Thanh T Nguyen
Examiner (ID: 10324, Phone: (571)272-1695 , Office: P/2893 )
Most Active Art Unit | 2893 |
Art Unit(s) | 2144, 2143, 2121, 2893, 2448, 2813, 2444 |
Total Applications | 2814 |
Issued Applications | 2220 |
Pending Applications | 158 |
Abandoned Applications | 436 |
Applications
Application number | Title of the application | Filing Date | Status |
---|---|---|---|
Array
(
[id] => 8275482
[patent_doc_number] => 20120169355
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2012-07-05
[patent_title] => 'SENSOR STRIP FOR OBSTACLE DETECTION AND CONNECTING STRUCTURE THEREOF'
[patent_app_type] => utility
[patent_app_number] => 13/392640
[patent_app_country] => US
[patent_app_date] => 2011-07-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 3730
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13392640
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/392640 | SENSOR STRIP FOR OBSTACLE DETECTION AND CONNECTING STRUCTURE THEREOF | Jul 21, 2011 | Abandoned |
Array
(
[id] => 7572882
[patent_doc_number] => 20110268538
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-11-03
[patent_title] => 'COMPONENT TEST APPARATUS AND COMPONENT TRANSPORT METHOD'
[patent_app_type] => utility
[patent_app_number] => 13/182861
[patent_app_country] => US
[patent_app_date] => 2011-07-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 13492
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0268/20110268538.pdf
[firstpage_image] =>[orig_patent_app_number] => 13182861
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/182861 | Component test apparatus and component transport method | Jul 13, 2011 | Issued |
Array
(
[id] => 8785303
[patent_doc_number] => 08432149
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2013-04-30
[patent_title] => 'Array column integrator'
[patent_app_type] => utility
[patent_app_number] => 13/174465
[patent_app_country] => US
[patent_app_date] => 2011-06-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 50
[patent_figures_cnt] => 75
[patent_no_of_words] => 27209
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 106
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13174465
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/174465 | Array column integrator | Jun 29, 2011 | Issued |
Array
(
[id] => 8730779
[patent_doc_number] => 20130076348
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2013-03-28
[patent_title] => 'EDDY CURRENT SENSOR AND EDDY CURRENT MEASUREMENT METHOD'
[patent_app_type] => utility
[patent_app_number] => 13/696021
[patent_app_country] => US
[patent_app_date] => 2011-06-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 17
[patent_figures_cnt] => 17
[patent_no_of_words] => 16505
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13696021
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/696021 | Eddy current sensor and eddy current measurement method | Jun 14, 2011 | Issued |
Array
(
[id] => 6011408
[patent_doc_number] => 20110221423
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-09-15
[patent_title] => 'MULTIMETER HAVING COMMUNICATIONS VIA MEASUREMENT TERMINALS AND COMMUNICATION SYSTEM FOR SAME'
[patent_app_type] => utility
[patent_app_number] => 13/116689
[patent_app_country] => US
[patent_app_date] => 2011-05-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 4474
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0221/20110221423.pdf
[firstpage_image] =>[orig_patent_app_number] => 13116689
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/116689 | Multimeter having communications via measurement terminals and communication system for same | May 25, 2011 | Issued |
Array
(
[id] => 8839335
[patent_doc_number] => 20130134964
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2013-05-30
[patent_title] => 'COIL COMPRISING A WINDING COMPRISING A MULTI-AXIAL CABLE'
[patent_app_type] => utility
[patent_app_number] => 13/699079
[patent_app_country] => US
[patent_app_date] => 2011-05-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 2179
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13699079
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/699079 | COIL COMPRISING A WINDING COMPRISING A MULTI-AXIAL CABLE | May 19, 2011 | Abandoned |
Array
(
[id] => 6094372
[patent_doc_number] => 20110219345
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-09-08
[patent_title] => 'Generating Test Benches for Pre-Silicon Validation of Retimed Complex IC Designs Against a Reference Design'
[patent_app_type] => utility
[patent_app_number] => 13/108615
[patent_app_country] => US
[patent_app_date] => 2011-05-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 6154
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0219/20110219345.pdf
[firstpage_image] =>[orig_patent_app_number] => 13108615
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/108615 | Generating test benches for pre-silicon validation of retimed complex IC designs against a reference design | May 15, 2011 | Issued |
Array
(
[id] => 7562458
[patent_doc_number] => 20110276292
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-11-10
[patent_title] => 'Method and apparatus for reading a programmable anti-fuse element in a high-voltage integrated circuit'
[patent_app_type] => utility
[patent_app_number] => 13/066624
[patent_app_country] => US
[patent_app_date] => 2011-04-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 3999
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0276/20110276292.pdf
[firstpage_image] =>[orig_patent_app_number] => 13066624
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/066624 | Method and apparatus for reading a programmable anti-fuse element in a high-voltage integrated circuit | Apr 19, 2011 | Issued |
Array
(
[id] => 6162206
[patent_doc_number] => 20110193585
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-08-11
[patent_title] => 'CONVEYOR-BASED MEMORY-MODULE TESTER WITH ELEVATORS DISTRIBUTING MOVING TEST MOTHERBOARDS AMONG PARALLEL CONVEYORS FOR TESTING'
[patent_app_type] => utility
[patent_app_number] => 13/089108
[patent_app_country] => US
[patent_app_date] => 2011-04-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 6083
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0193/20110193585.pdf
[firstpage_image] =>[orig_patent_app_number] => 13089108
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/089108 | Conveyor-based memory-module tester with elevators distributing moving test motherboards among parallel conveyors for testing | Apr 17, 2011 | Issued |
Array
(
[id] => 7811824
[patent_doc_number] => 08134356
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-03-13
[patent_title] => 'Operating an integrated circuit at a minimum supply voltage'
[patent_app_type] => utility
[patent_app_number] => 13/046103
[patent_app_country] => US
[patent_app_date] => 2011-03-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 16
[patent_no_of_words] => 13118
[patent_no_of_claims] => 29
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 112
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/134/08134356.pdf
[firstpage_image] =>[orig_patent_app_number] => 13046103
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/046103 | Operating an integrated circuit at a minimum supply voltage | Mar 10, 2011 | Issued |
Array
(
[id] => 8956741
[patent_doc_number] => 08502523
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2013-08-06
[patent_title] => 'Test apparatus and test method'
[patent_app_type] => utility
[patent_app_number] => 13/024264
[patent_app_country] => US
[patent_app_date] => 2011-02-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 8525
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 129
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13024264
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/024264 | Test apparatus and test method | Feb 8, 2011 | Issued |
Array
(
[id] => 8233471
[patent_doc_number] => 08198909
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-06-12
[patent_title] => 'Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion'
[patent_app_type] => utility
[patent_app_number] => 13/022803
[patent_app_country] => US
[patent_app_date] => 2011-02-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 17
[patent_figures_cnt] => 17
[patent_no_of_words] => 15418
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 185
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/198/08198909.pdf
[firstpage_image] =>[orig_patent_app_number] => 13022803
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/022803 | Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion | Feb 7, 2011 | Issued |
Array
(
[id] => 6099684
[patent_doc_number] => 20110163763
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-07-07
[patent_title] => 'ELECTRICAL CAPACITANCE SENSOR'
[patent_app_type] => utility
[patent_app_number] => 13/023012
[patent_app_country] => US
[patent_app_date] => 2011-02-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
[patent_figures_cnt] => 14
[patent_no_of_words] => 7846
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0163/20110163763.pdf
[firstpage_image] =>[orig_patent_app_number] => 13023012
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/023012 | Electrical capacitance sensor | Feb 7, 2011 | Issued |
Array
(
[id] => 5941353
[patent_doc_number] => 20110101973
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-05-05
[patent_title] => 'SENSOR SYSTEM AND METHOD'
[patent_app_type] => utility
[patent_app_number] => 13/005158
[patent_app_country] => US
[patent_app_date] => 2011-01-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 2406
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0101/20110101973.pdf
[firstpage_image] =>[orig_patent_app_number] => 13005158
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/005158 | Sensor system and method | Jan 11, 2011 | Issued |
Array
(
[id] => 6036915
[patent_doc_number] => 20110089964
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-04-21
[patent_title] => 'METHOD FOR TESTING SEMICONDUCTOR MEMORY DEVICE USING PROBE AND SEMICONDUCTOR MEMORY DEVICE USING THE SAME'
[patent_app_type] => utility
[patent_app_number] => 12/980437
[patent_app_country] => US
[patent_app_date] => 2010-12-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 6422
[patent_no_of_claims] => 21
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0089/20110089964.pdf
[firstpage_image] =>[orig_patent_app_number] => 12980437
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/980437 | METHOD FOR TESTING SEMICONDUCTOR MEMORY DEVICE USING PROBE AND SEMICONDUCTOR MEMORY DEVICE USING THE SAME | Dec 28, 2010 | Abandoned |
Array
(
[id] => 8446983
[patent_doc_number] => 08289040
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-10-16
[patent_title] => 'Test wafer unit and test system'
[patent_app_type] => utility
[patent_app_number] => 12/947721
[patent_app_country] => US
[patent_app_date] => 2010-11-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 13
[patent_no_of_words] => 8502
[patent_no_of_claims] => 22
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 222
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12947721
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/947721 | Test wafer unit and test system | Nov 15, 2010 | Issued |
Array
(
[id] => 7811846
[patent_doc_number] => 08134378
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-03-13
[patent_title] => 'Reconfigurable connections for stacked semiconductor devices'
[patent_app_type] => utility
[patent_app_number] => 12/900286
[patent_app_country] => US
[patent_app_date] => 2010-10-07
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 10893
[patent_no_of_claims] => 9
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 151
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/134/08134378.pdf
[firstpage_image] =>[orig_patent_app_number] => 12900286
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/900286 | Reconfigurable connections for stacked semiconductor devices | Oct 6, 2010 | Issued |
Array
(
[id] => 6115708
[patent_doc_number] => 20110074456
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-03-31
[patent_title] => 'PROBE APPARATUS AND TEST APPARATUS'
[patent_app_type] => utility
[patent_app_number] => 12/885403
[patent_app_country] => US
[patent_app_date] => 2010-09-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 5988
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0074/20110074456.pdf
[firstpage_image] =>[orig_patent_app_number] => 12885403
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/885403 | Probe apparatus and test apparatus | Sep 16, 2010 | Issued |
Array
(
[id] => 8275499
[patent_doc_number] => 20120169365
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2012-07-05
[patent_title] => 'SUBSTRATE INSPECTING APPARATUS AND ALIGNING METHOD IN SUBSTRATE INSPECTING APPARATUS'
[patent_app_type] => utility
[patent_app_number] => 13/395291
[patent_app_country] => US
[patent_app_date] => 2010-09-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 29
[patent_figures_cnt] => 29
[patent_no_of_words] => 12577
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13395291
[rel_patent_id] =>[rel_patent_doc_number] =>) 13/395291 | SUBSTRATE INSPECTING APPARATUS AND ALIGNING METHOD IN SUBSTRATE INSPECTING APPARATUS | Sep 8, 2010 | Abandoned |
Array
(
[id] => 4528186
[patent_doc_number] => 07952368
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2011-05-31
[patent_title] => 'Apparatus and method for measuring diode chip'
[patent_app_type] => utility
[patent_app_number] => 12/876218
[patent_app_country] => US
[patent_app_date] => 2010-09-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 5
[patent_no_of_words] => 4455
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 131
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/952/07952368.pdf
[firstpage_image] =>[orig_patent_app_number] => 12876218
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/876218 | Apparatus and method for measuring diode chip | Sep 5, 2010 | Issued |