Search

Thanh T Nguyen

Examiner (ID: 10324, Phone: (571)272-1695 , Office: P/2893 )

Most Active Art Unit
2893
Art Unit(s)
2144, 2143, 2121, 2893, 2448, 2813, 2444
Total Applications
2814
Issued Applications
2220
Pending Applications
158
Abandoned Applications
436

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 5512507 [patent_doc_number] => 20090212811 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-08-27 [patent_title] => 'Semiconductor device and method for testing the same' [patent_app_type] => utility [patent_app_number] => 12/379286 [patent_app_country] => US [patent_app_date] => 2009-02-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 3146 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0212/20090212811.pdf [firstpage_image] =>[orig_patent_app_number] => 12379286 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/379286
Semiconductor device and method for testing the same Feb 17, 2009 Abandoned
Array ( [id] => 6474533 [patent_doc_number] => 20100207609 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-08-19 [patent_title] => 'NON-CONTACT SENSOR SYSTEM AND METHOD FOR SELECTION DETERMINATION' [patent_app_type] => utility [patent_app_number] => 12/372594 [patent_app_country] => US [patent_app_date] => 2009-02-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 6475 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0207/20100207609.pdf [firstpage_image] =>[orig_patent_app_number] => 12372594 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/372594
Non-contact sensor system and method for selection determination Feb 16, 2009 Issued
Array ( [id] => 8625624 [patent_doc_number] => 08358121 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-01-22 [patent_title] => 'Digital multimeter having remote display with automatic communication mode switching' [patent_app_type] => utility [patent_app_number] => 12/356885 [patent_app_country] => US [patent_app_date] => 2009-01-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 13 [patent_no_of_words] => 3677 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 98 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12356885 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/356885
Digital multimeter having remote display with automatic communication mode switching Jan 20, 2009 Issued
Array ( [id] => 6330810 [patent_doc_number] => 20100327895 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-12-30 [patent_title] => 'MODULE FOR A PARALLEL TESTER FOR THE TESTING OF CIRCUIT BOARDS' [patent_app_type] => utility [patent_app_number] => 12/863739 [patent_app_country] => US [patent_app_date] => 2009-01-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 5507 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0327/20100327895.pdf [firstpage_image] =>[orig_patent_app_number] => 12863739 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/863739
Module for a parallel tester for the testing of circuit boards Jan 18, 2009 Issued
Array ( [id] => 5352522 [patent_doc_number] => 20090183866 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-07-23 [patent_title] => 'Thermal control unit for semiconductor testing' [patent_app_type] => utility [patent_app_number] => 12/321003 [patent_app_country] => US [patent_app_date] => 2009-01-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 16 [patent_figures_cnt] => 16 [patent_no_of_words] => 5575 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0183/20090183866.pdf [firstpage_image] =>[orig_patent_app_number] => 12321003 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/321003
Thermal control unit for semiconductor testing Jan 13, 2009 Issued
Array ( [id] => 5276043 [patent_doc_number] => 20090128175 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-05-21 [patent_title] => 'PROBE UNIT SUBSTRATE' [patent_app_type] => utility [patent_app_number] => 12/353813 [patent_app_country] => US [patent_app_date] => 2009-01-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 4812 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0128/20090128175.pdf [firstpage_image] =>[orig_patent_app_number] => 12353813 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/353813
Probe unit substrate Jan 13, 2009 Issued
Array ( [id] => 5341001 [patent_doc_number] => 20090179651 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-07-16 [patent_title] => 'PHOTOVOLTAIC CELL SOLAR SIMULATOR' [patent_app_type] => utility [patent_app_number] => 12/351087 [patent_app_country] => US [patent_app_date] => 2009-01-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 14371 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0179/20090179651.pdf [firstpage_image] =>[orig_patent_app_number] => 12351087 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/351087
Photovoltaic cell solar simulator Jan 8, 2009 Issued
Array ( [id] => 5432709 [patent_doc_number] => 20090167295 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-07-02 [patent_title] => 'PORTABLE ELECTRONIC DEVICE WITH ELECTRONIC COMPASS AND METHOD FOR CALIBRATING COMPASS' [patent_app_type] => utility [patent_app_number] => 12/343416 [patent_app_country] => US [patent_app_date] => 2008-12-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 4079 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0167/20090167295.pdf [firstpage_image] =>[orig_patent_app_number] => 12343416 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/343416
Portable electronic device with electronic compass and method for calibrating compass Dec 22, 2008 Issued
Array ( [id] => 5432708 [patent_doc_number] => 20090167294 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-07-02 [patent_title] => 'TEST HANDLER, METHOD FOR LOADING AND MANUFACTURING PACKAGED CHIPS, AND METHOD FOR TRANSFERRING TEST TRAYS' [patent_app_type] => utility [patent_app_number] => 12/339785 [patent_app_country] => US [patent_app_date] => 2008-12-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 13099 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0167/20090167294.pdf [firstpage_image] =>[orig_patent_app_number] => 12339785 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/339785
Test handler, method for loading and manufacturing packaged chips, and method for transferring test trays Dec 18, 2008 Issued
Array ( [id] => 6403764 [patent_doc_number] => 20100148808 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-06-17 [patent_title] => 'METHODS AND APPARATUS TO ANALYZE ON-CHIP CONTROLLED INTEGRATED CIRCUITS' [patent_app_type] => utility [patent_app_number] => 12/335286 [patent_app_country] => US [patent_app_date] => 2008-12-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 4485 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0148/20100148808.pdf [firstpage_image] =>[orig_patent_app_number] => 12335286 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/335286
Methods and apparatus to analyze on-chip controlled integrated circuits Dec 14, 2008 Issued
Array ( [id] => 8446985 [patent_doc_number] => 08289041 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-10-16 [patent_title] => 'Semiconductor integrated circuit device which has first chip and second chip accessed via the first chip and test method thereof' [patent_app_type] => utility [patent_app_number] => 12/314689 [patent_app_country] => US [patent_app_date] => 2008-12-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 9608 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 117 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12314689 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/314689
Semiconductor integrated circuit device which has first chip and second chip accessed via the first chip and test method thereof Dec 14, 2008 Issued
Array ( [id] => 5543299 [patent_doc_number] => 20090153176 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-06-18 [patent_title] => 'Semiconductor device' [patent_app_type] => utility [patent_app_number] => 12/314586 [patent_app_country] => US [patent_app_date] => 2008-12-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 12526 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0153/20090153176.pdf [firstpage_image] =>[orig_patent_app_number] => 12314586 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/314586
Semiconductor device Dec 11, 2008 Abandoned
Array ( [id] => 8592685 [patent_doc_number] => 08350562 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-01-08 [patent_title] => 'Device with contactless adjustment means' [patent_app_type] => utility [patent_app_number] => 12/332748 [patent_app_country] => US [patent_app_date] => 2008-12-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 11 [patent_no_of_words] => 3192 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 139 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12332748 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/332748
Device with contactless adjustment means Dec 10, 2008 Issued
Array ( [id] => 8018535 [patent_doc_number] => 08138775 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2012-03-20 [patent_title] => 'CMOS-controlled printhead sense circuit in inkjet printer' [patent_app_type] => utility [patent_app_number] => 12/330586 [patent_app_country] => US [patent_app_date] => 2008-12-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 2187 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 218 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/08/138/08138775.pdf [firstpage_image] =>[orig_patent_app_number] => 12330586 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/330586
CMOS-controlled printhead sense circuit in inkjet printer Dec 8, 2008 Issued
Array ( [id] => 5420218 [patent_doc_number] => 20090146673 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-06-11 [patent_title] => 'Manufacturing method of probe card and the probe card' [patent_app_type] => utility [patent_app_number] => 12/315745 [patent_app_country] => US [patent_app_date] => 2008-12-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3239 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0146/20090146673.pdf [firstpage_image] =>[orig_patent_app_number] => 12315745 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/315745
Manufacturing method of probe card and the probe card Dec 4, 2008 Issued
Array ( [id] => 9255401 [patent_doc_number] => 08618824 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2013-12-31 [patent_title] => 'MEMS based Kelvin probe for material state characterization' [patent_app_type] => utility [patent_app_number] => 12/277116 [patent_app_country] => US [patent_app_date] => 2008-11-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 4 [patent_no_of_words] => 2430 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 111 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 12277116 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/277116
MEMS based Kelvin probe for material state characterization Nov 23, 2008 Issued
Array ( [id] => 5531193 [patent_doc_number] => 20090230981 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-09-17 [patent_title] => 'INCREASING THERMAL ISOLATION OF A PROBE CARD ASSEMBLY' [patent_app_type] => utility [patent_app_number] => 12/275491 [patent_app_country] => US [patent_app_date] => 2008-11-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 6147 [patent_no_of_claims] => 29 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0230/20090230981.pdf [firstpage_image] =>[orig_patent_app_number] => 12275491 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/275491
Increasing thermal isolation of a probe card assembly Nov 20, 2008 Issued
Array ( [id] => 5562028 [patent_doc_number] => 20090134880 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2009-05-28 [patent_title] => 'TEST CIRCUITS AND CURRENT PULSE GENERATOR FOR SIMULATING AN ELECTOSTATIC DISCHARGE' [patent_app_type] => utility [patent_app_number] => 12/274365 [patent_app_country] => US [patent_app_date] => 2008-11-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 7175 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0134/20090134880.pdf [firstpage_image] =>[orig_patent_app_number] => 12274365 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/274365
Test circuits and current pulse generator for simulating an electrostatic discharge Nov 19, 2008 Issued
Array ( [id] => 6521790 [patent_doc_number] => 20100123455 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-05-20 [patent_title] => 'HIGH VOLTAGE CONNECTOR AND METHOD HAVING INTEGRATED VOLTAGE MEASUREMENT PROBE POINTS' [patent_app_type] => utility [patent_app_number] => 12/274384 [patent_app_country] => US [patent_app_date] => 2008-11-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3468 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 5 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0123/20100123455.pdf [firstpage_image] =>[orig_patent_app_number] => 12274384 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/274384
High voltage connector and method having integrated voltage measurement probe points Nov 19, 2008 Issued
Array ( [id] => 6305972 [patent_doc_number] => 20100109698 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2010-05-06 [patent_title] => 'PROBE ASSEMBLY ARRANGEMENT' [patent_app_type] => utility [patent_app_number] => 12/265592 [patent_app_country] => US [patent_app_date] => 2008-11-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 4818 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 8 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0109/20100109698.pdf [firstpage_image] =>[orig_patent_app_number] => 12265592 [rel_patent_id] =>[rel_patent_doc_number] =>)
12/265592
Probe assembly arrangement Nov 4, 2008 Issued
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