Thanh T Nguyen
Examiner (ID: 10324, Phone: (571)272-1695 , Office: P/2893 )
Most Active Art Unit | 2893 |
Art Unit(s) | 2144, 2143, 2121, 2893, 2448, 2813, 2444 |
Total Applications | 2814 |
Issued Applications | 2220 |
Pending Applications | 158 |
Abandoned Applications | 436 |
Applications
Application number | Title of the application | Filing Date | Status |
---|---|---|---|
Array
(
[id] => 8714033
[patent_doc_number] => 08400176
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[patent_issue_date] => 2013-03-19
[patent_title] => 'Wafer level contactor'
[patent_app_type] => utility
[patent_app_number] => 12/543386
[patent_app_country] => US
[patent_app_date] => 2009-08-18
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[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12543386
[rel_patent_id] =>[rel_patent_doc_number] =>) 12/543386 | Wafer level contactor | Aug 17, 2009 | Issued |
Array
(
[id] => 5926220
[patent_doc_number] => 20110037458
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[patent_kind] => A1
[patent_issue_date] => 2011-02-17
[patent_title] => 'Open loop magneto-resistive magnetic field sensor'
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Array
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[patent_issue_date] => 2009-12-03
[patent_title] => 'REPLACEABLE PROBE APPARATUS FOR PROBING SEMICONDUCTOR WAFER'
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[patent_app_date] => 2009-08-11
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/539208 | Replaceable probe apparatus for probing semiconductor wafer | Aug 10, 2009 | Issued |
Array
(
[id] => 5949457
[patent_doc_number] => 20110031968
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[patent_issue_date] => 2011-02-10
[patent_title] => 'Three axis field monitor'
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Array
(
[id] => 6193602
[patent_doc_number] => 20110025356
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[patent_title] => 'METHOD FOR MAKING ELECTRICAL TEST PROBE CONTACTS'
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Array
(
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[patent_title] => 'AUXILIARY POWER UNIT DIAGNOSTIC TOOL'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/509891 | Auxiliary power unit diagnostic tool | Jul 26, 2009 | Issued |
Array
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/502286 | PROBER AND SEMICONDUCTOR WAFER TESTING METHOD USING THE SAME | Jul 13, 2009 | Abandoned |
Array
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[id] => 6443465
[patent_doc_number] => 20100088888
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[patent_issue_date] => 2010-04-15
[patent_title] => 'LITHOGRAPHIC CONTACT ELEMENTS'
[patent_app_type] => utility
[patent_app_number] => 12/498886
[patent_app_country] => US
[patent_app_date] => 2009-07-07
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/498886 | LITHOGRAPHIC CONTACT ELEMENTS | Jul 6, 2009 | Abandoned |
Array
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[id] => 6355037
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[patent_title] => 'TEST EQUIPMENT AND TEST SYSTEM USING THE SAME'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/497641 | Test equipment and test system using the same | Jul 2, 2009 | Issued |
Array
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[id] => 6474790
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[patent_issue_date] => 2010-08-19
[patent_title] => 'POWER INTERRUPTION DETECTING SYSTEM, ELECTRONIC DEVICE AND POWER INTERRUPTION DETECTING DEVICE THEREOF'
[patent_app_type] => utility
[patent_app_number] => 12/494310
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/494310 | Power interruption detecting system, electronic device and power interruption detecting device thereof | Jun 29, 2009 | Issued |
Array
(
[id] => 8375997
[patent_doc_number] => 08258797
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[patent_kind] => B2
[patent_issue_date] => 2012-09-04
[patent_title] => 'Capacitive sensor interference determination'
[patent_app_type] => utility
[patent_app_number] => 12/491102
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/491102 | Capacitive sensor interference determination | Jun 23, 2009 | Issued |
Array
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[patent_title] => 'Multi-frequency transmitter for a metal detector'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 12/490164 | Multi-frequency transmitter for a metal detector | Jun 22, 2009 | Issued |
Array
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[id] => 6575731
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[patent_title] => 'DERIVING AN ELECTROMAGNETIC FIELD IN ONE DIRECTION BASED ON MEASUREMENT DATA OF ONE OR MORE SENSING ELEMENTS FOR MEASURING AN ELECTROMAGNETIC FIELD IN ANOTHER DIRECTION'
[patent_app_type] => utility
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Array
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[id] => 8544206
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[patent_title] => 'Optical component identifier'
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Array
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[id] => 8625648
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Array
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Array
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Array
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