
Scott R. Kastler
Examiner (ID: 10250, Phone: (571)272-1243 , Office: P/1733 )
| Most Active Art Unit | 1733 |
| Art Unit(s) | 1101, 1733, 2899, 1742, 1793, 1308, 1311 |
| Total Applications | 4528 |
| Issued Applications | 3615 |
| Pending Applications | 164 |
| Abandoned Applications | 754 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4667617
[patent_doc_number] => 20080042677
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-02-21
[patent_title] => 'Wafer probe'
[patent_app_type] => utility
[patent_app_number] => 11/975175
[patent_app_country] => US
[patent_app_date] => 2007-10-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 3398
[patent_no_of_claims] => 15
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[patent_maintenance] => 1
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0042/20080042677.pdf
[firstpage_image] =>[orig_patent_app_number] => 11975175
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/975175 | Wafer probe | Oct 17, 2007 | Issued |
Array
(
[id] => 4655283
[patent_doc_number] => 20080024143
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-01-31
[patent_title] => 'CLOSED-GRID BUS ARCHITECTURE FOR WAFER INTERCONNECT STRUCTURE'
[patent_app_type] => utility
[patent_app_number] => 11/866024
[patent_app_country] => US
[patent_app_date] => 2007-10-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 11
[patent_no_of_words] => 7226
[patent_no_of_claims] => 11
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[pdf_file] => publications/A1/0024/20080024143.pdf
[firstpage_image] =>[orig_patent_app_number] => 11866024
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/866024 | Closed-grid bus architecture for wafer interconnect structure | Oct 1, 2007 | Issued |
Array
(
[id] => 5163531
[patent_doc_number] => 20070285115
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-12-13
[patent_title] => 'UNIVERSAL WAFER CARRIER FOR WAFER LEVEL DIE BURN-IN'
[patent_app_type] => utility
[patent_app_number] => 11/841566
[patent_app_country] => US
[patent_app_date] => 2007-08-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 3947
[patent_no_of_claims] => 41
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0285/20070285115.pdf
[firstpage_image] =>[orig_patent_app_number] => 11841566
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/841566 | Universal wafer carrier for wafer level die burn-in | Aug 19, 2007 | Issued |
Array
(
[id] => 5414025
[patent_doc_number] => 20090039912
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-02-12
[patent_title] => 'Method of Acceptance for Semiconductor Devices'
[patent_app_type] => utility
[patent_app_number] => 11/837011
[patent_app_country] => US
[patent_app_date] => 2007-08-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 2325
[patent_no_of_claims] => 7
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[patent_maintenance] => 1
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0039/20090039912.pdf
[firstpage_image] =>[orig_patent_app_number] => 11837011
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/837011 | Method of acceptance for semiconductor devices | Aug 9, 2007 | Issued |
Array
(
[id] => 5083336
[patent_doc_number] => 20070273387
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-11-29
[patent_title] => 'Optical testing device'
[patent_app_type] => utility
[patent_app_number] => 11/890987
[patent_app_country] => US
[patent_app_date] => 2007-08-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 3498
[patent_no_of_claims] => 31
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[pdf_file] => publications/A1/0273/20070273387.pdf
[firstpage_image] =>[orig_patent_app_number] => 11890987
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/890987 | Optical testing device | Aug 6, 2007 | Abandoned |
Array
(
[id] => 5228593
[patent_doc_number] => 20070290700
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-12-20
[patent_title] => 'Wafer probe station having a skirting component'
[patent_app_type] => utility
[patent_app_number] => 11/881571
[patent_app_country] => US
[patent_app_date] => 2007-07-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
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[patent_no_of_words] => 11943
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[pdf_file] => publications/A1/0290/20070290700.pdf
[firstpage_image] =>[orig_patent_app_number] => 11881571
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/881571 | Wafer probe station having a skirting component | Jul 26, 2007 | Issued |
Array
(
[id] => 4702284
[patent_doc_number] => 20080061806
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-03-13
[patent_title] => 'PROBE SUBSTRATE FOR TEST AND MANUFACTURING METHOD THEREOF'
[patent_app_type] => utility
[patent_app_number] => 11/767705
[patent_app_country] => US
[patent_app_date] => 2007-06-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 15
[patent_figures_cnt] => 15
[patent_no_of_words] => 4459
[patent_no_of_claims] => 22
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0061/20080061806.pdf
[firstpage_image] =>[orig_patent_app_number] => 11767705
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/767705 | PROBE SUBSTRATE FOR TEST AND MANUFACTURING METHOD THEREOF | Jun 24, 2007 | Abandoned |
Array
(
[id] => 113092
[patent_doc_number] => 07719257
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-05-18
[patent_title] => 'Current sensing module and assembly method thereof'
[patent_app_type] => utility
[patent_app_number] => 11/759307
[patent_app_country] => US
[patent_app_date] => 2007-06-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 12
[patent_no_of_words] => 5951
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/719/07719257.pdf
[firstpage_image] =>[orig_patent_app_number] => 11759307
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/759307 | Current sensing module and assembly method thereof | Jun 6, 2007 | Issued |
Array
(
[id] => 152698
[patent_doc_number] => 07683606
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-03-23
[patent_title] => 'Flexible display testing and inspection'
[patent_app_type] => utility
[patent_app_number] => 11/752203
[patent_app_country] => US
[patent_app_date] => 2007-05-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
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[patent_no_of_words] => 5754
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[pdf_file] => patents/07/683/07683606.pdf
[firstpage_image] =>[orig_patent_app_number] => 11752203
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/752203 | Flexible display testing and inspection | May 21, 2007 | Issued |
Array
(
[id] => 594023
[patent_doc_number] => 07436193
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-10-14
[patent_title] => 'Thin film probe card contact drive system'
[patent_app_type] => utility
[patent_app_number] => 11/749622
[patent_app_country] => US
[patent_app_date] => 2007-05-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[patent_no_of_words] => 3622
[patent_no_of_claims] => 10
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/436/07436193.pdf
[firstpage_image] =>[orig_patent_app_number] => 11749622
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/749622 | Thin film probe card contact drive system | May 15, 2007 | Issued |
Array
(
[id] => 143043
[patent_doc_number] => 07688097
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-03-30
[patent_title] => 'Wafer probe'
[patent_app_type] => utility
[patent_app_number] => 11/796237
[patent_app_country] => US
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[pdf_file] => patents/07/688/07688097.pdf
[firstpage_image] =>[orig_patent_app_number] => 11796237
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/796237 | Wafer probe | Apr 25, 2007 | Issued |
Array
(
[id] => 174331
[patent_doc_number] => 07659711
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-02-09
[patent_title] => 'Test handler including single-door-type stockers'
[patent_app_type] => utility
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[pdf_file] => patents/07/659/07659711.pdf
[firstpage_image] =>[orig_patent_app_number] => 11723491
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/723491 | Test handler including single-door-type stockers | Mar 19, 2007 | Issued |
Array
(
[id] => 5217877
[patent_doc_number] => 20070159188
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-07-12
[patent_title] => 'Method for testing electronic modules using board with test contactors having beam contacts'
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[patent_app_number] => 11/714006
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[pdf_file] => publications/A1/0159/20070159188.pdf
[firstpage_image] =>[orig_patent_app_number] => 11714006
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/714006 | Method for testing electronic modules using board with test contactors having beam contacts | Mar 4, 2007 | Abandoned |
Array
(
[id] => 185938
[patent_doc_number] => 07649371
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-01-19
[patent_title] => 'Thermal stratification methods'
[patent_app_type] => utility
[patent_app_number] => 11/678674
[patent_app_country] => US
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[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/07/649/07649371.pdf
[firstpage_image] =>[orig_patent_app_number] => 11678674
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/678674 | Thermal stratification methods | Feb 25, 2007 | Issued |
Array
(
[id] => 315359
[patent_doc_number] => 07525332
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[patent_kind] => B2
[patent_issue_date] => 2009-04-28
[patent_title] => 'On-chip substrate regulator test mode'
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[firstpage_image] =>[orig_patent_app_number] => 11708979
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/708979 | On-chip substrate regulator test mode | Feb 20, 2007 | Issued |
Array
(
[id] => 5020034
[patent_doc_number] => 20070146000
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[patent_title] => 'Semiconductor test apparatus'
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[pdf_file] => publications/A1/0146/20070146000.pdf
[firstpage_image] =>[orig_patent_app_number] => 11708401
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/708401 | Semiconductor test apparatus | Feb 19, 2007 | Issued |
Array
(
[id] => 5228596
[patent_doc_number] => 20070290703
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[patent_kind] => A1
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[patent_title] => 'High Resolution Analytical Probe Station'
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[firstpage_image] =>[orig_patent_app_number] => 11676142
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/676142 | High Resolution Analytical Probe Station | Feb 15, 2007 | Abandoned |
Array
(
[id] => 5257181
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/627900 | Probe for electrical test and probe assembly | Jan 25, 2007 | Issued |
Array
(
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/627108 | Systems and methods for defect testing of externally accessible integrated circuit interconnects | Jan 24, 2007 | Issued |
Array
(
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[patent_title] => 'Universal grid composite circuit board testing tool'
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[firstpage_image] =>[orig_patent_app_number] => 11649303
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/649303 | Universal grid composite circuit board testing tool | Jan 3, 2007 | Issued |