
Siming Liu
Examiner (ID: 7038, Phone: (571)270-3859 , Office: P/2413 )
| Most Active Art Unit | 2411 |
| Art Unit(s) | 2413, 2472, 2416, 2411 |
| Total Applications | 686 |
| Issued Applications | 539 |
| Pending Applications | 45 |
| Abandoned Applications | 106 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 5686332
[patent_doc_number] => 20060284647
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-12-21
[patent_title] => 'Sensor apparatus'
[patent_app_type] => utility
[patent_app_number] => 11/335397
[patent_app_country] => US
[patent_app_date] => 2006-01-19
[patent_effective_date] => 0000-00-00
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[pdf_file] => publications/A1/0284/20060284647.pdf
[firstpage_image] =>[orig_patent_app_number] => 11335397
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/335397 | Sensor apparatus | Jan 18, 2006 | Abandoned |
Array
(
[id] => 5641455
[patent_doc_number] => 20060279910
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-12-14
[patent_title] => 'Current sensor assembly'
[patent_app_type] => utility
[patent_app_number] => 11/335793
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[firstpage_image] =>[orig_patent_app_number] => 11335793
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/335793 | Current sensor assembly | Jan 18, 2006 | Issued |
Array
(
[id] => 877900
[patent_doc_number] => 07358714
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-04-15
[patent_title] => 'Testing method and testing apparatus'
[patent_app_type] => utility
[patent_app_number] => 11/334399
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[pdf_file] => patents/07/358/07358714.pdf
[firstpage_image] =>[orig_patent_app_number] => 11334399
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/334399 | Testing method and testing apparatus | Jan 18, 2006 | Issued |
Array
(
[id] => 5665087
[patent_doc_number] => 20060170437
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-08-03
[patent_title] => 'Probe card for testing a plurality of semiconductor chips and method thereof'
[patent_app_type] => utility
[patent_app_number] => 11/330399
[patent_app_country] => US
[patent_app_date] => 2006-01-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
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[firstpage_image] =>[orig_patent_app_number] => 11330399
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/330399 | Probe card for testing a plurality of semiconductor chips and method thereof | Jan 11, 2006 | Abandoned |
Array
(
[id] => 394454
[patent_doc_number] => 07298155
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[patent_issue_date] => 2007-11-20
[patent_title] => 'Probing apparatus'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/330599 | Probing apparatus | Jan 10, 2006 | Issued |
Array
(
[id] => 602938
[patent_doc_number] => 07432702
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-10-07
[patent_title] => 'Circuit board damping assembly'
[patent_app_type] => utility
[patent_app_number] => 11/321297
[patent_app_country] => US
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[patent_effective_date] => 0000-00-00
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[pdf_file] => patents/07/432/07432702.pdf
[firstpage_image] =>[orig_patent_app_number] => 11321297
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/321297 | Circuit board damping assembly | Dec 21, 2005 | Issued |
Array
(
[id] => 373810
[patent_doc_number] => 07474115
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2009-01-06
[patent_title] => 'Organic electronic device display defect detection'
[patent_app_type] => utility
[patent_app_number] => 11/303393
[patent_app_country] => US
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[patent_effective_date] => 0000-00-00
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/474/07474115.pdf
[firstpage_image] =>[orig_patent_app_number] => 11303393
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/303393 | Organic electronic device display defect detection | Dec 15, 2005 | Issued |
Array
(
[id] => 5675526
[patent_doc_number] => 20060180881
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-08-17
[patent_title] => 'Probe head and method of fabricating the same'
[patent_app_type] => utility
[patent_app_number] => 11/285281
[patent_app_country] => US
[patent_app_date] => 2005-11-23
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[patent_drawing_sheets_cnt] => 14
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[pdf_file] => publications/A1/0180/20060180881.pdf
[firstpage_image] =>[orig_patent_app_number] => 11285281
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/285281 | Probe head and method of fabricating the same | Nov 22, 2005 | Abandoned |
Array
(
[id] => 5719500
[patent_doc_number] => 20060072273
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-04-06
[patent_title] => 'Power supply device, test apparatus, and power supply voltage stabilizing device'
[patent_app_type] => utility
[patent_app_number] => 11/284224
[patent_app_country] => US
[patent_app_date] => 2005-11-21
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[pdf_file] => publications/A1/0072/20060072273.pdf
[firstpage_image] =>[orig_patent_app_number] => 11284224
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/284224 | Power supply device, test apparatus, and power supply voltage stabilizing device | Nov 20, 2005 | Issued |
Array
(
[id] => 810743
[patent_doc_number] => 07417449
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2008-08-26
[patent_title] => 'Wafer stage storage structure speed testing'
[patent_app_type] => utility
[patent_app_number] => 11/274595
[patent_app_country] => US
[patent_app_date] => 2005-11-15
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[patent_drawing_sheets_cnt] => 4
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[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/417/07417449.pdf
[firstpage_image] =>[orig_patent_app_number] => 11274595
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/274595 | Wafer stage storage structure speed testing | Nov 14, 2005 | Issued |
Array
(
[id] => 4576541
[patent_doc_number] => 07859248
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2010-12-28
[patent_title] => 'Electronic device test apparatus and method of setting an optimum pushing condition for contact arm of electronic device test apparatus'
[patent_app_type] => utility
[patent_app_number] => 12/092496
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[pdf_file] => patents/07/859/07859248.pdf
[firstpage_image] =>[orig_patent_app_number] => 12092496
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/092496 | Electronic device test apparatus and method of setting an optimum pushing condition for contact arm of electronic device test apparatus | Nov 8, 2005 | Issued |
Array
(
[id] => 398199
[patent_doc_number] => 07295030
[patent_country] => US
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[patent_issue_date] => 2007-11-13
[patent_title] => 'Thin film transistor tester and corresponding test method'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/163996 | Thin film transistor tester and corresponding test method | Nov 6, 2005 | Issued |
Array
(
[id] => 5733070
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[patent_title] => 'Impedance controlled via structure'
[patent_app_type] => utility
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Array
(
[id] => 364011
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[patent_title] => 'Integrated circuit with testable clock circuits'
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[pdf_file] => patents/07/482/07482827.pdf
[firstpage_image] =>[orig_patent_app_number] => 11719091
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/719091 | Integrated circuit with testable clock circuits | Oct 27, 2005 | Issued |
Array
(
[id] => 5640854
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[patent_title] => 'Method and storage device for testing A V-Chip'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/257193 | Method and storage device for testing A V-Chip | Oct 24, 2005 | Abandoned |
Array
(
[id] => 5774725
[patent_doc_number] => 20060103371
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[patent_title] => 'Testing system for solar cells'
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[firstpage_image] =>[orig_patent_app_number] => 11249298
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/249298 | Testing system for solar cells | Oct 12, 2005 | Issued |
Array
(
[id] => 458096
[patent_doc_number] => 07245120
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[rel_patent_id] =>[rel_patent_doc_number] =>) 11/237092 | Predictive, adaptive power supply for an integrated circuit under test | Sep 26, 2005 | Issued |
Array
(
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Array
(
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Array
(
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[patent_title] => 'Manufacture Method Of Vertical-Type Electric Contactor Vertical-Type Electric Contactor Thereof'
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[pdf_file] => publications/A1/0079/20080079453.pdf
[firstpage_image] =>[orig_patent_app_number] => 11662993
[rel_patent_id] =>[rel_patent_doc_number] =>) 11/662993 | Manufacture Method Of Vertical-Type Electric Contactor Vertical-Type Electric Contactor Thereof | Sep 19, 2005 | Abandoned |