Thanh T Nguyen

Array ( [id] => 8376005 [patent_doc_number] => 08258802 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-09-04 [patent_title] => 'Test apparatus and test method' [patent_app_type] => utility [patent_app_number] => 12/694151 [patent_app_country] => US [patent_app_date] => 2010-01-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 7319 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 155 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12694151 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8578532 [patent_doc_number] => 08344748 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-01-01 [patent_title] => 'Probe for testing semiconductor devices' [patent_app_type] => utility [patent_app_number] => 12/693428 [patent_app_country] => US [patent_app_date] => 2010-01-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 30 [patent_no_of_words] => 6497 [patent_no_of_claims] => 36 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 160 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12693428 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8726279 [patent_doc_number] => 08405405 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-03-26 [patent_title] => 'Wideband I-V probe and method' [patent_app_type] => utility [patent_app_number] => 12/656203 [patent_app_country] => US [patent_app_date] => 2010-01-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 23 [patent_figures_cnt] => 29 [patent_no_of_words] => 3408 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 157 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12656203 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6170940 [patent_doc_number] => 20110175596 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-07-21 [patent_title] => 'CURRENT MEASURING APPARATUS FOR POWER SUPPLY' [patent_app_type] => utility [patent_app_number] => 12/689187 [patent_app_country] => US [patent_app_date] => 2010-01-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 933 [patent_no_of_claims] => 4 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0175/20110175596.pdf [firstpage_image] =>[orig_patent_app_number] => 12689187 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8846982 [patent_doc_number] => 08456169 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-06-04 [patent_title] => 'High speed measurement of random variation/yield in integrated circuit device testing' [patent_app_type] => utility [patent_app_number] => 12/686476 [patent_app_country] => US [patent_app_date] => 2010-01-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 9 [patent_no_of_words] => 4198 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 109 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12686476 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6474690 [patent_doc_number] => 20100207625 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-08-19 [patent_title] => 'CURRENT SENSOR' [patent_app_type] => utility [patent_app_number] => 12/686289 [patent_app_country] => US [patent_app_date] => 2010-01-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2936 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0207/20100207625.pdf [firstpage_image] =>[orig_patent_app_number] => 12686289 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6305951 [patent_doc_number] => 20100109696 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-05-06 [patent_title] => 'ELECTRONICS TESTER WITH A SIGNAL DISTRIBUTION BOARD AND A WAFER CHUCK HAVING DIFFERENT COEFFICIENTS OF THERMAL EXPANSION' [patent_app_type] => utility [patent_app_number] => 12/684051 [patent_app_country] => US [patent_app_date] => 2010-01-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 18 [patent_figures_cnt] => 18 [patent_no_of_words] => 15383 [patent_no_of_claims] => 94 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0109/20100109696.pdf [firstpage_image] =>[orig_patent_app_number] => 12684051 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5941386 [patent_doc_number] => 20110102006 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-05-05 [patent_title] => 'CIRCUIT AND METHOD FOR TESTING SEMICONDUCTOR APPARATUS' [patent_app_type] => utility [patent_app_number] => 12/651066 [patent_app_country] => US [patent_app_date] => 2009-12-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4335 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0102/20110102006.pdf [firstpage_image] =>[orig_patent_app_number] => 12651066 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6155036 [patent_doc_number] => 20110156739 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-06-30 [patent_title] => 'TEST KIT FOR TESTING A CHIP SUBASSEMBLY AND A TESTING METHOD BY USING THE SAME' [patent_app_type] => utility [patent_app_number] => 12/651067 [patent_app_country] => US [patent_app_date] => 2009-12-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2920 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0156/20110156739.pdf [firstpage_image] =>[orig_patent_app_number] => 12651067 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8802995 [patent_doc_number] => 08441272 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-05-14 [patent_title] => 'MEMS probe for probe cards for integrated circuits' [patent_app_type] => utility [patent_app_number] => 12/649109 [patent_app_country] => US [patent_app_date] => 2009-12-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 19 [patent_no_of_words] => 5544 [patent_no_of_claims] => 35 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 121 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12649109 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8352771 [patent_doc_number] => 08248098 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-08-21 [patent_title] => 'Apparatus and method for measuring characteristics of semiconductor device' [patent_app_type] => utility [patent_app_number] => 12/647499 [patent_app_country] => US [patent_app_date] => 2009-12-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 3554 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 186 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12647499 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6257251 [patent_doc_number] => 20100295570 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-11-25 [patent_title] => 'Probe Connector' [patent_app_type] => utility [patent_app_number] => 12/647415 [patent_app_country] => US [patent_app_date] => 2009-12-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 926 [patent_no_of_claims] => 1 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0295/20100295570.pdf [firstpage_image] =>[orig_patent_app_number] => 12647415 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8470630 [patent_doc_number] => 08299812 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-10-30 [patent_title] => 'Probe card' [patent_app_type] => utility [patent_app_number] => 12/646776 [patent_app_country] => US [patent_app_date] => 2009-12-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 5764 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 140 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12646776 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8953582 [patent_doc_number] => RE044407 [patent_country] => US [patent_kind] => E1 [patent_issue_date] => 2013-08-06 [patent_title] => 'Space transformers employing wire bonds for interconnections with fine pitch contacts' [patent_app_type] => reissue [patent_app_number] => 12/646661 [patent_app_country] => US [patent_app_date] => 2009-12-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 5 [patent_no_of_words] => 4168 [patent_no_of_claims] => 68 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 103 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12646661 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 5964463 [patent_doc_number] => 20110148429 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2011-06-23 [patent_title] => 'DC Testing Integrated Circuits' [patent_app_type] => utility [patent_app_number] => 12/643105 [patent_app_country] => US [patent_app_date] => 2009-12-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2703 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0148/20110148429.pdf [firstpage_image] =>[orig_patent_app_number] => 12643105 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6403780 [patent_doc_number] => 20100148811 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-06-17 [patent_title] => 'Probe card, and apparatus and method for testing semiconductor device using the probe card' [patent_app_type] => utility [patent_app_number] => 12/654235 [patent_app_country] => US [patent_app_date] => 2009-12-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 5237 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0148/20100148811.pdf [firstpage_image] =>[orig_patent_app_number] => 12654235 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 4444173 [patent_doc_number] => 07928747 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2011-04-19 [patent_title] => 'Operating an integrated circuit at a minimum supply voltage' [patent_app_type] => utility [patent_app_number] => 12/634373 [patent_app_country] => US [patent_app_date] => 2009-12-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 16 [patent_no_of_words] => 13091 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 100 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/928/07928747.pdf [firstpage_image] =>[orig_patent_app_number] => 12634373 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 8550034 [patent_doc_number] => 08324919 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-12-04 [patent_title] => 'Scrub inducing compliant electrical contact' [patent_app_type] => utility [patent_app_number] => 12/629790 [patent_app_country] => US [patent_app_date] => 2009-12-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 13 [patent_no_of_words] => 3417 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 77 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12629790 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6458298 [patent_doc_number] => 20100039739 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-02-18 [patent_title] => 'VOLTAGE FAULT DETECTION AND PROTECTION' [patent_app_type] => utility [patent_app_number] => 12/606788 [patent_app_country] => US [patent_app_date] => 2009-10-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 5653 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0039/20100039739.pdf [firstpage_image] =>[orig_patent_app_number] => 12606788 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 6462105 [patent_doc_number] => 20100040107 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-02-18 [patent_title] => 'TESTING DEVICE AND TESTING METHOD OF SEMICONDUCTOR DEVICES' [patent_app_type] => utility [patent_app_number] => 12/606609 [patent_app_country] => US [patent_app_date] => 2009-10-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 8932 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0040/20100040107.pdf [firstpage_image] =>[orig_patent_app_number] => 12606609 [rel_patent_id] =>[rel_patent_doc_number] =>)