456.pdf [firstpage_image] =>[orig_patent_app_number] => 09929388 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/929388
Probe card and test system for semiconductor wafers Aug 13, 2001 Issued
Array ( [id] => 1190263 [patent_doc_number] => 06734681 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-05-11 [patent_title] => 'Apparatus and methods for testing circuit boards' [patent_app_type] => B2 [patent_app_number] => 09/927903 [patent_app_country] => US [patent_app_date] => 2001-08-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 3709 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 193 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/734/06734681.pdf [firstpage_image] =>[orig_patent_app_number] => 09927903 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/927903
Apparatus and methods for testing circuit boards Aug 9, 2001 Issued
Array ( [id] => 1090461 [patent_doc_number] => 06828814 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-12-07 [patent_title] => 'Circuit configuration and display element' [patent_app_type] => B2 [patent_app_number] => 09/928010 [patent_app_country] => US [patent_app_date] => 2001-08-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2978 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 159 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/828/06828814.pdf [firstpage_image] =>[orig_patent_app_number] => 09928010 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/928010
Circuit configuration and display element Aug 9, 2001 Issued
Array ( [id] => 1301043 [patent_doc_number] => 06628132 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-09-30 [patent_title] => 'Methods and apparatus for testing a semiconductor structure using improved temperature desoak techniques' [patent_app_type] => B2 [patent_app_number] => 09/928001 [patent_app_country] => US [patent_app_date] => 2001-08-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 9876 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 110 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/628/06628132.pdf [firstpage_image] =>[orig_patent_app_number] => 09928001 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/928001
Methods and apparatus for testing a semiconductor structure using improved temperature desoak techniques Aug 9, 2001 Issued
Array ( [id] => 1469032 [patent_doc_number] => 06459288 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2002-10-01 [patent_title] => 'Conductive bump array contactors having an ejector and methods of testing using same' [patent_app_type] => B2 [patent_app_number] => 09/923664 [patent_app_country] => US [patent_app_date] => 2001-08-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 4972 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 208 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/459/06459288.pdf [firstpage_image] =>[orig_patent_app_number] => 09923664 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/923664
Conductive bump array contactors having an ejector and methods of testing using same Aug 5, 2001 Issued
Array ( [id] => 1469034 [patent_doc_number] => 06459289 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2002-10-01 [patent_title] => 'Conductive bump array contactors having an ejector and methods of testing using same' [patent_app_type] => B2 [patent_app_number] => 09/923728 [patent_app_country] => US [patent_app_date] => 2001-08-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 4980 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 221 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/459/06459289.pdf [firstpage_image] =>[orig_patent_app_number] => 09923728 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/923728
Conductive bump array contactors having an ejector and methods of testing using same Aug 5, 2001 Issued
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