
Scott R. Kastler
Examiner (ID: 10250, Phone: (571)272-1243 , Office: P/1733 )
| Most Active Art Unit | 1733 |
| Art Unit(s) | 1101, 1733, 2899, 1742, 1793, 1308, 1311 |
| Total Applications | 4528 |
| Issued Applications | 3615 |
| Pending Applications | 164 |
| Abandoned Applications | 754 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 390731
[patent_doc_number] => 07301327
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2007-11-27
[patent_title] => 'Testing of a system-on-a-chip having a programmable section and a plurality of high-speed interfaces'
[patent_app_type] => utility
[patent_app_number] => 11/449174
[patent_app_country] => US
[patent_app_date] => 2006-06-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 10
[patent_no_of_words] => 6396
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 112
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/301/07301327.pdf
[firstpage_image] =>[orig_patent_app_number] => 11449174
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/449174 | Testing of a system-on-a-chip having a programmable section and a plurality of high-speed interfaces | Jun 7, 2006 | Issued |
Array
(
[id] => 807569
[patent_doc_number] => 07420384
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2008-09-02
[patent_title] => 'Testing of a system-on-a-chip having a programmable section and a plurality of high-speed interfaces'
[patent_app_type] => utility
[patent_app_number] => 11/449173
[patent_app_country] => US
[patent_app_date] => 2006-06-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 10
[patent_no_of_words] => 6396
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 129
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/420/07420384.pdf
[firstpage_image] =>[orig_patent_app_number] => 11449173
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/449173 | Testing of a system-on-a-chip having a programmable section and a plurality of high-speed interfaces | Jun 7, 2006 | Issued |
Array
(
[id] => 5175534
[patent_doc_number] => 20070176592
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-08-02
[patent_title] => 'Portable information terminal apparatus, voltage measurement apparatus, voltage measurement method and program thereof'
[patent_app_type] => utility
[patent_app_number] => 11/442610
[patent_app_country] => US
[patent_app_date] => 2006-05-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 5506
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0176/20070176592.pdf
[firstpage_image] =>[orig_patent_app_number] => 11442610
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/442610 | Portable information terminal apparatus and voltage measurement apparatus | May 29, 2006 | Issued |
Array
(
[id] => 5089458
[patent_doc_number] => 20070229097
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-10-04
[patent_title] => 'Probe, probe card, and testing device'
[patent_app_type] => utility
[patent_app_number] => 11/439227
[patent_app_country] => US
[patent_app_date] => 2006-05-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 16
[patent_figures_cnt] => 16
[patent_no_of_words] => 5618
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0229/20070229097.pdf
[firstpage_image] =>[orig_patent_app_number] => 11439227
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/439227 | Probe, probe card, and testing device | May 23, 2006 | Abandoned |
Array
(
[id] => 470011
[patent_doc_number] => 07233158
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-06-19
[patent_title] => 'Air socket for testing integrated circuits'
[patent_app_type] => utility
[patent_app_number] => 11/435081
[patent_app_country] => US
[patent_app_date] => 2006-05-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 5404
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 174
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/233/07233158.pdf
[firstpage_image] =>[orig_patent_app_number] => 11435081
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/435081 | Air socket for testing integrated circuits | May 14, 2006 | Issued |
Array
(
[id] => 5606108
[patent_doc_number] => 20060267624
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-11-30
[patent_title] => 'Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component'
[patent_app_type] => utility
[patent_app_number] => 11/433845
[patent_app_country] => US
[patent_app_date] => 2006-05-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 20
[patent_figures_cnt] => 20
[patent_no_of_words] => 4416
[patent_no_of_claims] => 5
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0267/20060267624.pdf
[firstpage_image] =>[orig_patent_app_number] => 11433845
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/433845 | Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component | May 11, 2006 | Issued |
Array
(
[id] => 5849069
[patent_doc_number] => 20060232260
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-10-19
[patent_title] => 'COMPENSATION OF SIMPLE FIBRE OPTIC FARADAY EFFECT SENSORS'
[patent_app_type] => utility
[patent_app_number] => 11/382656
[patent_app_country] => US
[patent_app_date] => 2006-05-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 21
[patent_figures_cnt] => 21
[patent_no_of_words] => 8124
[patent_no_of_claims] => 15
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 0
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0232/20060232260.pdf
[firstpage_image] =>[orig_patent_app_number] => 11382656
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/382656 | Compensation of simple fibre optic Faraday effect sensors | May 9, 2006 | Issued |
Array
(
[id] => 373803
[patent_doc_number] => 07474108
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-01-06
[patent_title] => 'Apparatus and method for contacting of test objects'
[patent_app_type] => utility
[patent_app_number] => 11/398052
[patent_app_country] => US
[patent_app_date] => 2006-04-05
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 19
[patent_no_of_words] => 10192
[patent_no_of_claims] => 29
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[patent_words_short_claim] => 102
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/474/07474108.pdf
[firstpage_image] =>[orig_patent_app_number] => 11398052
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/398052 | Apparatus and method for contacting of test objects | Apr 4, 2006 | Issued |
Array
(
[id] => 904707
[patent_doc_number] => 07336094
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-02-26
[patent_title] => 'Carriage for liquid crystal module'
[patent_app_type] => utility
[patent_app_number] => 11/391206
[patent_app_country] => US
[patent_app_date] => 2006-03-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 12
[patent_no_of_words] => 5156
[patent_no_of_claims] => 14
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/336/07336094.pdf
[firstpage_image] =>[orig_patent_app_number] => 11391206
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/391206 | Carriage for liquid crystal module | Mar 28, 2006 | Issued |
Array
(
[id] => 286059
[patent_doc_number] => 07550988
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-06-23
[patent_title] => 'Test device with test parameter adaptation'
[patent_app_type] => utility
[patent_app_number] => 11/388306
[patent_app_country] => US
[patent_app_date] => 2006-03-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 7
[patent_no_of_words] => 8235
[patent_no_of_claims] => 16
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/550/07550988.pdf
[firstpage_image] =>[orig_patent_app_number] => 11388306
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/388306 | Test device with test parameter adaptation | Mar 21, 2006 | Issued |
Array
(
[id] => 373802
[patent_doc_number] => 07474107
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2009-01-06
[patent_title] => 'Buried short location determination using voltage contrast inspection'
[patent_app_type] => utility
[patent_app_number] => 11/308407
[patent_app_country] => US
[patent_app_date] => 2006-03-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
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[patent_no_of_words] => 3632
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/474/07474107.pdf
[firstpage_image] =>[orig_patent_app_number] => 11308407
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/308407 | Buried short location determination using voltage contrast inspection | Mar 21, 2006 | Issued |
Array
(
[id] => 4997932
[patent_doc_number] => 20070040566
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-02-22
[patent_title] => 'Testing assembly for electric test of electric package and testing socket thereof'
[patent_app_type] => utility
[patent_app_number] => 11/370305
[patent_app_country] => US
[patent_app_date] => 2006-03-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
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[pdf_file] => publications/A1/0040/20070040566.pdf
[firstpage_image] =>[orig_patent_app_number] => 11370305
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/370305 | Testing assembly for electric test of electric package and testing socket thereof | Mar 6, 2006 | Issued |
Array
(
[id] => 5640868
[patent_doc_number] => 20060279323
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-12-14
[patent_title] => 'Power apparatus for dividing high voltage'
[patent_app_type] => utility
[patent_app_number] => 11/362104
[patent_app_country] => US
[patent_app_date] => 2006-02-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0279/20060279323.pdf
[firstpage_image] =>[orig_patent_app_number] => 11362104
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/362104 | Power apparatus for dividing high voltage | Feb 26, 2006 | Abandoned |
Array
(
[id] => 390765
[patent_doc_number] => 07301361
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-11-27
[patent_title] => 'Logic circuit for board power-supply evaluation and board power-supply evaluating method'
[patent_app_type] => utility
[patent_app_number] => 11/357104
[patent_app_country] => US
[patent_app_date] => 2006-02-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/301/07301361.pdf
[firstpage_image] =>[orig_patent_app_number] => 11357104
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/357104 | Logic circuit for board power-supply evaluation and board power-supply evaluating method | Feb 20, 2006 | Issued |
Array
(
[id] => 5653299
[patent_doc_number] => 20060139034
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-06-29
[patent_title] => 'System and method for detecting the proximity of a body'
[patent_app_type] => utility
[patent_app_number] => 11/356595
[patent_app_country] => US
[patent_app_date] => 2006-02-16
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0139/20060139034.pdf
[firstpage_image] =>[orig_patent_app_number] => 11356595
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/356595 | System and method for detecting the proximity of a body | Feb 15, 2006 | Issued |
Array
(
[id] => 920243
[patent_doc_number] => 07321232
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-01-22
[patent_title] => 'Charge amount measurement method, shift value measurement method of charged beam, charge amount measuring device and shift value measuring device of charged beam'
[patent_app_type] => utility
[patent_app_number] => 11/348246
[patent_app_country] => US
[patent_app_date] => 2006-02-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/321/07321232.pdf
[firstpage_image] =>[orig_patent_app_number] => 11348246
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/348246 | Charge amount measurement method, shift value measurement method of charged beam, charge amount measuring device and shift value measuring device of charged beam | Feb 6, 2006 | Issued |
Array
(
[id] => 7595053
[patent_doc_number] => 07626408
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2009-12-01
[patent_title] => 'Electrical spring probe'
[patent_app_type] => utility
[patent_app_number] => 11/347502
[patent_app_country] => US
[patent_app_date] => 2006-02-03
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/07/626/07626408.pdf
[firstpage_image] =>[orig_patent_app_number] => 11347502
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/347502 | Electrical spring probe | Feb 2, 2006 | Issued |
Array
(
[id] => 5175553
[patent_doc_number] => 20070176611
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-08-02
[patent_title] => 'Method and apparatus for probing at arbitrary locations within an inaccessible array of leads the solder balls or pins actually connecting a VLSI IC package to a substrate or socket'
[patent_app_type] => utility
[patent_app_number] => 11/345007
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[pdf_file] => publications/A1/0176/20070176611.pdf
[firstpage_image] =>[orig_patent_app_number] => 11345007
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/345007 | Method and apparatus for probing at arbitrary locations within an inaccessible array of leads the solder balls or pins actually connecting a VLSI IC package to a substrate or socket | Jan 30, 2006 | Issued |
Array
(
[id] => 5594260
[patent_doc_number] => 20060158176
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[patent_kind] => A1
[patent_issue_date] => 2006-07-20
[patent_title] => 'Measuring method and measuring arrangement for measuring currents with a large dynamic range'
[patent_app_type] => utility
[patent_app_number] => 11/330603
[patent_app_country] => US
[patent_app_date] => 2006-01-12
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[pdf_file] => publications/A1/0158/20060158176.pdf
[firstpage_image] =>[orig_patent_app_number] => 11330603
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/330603 | Measuring method and measuring arrangement for measuring currents with a large dynamic range | Jan 11, 2006 | Issued |
Array
(
[id] => 5414018
[patent_doc_number] => 20090039905
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-02-12
[patent_title] => 'COMPOSITE CONDUCTIVE SHEET, METHOD FOR PRODUCING THE SAME, ANISOTROPIC CONDUCTIVE CONNECTOR, ADAPTER, AND CIRCUIT DEVICE ELECTRIC INSPECTION DEVICE'
[patent_app_type] => utility
[patent_app_number] => 11/815506
[patent_app_country] => US
[patent_app_date] => 2006-01-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
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[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0039/20090039905.pdf
[firstpage_image] =>[orig_patent_app_number] => 11815506
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/815506 | Composite conductive sheet, method for producing the same, anisotropic conductive connector, adapter, and circuit device electric inspection device | Jan 10, 2006 | Issued |