Search

Siming Liu

Examiner (ID: 7038, Phone: (571)270-3859 , Office: P/2413 )

Most Active Art Unit
2411
Art Unit(s)
2413, 2472, 2416, 2411
Total Applications
686
Issued Applications
539
Pending Applications
45
Abandoned Applications
106

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 5537237 [patent_doc_number] => 20090219042 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-09-03 [patent_title] => 'Probe card' [patent_app_type] => utility [patent_app_number] => 11/991296 [patent_app_country] => US [patent_app_date] => 2006-08-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 8075 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0219/20090219042.pdf [firstpage_image] =>[orig_patent_app_number] => 11991296 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/991296
Probe card Aug 29, 2006 Issued
Array ( [id] => 5600019 [patent_doc_number] => 20060290364 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-12-28 [patent_title] => 'Cable terminal with flexible contacts' [patent_app_type] => utility [patent_app_number] => 11/512553 [patent_app_country] => US [patent_app_date] => 2006-08-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2881 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0290/20060290364.pdf [firstpage_image] =>[orig_patent_app_number] => 11512553 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/512553
Cable terminal with flexible contacts Aug 28, 2006 Abandoned
Array ( [id] => 5150110 [patent_doc_number] => 20070050170 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-03-01 [patent_title] => 'Device characteristics measuring system' [patent_app_type] => utility [patent_app_number] => 11/509297 [patent_app_country] => US [patent_app_date] => 2006-08-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 5618 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0050/20070050170.pdf [firstpage_image] =>[orig_patent_app_number] => 11509297 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/509297
Device characteristics measuring system Aug 23, 2006 Abandoned
Array ( [id] => 5202822 [patent_doc_number] => 20070024301 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-02-01 [patent_title] => 'Electrical feedback detection system for multi-point probes' [patent_app_type] => utility [patent_app_number] => 11/509208 [patent_app_country] => US [patent_app_date] => 2006-08-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 2747 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0024/20070024301.pdf [firstpage_image] =>[orig_patent_app_number] => 11509208 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/509208
Electrical feedback detection system for multi-point probes Aug 23, 2006 Issued
Array ( [id] => 4731726 [patent_doc_number] => 20080048704 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-02-28 [patent_title] => 'Apparatus and methods for testing microelectronic devices' [patent_app_type] => utility [patent_app_number] => 11/509292 [patent_app_country] => US [patent_app_date] => 2006-08-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4868 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0048/20080048704.pdf [firstpage_image] =>[orig_patent_app_number] => 11509292 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/509292
Apparatus and methods for testing microelectronic devices Aug 22, 2006 Issued
Array ( [id] => 4458057 [patent_doc_number] => 07893703 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-02-22 [patent_title] => 'Systems and methods for controlling deposition of a charge on a wafer for measurement of one or more electrical properties of the wafer' [patent_app_type] => utility [patent_app_number] => 11/465893 [patent_app_country] => US [patent_app_date] => 2006-08-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 21 [patent_figures_cnt] => 62 [patent_no_of_words] => 54054 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 102 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/893/07893703.pdf [firstpage_image] =>[orig_patent_app_number] => 11465893 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/465893
Systems and methods for controlling deposition of a charge on a wafer for measurement of one or more electrical properties of the wafer Aug 20, 2006 Issued
Array ( [id] => 865843 [patent_doc_number] => 07368930 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-05-06 [patent_title] => 'Adjustment mechanism' [patent_app_type] => utility [patent_app_number] => 11/464593 [patent_app_country] => US [patent_app_date] => 2006-08-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 24 [patent_no_of_words] => 11133 [patent_no_of_claims] => 38 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 89 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/368/07368930.pdf [firstpage_image] =>[orig_patent_app_number] => 11464593 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/464593
Adjustment mechanism Aug 14, 2006 Issued
Array ( [id] => 5640865 [patent_doc_number] => 20060279320 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-12-14 [patent_title] => 'Non-Abrasive Electrical Test Contact' [patent_app_type] => utility [patent_app_number] => 11/460632 [patent_app_country] => US [patent_app_date] => 2006-07-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 2875 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0279/20060279320.pdf [firstpage_image] =>[orig_patent_app_number] => 11460632 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/460632
Non-abrasive electrical test contact Jul 27, 2006 Issued
Array ( [id] => 5049474 [patent_doc_number] => 20070030018 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-02-08 [patent_title] => 'Docking device actuated by pressure means' [patent_app_type] => utility [patent_app_number] => 11/492198 [patent_app_country] => US [patent_app_date] => 2006-07-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4134 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0030/20070030018.pdf [firstpage_image] =>[orig_patent_app_number] => 11492198 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/492198
Docking device actuated by pressure means Jul 24, 2006 Issued
Array ( [id] => 918576 [patent_doc_number] => 07323859 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-01-29 [patent_title] => 'Auto-measuring universal meter' [patent_app_type] => utility [patent_app_number] => 11/488697 [patent_app_country] => US [patent_app_date] => 2006-07-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4172 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 545 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/323/07323859.pdf [firstpage_image] =>[orig_patent_app_number] => 11488697 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/488697
Auto-measuring universal meter Jul 18, 2006 Issued
Array ( [id] => 93480 [patent_doc_number] => 07737713 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-06-15 [patent_title] => 'Apparatus for hot-probing integrated semiconductor circuits on wafers' [patent_app_type] => utility [patent_app_number] => 11/482894 [patent_app_country] => US [patent_app_date] => 2006-07-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3685 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 125 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/737/07737713.pdf [firstpage_image] =>[orig_patent_app_number] => 11482894 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/482894
Apparatus for hot-probing integrated semiconductor circuits on wafers Jul 9, 2006 Issued
Array ( [id] => 5499784 [patent_doc_number] => 20090160472 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-06-25 [patent_title] => 'WAFER-LEVEL BURN-IN METHOD AND WAFER-LEVEL BURN-IN APPARATUS' [patent_app_type] => utility [patent_app_number] => 12/064093 [patent_app_country] => US [patent_app_date] => 2006-06-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 7448 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0160/20090160472.pdf [firstpage_image] =>[orig_patent_app_number] => 12064093 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/064093
WAFER-LEVEL BURN-IN METHOD AND WAFER-LEVEL BURN-IN APPARATUS Jun 25, 2006 Abandoned
Array ( [id] => 5228595 [patent_doc_number] => 20070290702 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-12-20 [patent_title] => 'System and method for thermal management and gradient reduction' [patent_app_type] => utility [patent_app_number] => 11/455996 [patent_app_country] => US [patent_app_date] => 2006-06-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5370 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0290/20070290702.pdf [firstpage_image] =>[orig_patent_app_number] => 11455996 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/455996
System and method for thermal management and gradient reduction Jun 18, 2006 Abandoned
Array ( [id] => 377523 [patent_doc_number] => 07312625 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2007-12-25 [patent_title] => 'Test circuit and method of use thereof for the manufacture of integrated circuits' [patent_app_type] => utility [patent_app_number] => 11/449197 [patent_app_country] => US [patent_app_date] => 2006-06-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 6167 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 101 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/312/07312625.pdf [firstpage_image] =>[orig_patent_app_number] => 11449197 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/449197
Test circuit and method of use thereof for the manufacture of integrated circuits Jun 7, 2006 Issued
Array ( [id] => 5197081 [patent_doc_number] => 20070296399 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-12-27 [patent_title] => 'Electrical system' [patent_app_type] => utility [patent_app_number] => 11/443093 [patent_app_country] => US [patent_app_date] => 2006-05-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 7948 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0296/20070296399.pdf [firstpage_image] =>[orig_patent_app_number] => 11443093 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/443093
Magnetoresistive sensor for current sensing May 30, 2006 Issued
Array ( [id] => 7968397 [patent_doc_number] => 07940064 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-05-10 [patent_title] => 'Method and apparatus for wafer level burn-in' [patent_app_type] => utility [patent_app_number] => 12/063276 [patent_app_country] => US [patent_app_date] => 2006-05-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 11 [patent_no_of_words] => 6319 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 180 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/940/07940064.pdf [firstpage_image] =>[orig_patent_app_number] => 12063276 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/063276
Method and apparatus for wafer level burn-in May 28, 2006 Issued
Array ( [id] => 5014454 [patent_doc_number] => 20070257662 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-11-08 [patent_title] => 'Current probe' [patent_app_type] => utility [patent_app_number] => 11/430398 [patent_app_country] => US [patent_app_date] => 2006-05-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 6637 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0257/20070257662.pdf [firstpage_image] =>[orig_patent_app_number] => 11430398 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/430398
Current probe May 7, 2006 Abandoned
Array ( [id] => 5181091 [patent_doc_number] => 20070052433 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-03-08 [patent_title] => 'Coaxial probe, method for production thereof, and device for measuring in the near electromagnetic field on systems at a submicrometric distance' [patent_app_type] => utility [patent_app_number] => 11/430192 [patent_app_country] => US [patent_app_date] => 2006-05-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 4246 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0052/20070052433.pdf [firstpage_image] =>[orig_patent_app_number] => 11430192 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/430192
Coaxial probe, method for production thereof, and device for measuring in the near electromagnetic field on systems at a submicrometric distance May 7, 2006 Abandoned
Array ( [id] => 877905 [patent_doc_number] => 07358717 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-04-15 [patent_title] => 'Input by-pass circuit for a current probe' [patent_app_type] => utility [patent_app_number] => 11/430394 [patent_app_country] => US [patent_app_date] => 2006-05-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4280 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 233 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/358/07358717.pdf [firstpage_image] =>[orig_patent_app_number] => 11430394 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/430394
Input by-pass circuit for a current probe May 7, 2006 Issued
Array ( [id] => 4576741 [patent_doc_number] => 07859277 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-12-28 [patent_title] => 'Apparatus, systems and methods for processing signals between a tester and a plurality of devices under test at high temperatures and with single touchdown of a probe array' [patent_app_type] => utility [patent_app_number] => 11/410699 [patent_app_country] => US [patent_app_date] => 2006-04-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 8 [patent_no_of_words] => 2961 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 189 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/859/07859277.pdf [firstpage_image] =>[orig_patent_app_number] => 11410699 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/410699
Apparatus, systems and methods for processing signals between a tester and a plurality of devices under test at high temperatures and with single touchdown of a probe array Apr 23, 2006 Issued
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