Sin J. Lee

Array ( [id] => 1596959 [patent_doc_number] => 06384418 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-05-07 [patent_title] => 'Sample transfer apparatus and sample stage' [patent_app_type] => B1 [patent_app_number] => 09/314060 [patent_app_country] => US [patent_app_date] => 1999-05-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 7 [patent_no_of_words] => 2903 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 51 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/384/06384418.pdf [firstpage_image] =>[orig_patent_app_number] => 09314060 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1461244 [patent_doc_number] => 06392230 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-05-21 [patent_title] => 'Focused ion beam forming method' [patent_app_type] => B1 [patent_app_number] => 09/286050 [patent_app_country] => US [patent_app_date] => 1999-04-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 2551 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 57 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/392/06392230.pdf [firstpage_image] =>[orig_patent_app_number] => 09286050 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1056747 [patent_doc_number] => 06855941 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2005-02-15 [patent_title] => 'Laser microscope' [patent_app_type] => utility [patent_app_number] => 09/265183 [patent_app_country] => US [patent_app_date] => 1999-03-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 7 [patent_no_of_words] => 5758 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 237 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/855/06855941.pdf [firstpage_image] =>[orig_patent_app_number] => 09265183 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1418368 [patent_doc_number] => 06525317 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-02-25 [patent_title] => 'Reduction of charging effect and carbon deposition caused by electron beam devices' [patent_app_type] => B1 [patent_app_number] => 09/222999 [patent_app_country] => US [patent_app_date] => 1998-12-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 2141 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 63 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/525/06525317.pdf [firstpage_image] =>[orig_patent_app_number] => 09222999 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1418453 [patent_doc_number] => 06525324 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-02-25 [patent_title] => 'Charged-particle-beam projection optical system' [patent_app_type] => B1 [patent_app_number] => 09/204753 [patent_app_country] => US [patent_app_date] => 1998-12-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 3480 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 97 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/525/06525324.pdf [firstpage_image] =>[orig_patent_app_number] => 09204753 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1385804 [patent_doc_number] => 06555828 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-04-29 [patent_title] => 'Method and apparatus for inspecting reflection masks for defects' [patent_app_type] => B1 [patent_app_number] => 09/193198 [patent_app_country] => US [patent_app_date] => 1998-11-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 12 [patent_no_of_words] => 4401 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 116 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/555/06555828.pdf [firstpage_image] =>[orig_patent_app_number] => 09193198 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1401545 [patent_doc_number] => 06511048 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2003-01-28 [patent_title] => 'Electron beam lithography apparatus and pattern forming method' [patent_app_type] => B1 [patent_app_number] => 09/191383 [patent_app_country] => US [patent_app_date] => 1998-11-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 13 [patent_no_of_words] => 4178 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 12 [patent_words_short_claim] => 230 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/511/06511048.pdf [firstpage_image] =>[orig_patent_app_number] => 09191383 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4365687 [patent_doc_number] => 06255661 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-07-03 [patent_title] => 'Mirror projection system for a scanning lithographic projection apparatus, and lithographic apparatus comprising such a system' [patent_app_type] => 1 [patent_app_number] => 9/170467 [patent_app_country] => US [patent_app_date] => 1998-10-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 3215 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 95 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/255/06255661.pdf [firstpage_image] =>[orig_patent_app_number] => 170467 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6365346 [patent_doc_number] => 20020117635 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2002-08-29 [patent_title] => 'PATTERNED WAFER INSPECTION METHOD AND APPARATUS THEREFOR' [patent_app_type] => new [patent_app_number] => 09/164366 [patent_app_country] => US [patent_app_date] => 1998-10-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 10368 [patent_no_of_claims] => 41 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 151 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0117/20020117635.pdf [firstpage_image] =>[orig_patent_app_number] => 09164366 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1461224 [patent_doc_number] => 06392225 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-05-21 [patent_title] => 'Method and apparatus for transferring ions from an atmospheric pressure ion source into an ion trap mass spectrometer' [patent_app_type] => B1 [patent_app_number] => 09/160639 [patent_app_country] => US [patent_app_date] => 1998-09-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 9 [patent_no_of_words] => 2354 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/392/06392225.pdf [firstpage_image] =>[orig_patent_app_number] => 09160639 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 1524816 [patent_doc_number] => 06353231 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2002-03-05 [patent_title] => 'Pinhole detector for electron intensity distribution' [patent_app_type] => B1 [patent_app_number] => 09/143999 [patent_app_country] => US [patent_app_date] => 1998-08-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 8 [patent_no_of_words] => 2984 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 168 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/353/06353231.pdf [firstpage_image] =>[orig_patent_app_number] => 09143999 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4413321 [patent_doc_number] => 06310342 [patent_country] => US [patent_kind] => NA [patent_issue_date] => 2001-10-30 [patent_title] => 'Optical microscope stage for scanning probe microscope' [patent_app_type] => 1 [patent_app_number] => 9/128885 [patent_app_country] => US [patent_app_date] => 1998-08-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 23 [patent_figures_cnt] => 23 [patent_no_of_words] => 13831 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 147 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/310/06310342.pdf [firstpage_image] =>[orig_patent_app_number] => 128885 [rel_patent_id] =>[rel_patent_doc_number] =>)