
Siming Liu
Examiner (ID: 7038, Phone: (571)270-3859 , Office: P/2413 )
| Most Active Art Unit | 2411 |
| Art Unit(s) | 2413, 2472, 2416, 2411 |
| Total Applications | 686 |
| Issued Applications | 539 |
| Pending Applications | 45 |
| Abandoned Applications | 106 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 5537237
[patent_doc_number] => 20090219042
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-09-03
[patent_title] => 'Probe card'
[patent_app_type] => utility
[patent_app_number] => 11/991296
[patent_app_country] => US
[patent_app_date] => 2006-08-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
[patent_figures_cnt] => 14
[patent_no_of_words] => 8075
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[pdf_file] => publications/A1/0219/20090219042.pdf
[firstpage_image] =>[orig_patent_app_number] => 11991296
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/991296 | Probe card | Aug 29, 2006 | Issued |
Array
(
[id] => 5600019
[patent_doc_number] => 20060290364
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-12-28
[patent_title] => 'Cable terminal with flexible contacts'
[patent_app_type] => utility
[patent_app_number] => 11/512553
[patent_app_country] => US
[patent_app_date] => 2006-08-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
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[patent_no_of_words] => 2881
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[pdf_file] => publications/A1/0290/20060290364.pdf
[firstpage_image] =>[orig_patent_app_number] => 11512553
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/512553 | Cable terminal with flexible contacts | Aug 28, 2006 | Abandoned |
Array
(
[id] => 5150110
[patent_doc_number] => 20070050170
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-03-01
[patent_title] => 'Device characteristics measuring system'
[patent_app_type] => utility
[patent_app_number] => 11/509297
[patent_app_country] => US
[patent_app_date] => 2006-08-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 16
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[patent_no_of_words] => 5618
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[pdf_file] => publications/A1/0050/20070050170.pdf
[firstpage_image] =>[orig_patent_app_number] => 11509297
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/509297 | Device characteristics measuring system | Aug 23, 2006 | Abandoned |
Array
(
[id] => 5202822
[patent_doc_number] => 20070024301
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-02-01
[patent_title] => 'Electrical feedback detection system for multi-point probes'
[patent_app_type] => utility
[patent_app_number] => 11/509208
[patent_app_country] => US
[patent_app_date] => 2006-08-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
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[patent_no_of_words] => 2747
[patent_no_of_claims] => 16
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[pdf_file] => publications/A1/0024/20070024301.pdf
[firstpage_image] =>[orig_patent_app_number] => 11509208
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/509208 | Electrical feedback detection system for multi-point probes | Aug 23, 2006 | Issued |
Array
(
[id] => 4731726
[patent_doc_number] => 20080048704
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-02-28
[patent_title] => 'Apparatus and methods for testing microelectronic devices'
[patent_app_type] => utility
[patent_app_number] => 11/509292
[patent_app_country] => US
[patent_app_date] => 2006-08-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
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[patent_no_of_words] => 4868
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[pdf_file] => publications/A1/0048/20080048704.pdf
[firstpage_image] =>[orig_patent_app_number] => 11509292
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/509292 | Apparatus and methods for testing microelectronic devices | Aug 22, 2006 | Issued |
Array
(
[id] => 4458057
[patent_doc_number] => 07893703
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-02-22
[patent_title] => 'Systems and methods for controlling deposition of a charge on a wafer for measurement of one or more electrical properties of the wafer'
[patent_app_type] => utility
[patent_app_number] => 11/465893
[patent_app_country] => US
[patent_app_date] => 2006-08-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 21
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[pdf_file] => patents/07/893/07893703.pdf
[firstpage_image] =>[orig_patent_app_number] => 11465893
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/465893 | Systems and methods for controlling deposition of a charge on a wafer for measurement of one or more electrical properties of the wafer | Aug 20, 2006 | Issued |
Array
(
[id] => 865843
[patent_doc_number] => 07368930
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-05-06
[patent_title] => 'Adjustment mechanism'
[patent_app_type] => utility
[patent_app_number] => 11/464593
[patent_app_country] => US
[patent_app_date] => 2006-08-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 17
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[patent_no_of_words] => 11133
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/368/07368930.pdf
[firstpage_image] =>[orig_patent_app_number] => 11464593
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/464593 | Adjustment mechanism | Aug 14, 2006 | Issued |
Array
(
[id] => 5640865
[patent_doc_number] => 20060279320
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-12-14
[patent_title] => 'Non-Abrasive Electrical Test Contact'
[patent_app_type] => utility
[patent_app_number] => 11/460632
[patent_app_country] => US
[patent_app_date] => 2006-07-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
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[patent_no_of_words] => 2875
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[pdf_file] => publications/A1/0279/20060279320.pdf
[firstpage_image] =>[orig_patent_app_number] => 11460632
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/460632 | Non-abrasive electrical test contact | Jul 27, 2006 | Issued |
Array
(
[id] => 5049474
[patent_doc_number] => 20070030018
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-02-08
[patent_title] => 'Docking device actuated by pressure means'
[patent_app_type] => utility
[patent_app_number] => 11/492198
[patent_app_country] => US
[patent_app_date] => 2006-07-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
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[pdf_file] => publications/A1/0030/20070030018.pdf
[firstpage_image] =>[orig_patent_app_number] => 11492198
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/492198 | Docking device actuated by pressure means | Jul 24, 2006 | Issued |
Array
(
[id] => 918576
[patent_doc_number] => 07323859
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-01-29
[patent_title] => 'Auto-measuring universal meter'
[patent_app_type] => utility
[patent_app_number] => 11/488697
[patent_app_country] => US
[patent_app_date] => 2006-07-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
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[patent_no_of_words] => 4172
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/323/07323859.pdf
[firstpage_image] =>[orig_patent_app_number] => 11488697
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/488697 | Auto-measuring universal meter | Jul 18, 2006 | Issued |
Array
(
[id] => 93480
[patent_doc_number] => 07737713
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-06-15
[patent_title] => 'Apparatus for hot-probing integrated semiconductor circuits on wafers'
[patent_app_type] => utility
[patent_app_number] => 11/482894
[patent_app_country] => US
[patent_app_date] => 2006-07-10
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[patent_drawing_sheets_cnt] => 4
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[pdf_file] => patents/07/737/07737713.pdf
[firstpage_image] =>[orig_patent_app_number] => 11482894
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/482894 | Apparatus for hot-probing integrated semiconductor circuits on wafers | Jul 9, 2006 | Issued |
Array
(
[id] => 5499784
[patent_doc_number] => 20090160472
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2009-06-25
[patent_title] => 'WAFER-LEVEL BURN-IN METHOD AND WAFER-LEVEL BURN-IN APPARATUS'
[patent_app_type] => utility
[patent_app_number] => 12/064093
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[pdf_file] => publications/A1/0160/20090160472.pdf
[firstpage_image] =>[orig_patent_app_number] => 12064093
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/064093 | WAFER-LEVEL BURN-IN METHOD AND WAFER-LEVEL BURN-IN APPARATUS | Jun 25, 2006 | Abandoned |
Array
(
[id] => 5228595
[patent_doc_number] => 20070290702
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[patent_kind] => A1
[patent_issue_date] => 2007-12-20
[patent_title] => 'System and method for thermal management and gradient reduction'
[patent_app_type] => utility
[patent_app_number] => 11/455996
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[firstpage_image] =>[orig_patent_app_number] => 11455996
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/455996 | System and method for thermal management and gradient reduction | Jun 18, 2006 | Abandoned |
Array
(
[id] => 377523
[patent_doc_number] => 07312625
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[patent_kind] => B1
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[patent_title] => 'Test circuit and method of use thereof for the manufacture of integrated circuits'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/449197 | Test circuit and method of use thereof for the manufacture of integrated circuits | Jun 7, 2006 | Issued |
Array
(
[id] => 5197081
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[patent_issue_date] => 2007-12-27
[patent_title] => 'Electrical system'
[patent_app_type] => utility
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[firstpage_image] =>[orig_patent_app_number] => 11443093
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/443093 | Magnetoresistive sensor for current sensing | May 30, 2006 | Issued |
Array
(
[id] => 7968397
[patent_doc_number] => 07940064
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[patent_title] => 'Method and apparatus for wafer level burn-in'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/063276 | Method and apparatus for wafer level burn-in | May 28, 2006 | Issued |
Array
(
[id] => 5014454
[patent_doc_number] => 20070257662
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[patent_title] => 'Current probe'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/430398 | Current probe | May 7, 2006 | Abandoned |
Array
(
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[patent_title] => 'Coaxial probe, method for production thereof, and device for measuring in the near electromagnetic field on systems at a submicrometric distance'
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Array
(
[id] => 877905
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/430394 | Input by-pass circuit for a current probe | May 7, 2006 | Issued |
Array
(
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[patent_title] => 'Apparatus, systems and methods for processing signals between a tester and a plurality of devices under test at high temperatures and with single touchdown of a probe array'
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[firstpage_image] =>[orig_patent_app_number] => 11410699
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/410699 | Apparatus, systems and methods for processing signals between a tester and a plurality of devices under test at high temperatures and with single touchdown of a probe array | Apr 23, 2006 | Issued |