Search

Thanh T Nguyen

Examiner (ID: 10324, Phone: (571)272-1695 , Office: P/2893 )

Most Active Art Unit
2893
Art Unit(s)
2144, 2143, 2121, 2893, 2448, 2813, 2444
Total Applications
2814
Issued Applications
2220
Pending Applications
158
Abandoned Applications
436

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 7507481 [patent_doc_number] => 20110254573 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-10-20 [patent_title] => 'METHOD AND SYSTEM FOR ANALYZING A CHEMICALLY-ACTIVE MATERIAL' [patent_app_type] => utility [patent_app_number] => 12/759730 [patent_app_country] => US [patent_app_date] => 2010-04-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 9905 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0254/20110254573.pdf [firstpage_image] =>[orig_patent_app_number] => 12759730 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/759730
Method and system for analyzing a chemically-active material Apr 13, 2010 Issued
Array ( [id] => 6453936 [patent_doc_number] => 20100283513 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-11-11 [patent_title] => 'RF SENSING CIRCUIT WITH A VOLTAGE-CONTROLLED OSCILLATOR' [patent_app_type] => utility [patent_app_number] => 12/757249 [patent_app_country] => US [patent_app_date] => 2010-04-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 2068 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0283/20100283513.pdf [firstpage_image] =>[orig_patent_app_number] => 12757249 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/757249
RF sensing circuit with a voltage-controlled oscillator Apr 8, 2010 Issued
Array ( [id] => 8933355 [patent_doc_number] => 08493060 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2013-07-23 [patent_title] => 'Electronic circuit tester and method of use' [patent_app_type] => utility [patent_app_number] => 12/752276 [patent_app_country] => US [patent_app_date] => 2010-04-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 9 [patent_no_of_words] => 5316 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 154 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12752276 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/752276
Electronic circuit tester and method of use Mar 31, 2010 Issued
Array ( [id] => 6406496 [patent_doc_number] => 20100179777 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-07-15 [patent_title] => 'TEST PULSES FOR ENABLING REVENUE TESTABLE PANEL METERS' [patent_app_type] => utility [patent_app_number] => 12/728567 [patent_app_country] => US [patent_app_date] => 2010-03-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 4042 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0179/20100179777.pdf [firstpage_image] =>[orig_patent_app_number] => 12728567 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/728567
TEST PULSES FOR ENABLING REVENUE TESTABLE PANEL METERS Mar 21, 2010 Abandoned
Array ( [id] => 8760943 [patent_doc_number] => 08421472 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-04-16 [patent_title] => 'Apparatuses and methods for testing welding apparatuses' [patent_app_type] => utility [patent_app_number] => 12/721597 [patent_app_country] => US [patent_app_date] => 2010-03-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 4661 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 128 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12721597 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/721597
Apparatuses and methods for testing welding apparatuses Mar 10, 2010 Issued
Array ( [id] => 6618851 [patent_doc_number] => 20100225345 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-09-09 [patent_title] => 'APPARATUS AND METHOD FOR TESTING A SEMICONDUCTOR DEVICE' [patent_app_type] => utility [patent_app_number] => 12/710650 [patent_app_country] => US [patent_app_date] => 2010-02-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 4316 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0225/20100225345.pdf [firstpage_image] =>[orig_patent_app_number] => 12710650 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/710650
Apparatus and method for testing a semiconductor device Feb 22, 2010 Issued
Array ( [id] => 9060688 [patent_doc_number] => 08547127 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-10-01 [patent_title] => 'Probe block' [patent_app_type] => utility [patent_app_number] => 13/203641 [patent_app_country] => US [patent_app_date] => 2010-02-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 11 [patent_no_of_words] => 4976 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 230 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 13203641 [rel_patent_id] =>[rel_patent_doc_number] =>)
13/203641
Probe block Feb 21, 2010 Issued
Array ( [id] => 6052972 [patent_doc_number] => 20110109339 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-05-12 [patent_title] => 'APPARATUS AND METHOD FOR INSPECTING CIRCUIT OF SUBSTRATE' [patent_app_type] => utility [patent_app_number] => 12/710149 [patent_app_country] => US [patent_app_date] => 2010-02-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 5529 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0109/20110109339.pdf [firstpage_image] =>[orig_patent_app_number] => 12710149 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/710149
Apparatus and method for inspecting circuit of substrate Feb 21, 2010 Issued
Array ( [id] => 6482812 [patent_doc_number] => 20100213950 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-08-26 [patent_title] => 'SYSTEM IN PACKAGE BATCH TEST METHOD AND BATCH TEST SYSTEM THEREOF' [patent_app_type] => utility [patent_app_number] => 12/708758 [patent_app_country] => US [patent_app_date] => 2010-02-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 9253 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0213/20100213950.pdf [firstpage_image] =>[orig_patent_app_number] => 12708758 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/708758
SYSTEM IN PACKAGE BATCH TEST METHOD AND BATCH TEST SYSTEM THEREOF Feb 18, 2010 Abandoned
Array ( [id] => 8653682 [patent_doc_number] => 08373433 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-02-12 [patent_title] => 'Test apparatus, test method and manufacturing method' [patent_app_type] => utility [patent_app_number] => 12/703568 [patent_app_country] => US [patent_app_date] => 2010-02-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 8602 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 135 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12703568 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/703568
Test apparatus, test method and manufacturing method Feb 9, 2010 Issued
Array ( [id] => 6499242 [patent_doc_number] => 20100201391 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-08-12 [patent_title] => 'APPARATUS AND METHOD FOR TESTING SEMICONDUCTOR DEVICES' [patent_app_type] => utility [patent_app_number] => 12/702347 [patent_app_country] => US [patent_app_date] => 2010-02-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 4806 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0201/20100201391.pdf [firstpage_image] =>[orig_patent_app_number] => 12702347 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/702347
Apparatus and method for testing semiconductor devices Feb 8, 2010 Issued
Array ( [id] => 6474907 [patent_doc_number] => 20100207648 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-08-19 [patent_title] => 'Contact Resistance Test Structure and Method Suitable for Three-Dimensional Integrated Circuits' [patent_app_type] => utility [patent_app_number] => 12/699206 [patent_app_country] => US [patent_app_date] => 2010-02-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 4606 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0207/20100207648.pdf [firstpage_image] =>[orig_patent_app_number] => 12699206 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/699206
Contact resistance test structure and method suitable for three-dimensional integrated circuits Feb 2, 2010 Issued
Array ( [id] => 6312749 [patent_doc_number] => 20100194416 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-08-05 [patent_title] => 'ELECTRICAL CONNECTING APPARATUS' [patent_app_type] => utility [patent_app_number] => 12/698058 [patent_app_country] => US [patent_app_date] => 2010-02-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 4757 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0194/20100194416.pdf [firstpage_image] =>[orig_patent_app_number] => 12698058 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/698058
Electrical connecting apparatus Jan 31, 2010 Issued
Array ( [id] => 8713994 [patent_doc_number] => 08400138 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-03-19 [patent_title] => 'Method and apparatus for measuring current output of low-voltage pad-mount distribution power transformers' [patent_app_type] => utility [patent_app_number] => 12/696319 [patent_app_country] => US [patent_app_date] => 2010-01-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 8 [patent_no_of_words] => 4915 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 152 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12696319 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/696319
Method and apparatus for measuring current output of low-voltage pad-mount distribution power transformers Jan 28, 2010 Issued
Array ( [id] => 6106834 [patent_doc_number] => 20110187396 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-08-04 [patent_title] => 'QUIESCENT CURRENT (IDDQ) INDICATION AND TESTING APPARATUS AND METHODS' [patent_app_type] => utility [patent_app_number] => 12/696257 [patent_app_country] => US [patent_app_date] => 2010-01-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 8679 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0187/20110187396.pdf [firstpage_image] =>[orig_patent_app_number] => 12696257 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/696257
Quiescent current (IDDQ) indication and testing apparatus and methods Jan 28, 2010 Issued
Array ( [id] => 6512044 [patent_doc_number] => 20100219855 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-09-02 [patent_title] => 'Semiconductor device having CMOS transfer circuit and clamp element' [patent_app_type] => utility [patent_app_number] => 12/656453 [patent_app_country] => US [patent_app_date] => 2010-01-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 5510 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0219/20100219855.pdf [firstpage_image] =>[orig_patent_app_number] => 12656453 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/656453
Semiconductor device having CMOS transfer circuit and clamp element Jan 28, 2010 Issued
Array ( [id] => 7753000 [patent_doc_number] => 08111059 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2012-02-07 [patent_title] => 'Electric current locator' [patent_app_type] => utility [patent_app_number] => 12/695197 [patent_app_country] => US [patent_app_date] => 2010-01-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 10456 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 486 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/111/08111059.pdf [firstpage_image] =>[orig_patent_app_number] => 12695197 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/695197
Electric current locator Jan 27, 2010 Issued
Array ( [id] => 6453540 [patent_doc_number] => 20100283496 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-11-11 [patent_title] => 'TRANSMISSION-MODULATED PHOTOCONDUCTIVE DECAY MEASUREMENT SYSTEM' [patent_app_type] => utility [patent_app_number] => 12/694914 [patent_app_country] => US [patent_app_date] => 2010-01-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 7755 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0283/20100283496.pdf [firstpage_image] =>[orig_patent_app_number] => 12694914 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/694914
Transmission-modulated photoconductive decay measurement system Jan 26, 2010 Issued
Array ( [id] => 8376007 [patent_doc_number] => 08258803 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-09-04 [patent_title] => 'Test apparatus and test method' [patent_app_type] => utility [patent_app_number] => 12/694154 [patent_app_country] => US [patent_app_date] => 2010-01-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 12 [patent_no_of_words] => 9506 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 124 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12694154 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/694154
Test apparatus and test method Jan 25, 2010 Issued
Array ( [id] => 9060686 [patent_doc_number] => 08547125 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-10-01 [patent_title] => 'Test apparatus and test module' [patent_app_type] => utility [patent_app_number] => 12/694149 [patent_app_country] => US [patent_app_date] => 2010-01-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 7177 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 62 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12694149 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/694149
Test apparatus and test module Jan 25, 2010 Issued
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