Thanh T Nguyen
Examiner (ID: 10324, Phone: (571)272-1695 , Office: P/2893 )
Most Active Art Unit | 2893 |
Art Unit(s) | 2144, 2143, 2121, 2893, 2448, 2813, 2444 |
Total Applications | 2814 |
Issued Applications | 2220 |
Pending Applications | 158 |
Abandoned Applications | 436 |
Applications
Application number | Title of the application | Filing Date | Status |
---|---|---|---|
Array
(
[id] => 5407840
[patent_doc_number] => 20090121738
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[patent_title] => 'SEMICONDUCTOR TEST DEVICE'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/261489 | Semiconductor test device | Oct 29, 2008 | Issued |
Array
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[patent_title] => 'Fiber-optic current sensor with polarimetric detection scheme'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/256289 | Fiber-optic current sensor with polarimetric detection scheme | Oct 21, 2008 | Issued |
Array
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[patent_title] => 'Method and System for Derivation of Breakdown Voltage for MOS Integrated Circuit Devices'
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Array
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[patent_title] => 'Sensor, sensor system, portable sensor system, method of analyzing metal ions, mounting substrate, method of analyzing plating preventing chemical species, method of analyzing produced compound, and method of analyzing monovalent copper chemical species'
[patent_app_type] => utility
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Array
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Array
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Array
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[patent_doc_number] => 20090206865
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[patent_title] => 'ELECTRICAL TEST STRUCTURE AND METHOD FOR CHARACTERIZATION OF DEEP TRENCH SIDEWALL RELIABILITY'
[patent_app_type] => utility
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[firstpage_image] =>[orig_patent_app_number] => 12212289
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/212289 | Electrical test structure and method for characterization of deep trench sidewall reliability | Sep 16, 2008 | Issued |
Array
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[patent_issue_date] => 2010-06-15
[patent_title] => 'Current-voltage-based method for evaluating thin dielectrics based on interface traps'
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[patent_app_number] => 12/209986
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Array
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[patent_title] => 'HIGH FREQUENCY DIFFERENTIAL TEST PROBE FOR AUTOMATED PRINTED WIRING BOARD TEST SYSTEMS'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/208590 | High frequency differential test probe for automated printed wiring board test systems | Sep 10, 2008 | Issued |
Array
(
[id] => 4624994
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[patent_issue_date] => 2011-08-23
[patent_title] => 'Probe head apparatus for testing semiconductors'
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Array
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[id] => 6590768
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[patent_title] => 'IN SITU MEMBRANE MONITORING'
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Array
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[id] => 6106818
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Array
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Array
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Array
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Array
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Array
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