Search

Scott R. Kastler

Examiner (ID: 10250, Phone: (571)272-1243 , Office: P/1733 )

Most Active Art Unit
1733
Art Unit(s)
1101, 1733, 2899, 1742, 1793, 1308, 1311
Total Applications
4528
Issued Applications
3615
Pending Applications
164
Abandoned Applications
754

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 6923820 [patent_doc_number] => 20050237075 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-10-27 [patent_title] => 'Method for testing using a universal wafer carrier for wafer level die burn-in' [patent_app_type] => utility [patent_app_number] => 11/170852 [patent_app_country] => US [patent_app_date] => 2005-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3773 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0237/20050237075.pdf [firstpage_image] =>[orig_patent_app_number] => 11170852 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/170852
Method for testing using a universal wafer carrier for wafer level die burn-in Jun 29, 2005 Issued
Array ( [id] => 893396 [patent_doc_number] => 07345501 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-03-18 [patent_title] => 'Electro-optical device, electronic apparatus, and mounting structure' [patent_app_type] => utility [patent_app_number] => 11/159701 [patent_app_country] => US [patent_app_date] => 2005-06-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 9 [patent_no_of_words] => 9906 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 247 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/345/07345501.pdf [firstpage_image] =>[orig_patent_app_number] => 11159701 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/159701
Electro-optical device, electronic apparatus, and mounting structure Jun 22, 2005 Issued
Array ( [id] => 432786 [patent_doc_number] => 07265563 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-09-04 [patent_title] => 'Test method for semiconductor components using anisotropic conductive polymer contact system' [patent_app_type] => utility [patent_app_number] => 11/152712 [patent_app_country] => US [patent_app_date] => 2005-06-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 22 [patent_no_of_words] => 4461 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 166 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/265/07265563.pdf [firstpage_image] =>[orig_patent_app_number] => 11152712 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/152712
Test method for semiconductor components using anisotropic conductive polymer contact system Jun 14, 2005 Issued
Array ( [id] => 5606090 [patent_doc_number] => 20060267606 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-11-30 [patent_title] => 'Signal probe and probe assembly' [patent_app_type] => utility [patent_app_number] => 11/141500 [patent_app_country] => US [patent_app_date] => 2005-05-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 5501 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0267/20060267606.pdf [firstpage_image] =>[orig_patent_app_number] => 11141500 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/141500
Signal probe and probe assembly May 30, 2005 Issued
Array ( [id] => 5606105 [patent_doc_number] => 20060267621 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-11-30 [patent_title] => 'On-chip apparatus and method for determining integrated circuit stress conditions' [patent_app_type] => utility [patent_app_number] => 11/140605 [patent_app_country] => US [patent_app_date] => 2005-05-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 6970 [patent_no_of_claims] => 45 [patent_no_of_ind_claims] => 9 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0267/20060267621.pdf [firstpage_image] =>[orig_patent_app_number] => 11140605 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/140605
On-chip apparatus and method for determining integrated circuit stress conditions May 26, 2005 Abandoned
Array ( [id] => 664376 [patent_doc_number] => 07102344 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2006-09-05 [patent_title] => 'Circuit tester' [patent_app_type] => utility [patent_app_number] => 11/139001 [patent_app_country] => US [patent_app_date] => 2005-05-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 3 [patent_no_of_words] => 1644 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 413 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/102/07102344.pdf [firstpage_image] =>[orig_patent_app_number] => 11139001 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/139001
Circuit tester May 26, 2005 Issued
Array ( [id] => 93474 [patent_doc_number] => 07737707 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-06-15 [patent_title] => 'Sheet-like probe, method of producing the probe, and application of the probe' [patent_app_type] => utility [patent_app_number] => 11/587401 [patent_app_country] => US [patent_app_date] => 2005-04-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 45 [patent_figures_cnt] => 45 [patent_no_of_words] => 33210 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 254 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/737/07737707.pdf [firstpage_image] =>[orig_patent_app_number] => 11587401 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/587401
Sheet-like probe, method of producing the probe, and application of the probe Apr 25, 2005 Issued
Array ( [id] => 911630 [patent_doc_number] => 07330023 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-02-12 [patent_title] => 'Wafer probe station having a skirting component' [patent_app_type] => utility [patent_app_number] => 11/112813 [patent_app_country] => US [patent_app_date] => 2005-04-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 19 [patent_no_of_words] => 11984 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 158 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/330/07330023.pdf [firstpage_image] =>[orig_patent_app_number] => 11112813 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/112813
Wafer probe station having a skirting component Apr 20, 2005 Issued
Array ( [id] => 6910376 [patent_doc_number] => 20050174134 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-08-11 [patent_title] => 'Method and apparatus for testing bumped die' [patent_app_type] => utility [patent_app_number] => 11/101220 [patent_app_country] => US [patent_app_date] => 2005-04-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2782 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0174/20050174134.pdf [firstpage_image] =>[orig_patent_app_number] => 11101220 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/101220
Method and apparatus for testing bumped die Apr 6, 2005 Abandoned
Array ( [id] => 908614 [patent_doc_number] => 07332922 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-02-19 [patent_title] => 'Method for fabricating a structure for making contact with a device' [patent_app_type] => utility [patent_app_number] => 11/101309 [patent_app_country] => US [patent_app_date] => 2005-04-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 13 [patent_no_of_words] => 2918 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 185 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/332/07332922.pdf [firstpage_image] =>[orig_patent_app_number] => 11101309 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/101309
Method for fabricating a structure for making contact with a device Apr 6, 2005 Issued
Array ( [id] => 6950245 [patent_doc_number] => 20050225339 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-10-13 [patent_title] => 'Double side probing of semiconductor devices' [patent_app_type] => utility [patent_app_number] => 11/095808 [patent_app_country] => US [patent_app_date] => 2005-03-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 1624 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0225/20050225339.pdf [firstpage_image] =>[orig_patent_app_number] => 11095808 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/095808
Double side probing of semiconductor devices Mar 29, 2005 Issued
Array ( [id] => 7185022 [patent_doc_number] => 20050162175 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-07-28 [patent_title] => 'Charging voltage measuring device for substrate and ion beam irradiating device' [patent_app_type] => utility [patent_app_number] => 11/089984 [patent_app_country] => US [patent_app_date] => 2005-03-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 6899 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0162/20050162175.pdf [firstpage_image] =>[orig_patent_app_number] => 11089984 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/089984
Charging voltage measuring device for substrate and ion beam irradiating device Mar 24, 2005 Issued
Array ( [id] => 5262755 [patent_doc_number] => 20090115440 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-05-07 [patent_title] => 'TESTING INTEGRATED CIRCUITS' [patent_app_type] => utility [patent_app_number] => 10/594404 [patent_app_country] => US [patent_app_date] => 2005-03-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2304 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0115/20090115440.pdf [firstpage_image] =>[orig_patent_app_number] => 10594404 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/594404
TESTING INTEGRATED CIRCUITS Mar 22, 2005 Abandoned
Array ( [id] => 904656 [patent_doc_number] => 07336064 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-02-26 [patent_title] => 'Apparatus for current measurement' [patent_app_type] => utility [patent_app_number] => 11/085153 [patent_app_country] => US [patent_app_date] => 2005-03-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 6 [patent_no_of_words] => 3699 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 191 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/336/07336064.pdf [firstpage_image] =>[orig_patent_app_number] => 11085153 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/085153
Apparatus for current measurement Mar 21, 2005 Issued
Array ( [id] => 785930 [patent_doc_number] => 06989682 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2006-01-24 [patent_title] => 'Test key on a wafer' [patent_app_type] => utility [patent_app_number] => 10/907007 [patent_app_country] => US [patent_app_date] => 2005-03-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 2388 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 71 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/989/06989682.pdf [firstpage_image] =>[orig_patent_app_number] => 10907007 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/907007
Test key on a wafer Mar 15, 2005 Issued
Array ( [id] => 5805545 [patent_doc_number] => 20060091898 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-05-04 [patent_title] => 'Unknown' [patent_app_type] => utility [patent_app_number] => 11/079303 [patent_app_country] => US [patent_app_date] => 2005-03-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 1410 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0091/20060091898.pdf [firstpage_image] =>[orig_patent_app_number] => 11079303 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/079303
Process and circuit for protection of test contacts in high current measurement of semiconductor components Mar 14, 2005 Issued
Array ( [id] => 335707 [patent_doc_number] => 07509051 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-03-24 [patent_title] => 'Transceiver module with voltage regulation and filtering' [patent_app_type] => utility [patent_app_number] => 11/058115 [patent_app_country] => US [patent_app_date] => 2005-02-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 3 [patent_no_of_words] => 2455 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 164 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/509/07509051.pdf [firstpage_image] =>[orig_patent_app_number] => 11058115 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/058115
Transceiver module with voltage regulation and filtering Feb 14, 2005 Issued
Array ( [id] => 762524 [patent_doc_number] => 07012439 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-03-14 [patent_title] => 'Multiple directional scans of test structures on semiconductor integrated circuits' [patent_app_type] => utility [patent_app_number] => 11/058943 [patent_app_country] => US [patent_app_date] => 2005-02-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 35 [patent_figures_cnt] => 52 [patent_no_of_words] => 22962 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 172 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/012/07012439.pdf [firstpage_image] =>[orig_patent_app_number] => 11058943 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/058943
Multiple directional scans of test structures on semiconductor integrated circuits Feb 14, 2005 Issued
Array ( [id] => 487980 [patent_doc_number] => 07218128 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-05-15 [patent_title] => 'Method and apparatus for locating and testing a chip' [patent_app_type] => utility [patent_app_number] => 10/906306 [patent_app_country] => US [patent_app_date] => 2005-02-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 8 [patent_no_of_words] => 6001 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 73 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/218/07218128.pdf [firstpage_image] =>[orig_patent_app_number] => 10906306 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/906306
Method and apparatus for locating and testing a chip Feb 13, 2005 Issued
Array ( [id] => 243781 [patent_doc_number] => 07589518 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-09-15 [patent_title] => 'Wafer probe station having a skirting component' [patent_app_type] => utility [patent_app_number] => 11/056647 [patent_app_country] => US [patent_app_date] => 2005-02-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 19 [patent_no_of_words] => 12108 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 96 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/589/07589518.pdf [firstpage_image] =>[orig_patent_app_number] => 11056647 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/056647
Wafer probe station having a skirting component Feb 10, 2005 Issued
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