Steven J. Ganey

Array ( [id] => 1229568 [patent_doc_number] => 06701474 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2004-03-02 [patent_title] => 'System and method for testing integrated circuits' [patent_app_type] => B2 [patent_app_number] => 09/888054 [patent_app_country] => US [patent_app_date] => 2001-06-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 13 [patent_no_of_words] => 11744 [patent_no_of_claims] => 63 [patent_no_of_ind_claims] => 17 [patent_words_short_claim] => 66 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/06/701/06701474.pdf [firstpage_image] =>[orig_patent_app_number] => 09888054 [rel_patent_id] =>[rel_patent_doc_number] =>)