Search

Sing-wai Wu

Examiner (ID: 5936, Phone: (571)270-5850 , Office: P/2611 )

Most Active Art Unit
2611
Art Unit(s)
2611, 2628, 2677
Total Applications
650
Issued Applications
526
Pending Applications
35
Abandoned Applications
110

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 19773391 [patent_doc_number] => 20250054817 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-02-13 [patent_title] => TEST STRUCTURE AND INTEGRATED CIRCUIT TEST USING SAME [patent_app_type] => utility [patent_app_number] => 18/230918 [patent_app_country] => US [patent_app_date] => 2023-08-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7250 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 138 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18230918 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/230918
Test structure and integrated circuit test using same Aug 6, 2023 Issued
Array ( [id] => 18787330 [patent_doc_number] => 20230375614 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-11-23 [patent_title] => TEST CIRCUIT AND METHOD [patent_app_type] => utility [patent_app_number] => 18/363143 [patent_app_country] => US [patent_app_date] => 2023-08-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10424 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 114 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18363143 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/363143
Test circuit and method Jul 31, 2023 Issued
Array ( [id] => 19978300 [patent_doc_number] => 12345774 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-07-01 [patent_title] => Methods and apparatus to detect and diagnose faults in buck regulators [patent_app_type] => utility [patent_app_number] => 18/227149 [patent_app_country] => US [patent_app_date] => 2023-07-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 7730 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 109 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18227149 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/227149
Methods and apparatus to detect and diagnose faults in buck regulators Jul 26, 2023 Issued
Array ( [id] => 20563603 [patent_doc_number] => 12566209 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-03-03 [patent_title] => Test tray system and related method [patent_app_type] => utility [patent_app_number] => 18/358101 [patent_app_country] => US [patent_app_date] => 2023-07-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 27 [patent_no_of_words] => 1038 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 65 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18358101 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/358101
Test tray system and related method Jul 24, 2023 Issued
Array ( [id] => 19725238 [patent_doc_number] => 20250027989 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-01-23 [patent_title] => INTERFACE BUILT IN TEST FAILURE DETECTION APPARATUS [patent_app_type] => utility [patent_app_number] => 18/354808 [patent_app_country] => US [patent_app_date] => 2023-07-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2494 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 103 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18354808 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/354808
Interface built in test failure detection apparatus Jul 18, 2023 Issued
Array ( [id] => 19114096 [patent_doc_number] => 20240125846 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-04-18 [patent_title] => SEMICONDUCTOR WAFER CONFIGURED FOR SINGLE TOUCH-DOWN TESTING [patent_app_type] => utility [patent_app_number] => 18/221824 [patent_app_country] => US [patent_app_date] => 2023-07-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8957 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 172 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18221824 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/221824
Semiconductor wafer configured for single touch-down testing Jul 12, 2023 Issued
Array ( [id] => 20078741 [patent_doc_number] => 12352801 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-07-08 [patent_title] => Wafer testing for current property of a power transistor [patent_app_type] => utility [patent_app_number] => 18/349780 [patent_app_country] => US [patent_app_date] => 2023-07-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 1187 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 357 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18349780 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/349780
Wafer testing for current property of a power transistor Jul 9, 2023 Issued
Array ( [id] => 19052310 [patent_doc_number] => 20240094279 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-03-21 [patent_title] => SEMICONDUCTOR DEVICE [patent_app_type] => utility [patent_app_number] => 18/347137 [patent_app_country] => US [patent_app_date] => 2023-07-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5938 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 119 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18347137 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/347137
Semiconductor device Jul 4, 2023 Issued
Array ( [id] => 19917110 [patent_doc_number] => 12292474 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-05-06 [patent_title] => Leakage current detection and interruption device for power cord and related electrical connectors and electrical appliances [patent_app_type] => utility [patent_app_number] => 18/347012 [patent_app_country] => US [patent_app_date] => 2023-07-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 9 [patent_no_of_words] => 3462 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 176 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18347012 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/347012
Leakage current detection and interruption device for power cord and related electrical connectors and electrical appliances Jul 4, 2023 Issued
Array ( [id] => 19460006 [patent_doc_number] => 12100509 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-09-24 [patent_title] => Remote analyte testing system [patent_app_type] => utility [patent_app_number] => 18/344558 [patent_app_country] => US [patent_app_date] => 2023-06-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 9544 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 58 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18344558 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/344558
Remote analyte testing system Jun 28, 2023 Issued
Array ( [id] => 18727176 [patent_doc_number] => 20230341460 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-10-26 [patent_title] => INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE, AND/OR SUB-THRESHOLD LEAKAGE SENSOR [patent_app_type] => utility [patent_app_number] => 18/215828 [patent_app_country] => US [patent_app_date] => 2023-06-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 21102 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -22 [patent_words_short_claim] => 99 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18215828 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/215828
Integrated circuit workload, temperature, and/or sub-threshold leakage sensor Jun 28, 2023 Issued
Array ( [id] => 18774312 [patent_doc_number] => 20230369143 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-11-16 [patent_title] => TEST STRUCTURE AND TEST METHOD THEREOF [patent_app_type] => utility [patent_app_number] => 18/342919 [patent_app_country] => US [patent_app_date] => 2023-06-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9406 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 134 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18342919 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/342919
Test structure and test method thereof Jun 27, 2023 Issued
Array ( [id] => 19685380 [patent_doc_number] => 20250003925 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-01-02 [patent_title] => CONDENSATION MITIGATION IN IONIZATION SENSING [patent_app_type] => utility [patent_app_number] => 18/342162 [patent_app_country] => US [patent_app_date] => 2023-06-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2122 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 30 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18342162 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/342162
Condensation mitigation in ionization sensing Jun 26, 2023 Issued
Array ( [id] => 19911158 [patent_doc_number] => 12287365 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-04-29 [patent_title] => Radio-frequency element group testing system and method [patent_app_type] => utility [patent_app_number] => 18/337690 [patent_app_country] => US [patent_app_date] => 2023-06-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 9 [patent_no_of_words] => 1112 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 180 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18337690 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/337690
Radio-frequency element group testing system and method Jun 19, 2023 Issued
Array ( [id] => 19644242 [patent_doc_number] => 20240418762 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-12-19 [patent_title] => Diagnostic Circuit [patent_app_type] => utility [patent_app_number] => 18/335790 [patent_app_country] => US [patent_app_date] => 2023-06-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5839 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 79 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18335790 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/335790
Diagnostic circuit Jun 14, 2023 Issued
Array ( [id] => 20538425 [patent_doc_number] => 12555504 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2026-02-17 [patent_title] => Display device and method of manufacturing the same [patent_app_type] => utility [patent_app_number] => 18/210359 [patent_app_country] => US [patent_app_date] => 2023-06-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4875 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 68 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18210359 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/210359
Display device and method of manufacturing the same Jun 14, 2023 Issued
Array ( [id] => 18727195 [patent_doc_number] => 20230341479 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-10-26 [patent_title] => STRAY FIELD REJECTION IN MAGNETIC SENSORS [patent_app_type] => utility [patent_app_number] => 18/334225 [patent_app_country] => US [patent_app_date] => 2023-06-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7248 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 110 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18334225 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/334225
Stray field rejection in magnetic sensors Jun 12, 2023 Issued
Array ( [id] => 19250265 [patent_doc_number] => 20240201254 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-06-20 [patent_title] => JITTER MEASURING CIRCUIT, JITTER ANALYZING APPARATUS INCLUDING THE SAME, AND RELATED METHODS OF MANUFACTURING SEMICONDUCTOR DEVICES [patent_app_type] => utility [patent_app_number] => 18/203024 [patent_app_country] => US [patent_app_date] => 2023-05-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6818 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 73 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18203024 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/203024
JITTER MEASURING CIRCUIT, JITTER ANALYZING APPARATUS INCLUDING THE SAME, AND RELATED METHODS OF MANUFACTURING SEMICONDUCTOR DEVICES May 28, 2023 Pending
Array ( [id] => 18652659 [patent_doc_number] => 20230298497 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-09-21 [patent_title] => DISPLAY PANEL, ELECTRONIC DEVICE AND CRACK DETECTION METHOD [patent_app_type] => utility [patent_app_number] => 18/323421 [patent_app_country] => US [patent_app_date] => 2023-05-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 13085 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 128 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18323421 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/323421
Display panel, electronic device and crack detection method May 24, 2023 Issued
Array ( [id] => 18787329 [patent_doc_number] => 20230375613 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-11-23 [patent_title] => TESTING ELEMENTS FOR BONDED STRUCTURES [patent_app_type] => utility [patent_app_number] => 18/321314 [patent_app_country] => US [patent_app_date] => 2023-05-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 13856 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -22 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18321314 [rel_patent_id] =>[rel_patent_doc_number] =>)
18/321314
Testing elements for bonded structures May 21, 2023 Issued
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