Search

Scott R. Kastler

Examiner (ID: 10250, Phone: (571)272-1243 , Office: P/1733 )

Most Active Art Unit
1733
Art Unit(s)
1101, 1733, 2899, 1742, 1793, 1308, 1311
Total Applications
4528
Issued Applications
3615
Pending Applications
164
Abandoned Applications
754

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 7645078 [patent_doc_number] => 06472894 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-10-29 [patent_title] => 'Apparatus for testing bumped die' [patent_app_type] => B1 [patent_app_number] => 09/923460 [patent_app_country] => US [patent_app_date] => 2001-08-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 9 [patent_no_of_words] => 2723 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 25 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/472/06472894.pdf [firstpage_image] =>[orig_patent_app_number] => 09923460 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/923460
Apparatus for testing bumped die Aug 5, 2001 Issued
Array ( [id] => 1591603 [patent_doc_number] => 06483332 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2002-11-19 [patent_title] => 'Conductive bump array contactors having an ejector and methods of testing using same' [patent_app_type] => B2 [patent_app_number] => 09/923681 [patent_app_country] => US [patent_app_date] => 2001-08-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 4978 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 200 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/483/06483332.pdf [firstpage_image] =>[orig_patent_app_number] => 09923681 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/923681
Conductive bump array contactors having an ejector and methods of testing using same Aug 5, 2001 Issued
Array ( [id] => 5886312 [patent_doc_number] => 20020011860 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-01-31 [patent_title] => 'Conductive bump array contactors having an ejector and methods of testing using same' [patent_app_type] => new [patent_app_number] => 09/923679 [patent_app_country] => US [patent_app_date] => 2001-08-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4968 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 172 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0011/20020011860.pdf [firstpage_image] =>[orig_patent_app_number] => 09923679 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/923679
Conductive bump array contactors having an ejector and methods of testing using same Aug 5, 2001 Issued
Array ( [id] => 5826341 [patent_doc_number] => 20020067178 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-06-06 [patent_title] => 'Testing head having cantilever probes' [patent_app_type] => new [patent_app_number] => 09/922002 [patent_app_country] => US [patent_app_date] => 2001-08-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 3273 [patent_no_of_claims] => 58 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 39 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0067/20020067178.pdf [firstpage_image] =>[orig_patent_app_number] => 09922002 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/922002
Testing head having cantilever probes Aug 2, 2001 Issued
Array ( [id] => 5799096 [patent_doc_number] => 20020008531 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-01-24 [patent_title] => 'Conductive bump array contactors having an ejector and methods of testing using same' [patent_app_type] => new [patent_app_number] => 09/921970 [patent_app_country] => US [patent_app_date] => 2001-08-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4966 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 172 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0008/20020008531.pdf [firstpage_image] =>[orig_patent_app_number] => 09921970 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/921970
Conductive bump array contactors having an ejector and methods of testing using same Aug 1, 2001 Issued
Array ( [id] => 7077212 [patent_doc_number] => 20010040463 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2001-11-15 [patent_title] => 'Conductive bump array contactors having an ejector and methods of testing using same' [patent_app_type] => new [patent_app_number] => 09/912617 [patent_app_country] => US [patent_app_date] => 2001-07-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4967 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 172 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0040/20010040463.pdf [firstpage_image] =>[orig_patent_app_number] => 09912617 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/912617
Conductive bump array contactors having an ejector and methods of testing using same Jul 23, 2001 Issued
Array ( [id] => 1306869 [patent_doc_number] => 06621261 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-09-16 [patent_title] => 'Work inspection apparatus' [patent_app_type] => B2 [patent_app_number] => 09/908800 [patent_app_country] => US [patent_app_date] => 2001-07-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 2 [patent_no_of_words] => 1302 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 122 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/621/06621261.pdf [firstpage_image] =>[orig_patent_app_number] => 09908800 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/908800
Work inspection apparatus Jul 19, 2001 Issued
Array ( [id] => 1133353 [patent_doc_number] => 06788081 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-09-07 [patent_title] => 'Motherboard memory slot ribbon cable and apparatus' [patent_app_type] => B2 [patent_app_number] => 09/908511 [patent_app_country] => US [patent_app_date] => 2001-07-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 8 [patent_no_of_words] => 4461 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 149 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/788/06788081.pdf [firstpage_image] =>[orig_patent_app_number] => 09908511 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/908511
Motherboard memory slot ribbon cable and apparatus Jul 17, 2001 Issued
Array ( [id] => 1230329 [patent_doc_number] => 06696847 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2004-02-24 [patent_title] => 'Photo assisted electrical linewidth measurement method and apparatus' [patent_app_type] => B1 [patent_app_number] => 09/907311 [patent_app_country] => US [patent_app_date] => 2001-07-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 15 [patent_no_of_words] => 2099 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 61 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/696/06696847.pdf [firstpage_image] =>[orig_patent_app_number] => 09907311 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/907311
Photo assisted electrical linewidth measurement method and apparatus Jul 16, 2001 Issued
Array ( [id] => 6577723 [patent_doc_number] => 20020014894 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-02-07 [patent_title] => 'Temperature control apparatus' [patent_app_type] => new [patent_app_number] => 09/904506 [patent_app_country] => US [patent_app_date] => 2001-07-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 6184 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 105 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0014/20020014894.pdf [firstpage_image] =>[orig_patent_app_number] => 09904506 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/904506
Temperature control apparatus Jul 15, 2001 Abandoned
Array ( [id] => 7634171 [patent_doc_number] => 06657449 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-12-02 [patent_title] => 'Test pin unit for PCB test device and feeding device of the same' [patent_app_type] => B2 [patent_app_number] => 09/903204 [patent_app_country] => US [patent_app_date] => 2001-07-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4487 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 14 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/657/06657449.pdf [firstpage_image] =>[orig_patent_app_number] => 09903204 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/903204
Test pin unit for PCB test device and feeding device of the same Jul 10, 2001 Issued
Array ( [id] => 1420885 [patent_doc_number] => 06525528 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-02-25 [patent_title] => 'ROM automatic burning device' [patent_app_type] => B2 [patent_app_number] => 09/900862 [patent_app_country] => US [patent_app_date] => 2001-07-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 11 [patent_no_of_words] => 2867 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 438 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/525/06525528.pdf [firstpage_image] =>[orig_patent_app_number] => 09900862 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/900862
ROM automatic burning device Jul 9, 2001 Issued
Array ( [id] => 1289472 [patent_doc_number] => 06639416 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-10-28 [patent_title] => 'Method and apparatus for testing semiconductor dice' [patent_app_type] => B1 [patent_app_number] => 09/897592 [patent_app_country] => US [patent_app_date] => 2001-07-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 16 [patent_no_of_words] => 5084 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 113 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/639/06639416.pdf [firstpage_image] =>[orig_patent_app_number] => 09897592 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/897592
Method and apparatus for testing semiconductor dice Jul 1, 2001 Issued
Array ( [id] => 1289482 [patent_doc_number] => 06639417 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2003-10-28 [patent_title] => 'Semiconductor parametric testing apparatus' [patent_app_type] => B2 [patent_app_number] => 09/891802 [patent_app_country] => US [patent_app_date] => 2001-06-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 10 [patent_no_of_words] => 3057 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 211 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/639/06639417.pdf [firstpage_image] =>[orig_patent_app_number] => 09891802 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/891802
Semiconductor parametric testing apparatus Jun 25, 2001 Issued
Array ( [id] => 6985879 [patent_doc_number] => 20010035767 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2001-11-01 [patent_title] => 'Deformable liquid crystal sensing head' [patent_app_type] => new [patent_app_number] => 09/891683 [patent_app_country] => US [patent_app_date] => 2001-06-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 5951 [patent_no_of_claims] => 44 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 63 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0035/20010035767.pdf [firstpage_image] =>[orig_patent_app_number] => 09891683 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/891683
Deformable liquid crystal sensing head Jun 24, 2001 Abandoned
Array ( [id] => 7012816 [patent_doc_number] => 20010050567 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2001-12-13 [patent_title] => 'Segmented architecture for wafer test & burn-in' [patent_app_type] => new [patent_app_number] => 09/887211 [patent_app_country] => US [patent_app_date] => 2001-06-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 27 [patent_figures_cnt] => 27 [patent_no_of_words] => 6204 [patent_no_of_claims] => 57 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 35 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0050/20010050567.pdf [firstpage_image] =>[orig_patent_app_number] => 09887211 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/887211
Segmented architecture for wafer test & burn-in Jun 21, 2001 Abandoned
Array ( [id] => 7077210 [patent_doc_number] => 20010040461 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2001-11-15 [patent_title] => 'Wafer probe station having environment control enclosure' [patent_app_type] => new [patent_app_number] => 09/886353 [patent_app_country] => US [patent_app_date] => 2001-06-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4127 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 22 [patent_words_short_claim] => 19 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0040/20010040461.pdf [firstpage_image] =>[orig_patent_app_number] => 09886353 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/886353
Wafer probe station having environment control enclosure Jun 19, 2001 Issued
Array ( [id] => 6816354 [patent_doc_number] => 20030067312 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2003-04-10 [patent_title] => 'Voltage testing and measurement' [patent_app_type] => new [patent_app_number] => 09/881352 [patent_app_country] => US [patent_app_date] => 2001-06-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 34 [patent_figures_cnt] => 34 [patent_no_of_words] => 25703 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 17 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0067/20030067312.pdf [firstpage_image] =>[orig_patent_app_number] => 09881352 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/881352
Voltage testing and measurement Jun 11, 2001 Abandoned
Array ( [id] => 946892 [patent_doc_number] => 06965226 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2005-11-15 [patent_title] => 'Chuck for holding a device under test' [patent_app_type] => utility [patent_app_number] => 09/877823 [patent_app_country] => US [patent_app_date] => 2001-06-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 16 [patent_no_of_words] => 5652 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 122 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/965/06965226.pdf [firstpage_image] =>[orig_patent_app_number] => 09877823 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/877823
Chuck for holding a device under test Jun 6, 2001 Issued
Array ( [id] => 1476795 [patent_doc_number] => 06388459 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2002-05-14 [patent_title] => 'Conductive bump array contactors having an ejector and methods of testing using same' [patent_app_type] => B2 [patent_app_number] => 09/865335 [patent_app_country] => US [patent_app_date] => 2001-05-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 4953 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 195 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/388/06388459.pdf [firstpage_image] =>[orig_patent_app_number] => 09865335 [rel_patent_id] =>[rel_patent_doc_number] =>)
09/865335
Conductive bump array contactors having an ejector and methods of testing using same May 23, 2001 Issued
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