
Scott R. Kastler
Examiner (ID: 10250, Phone: (571)272-1243 , Office: P/1733 )
| Most Active Art Unit | 1733 |
| Art Unit(s) | 1101, 1733, 2899, 1742, 1793, 1308, 1311 |
| Total Applications | 4528 |
| Issued Applications | 3615 |
| Pending Applications | 164 |
| Abandoned Applications | 754 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 5612087
[patent_doc_number] => 20060114013
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-06-01
[patent_title] => 'Miniature fluid-cooled heat sink with integral heater'
[patent_app_type] => utility
[patent_app_number] => 11/326340
[patent_app_country] => US
[patent_app_date] => 2006-01-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
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[patent_no_of_words] => 5232
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[pdf_file] => publications/A1/0114/20060114013.pdf
[firstpage_image] =>[orig_patent_app_number] => 11326340
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/326340 | Miniature fluid-cooled heat sink with integral heater | Jan 5, 2006 | Issued |
Array
(
[id] => 4986351
[patent_doc_number] => 20070152689
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-07-05
[patent_title] => 'Modular probe card'
[patent_app_type] => utility
[patent_app_number] => 11/322408
[patent_app_country] => US
[patent_app_date] => 2006-01-03
[patent_effective_date] => 0000-00-00
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[firstpage_image] =>[orig_patent_app_number] => 11322408
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/322408 | Modular probe card | Jan 2, 2006 | Issued |
Array
(
[id] => 4986315
[patent_doc_number] => 20070152653
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[patent_kind] => A1
[patent_issue_date] => 2007-07-05
[patent_title] => 'System and method for reducing common-mode interference in differential or single-ended signals'
[patent_app_type] => utility
[patent_app_number] => 11/321503
[patent_app_country] => US
[patent_app_date] => 2005-12-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
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[pdf_file] => publications/A1/0152/20070152653.pdf
[firstpage_image] =>[orig_patent_app_number] => 11321503
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/321503 | System and method for reducing common-mode interference in differential or single-ended signals | Dec 28, 2005 | Abandoned |
Array
(
[id] => 5681280
[patent_doc_number] => 20060197547
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[patent_kind] => A1
[patent_issue_date] => 2006-09-07
[patent_title] => 'TEST APPARATUSES FOR INTEGRATED CIRCUITS AND METHOD FOR MANUFACTURING THE SAME'
[patent_app_type] => utility
[patent_app_number] => 11/306442
[patent_app_country] => US
[patent_app_date] => 2005-12-28
[patent_effective_date] => 0000-00-00
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[firstpage_image] =>[orig_patent_app_number] => 11306442
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/306442 | Test apparatuses for integrated circuits and method for manufacturing the same | Dec 27, 2005 | Issued |
Array
(
[id] => 5646424
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[patent_title] => 'Device and method for testing electronic components'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/316342 | Device and method for testing electronic components | Dec 22, 2005 | Issued |
Array
(
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[patent_title] => 'Probe card assembly'
[patent_app_type] => utility
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/317408 | Probe card assembly | Dec 21, 2005 | Issued |
Array
(
[id] => 889570
[patent_doc_number] => 07348787
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[patent_issue_date] => 2008-03-25
[patent_title] => 'Wafer probe station having environment control enclosure'
[patent_app_type] => utility
[patent_app_number] => 11/317400
[patent_app_country] => US
[patent_app_date] => 2005-12-22
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/07/348/07348787.pdf
[firstpage_image] =>[orig_patent_app_number] => 11317400
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/317400 | Wafer probe station having environment control enclosure | Dec 21, 2005 | Issued |
Array
(
[id] => 881602
[patent_doc_number] => 07355433
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-04-08
[patent_title] => 'Configurations and method for carrying out wafer level unclamped inductive switching (UIS) tests'
[patent_app_type] => utility
[patent_app_number] => 11/300082
[patent_app_country] => US
[patent_app_date] => 2005-12-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
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[pdf_file] => patents/07/355/07355433.pdf
[firstpage_image] =>[orig_patent_app_number] => 11300082
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/300082 | Configurations and method for carrying out wafer level unclamped inductive switching (UIS) tests | Dec 13, 2005 | Issued |
Array
(
[id] => 5169314
[patent_doc_number] => 20070069745
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-03-29
[patent_title] => 'PROBE CARD FOR INTEGRATED CIRCUITS'
[patent_app_type] => utility
[patent_app_number] => 11/164908
[patent_app_country] => US
[patent_app_date] => 2005-12-09
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[firstpage_image] =>[orig_patent_app_number] => 11164908
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/164908 | PROBE CARD FOR INTEGRATED CIRCUITS | Dec 8, 2005 | Abandoned |
Array
(
[id] => 377522
[patent_doc_number] => 07312624
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-12-25
[patent_title] => 'Substrate for electro-optical device, testing method thereof, electro-optical device and electronic apparatus'
[patent_app_type] => utility
[patent_app_number] => 11/295432
[patent_app_country] => US
[patent_app_date] => 2005-12-07
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[patent_drawing_sheets_cnt] => 24
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[firstpage_image] =>[orig_patent_app_number] => 11295432
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/295432 | Substrate for electro-optical device, testing method thereof, electro-optical device and electronic apparatus | Dec 6, 2005 | Issued |
Array
(
[id] => 233328
[patent_doc_number] => 07598757
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[patent_title] => 'Double ended contact probe'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/661102 | Double ended contact probe | Dec 5, 2005 | Issued |
Array
(
[id] => 5898940
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[patent_title] => 'Method and apparatus for inspecting integrated circuit pattern'
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Array
(
[id] => 5898999
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Array
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Array
(
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Array
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[id] => 338477
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[patent_title] => 'Automatic testing equipment instrument card and probe cabling system and apparatus'
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Array
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Array
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Array
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Array
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