
Scott R. Kastler
Examiner (ID: 10250, Phone: (571)272-1243 , Office: P/1733 )
| Most Active Art Unit | 1733 |
| Art Unit(s) | 1101, 1733, 2899, 1742, 1793, 1308, 1311 |
| Total Applications | 4528 |
| Issued Applications | 3615 |
| Pending Applications | 164 |
| Abandoned Applications | 754 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 6923820
[patent_doc_number] => 20050237075
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-10-27
[patent_title] => 'Method for testing using a universal wafer carrier for wafer level die burn-in'
[patent_app_type] => utility
[patent_app_number] => 11/170852
[patent_app_country] => US
[patent_app_date] => 2005-06-30
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0237/20050237075.pdf
[firstpage_image] =>[orig_patent_app_number] => 11170852
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/170852 | Method for testing using a universal wafer carrier for wafer level die burn-in | Jun 29, 2005 | Issued |
Array
(
[id] => 893396
[patent_doc_number] => 07345501
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-03-18
[patent_title] => 'Electro-optical device, electronic apparatus, and mounting structure'
[patent_app_type] => utility
[patent_app_number] => 11/159701
[patent_app_country] => US
[patent_app_date] => 2005-06-23
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[pdf_file] => patents/07/345/07345501.pdf
[firstpage_image] =>[orig_patent_app_number] => 11159701
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/159701 | Electro-optical device, electronic apparatus, and mounting structure | Jun 22, 2005 | Issued |
Array
(
[id] => 432786
[patent_doc_number] => 07265563
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-09-04
[patent_title] => 'Test method for semiconductor components using anisotropic conductive polymer contact system'
[patent_app_type] => utility
[patent_app_number] => 11/152712
[patent_app_country] => US
[patent_app_date] => 2005-06-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
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[pdf_file] => patents/07/265/07265563.pdf
[firstpage_image] =>[orig_patent_app_number] => 11152712
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/152712 | Test method for semiconductor components using anisotropic conductive polymer contact system | Jun 14, 2005 | Issued |
Array
(
[id] => 5606090
[patent_doc_number] => 20060267606
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-11-30
[patent_title] => 'Signal probe and probe assembly'
[patent_app_type] => utility
[patent_app_number] => 11/141500
[patent_app_country] => US
[patent_app_date] => 2005-05-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
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[patent_no_of_words] => 5501
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[firstpage_image] =>[orig_patent_app_number] => 11141500
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/141500 | Signal probe and probe assembly | May 30, 2005 | Issued |
Array
(
[id] => 5606105
[patent_doc_number] => 20060267621
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-11-30
[patent_title] => 'On-chip apparatus and method for determining integrated circuit stress conditions'
[patent_app_type] => utility
[patent_app_number] => 11/140605
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[patent_app_date] => 2005-05-27
[patent_effective_date] => 0000-00-00
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[firstpage_image] =>[orig_patent_app_number] => 11140605
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/140605 | On-chip apparatus and method for determining integrated circuit stress conditions | May 26, 2005 | Abandoned |
Array
(
[id] => 664376
[patent_doc_number] => 07102344
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2006-09-05
[patent_title] => 'Circuit tester'
[patent_app_type] => utility
[patent_app_number] => 11/139001
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[pdf_file] => patents/07/102/07102344.pdf
[firstpage_image] =>[orig_patent_app_number] => 11139001
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/139001 | Circuit tester | May 26, 2005 | Issued |
Array
(
[id] => 93474
[patent_doc_number] => 07737707
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-06-15
[patent_title] => 'Sheet-like probe, method of producing the probe, and application of the probe'
[patent_app_type] => utility
[patent_app_number] => 11/587401
[patent_app_country] => US
[patent_app_date] => 2005-04-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 45
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[patent_no_of_words] => 33210
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[pdf_file] => patents/07/737/07737707.pdf
[firstpage_image] =>[orig_patent_app_number] => 11587401
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/587401 | Sheet-like probe, method of producing the probe, and application of the probe | Apr 25, 2005 | Issued |
Array
(
[id] => 911630
[patent_doc_number] => 07330023
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-02-12
[patent_title] => 'Wafer probe station having a skirting component'
[patent_app_type] => utility
[patent_app_number] => 11/112813
[patent_app_country] => US
[patent_app_date] => 2005-04-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
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[patent_no_of_words] => 11984
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[pdf_file] => patents/07/330/07330023.pdf
[firstpage_image] =>[orig_patent_app_number] => 11112813
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/112813 | Wafer probe station having a skirting component | Apr 20, 2005 | Issued |
Array
(
[id] => 6910376
[patent_doc_number] => 20050174134
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-08-11
[patent_title] => 'Method and apparatus for testing bumped die'
[patent_app_type] => utility
[patent_app_number] => 11/101220
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[patent_app_date] => 2005-04-07
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[pdf_file] => publications/A1/0174/20050174134.pdf
[firstpage_image] =>[orig_patent_app_number] => 11101220
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/101220 | Method and apparatus for testing bumped die | Apr 6, 2005 | Abandoned |
Array
(
[id] => 908614
[patent_doc_number] => 07332922
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-02-19
[patent_title] => 'Method for fabricating a structure for making contact with a device'
[patent_app_type] => utility
[patent_app_number] => 11/101309
[patent_app_country] => US
[patent_app_date] => 2005-04-07
[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/07/332/07332922.pdf
[firstpage_image] =>[orig_patent_app_number] => 11101309
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/101309 | Method for fabricating a structure for making contact with a device | Apr 6, 2005 | Issued |
Array
(
[id] => 6950245
[patent_doc_number] => 20050225339
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[patent_title] => 'Double side probing of semiconductor devices'
[patent_app_type] => utility
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[firstpage_image] =>[orig_patent_app_number] => 11095808
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/095808 | Double side probing of semiconductor devices | Mar 29, 2005 | Issued |
Array
(
[id] => 7185022
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[patent_title] => 'Charging voltage measuring device for substrate and ion beam irradiating device'
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Array
(
[id] => 5262755
[patent_doc_number] => 20090115440
[patent_country] => US
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[patent_title] => 'TESTING INTEGRATED CIRCUITS'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/594404 | TESTING INTEGRATED CIRCUITS | Mar 22, 2005 | Abandoned |
Array
(
[id] => 904656
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[patent_title] => 'Apparatus for current measurement'
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[firstpage_image] =>[orig_patent_app_number] => 11085153
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/085153 | Apparatus for current measurement | Mar 21, 2005 | Issued |
Array
(
[id] => 785930
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/907007 | Test key on a wafer | Mar 15, 2005 | Issued |
Array
(
[id] => 5805545
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/079303 | Process and circuit for protection of test contacts in high current measurement of semiconductor components | Mar 14, 2005 | Issued |
Array
(
[id] => 335707
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Array
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Array
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Array
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