Search

Scott R. Kastler

Examiner (ID: 10250, Phone: (571)272-1243 , Office: P/1733 )

Most Active Art Unit
1733
Art Unit(s)
1101, 1733, 2899, 1742, 1793, 1308, 1311
Total Applications
4528
Issued Applications
3615
Pending Applications
164
Abandoned Applications
754

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 240108 [patent_doc_number] => 07592828 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-09-22 [patent_title] => 'Method and device of measuring interface trap density in semiconductor device' [patent_app_type] => utility [patent_app_number] => 11/646806 [patent_app_country] => US [patent_app_date] => 2006-12-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 1787 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 83 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/592/07592828.pdf [firstpage_image] =>[orig_patent_app_number] => 11646806 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/646806
Method and device of measuring interface trap density in semiconductor device Dec 26, 2006 Issued
Array ( [id] => 5214104 [patent_doc_number] => 20070103184 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-05-10 [patent_title] => 'TDDB test pattern and method for testing TDDB of MOS capacitor dielectric' [patent_app_type] => utility [patent_app_number] => 11/643656 [patent_app_country] => US [patent_app_date] => 2006-12-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3400 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0103/20070103184.pdf [firstpage_image] =>[orig_patent_app_number] => 11643656 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/643656
TDDB test pattern and method for testing TDDB of MOS capacitor dielectric Dec 21, 2006 Issued
Array ( [id] => 5251014 [patent_doc_number] => 20070132470 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-06-14 [patent_title] => 'Temperature characteristic inspection device' [patent_app_type] => utility [patent_app_number] => 11/637504 [patent_app_country] => US [patent_app_date] => 2006-12-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 9851 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0132/20070132470.pdf [firstpage_image] =>[orig_patent_app_number] => 11637504 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/637504
Temperature characteristic inspection device Dec 10, 2006 Issued
Array ( [id] => 307952 [patent_doc_number] => 07532026 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-05-12 [patent_title] => 'Testing device' [patent_app_type] => utility [patent_app_number] => 11/566161 [patent_app_country] => US [patent_app_date] => 2006-12-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 2225 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 134 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/532/07532026.pdf [firstpage_image] =>[orig_patent_app_number] => 11566161 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/566161
Testing device Nov 30, 2006 Issued
Array ( [id] => 4830284 [patent_doc_number] => 20080129310 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-06-05 [patent_title] => 'Zero Motion Contact Actuation' [patent_app_type] => utility [patent_app_number] => 11/565406 [patent_app_country] => US [patent_app_date] => 2006-11-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2897 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0129/20080129310.pdf [firstpage_image] =>[orig_patent_app_number] => 11565406 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/565406
Zero motion contact actuation Nov 29, 2006 Issued
Array ( [id] => 7599348 [patent_doc_number] => 07583100 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-09-01 [patent_title] => 'Test head for testing electrical components' [patent_app_type] => utility [patent_app_number] => 11/606103 [patent_app_country] => US [patent_app_date] => 2006-11-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 5631 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 103 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/583/07583100.pdf [firstpage_image] =>[orig_patent_app_number] => 11606103 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/606103
Test head for testing electrical components Nov 29, 2006 Issued
Array ( [id] => 5038573 [patent_doc_number] => 20070090855 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-04-26 [patent_title] => 'Method and apparatus for testing bumped die' [patent_app_type] => utility [patent_app_number] => 11/600994 [patent_app_country] => US [patent_app_date] => 2006-11-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2816 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0090/20070090855.pdf [firstpage_image] =>[orig_patent_app_number] => 11600994 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/600994
Method and apparatus for testing bumped die Nov 16, 2006 Abandoned
Array ( [id] => 4686022 [patent_doc_number] => 20080030203 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-02-07 [patent_title] => 'System and Method for Utilizing an Automatic Circuit Tester System having Multiple Automatic Circuit Tester Platforms' [patent_app_type] => utility [patent_app_number] => 11/561000 [patent_app_country] => US [patent_app_date] => 2006-11-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 5972 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0030/20080030203.pdf [firstpage_image] =>[orig_patent_app_number] => 11561000 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/561000
System and method for utilizing an automatic circuit tester system having multiple automatic circuit tester platforms Nov 16, 2006 Issued
Array ( [id] => 5104847 [patent_doc_number] => 20070063722 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-03-22 [patent_title] => 'Method and apparatus for testing bumped die' [patent_app_type] => utility [patent_app_number] => 11/601546 [patent_app_country] => US [patent_app_date] => 2006-11-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2816 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0063/20070063722.pdf [firstpage_image] =>[orig_patent_app_number] => 11601546 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/601546
Method and apparatus for testing bumped die Nov 16, 2006 Abandoned
Array ( [id] => 4997934 [patent_doc_number] => 20070040568 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-02-22 [patent_title] => 'Semiconductor device, driving method and inspection method thereof' [patent_app_type] => utility [patent_app_number] => 11/589082 [patent_app_country] => US [patent_app_date] => 2006-10-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 8938 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0040/20070040568.pdf [firstpage_image] =>[orig_patent_app_number] => 11589082 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/589082
Semiconductor device, driving method and inspection method thereof Oct 29, 2006 Issued
Array ( [id] => 5214100 [patent_doc_number] => 20070103180 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-05-10 [patent_title] => 'Universal wafer carrier for wafer level die burn-in' [patent_app_type] => utility [patent_app_number] => 11/588707 [patent_app_country] => US [patent_app_date] => 2006-10-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3791 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0103/20070103180.pdf [firstpage_image] =>[orig_patent_app_number] => 11588707 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/588707
Universal wafer carrier for wafer level die burn-in Oct 26, 2006 Abandoned
Array ( [id] => 4743698 [patent_doc_number] => 20080088299 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-04-17 [patent_title] => 'ATTACHMENT DEVICE AND METHOD FOR FASTENING ELECTRICAL CABLE MONITORING INSTRUMENTS TO ELECTRICAL CABLES' [patent_app_type] => utility [patent_app_number] => 11/548700 [patent_app_country] => US [patent_app_date] => 2006-10-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 2670 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0088/20080088299.pdf [firstpage_image] =>[orig_patent_app_number] => 11548700 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/548700
Attachment device and method for fastening electrical cable monitoring instruments to electrical cables Oct 11, 2006 Issued
Array ( [id] => 253221 [patent_doc_number] => 07579857 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-08-25 [patent_title] => 'Electrical contact device of probe card' [patent_app_type] => utility [patent_app_number] => 11/505407 [patent_app_country] => US [patent_app_date] => 2006-08-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 29 [patent_no_of_words] => 3192 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 136 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/579/07579857.pdf [firstpage_image] =>[orig_patent_app_number] => 11505407 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/505407
Electrical contact device of probe card Aug 16, 2006 Issued
Array ( [id] => 5606102 [patent_doc_number] => 20060267618 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-11-30 [patent_title] => 'Characterizing circuit performance by separating device and interconnect impact on signal delay' [patent_app_type] => utility [patent_app_number] => 11/498371 [patent_app_country] => US [patent_app_date] => 2006-08-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 6255 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0267/20060267618.pdf [firstpage_image] =>[orig_patent_app_number] => 11498371 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/498371
Characterizing circuit performance by separating device and interconnect impact on signal delay Aug 2, 2006 Issued
Array ( [id] => 5623334 [patent_doc_number] => 20060261839 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-11-23 [patent_title] => 'Motherboard memory slot ribbon cable and apparatus' [patent_app_type] => utility [patent_app_number] => 11/494038 [patent_app_country] => US [patent_app_date] => 2006-07-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4524 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0261/20060261839.pdf [firstpage_image] =>[orig_patent_app_number] => 11494038 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/494038
Methods of testing memory devices Jul 26, 2006 Issued
Array ( [id] => 5623329 [patent_doc_number] => 20060261834 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-11-23 [patent_title] => 'Construction and use of dielectric plate for mating test equipment to a load board of a circuit tester' [patent_app_type] => utility [patent_app_number] => 11/493330 [patent_app_country] => US [patent_app_date] => 2006-07-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 1792 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0261/20060261834.pdf [firstpage_image] =>[orig_patent_app_number] => 11493330 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/493330
Construction and use of dielectric plate for mating test equipment to a load board of a circuit tester Jul 24, 2006 Abandoned
Array ( [id] => 584922 [patent_doc_number] => 07453260 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-11-18 [patent_title] => 'Testing circuits on substrate' [patent_app_type] => utility [patent_app_number] => 11/492509 [patent_app_country] => US [patent_app_date] => 2006-07-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 19 [patent_no_of_words] => 3462 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 129 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/453/07453260.pdf [firstpage_image] =>[orig_patent_app_number] => 11492509 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/492509
Testing circuits on substrate Jul 23, 2006 Issued
Array ( [id] => 5659543 [patent_doc_number] => 20060250139 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-11-09 [patent_title] => 'Bond pad structure comprising multiple bond pads with metal overlap' [patent_app_type] => utility [patent_app_number] => 11/485002 [patent_app_country] => US [patent_app_date] => 2006-07-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4103 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 22 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0250/20060250139.pdf [firstpage_image] =>[orig_patent_app_number] => 11485002 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/485002
Bond pad structure comprising multiple bond pads with metal overlap Jul 11, 2006 Abandoned
Array ( [id] => 5659555 [patent_doc_number] => 20060250151 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-11-09 [patent_title] => 'Methods of making a resilient contact apparatus and resilient contact probes' [patent_app_type] => utility [patent_app_number] => 11/483058 [patent_app_country] => US [patent_app_date] => 2006-07-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 9251 [patent_no_of_claims] => 35 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0250/20060250151.pdf [firstpage_image] =>[orig_patent_app_number] => 11483058 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/483058
Methods of making a resilient contact apparatus and resilient contact probes Jul 5, 2006 Abandoned
Array ( [id] => 572910 [patent_doc_number] => 07466160 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-12-16 [patent_title] => 'Shared memory bus architecture for system with processor and memory units' [patent_app_type] => utility [patent_app_number] => 11/472016 [patent_app_country] => US [patent_app_date] => 2006-06-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 22 [patent_figures_cnt] => 27 [patent_no_of_words] => 14338 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 124 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/466/07466160.pdf [firstpage_image] =>[orig_patent_app_number] => 11472016 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/472016
Shared memory bus architecture for system with processor and memory units Jun 19, 2006 Issued
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