Search

Thanh T Nguyen

Examiner (ID: 10324, Phone: (571)272-1695 , Office: P/2893 )

Most Active Art Unit
2893
Art Unit(s)
2144, 2143, 2121, 2893, 2448, 2813, 2444
Total Applications
2814
Issued Applications
2220
Pending Applications
158
Abandoned Applications
436

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 8275482 [patent_doc_number] => 20120169355 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-07-05 [patent_title] => 'SENSOR STRIP FOR OBSTACLE DETECTION AND CONNECTING STRUCTURE THEREOF' [patent_app_type] => utility [patent_app_number] => 13/392640 [patent_app_country] => US [patent_app_date] => 2011-07-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3730 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13392640 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/392640
SENSOR STRIP FOR OBSTACLE DETECTION AND CONNECTING STRUCTURE THEREOF Jul 21, 2011 Abandoned
Array ( [id] => 7572882 [patent_doc_number] => 20110268538 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-11-03 [patent_title] => 'COMPONENT TEST APPARATUS AND COMPONENT TRANSPORT METHOD' [patent_app_type] => utility [patent_app_number] => 13/182861 [patent_app_country] => US [patent_app_date] => 2011-07-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 13492 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0268/20110268538.pdf [firstpage_image] =>[orig_patent_app_number] => 13182861 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/182861
Component test apparatus and component transport method Jul 13, 2011 Issued
Array ( [id] => 8785303 [patent_doc_number] => 08432149 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-04-30 [patent_title] => 'Array column integrator' [patent_app_type] => utility [patent_app_number] => 13/174465 [patent_app_country] => US [patent_app_date] => 2011-06-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 50 [patent_figures_cnt] => 75 [patent_no_of_words] => 27209 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 106 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13174465 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/174465
Array column integrator Jun 29, 2011 Issued
Array ( [id] => 8730779 [patent_doc_number] => 20130076348 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-03-28 [patent_title] => 'EDDY CURRENT SENSOR AND EDDY CURRENT MEASUREMENT METHOD' [patent_app_type] => utility [patent_app_number] => 13/696021 [patent_app_country] => US [patent_app_date] => 2011-06-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 17 [patent_no_of_words] => 16505 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13696021 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/696021
Eddy current sensor and eddy current measurement method Jun 14, 2011 Issued
Array ( [id] => 6011408 [patent_doc_number] => 20110221423 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-09-15 [patent_title] => 'MULTIMETER HAVING COMMUNICATIONS VIA MEASUREMENT TERMINALS AND COMMUNICATION SYSTEM FOR SAME' [patent_app_type] => utility [patent_app_number] => 13/116689 [patent_app_country] => US [patent_app_date] => 2011-05-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 4474 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0221/20110221423.pdf [firstpage_image] =>[orig_patent_app_number] => 13116689 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/116689
Multimeter having communications via measurement terminals and communication system for same May 25, 2011 Issued
Array ( [id] => 8839335 [patent_doc_number] => 20130134964 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2013-05-30 [patent_title] => 'COIL COMPRISING A WINDING COMPRISING A MULTI-AXIAL CABLE' [patent_app_type] => utility [patent_app_number] => 13/699079 [patent_app_country] => US [patent_app_date] => 2011-05-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2179 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13699079 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/699079
COIL COMPRISING A WINDING COMPRISING A MULTI-AXIAL CABLE May 19, 2011 Abandoned
Array ( [id] => 6094372 [patent_doc_number] => 20110219345 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-09-08 [patent_title] => 'Generating Test Benches for Pre-Silicon Validation of Retimed Complex IC Designs Against a Reference Design' [patent_app_type] => utility [patent_app_number] => 13/108615 [patent_app_country] => US [patent_app_date] => 2011-05-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 6154 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0219/20110219345.pdf [firstpage_image] =>[orig_patent_app_number] => 13108615 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/108615
Generating test benches for pre-silicon validation of retimed complex IC designs against a reference design May 15, 2011 Issued
Array ( [id] => 7562458 [patent_doc_number] => 20110276292 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-11-10 [patent_title] => 'Method and apparatus for reading a programmable anti-fuse element in a high-voltage integrated circuit' [patent_app_type] => utility [patent_app_number] => 13/066624 [patent_app_country] => US [patent_app_date] => 2011-04-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 3999 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0276/20110276292.pdf [firstpage_image] =>[orig_patent_app_number] => 13066624 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/066624
Method and apparatus for reading a programmable anti-fuse element in a high-voltage integrated circuit Apr 19, 2011 Issued
Array ( [id] => 6162206 [patent_doc_number] => 20110193585 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-08-11 [patent_title] => 'CONVEYOR-BASED MEMORY-MODULE TESTER WITH ELEVATORS DISTRIBUTING MOVING TEST MOTHERBOARDS AMONG PARALLEL CONVEYORS FOR TESTING' [patent_app_type] => utility [patent_app_number] => 13/089108 [patent_app_country] => US [patent_app_date] => 2011-04-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 6083 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0193/20110193585.pdf [firstpage_image] =>[orig_patent_app_number] => 13089108 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/089108
Conveyor-based memory-module tester with elevators distributing moving test motherboards among parallel conveyors for testing Apr 17, 2011 Issued
Array ( [id] => 7811824 [patent_doc_number] => 08134356 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-03-13 [patent_title] => 'Operating an integrated circuit at a minimum supply voltage' [patent_app_type] => utility [patent_app_number] => 13/046103 [patent_app_country] => US [patent_app_date] => 2011-03-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 16 [patent_no_of_words] => 13118 [patent_no_of_claims] => 29 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/134/08134356.pdf [firstpage_image] =>[orig_patent_app_number] => 13046103 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/046103
Operating an integrated circuit at a minimum supply voltage Mar 10, 2011 Issued
Array ( [id] => 8956741 [patent_doc_number] => 08502523 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-08-06 [patent_title] => 'Test apparatus and test method' [patent_app_type] => utility [patent_app_number] => 13/024264 [patent_app_country] => US [patent_app_date] => 2011-02-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 8525 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 129 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13024264 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/024264
Test apparatus and test method Feb 8, 2011 Issued
Array ( [id] => 8233471 [patent_doc_number] => 08198909 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-06-12 [patent_title] => 'Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion' [patent_app_type] => utility [patent_app_number] => 13/022803 [patent_app_country] => US [patent_app_date] => 2011-02-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 17 [patent_no_of_words] => 15418 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 185 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/198/08198909.pdf [firstpage_image] =>[orig_patent_app_number] => 13022803 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/022803
Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion Feb 7, 2011 Issued
Array ( [id] => 6099684 [patent_doc_number] => 20110163763 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-07-07 [patent_title] => 'ELECTRICAL CAPACITANCE SENSOR' [patent_app_type] => utility [patent_app_number] => 13/023012 [patent_app_country] => US [patent_app_date] => 2011-02-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 7846 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0163/20110163763.pdf [firstpage_image] =>[orig_patent_app_number] => 13023012 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/023012
Electrical capacitance sensor Feb 7, 2011 Issued
Array ( [id] => 5941353 [patent_doc_number] => 20110101973 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-05-05 [patent_title] => 'SENSOR SYSTEM AND METHOD' [patent_app_type] => utility [patent_app_number] => 13/005158 [patent_app_country] => US [patent_app_date] => 2011-01-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 2406 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0101/20110101973.pdf [firstpage_image] =>[orig_patent_app_number] => 13005158 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/005158
Sensor system and method Jan 11, 2011 Issued
Array ( [id] => 6036915 [patent_doc_number] => 20110089964 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-04-21 [patent_title] => 'METHOD FOR TESTING SEMICONDUCTOR MEMORY DEVICE USING PROBE AND SEMICONDUCTOR MEMORY DEVICE USING THE SAME' [patent_app_type] => utility [patent_app_number] => 12/980437 [patent_app_country] => US [patent_app_date] => 2010-12-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 6422 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0089/20110089964.pdf [firstpage_image] =>[orig_patent_app_number] => 12980437 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/980437
METHOD FOR TESTING SEMICONDUCTOR MEMORY DEVICE USING PROBE AND SEMICONDUCTOR MEMORY DEVICE USING THE SAME Dec 28, 2010 Abandoned
Array ( [id] => 8446983 [patent_doc_number] => 08289040 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-10-16 [patent_title] => 'Test wafer unit and test system' [patent_app_type] => utility [patent_app_number] => 12/947721 [patent_app_country] => US [patent_app_date] => 2010-11-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 8502 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 222 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12947721 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/947721
Test wafer unit and test system Nov 15, 2010 Issued
Array ( [id] => 7811846 [patent_doc_number] => 08134378 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-03-13 [patent_title] => 'Reconfigurable connections for stacked semiconductor devices' [patent_app_type] => utility [patent_app_number] => 12/900286 [patent_app_country] => US [patent_app_date] => 2010-10-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 10893 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 151 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/134/08134378.pdf [firstpage_image] =>[orig_patent_app_number] => 12900286 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/900286
Reconfigurable connections for stacked semiconductor devices Oct 6, 2010 Issued
Array ( [id] => 6115708 [patent_doc_number] => 20110074456 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-03-31 [patent_title] => 'PROBE APPARATUS AND TEST APPARATUS' [patent_app_type] => utility [patent_app_number] => 12/885403 [patent_app_country] => US [patent_app_date] => 2010-09-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 5988 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0074/20110074456.pdf [firstpage_image] =>[orig_patent_app_number] => 12885403 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/885403
Probe apparatus and test apparatus Sep 16, 2010 Issued
Array ( [id] => 8275499 [patent_doc_number] => 20120169365 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-07-05 [patent_title] => 'SUBSTRATE INSPECTING APPARATUS AND ALIGNING METHOD IN SUBSTRATE INSPECTING APPARATUS' [patent_app_type] => utility [patent_app_number] => 13/395291 [patent_app_country] => US [patent_app_date] => 2010-09-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 29 [patent_figures_cnt] => 29 [patent_no_of_words] => 12577 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13395291 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/395291
SUBSTRATE INSPECTING APPARATUS AND ALIGNING METHOD IN SUBSTRATE INSPECTING APPARATUS Sep 8, 2010 Abandoned
Array ( [id] => 4528186 [patent_doc_number] => 07952368 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2011-05-31 [patent_title] => 'Apparatus and method for measuring diode chip' [patent_app_type] => utility [patent_app_number] => 12/876218 [patent_app_country] => US [patent_app_date] => 2010-09-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 4455 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 131 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/952/07952368.pdf [firstpage_image] =>[orig_patent_app_number] => 12876218 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/876218
Apparatus and method for measuring diode chip Sep 5, 2010 Issued
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