Search

Scott R. Kastler

Examiner (ID: 10250, Phone: (571)272-1243 , Office: P/1733 )

Most Active Art Unit
1733
Art Unit(s)
1101, 1733, 2899, 1742, 1793, 1308, 1311
Total Applications
4528
Issued Applications
3615
Pending Applications
164
Abandoned Applications
754

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 387117 [patent_doc_number] => 07304487 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-12-04 [patent_title] => 'Test method of semiconductor devices' [patent_app_type] => utility [patent_app_number] => 11/247245 [patent_app_country] => US [patent_app_date] => 2005-10-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 15 [patent_no_of_words] => 5991 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 157 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/304/07304487.pdf [firstpage_image] =>[orig_patent_app_number] => 11247245 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/247245
Test method of semiconductor devices Oct 11, 2005 Issued
Array ( [id] => 5692839 [patent_doc_number] => 20060152985 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-07-13 [patent_title] => 'Output power testing apparatus for memory' [patent_app_type] => utility [patent_app_number] => 11/236500 [patent_app_country] => US [patent_app_date] => 2005-09-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 1409 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0152/20060152985.pdf [firstpage_image] =>[orig_patent_app_number] => 11236500 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/236500
Output power testing apparatus for memory Sep 27, 2005 Abandoned
Array ( [id] => 881525 [patent_doc_number] => 07355417 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2008-04-08 [patent_title] => 'Techniques for obtaining electromagnetic data from a circuit board' [patent_app_type] => utility [patent_app_number] => 11/230706 [patent_app_country] => US [patent_app_date] => 2005-09-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4231 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 237 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/355/07355417.pdf [firstpage_image] =>[orig_patent_app_number] => 11230706 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/230706
Techniques for obtaining electromagnetic data from a circuit board Sep 19, 2005 Issued
Array ( [id] => 814115 [patent_doc_number] => 07414390 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-08-19 [patent_title] => 'Signal detection contactor and signal calibration system' [patent_app_type] => utility [patent_app_number] => 11/227324 [patent_app_country] => US [patent_app_date] => 2005-09-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 5748 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 158 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/414/07414390.pdf [firstpage_image] =>[orig_patent_app_number] => 11227324 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/227324
Signal detection contactor and signal calibration system Sep 15, 2005 Issued
Array ( [id] => 908610 [patent_doc_number] => 07332920 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2008-02-19 [patent_title] => 'Pulsed thermal monitor' [patent_app_type] => utility [patent_app_number] => 11/226876 [patent_app_country] => US [patent_app_date] => 2005-09-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 9 [patent_no_of_words] => 5094 [patent_no_of_claims] => 3 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 126 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/332/07332920.pdf [firstpage_image] =>[orig_patent_app_number] => 11226876 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/226876
Pulsed thermal monitor Sep 13, 2005 Issued
Array ( [id] => 7601319 [patent_doc_number] => 07385386 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-06-10 [patent_title] => 'Transporting mechanism, movable probe card transporting apparatus using transporting mechanism, and prober' [patent_app_type] => utility [patent_app_number] => 11/210859 [patent_app_country] => US [patent_app_date] => 2005-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 15 [patent_no_of_words] => 8332 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 130 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/385/07385386.pdf [firstpage_image] =>[orig_patent_app_number] => 11210859 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/210859
Transporting mechanism, movable probe card transporting apparatus using transporting mechanism, and prober Aug 24, 2005 Issued
Array ( [id] => 6929397 [patent_doc_number] => 20050280430 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-12-22 [patent_title] => 'Test method for electronic modules using movable test contactors' [patent_app_type] => utility [patent_app_number] => 11/210563 [patent_app_country] => US [patent_app_date] => 2005-08-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 4887 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0280/20050280430.pdf [firstpage_image] =>[orig_patent_app_number] => 11210563 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/210563
Test method for electronic modules using movable test contactors Aug 23, 2005 Issued
Array ( [id] => 338500 [patent_doc_number] => 07504845 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-03-17 [patent_title] => 'Spray cooling thermal management system and method for semiconductor probing, diagnostics, and failure analysis' [patent_app_type] => utility [patent_app_number] => 11/205898 [patent_app_country] => US [patent_app_date] => 2005-08-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 10 [patent_no_of_words] => 5482 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 51 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/504/07504845.pdf [firstpage_image] =>[orig_patent_app_number] => 11205898 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/205898
Spray cooling thermal management system and method for semiconductor probing, diagnostics, and failure analysis Aug 15, 2005 Issued
Array ( [id] => 5878600 [patent_doc_number] => 20060028200 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-02-09 [patent_title] => 'Chuck for holding a device under test' [patent_app_type] => utility [patent_app_number] => 11/204910 [patent_app_country] => US [patent_app_date] => 2005-08-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 5675 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0028/20060028200.pdf [firstpage_image] =>[orig_patent_app_number] => 11204910 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/204910
Chuck for holding a device under test Aug 14, 2005 Issued
Array ( [id] => 390730 [patent_doc_number] => 07301326 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2007-11-27 [patent_title] => 'Modular interface' [patent_app_type] => utility [patent_app_number] => 11/199646 [patent_app_country] => US [patent_app_date] => 2005-08-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 32 [patent_figures_cnt] => 32 [patent_no_of_words] => 9567 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 116 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/301/07301326.pdf [firstpage_image] =>[orig_patent_app_number] => 11199646 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/199646
Modular interface Aug 8, 2005 Issued
Array ( [id] => 602934 [patent_doc_number] => 07432698 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2008-10-07 [patent_title] => 'Modular active test probe and removable tip module therefor' [patent_app_type] => utility [patent_app_number] => 11/197911 [patent_app_country] => US [patent_app_date] => 2005-08-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 5288 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 194 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/432/07432698.pdf [firstpage_image] =>[orig_patent_app_number] => 11197911 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/197911
Modular active test probe and removable tip module therefor Aug 3, 2005 Issued
Array ( [id] => 465714 [patent_doc_number] => 07239125 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-07-03 [patent_title] => 'Method and apparatus for electronic meter testing' [patent_app_type] => utility [patent_app_number] => 11/194833 [patent_app_country] => US [patent_app_date] => 2005-08-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 10 [patent_no_of_words] => 5876 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 121 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/239/07239125.pdf [firstpage_image] =>[orig_patent_app_number] => 11194833 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/194833
Method and apparatus for electronic meter testing Jul 31, 2005 Issued
Array ( [id] => 5795950 [patent_doc_number] => 20060032627 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-02-16 [patent_title] => 'Burn-in apparatus' [patent_app_type] => utility [patent_app_number] => 11/195004 [patent_app_country] => US [patent_app_date] => 2005-08-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 10009 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0032/20060032627.pdf [firstpage_image] =>[orig_patent_app_number] => 11195004 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/195004
Burn-in apparatus Jul 31, 2005 Issued
Array ( [id] => 873718 [patent_doc_number] => 07362119 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-04-22 [patent_title] => 'Torsion spring probe contactor design' [patent_app_type] => utility [patent_app_number] => 11/194801 [patent_app_country] => US [patent_app_date] => 2005-08-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 30 [patent_no_of_words] => 6514 [patent_no_of_claims] => 46 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 188 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/362/07362119.pdf [firstpage_image] =>[orig_patent_app_number] => 11194801 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/194801
Torsion spring probe contactor design Jul 31, 2005 Issued
Array ( [id] => 915672 [patent_doc_number] => 07327154 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-02-05 [patent_title] => 'Multichip package test' [patent_app_type] => utility [patent_app_number] => 11/191494 [patent_app_country] => US [patent_app_date] => 2005-07-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 4 [patent_no_of_words] => 1290 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 95 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/327/07327154.pdf [firstpage_image] =>[orig_patent_app_number] => 11191494 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/191494
Multichip package test Jul 26, 2005 Issued
Array ( [id] => 7216587 [patent_doc_number] => 20050253575 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-11-17 [patent_title] => 'Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method' [patent_app_type] => utility [patent_app_number] => 11/179538 [patent_app_country] => US [patent_app_date] => 2005-07-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 17 [patent_no_of_words] => 15666 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0253/20050253575.pdf [firstpage_image] =>[orig_patent_app_number] => 11179538 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/179538
Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method Jul 12, 2005 Issued
Array ( [id] => 562258 [patent_doc_number] => 07161373 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-01-09 [patent_title] => 'Method for testing using a universal wafer carrier for wafer level die burn-in' [patent_app_type] => utility [patent_app_number] => 11/172326 [patent_app_country] => US [patent_app_date] => 2005-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 3775 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 202 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/161/07161373.pdf [firstpage_image] =>[orig_patent_app_number] => 11172326 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/172326
Method for testing using a universal wafer carrier for wafer level die burn-in Jun 29, 2005 Issued
Array ( [id] => 549038 [patent_doc_number] => 07167014 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-01-23 [patent_title] => 'Method for testing using a universal wafer carrier for wafer level die burn-in' [patent_app_type] => utility [patent_app_number] => 11/170901 [patent_app_country] => US [patent_app_date] => 2005-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 3776 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 224 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/167/07167014.pdf [firstpage_image] =>[orig_patent_app_number] => 11170901 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/170901
Method for testing using a universal wafer carrier for wafer level die burn-in Jun 29, 2005 Issued
Array ( [id] => 7216765 [patent_doc_number] => 20050253620 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-11-17 [patent_title] => 'Method for testing using a universal wafer carrier for wafer level die burn-in' [patent_app_type] => utility [patent_app_number] => 11/172327 [patent_app_country] => US [patent_app_date] => 2005-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3773 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0253/20050253620.pdf [firstpage_image] =>[orig_patent_app_number] => 11172327 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/172327
Method for testing using a universal wafer carrier for wafer level die burn-in Jun 29, 2005 Issued
Array ( [id] => 620579 [patent_doc_number] => 07141997 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-11-28 [patent_title] => 'Method for testing using a universal wafer carrier for wafer level die burn-in' [patent_app_type] => utility [patent_app_number] => 11/171153 [patent_app_country] => US [patent_app_date] => 2005-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 3771 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 184 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/141/07141997.pdf [firstpage_image] =>[orig_patent_app_number] => 11171153 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/171153
Method for testing using a universal wafer carrier for wafer level die burn-in Jun 29, 2005 Issued
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