Search

Siming Liu

Examiner (ID: 7038, Phone: (571)270-3859 , Office: P/2413 )

Most Active Art Unit
2411
Art Unit(s)
2413, 2472, 2416, 2411
Total Applications
686
Issued Applications
539
Pending Applications
45
Abandoned Applications
106

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 5686332 [patent_doc_number] => 20060284647 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-12-21 [patent_title] => 'Sensor apparatus' [patent_app_type] => utility [patent_app_number] => 11/335397 [patent_app_country] => US [patent_app_date] => 2006-01-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 12433 [patent_no_of_claims] => 49 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0284/20060284647.pdf [firstpage_image] =>[orig_patent_app_number] => 11335397 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/335397
Sensor apparatus Jan 18, 2006 Abandoned
Array ( [id] => 5641455 [patent_doc_number] => 20060279910 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-12-14 [patent_title] => 'Current sensor assembly' [patent_app_type] => utility [patent_app_number] => 11/335793 [patent_app_country] => US [patent_app_date] => 2006-01-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 12433 [patent_no_of_claims] => 46 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0279/20060279910.pdf [firstpage_image] =>[orig_patent_app_number] => 11335793 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/335793
Current sensor assembly Jan 18, 2006 Issued
Array ( [id] => 877900 [patent_doc_number] => 07358714 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-04-15 [patent_title] => 'Testing method and testing apparatus' [patent_app_type] => utility [patent_app_number] => 11/334399 [patent_app_country] => US [patent_app_date] => 2006-01-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 13 [patent_no_of_words] => 5064 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 130 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/358/07358714.pdf [firstpage_image] =>[orig_patent_app_number] => 11334399 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/334399
Testing method and testing apparatus Jan 18, 2006 Issued
Array ( [id] => 5665087 [patent_doc_number] => 20060170437 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-08-03 [patent_title] => 'Probe card for testing a plurality of semiconductor chips and method thereof' [patent_app_type] => utility [patent_app_number] => 11/330399 [patent_app_country] => US [patent_app_date] => 2006-01-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3471 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0170/20060170437.pdf [firstpage_image] =>[orig_patent_app_number] => 11330399 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/330399
Probe card for testing a plurality of semiconductor chips and method thereof Jan 11, 2006 Abandoned
Array ( [id] => 394454 [patent_doc_number] => 07298155 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-11-20 [patent_title] => 'Probing apparatus' [patent_app_type] => utility [patent_app_number] => 11/330599 [patent_app_country] => US [patent_app_date] => 2006-01-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 8 [patent_no_of_words] => 6148 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 156 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/298/07298155.pdf [firstpage_image] =>[orig_patent_app_number] => 11330599 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/330599
Probing apparatus Jan 10, 2006 Issued
Array ( [id] => 602938 [patent_doc_number] => 07432702 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-10-07 [patent_title] => 'Circuit board damping assembly' [patent_app_type] => utility [patent_app_number] => 11/321297 [patent_app_country] => US [patent_app_date] => 2005-12-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 2510 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 98 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/432/07432702.pdf [firstpage_image] =>[orig_patent_app_number] => 11321297 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/321297
Circuit board damping assembly Dec 21, 2005 Issued
Array ( [id] => 373810 [patent_doc_number] => 07474115 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2009-01-06 [patent_title] => 'Organic electronic device display defect detection' [patent_app_type] => utility [patent_app_number] => 11/303393 [patent_app_country] => US [patent_app_date] => 2005-12-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 4489 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 71 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/474/07474115.pdf [firstpage_image] =>[orig_patent_app_number] => 11303393 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/303393
Organic electronic device display defect detection Dec 15, 2005 Issued
Array ( [id] => 5675526 [patent_doc_number] => 20060180881 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-08-17 [patent_title] => 'Probe head and method of fabricating the same' [patent_app_type] => utility [patent_app_number] => 11/285281 [patent_app_country] => US [patent_app_date] => 2005-11-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 3116 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0180/20060180881.pdf [firstpage_image] =>[orig_patent_app_number] => 11285281 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/285281
Probe head and method of fabricating the same Nov 22, 2005 Abandoned
Array ( [id] => 5719500 [patent_doc_number] => 20060072273 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-04-06 [patent_title] => 'Power supply device, test apparatus, and power supply voltage stabilizing device' [patent_app_type] => utility [patent_app_number] => 11/284224 [patent_app_country] => US [patent_app_date] => 2005-11-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 15566 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0072/20060072273.pdf [firstpage_image] =>[orig_patent_app_number] => 11284224 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/284224
Power supply device, test apparatus, and power supply voltage stabilizing device Nov 20, 2005 Issued
Array ( [id] => 810743 [patent_doc_number] => 07417449 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2008-08-26 [patent_title] => 'Wafer stage storage structure speed testing' [patent_app_type] => utility [patent_app_number] => 11/274595 [patent_app_country] => US [patent_app_date] => 2005-11-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 5212 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 90 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/417/07417449.pdf [firstpage_image] =>[orig_patent_app_number] => 11274595 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/274595
Wafer stage storage structure speed testing Nov 14, 2005 Issued
Array ( [id] => 4576541 [patent_doc_number] => 07859248 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-12-28 [patent_title] => 'Electronic device test apparatus and method of setting an optimum pushing condition for contact arm of electronic device test apparatus' [patent_app_type] => utility [patent_app_number] => 12/092496 [patent_app_country] => US [patent_app_date] => 2005-11-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 8883 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 144 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/859/07859248.pdf [firstpage_image] =>[orig_patent_app_number] => 12092496 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/092496
Electronic device test apparatus and method of setting an optimum pushing condition for contact arm of electronic device test apparatus Nov 8, 2005 Issued
Array ( [id] => 398199 [patent_doc_number] => 07295030 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-11-13 [patent_title] => 'Thin film transistor tester and corresponding test method' [patent_app_type] => utility [patent_app_number] => 11/163996 [patent_app_country] => US [patent_app_date] => 2005-11-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 26 [patent_no_of_words] => 5926 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 74 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/295/07295030.pdf [firstpage_image] =>[orig_patent_app_number] => 11163996 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/163996
Thin film transistor tester and corresponding test method Nov 6, 2005 Issued
Array ( [id] => 5733070 [patent_doc_number] => 20060258187 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-11-16 [patent_title] => 'Impedance controlled via structure' [patent_app_type] => utility [patent_app_number] => 11/266892 [patent_app_country] => US [patent_app_date] => 2005-11-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 4189 [patent_no_of_claims] => 36 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0258/20060258187.pdf [firstpage_image] =>[orig_patent_app_number] => 11266892 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/266892
Impedance controlled via structure Nov 2, 2005 Issued
Array ( [id] => 364011 [patent_doc_number] => 07482827 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2009-01-27 [patent_title] => 'Integrated circuit with testable clock circuits' [patent_app_type] => utility [patent_app_number] => 11/719091 [patent_app_country] => US [patent_app_date] => 2005-10-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 5 [patent_no_of_words] => 3328 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 139 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/482/07482827.pdf [firstpage_image] =>[orig_patent_app_number] => 11719091 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/719091
Integrated circuit with testable clock circuits Oct 27, 2005 Issued
Array ( [id] => 5640854 [patent_doc_number] => 20060279309 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-12-14 [patent_title] => 'Method and storage device for testing A V-Chip' [patent_app_type] => utility [patent_app_number] => 11/257193 [patent_app_country] => US [patent_app_date] => 2005-10-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 2891 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0279/20060279309.pdf [firstpage_image] =>[orig_patent_app_number] => 11257193 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/257193
Method and storage device for testing A V-Chip Oct 24, 2005 Abandoned
Array ( [id] => 5774725 [patent_doc_number] => 20060103371 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-05-18 [patent_title] => 'Testing system for solar cells' [patent_app_type] => utility [patent_app_number] => 11/249298 [patent_app_country] => US [patent_app_date] => 2005-10-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3369 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0103/20060103371.pdf [firstpage_image] =>[orig_patent_app_number] => 11249298 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/249298
Testing system for solar cells Oct 12, 2005 Issued
Array ( [id] => 458096 [patent_doc_number] => 07245120 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-07-17 [patent_title] => 'Predictive, adaptive power supply for an integrated circuit under test' [patent_app_type] => utility [patent_app_number] => 11/237092 [patent_app_country] => US [patent_app_date] => 2005-09-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 27 [patent_no_of_words] => 10201 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 128 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/245/07245120.pdf [firstpage_image] =>[orig_patent_app_number] => 11237092 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/237092
Predictive, adaptive power supply for an integrated circuit under test Sep 26, 2005 Issued
Array ( [id] => 45469 [patent_doc_number] => 07777479 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2010-08-17 [patent_title] => 'Current detector with variable output voltage level' [patent_app_type] => utility [patent_app_number] => 11/234696 [patent_app_country] => US [patent_app_date] => 2005-09-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 1895 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 163 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/777/07777479.pdf [firstpage_image] =>[orig_patent_app_number] => 11234696 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/234696
Current detector with variable output voltage level Sep 22, 2005 Issued
Array ( [id] => 5240182 [patent_doc_number] => 20070018673 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-01-25 [patent_title] => 'Electronic component testing apparatus' [patent_app_type] => utility [patent_app_number] => 11/233589 [patent_app_country] => US [patent_app_date] => 2005-09-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2286 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0018/20070018673.pdf [firstpage_image] =>[orig_patent_app_number] => 11233589 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/233589
Electronic component testing apparatus Sep 21, 2005 Abandoned
Array ( [id] => 4942130 [patent_doc_number] => 20080079453 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-04-03 [patent_title] => 'Manufacture Method Of Vertical-Type Electric Contactor Vertical-Type Electric Contactor Thereof' [patent_app_type] => utility [patent_app_number] => 11/662993 [patent_app_country] => US [patent_app_date] => 2005-09-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 8109 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0079/20080079453.pdf [firstpage_image] =>[orig_patent_app_number] => 11662993 [rel_patent_id] =>[rel_patent_doc_number] =>)
11/662993
Manufacture Method Of Vertical-Type Electric Contactor Vertical-Type Electric Contactor Thereof Sep 19, 2005 Abandoned
Menu