
Stanley S. Silverman
Supervisory Patent Examiner (ID: 16942, Phone: (571)272-1358 , Office: P/1736 )
| Most Active Art Unit | 1504 |
| Art Unit(s) | 1308, 1793, 1103, 1736, 1731, 3201, 1309, 1504, 1754 |
| Total Applications | 327 |
| Issued Applications | 259 |
| Pending Applications | 8 |
| Abandoned Applications | 60 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 19529893
[patent_doc_number] => 20240353795
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-10-24
[patent_title] => HOLOGRAPHIC MICROSCOPE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE USING THE SAME
[patent_app_type] => utility
[patent_app_number] => 18/736084
[patent_app_country] => US
[patent_app_date] => 2024-06-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 10236
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 154
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18736084
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/736084 | HOLOGRAPHIC MICROSCOPE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE USING THE SAME | Jun 5, 2024 | Pending |
Array
(
[id] => 19676986
[patent_doc_number] => 12188840
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2025-01-07
[patent_title] => Refractive periscope for extended-pupil parallelism and virtual imaging distance measurements
[patent_app_type] => utility
[patent_app_number] => 18/647481
[patent_app_country] => US
[patent_app_date] => 2024-04-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 29
[patent_figures_cnt] => 29
[patent_no_of_words] => 7224
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 295
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18647481
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/647481 | Refractive periscope for extended-pupil parallelism and virtual imaging distance measurements | Apr 25, 2024 | Issued |
Array
(
[id] => 19189249
[patent_doc_number] => 20240168162
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-05-23
[patent_title] => APPARATUSES AND METHODS FOR A ROTATING OPTICAL REFLECTOR
[patent_app_type] => utility
[patent_app_number] => 18/424615
[patent_app_country] => US
[patent_app_date] => 2024-01-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 8236
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 77
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18424615
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/424615 | APPARATUSES AND METHODS FOR A ROTATING OPTICAL REFLECTOR | Jan 25, 2024 | Pending |
Array
(
[id] => 19136305
[patent_doc_number] => 11971249
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2024-04-30
[patent_title] => Optical parallelism system for extended reality metrology
[patent_app_type] => utility
[patent_app_number] => 18/385035
[patent_app_country] => US
[patent_app_date] => 2023-10-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 29
[patent_figures_cnt] => 31
[patent_no_of_words] => 6539
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 218
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18385035
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/385035 | Optical parallelism system for extended reality metrology | Oct 29, 2023 | Issued |
Array
(
[id] => 19229600
[patent_doc_number] => 12009243
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2024-06-11
[patent_title] => Overlay measurement device and method, and system and program therefor
[patent_app_type] => utility
[patent_app_number] => 18/227652
[patent_app_country] => US
[patent_app_date] => 2023-07-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 9762
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 219
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18227652
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/227652 | Overlay measurement device and method, and system and program therefor | Jul 27, 2023 | Issued |
Array
(
[id] => 19326893
[patent_doc_number] => 12044570
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2024-07-23
[patent_title] => Calibration for an instrument (device, sensor)
[patent_app_type] => utility
[patent_app_number] => 18/320295
[patent_app_country] => US
[patent_app_date] => 2023-05-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 5690
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 46
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18320295
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/320295 | Calibration for an instrument (device, sensor) | May 18, 2023 | Issued |
Array
(
[id] => 19052017
[patent_doc_number] => 20240093986
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-03-21
[patent_title] => APPARATUS AND METHOD FOR COAXIALLY ALIGNING TWO ROTATABLE SHAFTS
[patent_app_type] => utility
[patent_app_number] => 18/307852
[patent_app_country] => US
[patent_app_date] => 2023-04-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 6673
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -20
[patent_words_short_claim] => 2
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18307852
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/307852 | Apparatus and method for coaxially aligning two rotatable shafts | Apr 26, 2023 | Issued |
Array
(
[id] => 18512664
[patent_doc_number] => 20230228876
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-07-20
[patent_title] => APPARATUSES AND METHODS FOR A ROTATING OPTICAL REFLECTOR
[patent_app_type] => utility
[patent_app_number] => 18/161387
[patent_app_country] => US
[patent_app_date] => 2023-01-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 8208
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -18
[patent_words_short_claim] => 77
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18161387
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/161387 | Apparatuses and methods for a rotating optical reflector | Jan 29, 2023 | Issued |
Array
(
[id] => 18406859
[patent_doc_number] => 20230168210
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-06-01
[patent_title] => MULTIPLE REFLECTOMETRY FOR MEASURING ETCH PARAMETERS
[patent_app_type] => utility
[patent_app_number] => 18/101869
[patent_app_country] => US
[patent_app_date] => 2023-01-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 6178
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 104
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18101869
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/101869 | Multiple reflectometry for measuring etch parameters | Jan 25, 2023 | Issued |
Array
(
[id] => 18486085
[patent_doc_number] => 20230213425
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-07-06
[patent_title] => HOLOGRAPHIC CHARACTERIZATION OF IRREGULAR PARTICLES
[patent_app_type] => utility
[patent_app_number] => 18/148499
[patent_app_country] => US
[patent_app_date] => 2022-12-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 6616
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -12
[patent_words_short_claim] => 113
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18148499
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/148499 | Holographic characterization of irregular particles | Dec 29, 2022 | Issued |
Array
(
[id] => 18319984
[patent_doc_number] => 20230118112
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-04-20
[patent_title] => MONITORING DEVICE AND MONITORING SYSTEM
[patent_app_type] => utility
[patent_app_number] => 18/066138
[patent_app_country] => US
[patent_app_date] => 2022-12-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 14438
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -34
[patent_words_short_claim] => 84
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18066138
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/066138 | Monitoring device and monitoring system | Dec 13, 2022 | Issued |
Array
(
[id] => 18280546
[patent_doc_number] => 20230096018
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-03-30
[patent_title] => WAFER NOTCH POSITIONING DETECTION
[patent_app_type] => utility
[patent_app_number] => 18/060981
[patent_app_country] => US
[patent_app_date] => 2022-12-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 6172
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 60
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18060981
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/060981 | Wafer notch positioning detection | Dec 1, 2022 | Issued |
Array
(
[id] => 18180266
[patent_doc_number] => 20230040995
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-02-09
[patent_title] => DEPTH PROFILING OF SEMICONDUCTOR STRUCTURES USING PICOSECOND ULTRASONICS
[patent_app_type] => utility
[patent_app_number] => 17/970054
[patent_app_country] => US
[patent_app_date] => 2022-10-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 23118
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 123
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17970054
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/970054 | Depth profiling of semiconductor structures using picosecond ultrasonics | Oct 19, 2022 | Issued |
Array
(
[id] => 18110715
[patent_doc_number] => 20230003595
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-01-05
[patent_title] => DAMAGE IDENTIFICATION METHOD BASED ON CABLE FORCE TESTS OF CABLE SYSTEM AND TEST ERROR SELF-ADAPTIVE ANALYSIS
[patent_app_type] => utility
[patent_app_number] => 17/941619
[patent_app_country] => US
[patent_app_date] => 2022-09-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 5073
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -8
[patent_words_short_claim] => 540
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17941619
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/941619 | Damage identification method based on cable force tests of cable system and test error self-adaptive analysis | Sep 8, 2022 | Issued |
Array
(
[id] => 18981193
[patent_doc_number] => 11906356
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2024-02-20
[patent_title] => Spectral-characteristic acquisition apparatus and method of obtaining spectral characteristics
[patent_app_type] => utility
[patent_app_number] => 17/876087
[patent_app_country] => US
[patent_app_date] => 2022-07-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 25
[patent_no_of_words] => 13581
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 132
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17876087
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/876087 | Spectral-characteristic acquisition apparatus and method of obtaining spectral characteristics | Jul 27, 2022 | Issued |
Array
(
[id] => 19369001
[patent_doc_number] => 12061080
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2024-08-13
[patent_title] => Optical-based validation of parallelism between internal facets
[patent_app_type] => utility
[patent_app_number] => 18/578616
[patent_app_country] => US
[patent_app_date] => 2022-07-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 13
[patent_no_of_words] => 15765
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 269
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18578616
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/578616 | Optical-based validation of parallelism between internal facets | Jul 25, 2022 | Issued |
Array
(
[id] => 18183982
[patent_doc_number] => 20230044712
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-02-09
[patent_title] => DISTANCE MEASUREMENT SYSTEM, DISTANCE MEASUREMENT DEVICE, AND DISTANCE MEASUREMENT METHOD
[patent_app_type] => utility
[patent_app_number] => 17/868169
[patent_app_country] => US
[patent_app_date] => 2022-07-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 7752
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -12
[patent_words_short_claim] => 100
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17868169
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/868169 | DISTANCE MEASUREMENT SYSTEM, DISTANCE MEASUREMENT DEVICE, AND DISTANCE MEASUREMENT METHOD | Jul 18, 2022 | Abandoned |
Array
(
[id] => 18125609
[patent_doc_number] => 20230011226
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-01-12
[patent_title] => FILM THICKNESS MEASUREMENT METHOD, FILM THICKNESS MEASUREMENT DEVICE, AND FILM FORMATION SYSTEM
[patent_app_type] => utility
[patent_app_number] => 17/853455
[patent_app_country] => US
[patent_app_date] => 2022-06-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 10196
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 110
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17853455
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/853455 | Film thickness measurement method, film thickness measurement device, and film formation system | Jun 28, 2022 | Issued |
Array
(
[id] => 18110632
[patent_doc_number] => 20230003512
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-01-05
[patent_title] => Measuring Device and Method of Determining a Depth of Field of an Optical Setup
[patent_app_type] => utility
[patent_app_number] => 17/841514
[patent_app_country] => US
[patent_app_date] => 2022-06-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 7704
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -10
[patent_words_short_claim] => 124
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17841514
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/841514 | Measuring device and method of determining a depth of field of an optical setup | Jun 14, 2022 | Issued |
Array
(
[id] => 18818716
[patent_doc_number] => 20230393056
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-12-07
[patent_title] => FLUID IDENTIFICATION USING OPTICAL DATA MEASUREMENTS
[patent_app_type] => utility
[patent_app_number] => 17/834892
[patent_app_country] => US
[patent_app_date] => 2022-06-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 8066
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 127
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17834892
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/834892 | Fluid identification using optical data measurements | Jun 6, 2022 | Issued |