Search

Stanley S. Silverman

Supervisory Patent Examiner (ID: 16942, Phone: (571)272-1358 , Office: P/1736 )

Most Active Art Unit
1504
Art Unit(s)
1308, 1793, 1103, 1736, 1731, 3201, 1309, 1504, 1754
Total Applications
327
Issued Applications
259
Pending Applications
8
Abandoned Applications
60

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 18037394 [patent_doc_number] => 20220381609 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-12-01 [patent_title] => REDUCING POLARIZATION DEPENDENT LOSS (PDL) IN A GRATING-BASED OPTICAL SPECTRUM ANALYZER (OSA) [patent_app_type] => utility [patent_app_number] => 17/334132 [patent_app_country] => US [patent_app_date] => 2021-05-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6769 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 76 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17334132 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/334132
Reducing polarization dependent loss (PDL) in a grating-based optical spectrum analyzer (OSA) May 27, 2021 Issued
Array ( [id] => 17244642 [patent_doc_number] => 20210364385 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-11-25 [patent_title] => METHOD AND SYSTEM FOR INTERROGATING OPTICAL FIBERS [patent_app_type] => utility [patent_app_number] => 17/325529 [patent_app_country] => US [patent_app_date] => 2021-05-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8010 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -13 [patent_words_short_claim] => 137 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17325529 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/325529
Method and system for interrogating optical fibers May 19, 2021 Issued
Array ( [id] => 17070694 [patent_doc_number] => 20210272911 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-09-02 [patent_title] => OVERLAY MARK AND METHOD OF MAKING [patent_app_type] => utility [patent_app_number] => 17/323396 [patent_app_country] => US [patent_app_date] => 2021-05-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10493 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17323396 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/323396
Overlay mark and method of making May 17, 2021 Issued
Array ( [id] => 17991249 [patent_doc_number] => 20220357286 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-11-10 [patent_title] => EFFECTIVE CELL APPROXIMATION MODEL FOR LOGIC STRUCTURES [patent_app_type] => utility [patent_app_number] => 17/308949 [patent_app_country] => US [patent_app_date] => 2021-05-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8726 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 79 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17308949 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/308949
Effective cell approximation model for logic structures May 4, 2021 Issued
Array ( [id] => 17468539 [patent_doc_number] => 11275014 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2022-03-15 [patent_title] => Particle characteristic measurement apparatus [patent_app_type] => utility [patent_app_number] => 17/246872 [patent_app_country] => US [patent_app_date] => 2021-05-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 4388 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 300 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17246872 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/246872
Particle characteristic measurement apparatus May 2, 2021 Issued
Array ( [id] => 18290726 [patent_doc_number] => 11619594 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-04-04 [patent_title] => Multiple reflectometry for measuring etch parameters [patent_app_type] => utility [patent_app_number] => 17/242569 [patent_app_country] => US [patent_app_date] => 2021-04-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 7 [patent_no_of_words] => 6116 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 125 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17242569 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/242569
Multiple reflectometry for measuring etch parameters Apr 27, 2021 Issued
Array ( [id] => 16993009 [patent_doc_number] => 20210231429 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-07-29 [patent_title] => LIQUID DROPLET MEASUREMENT METHOD AND LIQUID DROPLET MEASUREMENT DEVICE, AND METHOD AND APPARATUS FOR MANUFACTURING DEVICE [patent_app_type] => utility [patent_app_number] => 17/232817 [patent_app_country] => US [patent_app_date] => 2021-04-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7723 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 150 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17232817 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/232817
LIQUID DROPLET MEASUREMENT METHOD AND LIQUID DROPLET MEASUREMENT DEVICE, AND METHOD AND APPARATUS FOR MANUFACTURING DEVICE Apr 15, 2021 Abandoned
Array ( [id] => 17696948 [patent_doc_number] => 11370657 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-06-28 [patent_title] => Method and apparatus for manufacturing microfluidic chip with femtosecond plasma grating [patent_app_type] => utility [patent_app_number] => 17/230237 [patent_app_country] => US [patent_app_date] => 2021-04-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 6155 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 293 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17230237 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/230237
Method and apparatus for manufacturing microfluidic chip with femtosecond plasma grating Apr 13, 2021 Issued
Array ( [id] => 16981443 [patent_doc_number] => 20210225680 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-07-22 [patent_title] => SYSTEMS AND METHODS FOR ORIENTATOR BASED WAFER DEFECT SENSING [patent_app_type] => utility [patent_app_number] => 17/227079 [patent_app_country] => US [patent_app_date] => 2021-04-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7725 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 88 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17227079 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/227079
Systems and methods for orientator based wafer defect sensing Apr 8, 2021 Issued
Array ( [id] => 18560807 [patent_doc_number] => 11726046 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-08-15 [patent_title] => Multi-scale spectral imaging apparatuses and methods, and methods of manufacturing semiconductor devices by using the imaging methods [patent_app_type] => utility [patent_app_number] => 17/225275 [patent_app_country] => US [patent_app_date] => 2021-04-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 26 [patent_figures_cnt] => 26 [patent_no_of_words] => 11054 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 132 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17225275 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/225275
Multi-scale spectral imaging apparatuses and methods, and methods of manufacturing semiconductor devices by using the imaging methods Apr 7, 2021 Issued
Array ( [id] => 18479199 [patent_doc_number] => 11692933 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-07-04 [patent_title] => Systems and methods of ambient gas sensing in a vehicle [patent_app_type] => utility [patent_app_number] => 17/224046 [patent_app_country] => US [patent_app_date] => 2021-04-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 18 [patent_no_of_words] => 9884 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 127 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17224046 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/224046
Systems and methods of ambient gas sensing in a vehicle Apr 5, 2021 Issued
Array ( [id] => 19136399 [patent_doc_number] => 11971344 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-04-30 [patent_title] => Electrode quality evaluation method and electrode manufacturing method [patent_app_type] => utility [patent_app_number] => 17/915260 [patent_app_country] => US [patent_app_date] => 2021-04-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4650 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17915260 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/915260
Electrode quality evaluation method and electrode manufacturing method Mar 31, 2021 Issued
Array ( [id] => 17506462 [patent_doc_number] => 20220099565 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-03-31 [patent_title] => METHOD AND APPARATUS FOR CORRECTING ERROR OF OPTICAL SENSOR, APPARATUS FOR ESTIMATING BIO-INFORMATION [patent_app_type] => utility [patent_app_number] => 17/217307 [patent_app_country] => US [patent_app_date] => 2021-03-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7319 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 69 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17217307 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/217307
Method and apparatus for correcting error of optical sensor, apparatus for estimating bio-information Mar 29, 2021 Issued
Array ( [id] => 17914630 [patent_doc_number] => 20220317025 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-10-06 [patent_title] => OPTO-ACOUSTIC MEASUREMENT OF A TRANSPARENT FILM STACK [patent_app_type] => utility [patent_app_number] => 17/217990 [patent_app_country] => US [patent_app_date] => 2021-03-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11409 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 107 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17217990 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/217990
Opto-acoustic measurement of a transparent film stack Mar 29, 2021 Issued
Array ( [id] => 17898163 [patent_doc_number] => 20220307825 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-09-29 [patent_title] => Modulation Of Scanning Velocity During Overlay Metrology [patent_app_type] => utility [patent_app_number] => 17/214888 [patent_app_country] => US [patent_app_date] => 2021-03-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7705 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -23 [patent_words_short_claim] => 72 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17214888 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/214888
Modulation of scanning velocity during overlay metrology Mar 27, 2021 Issued
Array ( [id] => 17735911 [patent_doc_number] => 20220221370 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-07-14 [patent_title] => DEVICE AND METHOD FOR MEASURING THICKNESS OF DIELECTRIC LAYER IN CIRCUIT BOARD [patent_app_type] => utility [patent_app_number] => 17/209954 [patent_app_country] => US [patent_app_date] => 2021-03-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2035 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 166 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17209954 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/209954
Device and method for measuring thickness of dielectric layer in circuit board Mar 22, 2021 Issued
Array ( [id] => 17923737 [patent_doc_number] => 11466977 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-10-11 [patent_title] => Subcutaneous fat thickness measurement by Raman spectroscopy [patent_app_type] => utility [patent_app_number] => 17/249932 [patent_app_country] => US [patent_app_date] => 2021-03-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 21 [patent_no_of_words] => 8590 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 90 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17249932 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/249932
Subcutaneous fat thickness measurement by Raman spectroscopy Mar 17, 2021 Issued
Array ( [id] => 16933647 [patent_doc_number] => 20210199536 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-07-01 [patent_title] => TEST METHOD FOR CHARACTERIZING AN OPTICAL FIBER LINK [patent_app_type] => utility [patent_app_number] => 17/198686 [patent_app_country] => US [patent_app_date] => 2021-03-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10841 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 34 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17198686 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/198686
Test method for characterizing an optical fiber link Mar 10, 2021 Issued
Array ( [id] => 18429992 [patent_doc_number] => 11675208 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2023-06-13 [patent_title] => Reflectometer, spectrophotometer, ellipsometer and polarimeter system with a super continuum laser source of a beam of electromagnetism, and improved detector system [patent_app_type] => utility [patent_app_number] => 17/300091 [patent_app_country] => US [patent_app_date] => 2021-03-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 25 [patent_no_of_words] => 13110 [patent_no_of_claims] => 42 [patent_no_of_ind_claims] => 10 [patent_words_short_claim] => 186 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17300091 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/300091
Reflectometer, spectrophotometer, ellipsometer and polarimeter system with a super continuum laser source of a beam of electromagnetism, and improved detector system Mar 4, 2021 Issued
Array ( [id] => 16933708 [patent_doc_number] => 20210199597 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-07-01 [patent_title] => WAFER SHAPE AND FLATNESS MEASUREMENT APPARATUS AND METHOD [patent_app_type] => utility [patent_app_number] => 17/188932 [patent_app_country] => US [patent_app_date] => 2021-03-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8587 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -19 [patent_words_short_claim] => 58 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17188932 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/188932
Wafer shape and flatness measurement apparatus and method Feb 28, 2021 Issued
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