Search

Scott R. Kastler

Examiner (ID: 10250, Phone: (571)272-1243 , Office: P/1733 )

Most Active Art Unit
1733
Art Unit(s)
1101, 1733, 2899, 1742, 1793, 1308, 1311
Total Applications
4528
Issued Applications
3615
Pending Applications
164
Abandoned Applications
754

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 4667617 [patent_doc_number] => 20080042677 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-02-21 [patent_title] => 'Wafer probe' [patent_app_type] => utility [patent_app_number] => 11/975175 [patent_app_country] => US [patent_app_date] => 2007-10-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3398 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0042/20080042677.pdf [firstpage_image] =>[orig_patent_app_number] => 11975175 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/975175
Wafer probe Oct 17, 2007 Issued
Array ( [id] => 4655283 [patent_doc_number] => 20080024143 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-01-31 [patent_title] => 'CLOSED-GRID BUS ARCHITECTURE FOR WAFER INTERCONNECT STRUCTURE' [patent_app_type] => utility [patent_app_number] => 11/866024 [patent_app_country] => US [patent_app_date] => 2007-10-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 7226 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0024/20080024143.pdf [firstpage_image] =>[orig_patent_app_number] => 11866024 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/866024
Closed-grid bus architecture for wafer interconnect structure Oct 1, 2007 Issued
Array ( [id] => 5163531 [patent_doc_number] => 20070285115 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-12-13 [patent_title] => 'UNIVERSAL WAFER CARRIER FOR WAFER LEVEL DIE BURN-IN' [patent_app_type] => utility [patent_app_number] => 11/841566 [patent_app_country] => US [patent_app_date] => 2007-08-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3947 [patent_no_of_claims] => 41 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0285/20070285115.pdf [firstpage_image] =>[orig_patent_app_number] => 11841566 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/841566
Universal wafer carrier for wafer level die burn-in Aug 19, 2007 Issued
Array ( [id] => 5414025 [patent_doc_number] => 20090039912 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-02-12 [patent_title] => 'Method of Acceptance for Semiconductor Devices' [patent_app_type] => utility [patent_app_number] => 11/837011 [patent_app_country] => US [patent_app_date] => 2007-08-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2325 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0039/20090039912.pdf [firstpage_image] =>[orig_patent_app_number] => 11837011 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/837011
Method of acceptance for semiconductor devices Aug 9, 2007 Issued
Array ( [id] => 5083336 [patent_doc_number] => 20070273387 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-11-29 [patent_title] => 'Optical testing device' [patent_app_type] => utility [patent_app_number] => 11/890987 [patent_app_country] => US [patent_app_date] => 2007-08-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3498 [patent_no_of_claims] => 31 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0273/20070273387.pdf [firstpage_image] =>[orig_patent_app_number] => 11890987 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/890987
Optical testing device Aug 6, 2007 Abandoned
Array ( [id] => 5228593 [patent_doc_number] => 20070290700 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-12-20 [patent_title] => 'Wafer probe station having a skirting component' [patent_app_type] => utility [patent_app_number] => 11/881571 [patent_app_country] => US [patent_app_date] => 2007-07-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 11943 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0290/20070290700.pdf [firstpage_image] =>[orig_patent_app_number] => 11881571 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/881571
Wafer probe station having a skirting component Jul 26, 2007 Issued
Array ( [id] => 4702284 [patent_doc_number] => 20080061806 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-03-13 [patent_title] => 'PROBE SUBSTRATE FOR TEST AND MANUFACTURING METHOD THEREOF' [patent_app_type] => utility [patent_app_number] => 11/767705 [patent_app_country] => US [patent_app_date] => 2007-06-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 4459 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0061/20080061806.pdf [firstpage_image] =>[orig_patent_app_number] => 11767705 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/767705
PROBE SUBSTRATE FOR TEST AND MANUFACTURING METHOD THEREOF Jun 24, 2007 Abandoned
Array ( [id] => 113092 [patent_doc_number] => 07719257 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-05-18 [patent_title] => 'Current sensing module and assembly method thereof' [patent_app_type] => utility [patent_app_number] => 11/759307 [patent_app_country] => US [patent_app_date] => 2007-06-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 12 [patent_no_of_words] => 5951 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 80 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/719/07719257.pdf [firstpage_image] =>[orig_patent_app_number] => 11759307 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/759307
Current sensing module and assembly method thereof Jun 6, 2007 Issued
Array ( [id] => 152698 [patent_doc_number] => 07683606 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-03-23 [patent_title] => 'Flexible display testing and inspection' [patent_app_type] => utility [patent_app_number] => 11/752203 [patent_app_country] => US [patent_app_date] => 2007-05-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 5754 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 113 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/683/07683606.pdf [firstpage_image] =>[orig_patent_app_number] => 11752203 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/752203
Flexible display testing and inspection May 21, 2007 Issued
Array ( [id] => 594023 [patent_doc_number] => 07436193 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-10-14 [patent_title] => 'Thin film probe card contact drive system' [patent_app_type] => utility [patent_app_number] => 11/749622 [patent_app_country] => US [patent_app_date] => 2007-05-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 3622 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 70 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/436/07436193.pdf [firstpage_image] =>[orig_patent_app_number] => 11749622 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/749622
Thin film probe card contact drive system May 15, 2007 Issued
Array ( [id] => 143043 [patent_doc_number] => 07688097 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-03-30 [patent_title] => 'Wafer probe' [patent_app_type] => utility [patent_app_number] => 11/796237 [patent_app_country] => US [patent_app_date] => 2007-04-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 5 [patent_no_of_words] => 3480 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 149 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/688/07688097.pdf [firstpage_image] =>[orig_patent_app_number] => 11796237 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/796237
Wafer probe Apr 25, 2007 Issued
Array ( [id] => 174331 [patent_doc_number] => 07659711 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-02-09 [patent_title] => 'Test handler including single-door-type stockers' [patent_app_type] => utility [patent_app_number] => 11/723491 [patent_app_country] => US [patent_app_date] => 2007-03-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 9 [patent_no_of_words] => 4150 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 69 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/659/07659711.pdf [firstpage_image] =>[orig_patent_app_number] => 11723491 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/723491
Test handler including single-door-type stockers Mar 19, 2007 Issued
Array ( [id] => 5217877 [patent_doc_number] => 20070159188 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-07-12 [patent_title] => 'Method for testing electronic modules using board with test contactors having beam contacts' [patent_app_type] => utility [patent_app_number] => 11/714006 [patent_app_country] => US [patent_app_date] => 2007-03-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 4996 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0159/20070159188.pdf [firstpage_image] =>[orig_patent_app_number] => 11714006 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/714006
Method for testing electronic modules using board with test contactors having beam contacts Mar 4, 2007 Abandoned
Array ( [id] => 185938 [patent_doc_number] => 07649371 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-01-19 [patent_title] => 'Thermal stratification methods' [patent_app_type] => utility [patent_app_number] => 11/678674 [patent_app_country] => US [patent_app_date] => 2007-02-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 21 [patent_no_of_words] => 10325 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 51 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/649/07649371.pdf [firstpage_image] =>[orig_patent_app_number] => 11678674 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/678674
Thermal stratification methods Feb 25, 2007 Issued
Array ( [id] => 315359 [patent_doc_number] => 07525332 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-04-28 [patent_title] => 'On-chip substrate regulator test mode' [patent_app_type] => utility [patent_app_number] => 11/708979 [patent_app_country] => US [patent_app_date] => 2007-02-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2930 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 144 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/525/07525332.pdf [firstpage_image] =>[orig_patent_app_number] => 11708979 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/708979
On-chip substrate regulator test mode Feb 20, 2007 Issued
Array ( [id] => 5020034 [patent_doc_number] => 20070146000 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-06-28 [patent_title] => 'Semiconductor test apparatus' [patent_app_type] => utility [patent_app_number] => 11/708401 [patent_app_country] => US [patent_app_date] => 2007-02-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 12288 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 10 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0146/20070146000.pdf [firstpage_image] =>[orig_patent_app_number] => 11708401 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/708401
Semiconductor test apparatus Feb 19, 2007 Issued
Array ( [id] => 5228596 [patent_doc_number] => 20070290703 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-12-20 [patent_title] => 'High Resolution Analytical Probe Station' [patent_app_type] => utility [patent_app_number] => 11/676142 [patent_app_country] => US [patent_app_date] => 2007-02-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 38 [patent_figures_cnt] => 38 [patent_no_of_words] => 33900 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0290/20070290703.pdf [firstpage_image] =>[orig_patent_app_number] => 11676142 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/676142
High Resolution Analytical Probe Station Feb 15, 2007 Abandoned
Array ( [id] => 5257181 [patent_doc_number] => 20070210813 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-09-13 [patent_title] => 'PROBE FOR ELECTRICAL TEST AND PROBE ASSEMBLY' [patent_app_type] => utility [patent_app_number] => 11/627900 [patent_app_country] => US [patent_app_date] => 2007-01-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 3542 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0210/20070210813.pdf [firstpage_image] =>[orig_patent_app_number] => 11627900 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/627900
Probe for electrical test and probe assembly Jan 25, 2007 Issued
Array ( [id] => 217662 [patent_doc_number] => 07612574 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-11-03 [patent_title] => 'Systems and methods for defect testing of externally accessible integrated circuit interconnects' [patent_app_type] => utility [patent_app_number] => 11/627108 [patent_app_country] => US [patent_app_date] => 2007-01-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 5721 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 107 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/612/07612574.pdf [firstpage_image] =>[orig_patent_app_number] => 11627108 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/627108
Systems and methods for defect testing of externally accessible integrated circuit interconnects Jan 24, 2007 Issued
Array ( [id] => 4925528 [patent_doc_number] => 20080164891 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-07-10 [patent_title] => 'Universal grid composite circuit board testing tool' [patent_app_type] => utility [patent_app_number] => 11/649303 [patent_app_country] => US [patent_app_date] => 2007-01-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2049 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0164/20080164891.pdf [firstpage_image] =>[orig_patent_app_number] => 11649303 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/649303
Universal grid composite circuit board testing tool Jan 3, 2007 Issued
Menu