Search

Scott R. Kastler

Examiner (ID: 10250, Phone: (571)272-1243 , Office: P/1733 )

Most Active Art Unit
1733
Art Unit(s)
1101, 1733, 2899, 1742, 1793, 1308, 1311
Total Applications
4528
Issued Applications
3615
Pending Applications
164
Abandoned Applications
754

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 5612087 [patent_doc_number] => 20060114013 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-06-01 [patent_title] => 'Miniature fluid-cooled heat sink with integral heater' [patent_app_type] => utility [patent_app_number] => 11/326340 [patent_app_country] => US [patent_app_date] => 2006-01-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 5232 [patent_no_of_claims] => 29 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0114/20060114013.pdf [firstpage_image] =>[orig_patent_app_number] => 11326340 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/326340
Miniature fluid-cooled heat sink with integral heater Jan 5, 2006 Issued
Array ( [id] => 4986351 [patent_doc_number] => 20070152689 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-07-05 [patent_title] => 'Modular probe card' [patent_app_type] => utility [patent_app_number] => 11/322408 [patent_app_country] => US [patent_app_date] => 2006-01-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2124 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0152/20070152689.pdf [firstpage_image] =>[orig_patent_app_number] => 11322408 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/322408
Modular probe card Jan 2, 2006 Issued
Array ( [id] => 4986315 [patent_doc_number] => 20070152653 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-07-05 [patent_title] => 'System and method for reducing common-mode interference in differential or single-ended signals' [patent_app_type] => utility [patent_app_number] => 11/321503 [patent_app_country] => US [patent_app_date] => 2005-12-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3561 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0152/20070152653.pdf [firstpage_image] =>[orig_patent_app_number] => 11321503 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/321503
System and method for reducing common-mode interference in differential or single-ended signals Dec 28, 2005 Abandoned
Array ( [id] => 5681280 [patent_doc_number] => 20060197547 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-09-07 [patent_title] => 'TEST APPARATUSES FOR INTEGRATED CIRCUITS AND METHOD FOR MANUFACTURING THE SAME' [patent_app_type] => utility [patent_app_number] => 11/306442 [patent_app_country] => US [patent_app_date] => 2005-12-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2183 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0197/20060197547.pdf [firstpage_image] =>[orig_patent_app_number] => 11306442 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/306442
Test apparatuses for integrated circuits and method for manufacturing the same Dec 27, 2005 Issued
Array ( [id] => 5646424 [patent_doc_number] => 20060132156 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-06-22 [patent_title] => 'Device and method for testing electronic components' [patent_app_type] => utility [patent_app_number] => 11/316342 [patent_app_country] => US [patent_app_date] => 2005-12-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 6653 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0132/20060132156.pdf [firstpage_image] =>[orig_patent_app_number] => 11316342 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/316342
Device and method for testing electronic components Dec 22, 2005 Issued
Array ( [id] => 5020022 [patent_doc_number] => 20070145988 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-06-28 [patent_title] => 'Probe card assembly' [patent_app_type] => utility [patent_app_number] => 11/317408 [patent_app_country] => US [patent_app_date] => 2005-12-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 7871 [patent_no_of_claims] => 86 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0145/20070145988.pdf [firstpage_image] =>[orig_patent_app_number] => 11317408 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/317408
Probe card assembly Dec 21, 2005 Issued
Array ( [id] => 889570 [patent_doc_number] => 07348787 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-03-25 [patent_title] => 'Wafer probe station having environment control enclosure' [patent_app_type] => utility [patent_app_number] => 11/317400 [patent_app_country] => US [patent_app_date] => 2005-12-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 12 [patent_no_of_words] => 4237 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 110 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/348/07348787.pdf [firstpage_image] =>[orig_patent_app_number] => 11317400 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/317400
Wafer probe station having environment control enclosure Dec 21, 2005 Issued
Array ( [id] => 881602 [patent_doc_number] => 07355433 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-04-08 [patent_title] => 'Configurations and method for carrying out wafer level unclamped inductive switching (UIS) tests' [patent_app_type] => utility [patent_app_number] => 11/300082 [patent_app_country] => US [patent_app_date] => 2005-12-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 9 [patent_no_of_words] => 3800 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 11 [patent_words_short_claim] => 68 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/355/07355433.pdf [firstpage_image] =>[orig_patent_app_number] => 11300082 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/300082
Configurations and method for carrying out wafer level unclamped inductive switching (UIS) tests Dec 13, 2005 Issued
Array ( [id] => 5169314 [patent_doc_number] => 20070069745 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-03-29 [patent_title] => 'PROBE CARD FOR INTEGRATED CIRCUITS' [patent_app_type] => utility [patent_app_number] => 11/164908 [patent_app_country] => US [patent_app_date] => 2005-12-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 3116 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0069/20070069745.pdf [firstpage_image] =>[orig_patent_app_number] => 11164908 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/164908
PROBE CARD FOR INTEGRATED CIRCUITS Dec 8, 2005 Abandoned
Array ( [id] => 377522 [patent_doc_number] => 07312624 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-12-25 [patent_title] => 'Substrate for electro-optical device, testing method thereof, electro-optical device and electronic apparatus' [patent_app_type] => utility [patent_app_number] => 11/295432 [patent_app_country] => US [patent_app_date] => 2005-12-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 24 [patent_figures_cnt] => 29 [patent_no_of_words] => 20483 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 235 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/312/07312624.pdf [firstpage_image] =>[orig_patent_app_number] => 11295432 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/295432
Substrate for electro-optical device, testing method thereof, electro-optical device and electronic apparatus Dec 6, 2005 Issued
Array ( [id] => 233328 [patent_doc_number] => 07598757 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-10-06 [patent_title] => 'Double ended contact probe' [patent_app_type] => utility [patent_app_number] => 11/661102 [patent_app_country] => US [patent_app_date] => 2005-12-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 13239 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 153 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/598/07598757.pdf [firstpage_image] =>[orig_patent_app_number] => 11661102 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/661102
Double ended contact probe Dec 5, 2005 Issued
Array ( [id] => 5898940 [patent_doc_number] => 20060043982 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-03-02 [patent_title] => 'Method and apparatus for inspecting integrated circuit pattern' [patent_app_type] => utility [patent_app_number] => 11/269617 [patent_app_country] => US [patent_app_date] => 2005-11-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 18 [patent_no_of_words] => 21963 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0043/20060043982.pdf [firstpage_image] =>[orig_patent_app_number] => 11269617 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/269617
Method and apparatus for inspecting integrated circuit pattern Nov 8, 2005 Issued
Array ( [id] => 5898999 [patent_doc_number] => 20060044002 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-03-02 [patent_title] => 'Enhanced sampling methodology for semiconductor processing' [patent_app_type] => utility [patent_app_number] => 11/268236 [patent_app_country] => US [patent_app_date] => 2005-11-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2156 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0044/20060044002.pdf [firstpage_image] =>[orig_patent_app_number] => 11268236 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/268236
Enhanced sampling methodology for semiconductor processing Nov 6, 2005 Issued
Array ( [id] => 5898984 [patent_doc_number] => 20060043988 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-03-02 [patent_title] => 'Methods of making a resilient contact apparatus and resilient contact probes' [patent_app_type] => utility [patent_app_number] => 11/269085 [patent_app_country] => US [patent_app_date] => 2005-11-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 9230 [patent_no_of_claims] => 45 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0043/20060043988.pdf [firstpage_image] =>[orig_patent_app_number] => 11269085 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/269085
Resilient contact probes Nov 6, 2005 Issued
Array ( [id] => 833969 [patent_doc_number] => 07397260 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-07-08 [patent_title] => 'Structure and method for monitoring stress-induced degradation of conductive interconnects' [patent_app_type] => utility [patent_app_number] => 11/163948 [patent_app_country] => US [patent_app_date] => 2005-11-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 7464 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 333 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/397/07397260.pdf [firstpage_image] =>[orig_patent_app_number] => 11163948 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/163948
Structure and method for monitoring stress-induced degradation of conductive interconnects Nov 3, 2005 Issued
Array ( [id] => 338477 [patent_doc_number] => 07504822 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-03-17 [patent_title] => 'Automatic testing equipment instrument card and probe cabling system and apparatus' [patent_app_type] => utility [patent_app_number] => 11/262001 [patent_app_country] => US [patent_app_date] => 2005-10-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 7 [patent_no_of_words] => 4214 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 108 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/504/07504822.pdf [firstpage_image] =>[orig_patent_app_number] => 11262001 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/262001
Automatic testing equipment instrument card and probe cabling system and apparatus Oct 27, 2005 Issued
Array ( [id] => 5032181 [patent_doc_number] => 20070096720 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-05-03 [patent_title] => 'Impedance calibration for source series terminated serial link transmitter' [patent_app_type] => utility [patent_app_number] => 11/262101 [patent_app_country] => US [patent_app_date] => 2005-10-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4981 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0096/20070096720.pdf [firstpage_image] =>[orig_patent_app_number] => 11262101 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/262101
Impedance calibration for source series terminated serial link transmitter Oct 27, 2005 Issued
Array ( [id] => 422269 [patent_doc_number] => 07274203 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-09-25 [patent_title] => 'Design-for-test circuit for low pin count devices' [patent_app_type] => utility [patent_app_number] => 11/257706 [patent_app_country] => US [patent_app_date] => 2005-10-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 11 [patent_no_of_words] => 10558 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 105 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/274/07274203.pdf [firstpage_image] =>[orig_patent_app_number] => 11257706 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/257706
Design-for-test circuit for low pin count devices Oct 24, 2005 Issued
Array ( [id] => 572883 [patent_doc_number] => 07466158 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-12-16 [patent_title] => 'Multilayer semiconductor device' [patent_app_type] => utility [patent_app_number] => 11/254703 [patent_app_country] => US [patent_app_date] => 2005-10-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 13 [patent_no_of_words] => 6151 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 88 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/466/07466158.pdf [firstpage_image] =>[orig_patent_app_number] => 11254703 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/254703
Multilayer semiconductor device Oct 20, 2005 Issued
Array ( [id] => 5796840 [patent_doc_number] => 20060033517 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-02-16 [patent_title] => 'Probe for semiconductor devices' [patent_app_type] => utility [patent_app_number] => 11/256514 [patent_app_country] => US [patent_app_date] => 2005-10-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 20 [patent_no_of_words] => 15785 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0033/20060033517.pdf [firstpage_image] =>[orig_patent_app_number] => 11256514 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/256514
Probe for semiconductor devices Oct 18, 2005 Issued
Menu