
Scott R. Kastler
Examiner (ID: 10250, Phone: (571)272-1243 , Office: P/1733 )
| Most Active Art Unit | 1733 |
| Art Unit(s) | 1101, 1733, 2899, 1742, 1793, 1308, 1311 |
| Total Applications | 4528 |
| Issued Applications | 3615 |
| Pending Applications | 164 |
| Abandoned Applications | 754 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 240108
[patent_doc_number] => 07592828
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-09-22
[patent_title] => 'Method and device of measuring interface trap density in semiconductor device'
[patent_app_type] => utility
[patent_app_number] => 11/646806
[patent_app_country] => US
[patent_app_date] => 2006-12-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[patent_no_of_words] => 1787
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[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/592/07592828.pdf
[firstpage_image] =>[orig_patent_app_number] => 11646806
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/646806 | Method and device of measuring interface trap density in semiconductor device | Dec 26, 2006 | Issued |
Array
(
[id] => 5214104
[patent_doc_number] => 20070103184
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-05-10
[patent_title] => 'TDDB test pattern and method for testing TDDB of MOS capacitor dielectric'
[patent_app_type] => utility
[patent_app_number] => 11/643656
[patent_app_country] => US
[patent_app_date] => 2006-12-22
[patent_effective_date] => 0000-00-00
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/643656 | TDDB test pattern and method for testing TDDB of MOS capacitor dielectric | Dec 21, 2006 | Issued |
Array
(
[id] => 5251014
[patent_doc_number] => 20070132470
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-06-14
[patent_title] => 'Temperature characteristic inspection device'
[patent_app_type] => utility
[patent_app_number] => 11/637504
[patent_app_country] => US
[patent_app_date] => 2006-12-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
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[firstpage_image] =>[orig_patent_app_number] => 11637504
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/637504 | Temperature characteristic inspection device | Dec 10, 2006 | Issued |
Array
(
[id] => 307952
[patent_doc_number] => 07532026
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-05-12
[patent_title] => 'Testing device'
[patent_app_type] => utility
[patent_app_number] => 11/566161
[patent_app_country] => US
[patent_app_date] => 2006-12-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
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[patent_no_of_words] => 2225
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[pdf_file] => patents/07/532/07532026.pdf
[firstpage_image] =>[orig_patent_app_number] => 11566161
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/566161 | Testing device | Nov 30, 2006 | Issued |
Array
(
[id] => 4830284
[patent_doc_number] => 20080129310
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-06-05
[patent_title] => 'Zero Motion Contact Actuation'
[patent_app_type] => utility
[patent_app_number] => 11/565406
[patent_app_country] => US
[patent_app_date] => 2006-11-30
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0129/20080129310.pdf
[firstpage_image] =>[orig_patent_app_number] => 11565406
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/565406 | Zero motion contact actuation | Nov 29, 2006 | Issued |
Array
(
[id] => 7599348
[patent_doc_number] => 07583100
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-09-01
[patent_title] => 'Test head for testing electrical components'
[patent_app_type] => utility
[patent_app_number] => 11/606103
[patent_app_country] => US
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[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/07/583/07583100.pdf
[firstpage_image] =>[orig_patent_app_number] => 11606103
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/606103 | Test head for testing electrical components | Nov 29, 2006 | Issued |
Array
(
[id] => 5038573
[patent_doc_number] => 20070090855
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-04-26
[patent_title] => 'Method and apparatus for testing bumped die'
[patent_app_type] => utility
[patent_app_number] => 11/600994
[patent_app_country] => US
[patent_app_date] => 2006-11-17
[patent_effective_date] => 0000-00-00
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[patent_no_of_words] => 2816
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0090/20070090855.pdf
[firstpage_image] =>[orig_patent_app_number] => 11600994
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/600994 | Method and apparatus for testing bumped die | Nov 16, 2006 | Abandoned |
Array
(
[id] => 4686022
[patent_doc_number] => 20080030203
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-02-07
[patent_title] => 'System and Method for Utilizing an Automatic Circuit Tester System having Multiple Automatic Circuit Tester Platforms'
[patent_app_type] => utility
[patent_app_number] => 11/561000
[patent_app_country] => US
[patent_app_date] => 2006-11-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
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[pdf_file] => publications/A1/0030/20080030203.pdf
[firstpage_image] =>[orig_patent_app_number] => 11561000
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/561000 | System and method for utilizing an automatic circuit tester system having multiple automatic circuit tester platforms | Nov 16, 2006 | Issued |
Array
(
[id] => 5104847
[patent_doc_number] => 20070063722
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-03-22
[patent_title] => 'Method and apparatus for testing bumped die'
[patent_app_type] => utility
[patent_app_number] => 11/601546
[patent_app_country] => US
[patent_app_date] => 2006-11-17
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[pdf_file] => publications/A1/0063/20070063722.pdf
[firstpage_image] =>[orig_patent_app_number] => 11601546
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/601546 | Method and apparatus for testing bumped die | Nov 16, 2006 | Abandoned |
Array
(
[id] => 4997934
[patent_doc_number] => 20070040568
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-02-22
[patent_title] => 'Semiconductor device, driving method and inspection method thereof'
[patent_app_type] => utility
[patent_app_number] => 11/589082
[patent_app_country] => US
[patent_app_date] => 2006-10-30
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0040/20070040568.pdf
[firstpage_image] =>[orig_patent_app_number] => 11589082
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/589082 | Semiconductor device, driving method and inspection method thereof | Oct 29, 2006 | Issued |
Array
(
[id] => 5214100
[patent_doc_number] => 20070103180
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-05-10
[patent_title] => 'Universal wafer carrier for wafer level die burn-in'
[patent_app_type] => utility
[patent_app_number] => 11/588707
[patent_app_country] => US
[patent_app_date] => 2006-10-27
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0103/20070103180.pdf
[firstpage_image] =>[orig_patent_app_number] => 11588707
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/588707 | Universal wafer carrier for wafer level die burn-in | Oct 26, 2006 | Abandoned |
Array
(
[id] => 4743698
[patent_doc_number] => 20080088299
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-04-17
[patent_title] => 'ATTACHMENT DEVICE AND METHOD FOR FASTENING ELECTRICAL CABLE MONITORING INSTRUMENTS TO ELECTRICAL CABLES'
[patent_app_type] => utility
[patent_app_number] => 11/548700
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[firstpage_image] =>[orig_patent_app_number] => 11548700
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/548700 | Attachment device and method for fastening electrical cable monitoring instruments to electrical cables | Oct 11, 2006 | Issued |
Array
(
[id] => 253221
[patent_doc_number] => 07579857
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-08-25
[patent_title] => 'Electrical contact device of probe card'
[patent_app_type] => utility
[patent_app_number] => 11/505407
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[pdf_file] => patents/07/579/07579857.pdf
[firstpage_image] =>[orig_patent_app_number] => 11505407
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/505407 | Electrical contact device of probe card | Aug 16, 2006 | Issued |
Array
(
[id] => 5606102
[patent_doc_number] => 20060267618
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-11-30
[patent_title] => 'Characterizing circuit performance by separating device and interconnect impact on signal delay'
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[patent_app_number] => 11/498371
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[firstpage_image] =>[orig_patent_app_number] => 11498371
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/498371 | Characterizing circuit performance by separating device and interconnect impact on signal delay | Aug 2, 2006 | Issued |
Array
(
[id] => 5623334
[patent_doc_number] => 20060261839
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-11-23
[patent_title] => 'Motherboard memory slot ribbon cable and apparatus'
[patent_app_type] => utility
[patent_app_number] => 11/494038
[patent_app_country] => US
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[firstpage_image] =>[orig_patent_app_number] => 11494038
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/494038 | Methods of testing memory devices | Jul 26, 2006 | Issued |
Array
(
[id] => 5623329
[patent_doc_number] => 20060261834
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-11-23
[patent_title] => 'Construction and use of dielectric plate for mating test equipment to a load board of a circuit tester'
[patent_app_type] => utility
[patent_app_number] => 11/493330
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[firstpage_image] =>[orig_patent_app_number] => 11493330
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/493330 | Construction and use of dielectric plate for mating test equipment to a load board of a circuit tester | Jul 24, 2006 | Abandoned |
Array
(
[id] => 584922
[patent_doc_number] => 07453260
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[patent_issue_date] => 2008-11-18
[patent_title] => 'Testing circuits on substrate'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/492509 | Testing circuits on substrate | Jul 23, 2006 | Issued |
Array
(
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[patent_title] => 'Bond pad structure comprising multiple bond pads with metal overlap'
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Array
(
[id] => 5659555
[patent_doc_number] => 20060250151
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[patent_issue_date] => 2006-11-09
[patent_title] => 'Methods of making a resilient contact apparatus and resilient contact probes'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/483058 | Methods of making a resilient contact apparatus and resilient contact probes | Jul 5, 2006 | Abandoned |
Array
(
[id] => 572910
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[patent_title] => 'Shared memory bus architecture for system with processor and memory units'
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[firstpage_image] =>[orig_patent_app_number] => 11472016
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/472016 | Shared memory bus architecture for system with processor and memory units | Jun 19, 2006 | Issued |