Thanh T Nguyen
Examiner (ID: 10324, Phone: (571)272-1695 , Office: P/2893 )
Most Active Art Unit | 2893 |
Art Unit(s) | 2144, 2143, 2121, 2893, 2448, 2813, 2444 |
Total Applications | 2814 |
Issued Applications | 2220 |
Pending Applications | 158 |
Abandoned Applications | 436 |
Applications
Application number | Title of the application | Filing Date | Status |
---|---|---|---|
Array
(
[id] => 6115540
[patent_doc_number] => 20110074396
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-03-31
[patent_title] => 'BIOSENSOR AND ELECTRODE STRUCTURE THEREOF'
[patent_app_type] => utility
[patent_app_number] => 12/604984
[patent_app_country] => US
[patent_app_date] => 2009-10-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 2199
[patent_no_of_claims] => 24
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0074/20110074396.pdf
[firstpage_image] =>[orig_patent_app_number] => 12604984
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/604984 | BIOSENSOR AND ELECTRODE STRUCTURE THEREOF | Oct 22, 2009 | Abandoned |
Array
(
[id] => 6036882
[patent_doc_number] => 20110089931
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-04-21
[patent_title] => 'TEMPERATURE-COMPENSATED SHUNT CURRENT MEASUREMENT'
[patent_app_type] => utility
[patent_app_number] => 12/581300
[patent_app_country] => US
[patent_app_date] => 2009-10-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 15
[patent_figures_cnt] => 15
[patent_no_of_words] => 6820
[patent_no_of_claims] => 26
[patent_no_of_ind_claims] => 5
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0089/20110089931.pdf
[firstpage_image] =>[orig_patent_app_number] => 12581300
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/581300 | TEMPERATURE-COMPENSATED SHUNT CURRENT MEASUREMENT | Oct 18, 2009 | Abandoned |
Array
(
[id] => 6618888
[patent_doc_number] => 20100225347
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-09-09
[patent_title] => 'Circuit for Measuring Magnitude of Electrostatic Discharge (ESD) Events for Semiconductor Chip Bonding'
[patent_app_type] => utility
[patent_app_number] => 12/577780
[patent_app_country] => US
[patent_app_date] => 2009-10-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 7211
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0225/20100225347.pdf
[firstpage_image] =>[orig_patent_app_number] => 12577780
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/577780 | Circuit for measuring magnitude of electrostatic discharge (ESD) events for semiconductor chip bonding | Oct 12, 2009 | Issued |
Array
(
[id] => 6579613
[patent_doc_number] => 20100097088
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-04-22
[patent_title] => 'SENSOR APPARATUS'
[patent_app_type] => utility
[patent_app_number] => 12/576590
[patent_app_country] => US
[patent_app_date] => 2009-10-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 2551
[patent_no_of_claims] => 3
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0097/20100097088.pdf
[firstpage_image] =>[orig_patent_app_number] => 12576590
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/576590 | Sensor apparatus | Oct 8, 2009 | Issued |
Array
(
[id] => 6386038
[patent_doc_number] => 20100176836
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-07-15
[patent_title] => 'Wafer Level Burn-In and Electrical Test System and Method'
[patent_app_type] => utility
[patent_app_number] => 12/574447
[patent_app_country] => US
[patent_app_date] => 2009-10-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 17
[patent_figures_cnt] => 17
[patent_no_of_words] => 5169
[patent_no_of_claims] => 26
[patent_no_of_ind_claims] => 22
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0176/20100176836.pdf
[firstpage_image] =>[orig_patent_app_number] => 12574447
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/574447 | Wafer level burn-in and electrical test system and method | Oct 5, 2009 | Issued |
Array
(
[id] => 4544379
[patent_doc_number] => 07876116
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2011-01-25
[patent_title] => 'Compliant chuck for semiconducting device testing and chiller thereof'
[patent_app_type] => utility
[patent_app_number] => 12/568785
[patent_app_country] => US
[patent_app_date] => 2009-09-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 11
[patent_no_of_words] => 3400
[patent_no_of_claims] => 8
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 84
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/876/07876116.pdf
[firstpage_image] =>[orig_patent_app_number] => 12568785
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/568785 | Compliant chuck for semiconducting device testing and chiller thereof | Sep 28, 2009 | Issued |
Array
(
[id] => 8726254
[patent_doc_number] => 08405380
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2013-03-26
[patent_title] => 'Digital multimeters including a remote display'
[patent_app_type] => utility
[patent_app_number] => 12/568602
[patent_app_country] => US
[patent_app_date] => 2009-09-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 28
[patent_figures_cnt] => 28
[patent_no_of_words] => 4325
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 64
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12568602
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/568602 | Digital multimeters including a remote display | Sep 27, 2009 | Issued |
Array
(
[id] => 4488471
[patent_doc_number] => 07902813
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-03-08
[patent_title] => 'Protective digital relay device'
[patent_app_type] => utility
[patent_app_number] => 12/566279
[patent_app_country] => US
[patent_app_date] => 2009-09-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 16
[patent_figures_cnt] => 32
[patent_no_of_words] => 6732
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 114
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/902/07902813.pdf
[firstpage_image] =>[orig_patent_app_number] => 12566279
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/566279 | Protective digital relay device | Sep 23, 2009 | Issued |
Array
(
[id] => 8560638
[patent_doc_number] => 08334704
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-12-18
[patent_title] => 'Systems and methods for providing a system-on-a-substrate'
[patent_app_type] => utility
[patent_app_number] => 12/565085
[patent_app_country] => US
[patent_app_date] => 2009-09-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 10
[patent_no_of_words] => 4330
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 108
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12565085
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/565085 | Systems and methods for providing a system-on-a-substrate | Sep 22, 2009 | Issued |
Array
(
[id] => 6467176
[patent_doc_number] => 20100007332
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-01-14
[patent_title] => 'METHOD AND APPARATUS FOR EVALUATING RAPID CHANGES IN CURRENT'
[patent_app_type] => utility
[patent_app_number] => 12/562786
[patent_app_country] => US
[patent_app_date] => 2009-09-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 1971
[patent_no_of_claims] => 15
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0007/20100007332.pdf
[firstpage_image] =>[orig_patent_app_number] => 12562786
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/562786 | Method and apparatus for evaluating rapid changes in current | Sep 17, 2009 | Issued |
Array
(
[id] => 6203616
[patent_doc_number] => 20110066402
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2011-03-17
[patent_title] => 'MIXED SIGNAL ACQUISITION SYSTEM FOR A MEASUREMENT INSTRUMENT'
[patent_app_type] => utility
[patent_app_number] => 12/561908
[patent_app_country] => US
[patent_app_date] => 2009-09-17
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 4142
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0066/20110066402.pdf
[firstpage_image] =>[orig_patent_app_number] => 12561908
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/561908 | Mixed signal acquisition system for a measurement instrument | Sep 16, 2009 | Issued |
Array
(
[id] => 6355250
[patent_doc_number] => 20100073020
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-03-25
[patent_title] => 'Probe of electrical measuring instrument'
[patent_app_type] => utility
[patent_app_number] => 12/585490
[patent_app_country] => US
[patent_app_date] => 2009-09-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
[patent_figures_cnt] => 14
[patent_no_of_words] => 6032
[patent_no_of_claims] => 27
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0073/20100073020.pdf
[firstpage_image] =>[orig_patent_app_number] => 12585490
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/585490 | Probe of electrical measuring instrument | Sep 15, 2009 | Abandoned |
Array
(
[id] => 6561614
[patent_doc_number] => 20100289481
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-11-18
[patent_title] => 'APPARATUS AND METHOD FOR DC VOLTAGE MEASUREMENT'
[patent_app_type] => utility
[patent_app_number] => 12/561249
[patent_app_country] => US
[patent_app_date] => 2009-09-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 3057
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0289/20100289481.pdf
[firstpage_image] =>[orig_patent_app_number] => 12561249
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/561249 | Apparatus and method for DC voltage measurement | Sep 15, 2009 | Issued |
Array
(
[id] => 8245408
[patent_doc_number] => 08203336
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-06-19
[patent_title] => 'Eddy current probes having magnetic gap'
[patent_app_type] => utility
[patent_app_number] => 12/558531
[patent_app_country] => US
[patent_app_date] => 2009-09-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 1275
[patent_no_of_claims] => 6
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 172
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/203/08203336.pdf
[firstpage_image] =>[orig_patent_app_number] => 12558531
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/558531 | Eddy current probes having magnetic gap | Sep 12, 2009 | Issued |
Array
(
[id] => 8116061
[patent_doc_number] => 08159249
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-04-17
[patent_title] => 'Inspection unit'
[patent_app_type] => utility
[patent_app_number] => 12/553386
[patent_app_country] => US
[patent_app_date] => 2009-09-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 21
[patent_no_of_words] => 7221
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 122
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/08/159/08159249.pdf
[firstpage_image] =>[orig_patent_app_number] => 12553386
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/553386 | Inspection unit | Sep 2, 2009 | Issued |
Array
(
[id] => 8283566
[patent_doc_number] => 08217673
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2012-07-10
[patent_title] => 'Method and circuit for testing integrated circuit'
[patent_app_type] => utility
[patent_app_number] => 12/552288
[patent_app_country] => US
[patent_app_date] => 2009-09-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 2
[patent_no_of_words] => 4295
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 201
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12552288
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/552288 | Method and circuit for testing integrated circuit | Sep 1, 2009 | Issued |
Array
(
[id] => 6216910
[patent_doc_number] => 20100052655
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2010-03-04
[patent_title] => 'Self Contained Kilowatt-Hour meter Integral to Standard Load Center'
[patent_app_type] => utility
[patent_app_number] => 12/551891
[patent_app_country] => US
[patent_app_date] => 2009-09-01
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 4767
[patent_no_of_claims] => 38
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0052/20100052655.pdf
[firstpage_image] =>[orig_patent_app_number] => 12551891
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/551891 | Self contained kilowatt-hour meter integral to standard load center | Aug 31, 2009 | Issued |
Array
(
[id] => 8956742
[patent_doc_number] => 08502524
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2013-08-06
[patent_title] => 'Current measurement in an inverter unit and a frequency converter'
[patent_app_type] => utility
[patent_app_number] => 12/547353
[patent_app_country] => US
[patent_app_date] => 2009-08-25
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 5
[patent_no_of_words] => 3227
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 153
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12547353
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/547353 | Current measurement in an inverter unit and a frequency converter | Aug 24, 2009 | Issued |
Array
(
[id] => 4511867
[patent_doc_number] => 07915904
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-03-29
[patent_title] => 'System resistance simulating apparatus'
[patent_app_type] => utility
[patent_app_number] => 12/546640
[patent_app_country] => US
[patent_app_date] => 2009-08-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 7
[patent_figures_cnt] => 7
[patent_no_of_words] => 1046
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 114
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/915/07915904.pdf
[firstpage_image] =>[orig_patent_app_number] => 12546640
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/546640 | System resistance simulating apparatus | Aug 23, 2009 | Issued |
Array
(
[id] => 4473122
[patent_doc_number] => 07944229
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2011-05-17
[patent_title] => 'Method and apparatus for calibrating internal pulses in an integrated circuit'
[patent_app_type] => utility
[patent_app_number] => 12/543215
[patent_app_country] => US
[patent_app_date] => 2009-08-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 10
[patent_no_of_words] => 4384
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 91
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/944/07944229.pdf
[firstpage_image] =>[orig_patent_app_number] => 12543215
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/543215 | Method and apparatus for calibrating internal pulses in an integrated circuit | Aug 17, 2009 | Issued |