Search

Thanh T Nguyen

Examiner (ID: 10324, Phone: (571)272-1695 , Office: P/2893 )

Most Active Art Unit
2893
Art Unit(s)
2144, 2143, 2121, 2893, 2448, 2813, 2444
Total Applications
2814
Issued Applications
2220
Pending Applications
158
Abandoned Applications
436

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 4605175 [patent_doc_number] => 07986157 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2011-07-26 [patent_title] => 'High speed probing apparatus for semiconductor devices and probe stage for the same' [patent_app_type] => utility [patent_app_number] => 12/874563 [patent_app_country] => US [patent_app_date] => 2010-09-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 3860 [patent_no_of_claims] => 34 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 111 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/986/07986157.pdf [firstpage_image] =>[orig_patent_app_number] => 12874563 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/874563
High speed probing apparatus for semiconductor devices and probe stage for the same Sep 1, 2010 Issued
Array ( [id] => 8544222 [patent_doc_number] => 08319517 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-11-27 [patent_title] => 'Generator tester' [patent_app_type] => utility [patent_app_number] => 12/868011 [patent_app_country] => US [patent_app_date] => 2010-08-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 6 [patent_no_of_words] => 2125 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 60 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12868011 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/868011
Generator tester Aug 24, 2010 Issued
Array ( [id] => 8871325 [patent_doc_number] => 08466703 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-06-18 [patent_title] => 'Probe card analysis system and method' [patent_app_type] => utility [patent_app_number] => 12/862375 [patent_app_country] => US [patent_app_date] => 2010-08-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 10533 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 56 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12862375 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/862375
Probe card analysis system and method Aug 23, 2010 Issued
Array ( [id] => 8528530 [patent_doc_number] => 08305106 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-11-06 [patent_title] => 'Electronic self-healing methods for radio-frequency receivers' [patent_app_type] => utility [patent_app_number] => 12/806906 [patent_app_country] => US [patent_app_date] => 2010-08-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 25 [patent_figures_cnt] => 44 [patent_no_of_words] => 11755 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 198 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12806906 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/806906
Electronic self-healing methods for radio-frequency receivers Aug 23, 2010 Issued
Array ( [id] => 8773219 [patent_doc_number] => 08427182 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-04-23 [patent_title] => 'Test apparatus and power supply apparatus' [patent_app_type] => utility [patent_app_number] => 12/861695 [patent_app_country] => US [patent_app_date] => 2010-08-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 6741 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 429 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12861695 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/861695
Test apparatus and power supply apparatus Aug 22, 2010 Issued
Array ( [id] => 8871327 [patent_doc_number] => 08466706 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-06-18 [patent_title] => 'Solar combiner with integrated string current monitoring' [patent_app_type] => utility [patent_app_number] => 12/857778 [patent_app_country] => US [patent_app_date] => 2010-08-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5637 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 115 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12857778 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/857778
Solar combiner with integrated string current monitoring Aug 16, 2010 Issued
Array ( [id] => 7782428 [patent_doc_number] => 20120043984 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-02-23 [patent_title] => 'Test Adapter and Method for Achieving Optical Alignment and Thermal Coupling Thereof With a Device Under Test' [patent_app_type] => utility [patent_app_number] => 12/858424 [patent_app_country] => US [patent_app_date] => 2010-08-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 8192 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0043/20120043984.pdf [firstpage_image] =>[orig_patent_app_number] => 12858424 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/858424
Test adapter and method for achieving optical alignment and thermal coupling thereof with a device under test Aug 16, 2010 Issued
Array ( [id] => 6178628 [patent_doc_number] => 20110121848 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-05-26 [patent_title] => 'PROBE WAFER, PROBE DEVICE, AND TESTING SYSTEM' [patent_app_type] => utility [patent_app_number] => 12/857483 [patent_app_country] => US [patent_app_date] => 2010-08-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 7765 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0121/20110121848.pdf [firstpage_image] =>[orig_patent_app_number] => 12857483 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/857483
Probe wafer, probe device, and testing system Aug 15, 2010 Issued
Array ( [id] => 6052970 [patent_doc_number] => 20110109337 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-05-12 [patent_title] => 'PROBE WAFER, PROBE DEVICE, AND TESTING SYSTEM' [patent_app_type] => utility [patent_app_number] => 12/857478 [patent_app_country] => US [patent_app_date] => 2010-08-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 8489 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0109/20110109337.pdf [firstpage_image] =>[orig_patent_app_number] => 12857478 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/857478
Probe wafer, probe device, and testing system Aug 15, 2010 Issued
Array ( [id] => 8399124 [patent_doc_number] => 08269515 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-09-18 [patent_title] => 'High impedance, high parallelism, high temperature memory test system architecture' [patent_app_type] => utility [patent_app_number] => 12/849700 [patent_app_country] => US [patent_app_date] => 2010-08-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 8 [patent_no_of_words] => 4373 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 187 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12849700 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/849700
High impedance, high parallelism, high temperature memory test system architecture Aug 2, 2010 Issued
Array ( [id] => 6419721 [patent_doc_number] => 20100277195 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-11-04 [patent_title] => 'Modular Probe System' [patent_app_type] => utility [patent_app_number] => 12/837693 [patent_app_country] => US [patent_app_date] => 2010-07-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4811 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0277/20100277195.pdf [firstpage_image] =>[orig_patent_app_number] => 12837693 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/837693
Modular Probe System Jul 15, 2010 Abandoned
Array ( [id] => 8262351 [patent_doc_number] => 20120161784 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2012-06-28 [patent_title] => 'HIGH FREQUENCY MEASUREMENT APPARATUS AND METHOD WITH LOAD PULL' [patent_app_type] => utility [patent_app_number] => 13/376256 [patent_app_country] => US [patent_app_date] => 2010-06-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 7336 [patent_no_of_claims] => 27 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13376256 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/376256
HIGH FREQUENCY MEASUREMENT APPARATUS AND METHOD WITH LOAD PULL Jun 3, 2010 Abandoned
Array ( [id] => 7811825 [patent_doc_number] => 08134357 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-03-13 [patent_title] => 'Multi-electrode measuring system' [patent_app_type] => utility [patent_app_number] => 12/777942 [patent_app_country] => US [patent_app_date] => 2010-05-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 16 [patent_no_of_words] => 5584 [patent_no_of_claims] => 43 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 254 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/134/08134357.pdf [firstpage_image] =>[orig_patent_app_number] => 12777942 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/777942
Multi-electrode measuring system May 10, 2010 Issued
Array ( [id] => 4518791 [patent_doc_number] => 07932738 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2011-04-26 [patent_title] => 'Method and apparatus for reading a programmable anti-fuse element in a high-voltage integrated circuit' [patent_app_type] => utility [patent_app_number] => 12/800054 [patent_app_country] => US [patent_app_date] => 2010-05-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3999 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 165 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/932/07932738.pdf [firstpage_image] =>[orig_patent_app_number] => 12800054 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/800054
Method and apparatus for reading a programmable anti-fuse element in a high-voltage integrated circuit May 6, 2010 Issued
Array ( [id] => 6209092 [patent_doc_number] => 20110133757 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-06-09 [patent_title] => 'Apparatus and method for evaluating capacitor' [patent_app_type] => utility [patent_app_number] => 12/662717 [patent_app_country] => US [patent_app_date] => 2010-04-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5074 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0133/20110133757.pdf [firstpage_image] =>[orig_patent_app_number] => 12662717 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/662717
Apparatus and method for evaluating capacitor Apr 28, 2010 Abandoned
Array ( [id] => 6538762 [patent_doc_number] => 20100271041 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-10-28 [patent_title] => 'TESTING APPARATUS WITH HIGH EFFICIENCY AND HIGH ACCURACY' [patent_app_type] => utility [patent_app_number] => 12/766935 [patent_app_country] => US [patent_app_date] => 2010-04-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 2244 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0271/20100271041.pdf [firstpage_image] =>[orig_patent_app_number] => 12766935 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/766935
Testing apparatus with high efficiency and high accuracy Apr 25, 2010 Issued
Array ( [id] => 6538867 [patent_doc_number] => 20100271052 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-10-28 [patent_title] => 'Disconnection detecting device' [patent_app_type] => utility [patent_app_number] => 12/662568 [patent_app_country] => US [patent_app_date] => 2010-04-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 8815 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0271/20100271052.pdf [firstpage_image] =>[orig_patent_app_number] => 12662568 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/662568
Disconnection detecting device Apr 22, 2010 Issued
Array ( [id] => 4497054 [patent_doc_number] => 07956630 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2011-06-07 [patent_title] => 'Real-time effective-wavelength error correction for HDVSI' [patent_app_type] => utility [patent_app_number] => 12/766744 [patent_app_country] => US [patent_app_date] => 2010-04-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 4145 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 108 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/956/07956630.pdf [firstpage_image] =>[orig_patent_app_number] => 12766744 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/766744
Real-time effective-wavelength error correction for HDVSI Apr 22, 2010 Issued
Array ( [id] => 6538881 [patent_doc_number] => 20100271054 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-10-28 [patent_title] => 'INTEGRATED CIRCUIT DEVICE HAVING GROUND OPEN DETECTION CIRCUIT' [patent_app_type] => utility [patent_app_number] => 12/764505 [patent_app_country] => US [patent_app_date] => 2010-04-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 5933 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0271/20100271054.pdf [firstpage_image] =>[orig_patent_app_number] => 12764505 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/764505
Integrated circuit device having ground open detection circuit Apr 20, 2010 Issued
Array ( [id] => 8352751 [patent_doc_number] => 08248083 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-08-21 [patent_title] => 'Processing device for piezoelectric actuator and processing method for piezoelectric actuator' [patent_app_type] => utility [patent_app_number] => 12/759804 [patent_app_country] => US [patent_app_date] => 2010-04-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 3714 [patent_no_of_claims] => 2 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 206 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12759804 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/759804
Processing device for piezoelectric actuator and processing method for piezoelectric actuator Apr 13, 2010 Issued
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