Search

Thomas Brown

Examiner (ID: 19061)

Most Active Art Unit
2601
Art Unit(s)
2786, 2899, 2742, 2306, 2857, 2787, 2305, 2601, 2604
Total Applications
1242
Issued Applications
1062
Pending Applications
29
Abandoned Applications
151

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 18292269 [patent_doc_number] => 11621142 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-04-04 [patent_title] => Substrate positioning device and electron beam inspection tool [patent_app_type] => utility [patent_app_number] => 16/992058 [patent_app_country] => US [patent_app_date] => 2020-08-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 9 [patent_no_of_words] => 7684 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 207 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16992058 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/992058
Substrate positioning device and electron beam inspection tool Aug 11, 2020 Issued
Array ( [id] => 19071011 [patent_doc_number] => 20240105437 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-03-28 [patent_title] => MASS SPECTROMETER [patent_app_type] => utility [patent_app_number] => 17/768929 [patent_app_country] => US [patent_app_date] => 2020-08-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8726 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -6 [patent_words_short_claim] => 296 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17768929 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/768929
Mass spectrometer Aug 10, 2020 Issued
Array ( [id] => 17876656 [patent_doc_number] => 11448663 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-09-20 [patent_title] => Pattern height information correction system and pattern height information correction method [patent_app_type] => utility [patent_app_number] => 16/984813 [patent_app_country] => US [patent_app_date] => 2020-08-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 12 [patent_no_of_words] => 6932 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 121 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16984813 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/984813
Pattern height information correction system and pattern height information correction method Aug 3, 2020 Issued
Array ( [id] => 16576652 [patent_doc_number] => 20210011053 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-01-14 [patent_title] => Method And Apparatus Of Atomic Force Microscope Based Infrared Spectroscopy With Controlled Probing Depth [patent_app_type] => utility [patent_app_number] => 16/940996 [patent_app_country] => US [patent_app_date] => 2020-07-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7563 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -24 [patent_words_short_claim] => 139 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16940996 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/940996
Method and apparatus of atomic force microscope based infrared spectroscopy with controlled probing depth Jul 27, 2020 Issued
Array ( [id] => 16763683 [patent_doc_number] => 20210109264 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-04-15 [patent_title] => Thin laminar material for producing short wave infrared emission [patent_app_type] => utility [patent_app_number] => 16/940428 [patent_app_country] => US [patent_app_date] => 2020-07-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8626 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -20 [patent_words_short_claim] => 124 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16940428 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/940428
Thin laminar material for producing short wave infrared emission Jul 27, 2020 Issued
Array ( [id] => 16440298 [patent_doc_number] => 20200357625 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-11-12 [patent_title] => MASS SPECTROMETER AND METHOD FOR TIME-OF-FLIGHT MASS SPECTROMETRY [patent_app_type] => utility [patent_app_number] => 16/937883 [patent_app_country] => US [patent_app_date] => 2020-07-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8140 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 95 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16937883 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/937883
MASS SPECTROMETER AND METHOD FOR TIME-OF-FLIGHT MASS SPECTROMETRY Jul 23, 2020 Abandoned
Array ( [id] => 17795509 [patent_doc_number] => 20220254601 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-08-11 [patent_title] => TOMOGRAPHIC ATOM PROBE WITH TERAHERTZ PULSE GENERATOR [patent_app_type] => utility [patent_app_number] => 17/623584 [patent_app_country] => US [patent_app_date] => 2020-07-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4013 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -11 [patent_words_short_claim] => 131 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17623584 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/623584
TOMOGRAPHIC ATOM PROBE WITH TERAHERTZ PULSE GENERATOR Jul 22, 2020 Pending
Array ( [id] => 16660565 [patent_doc_number] => 20210057202 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-02-25 [patent_title] => ION FLOW GUIDE DEVICES AND METHODS [patent_app_type] => utility [patent_app_number] => 16/937033 [patent_app_country] => US [patent_app_date] => 2020-07-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9677 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -19 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16937033 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/937033
Ion flow guide devices and methods Jul 22, 2020 Issued
Array ( [id] => 17795507 [patent_doc_number] => 20220254599 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-08-11 [patent_title] => MULTIPLE LANDING ENERGY SCANNING ELECTRON MICROSCOPY SYSTEMS AND METHODS [patent_app_type] => utility [patent_app_number] => 17/630455 [patent_app_country] => US [patent_app_date] => 2020-07-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8475 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -13 [patent_words_short_claim] => 74 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17630455 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/630455
Multiple landing energy scanning electron microscopy systems and methods Jul 17, 2020 Issued
Array ( [id] => 18855080 [patent_doc_number] => 11852654 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-12-26 [patent_title] => Cantilever with a collocated piezoelectric actuator-sensor pair [patent_app_type] => utility [patent_app_number] => 16/932161 [patent_app_country] => US [patent_app_date] => 2020-07-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 14 [patent_no_of_words] => 5665 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 189 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16932161 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/932161
Cantilever with a collocated piezoelectric actuator-sensor pair Jul 16, 2020 Issued
Array ( [id] => 16612249 [patent_doc_number] => 20210030902 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-02-04 [patent_title] => SYSTEMS AND METHODS FOR SANITIZING PORTABLE DEVICES [patent_app_type] => utility [patent_app_number] => 16/924011 [patent_app_country] => US [patent_app_date] => 2020-07-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 20902 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 61 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16924011 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/924011
SYSTEMS AND METHODS FOR SANITIZING PORTABLE DEVICES Jul 7, 2020 Abandoned
Array ( [id] => 17716517 [patent_doc_number] => 11380515 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-07-05 [patent_title] => Charged particle beam device [patent_app_type] => utility [patent_app_number] => 16/922552 [patent_app_country] => US [patent_app_date] => 2020-07-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 17 [patent_no_of_words] => 4561 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 107 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16922552 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/922552
Charged particle beam device Jul 6, 2020 Issued
Array ( [id] => 17777938 [patent_doc_number] => 20220244288 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-08-04 [patent_title] => COATED ACTIVE CANTILEVER PROBES FOR USE IN TOPOGRAPHY IMAGING IN OPAQUE LIQUID ENVIRONMENTS, AND METHODS OF PERFORMING TOPOGRAPHY IMAGING [patent_app_type] => utility [patent_app_number] => 17/623789 [patent_app_country] => US [patent_app_date] => 2020-07-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 13928 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17623789 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/623789
Coated active cantilever probes for use in topography imaging in opaque liquid environments, and methods of performing topography imaging Jul 5, 2020 Issued
Array ( [id] => 16364436 [patent_doc_number] => 20200321187 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-10-08 [patent_title] => INSPECTION TOOL AND METHOD OF DETERMINING A DISTORTION OF AN INSPECTION TOOL [patent_app_type] => utility [patent_app_number] => 16/908507 [patent_app_country] => US [patent_app_date] => 2020-06-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9494 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -10 [patent_words_short_claim] => 158 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16908507 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/908507
Inspection tool and method of determining a distortion of an inspection tool Jun 21, 2020 Issued
Array ( [id] => 17777937 [patent_doc_number] => 20220244287 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-08-04 [patent_title] => Arrangement Having a Measuring Apparatus for a Scanning Probe Microscope, Scanning Probe Microscope, and Method for Operating [patent_app_type] => utility [patent_app_number] => 17/620375 [patent_app_country] => US [patent_app_date] => 2020-06-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3460 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 137 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17620375 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/620375
Arrangement Having a Measuring Apparatus for a Scanning Probe Microscope, Scanning Probe Microscope, and Method for Operating Jun 17, 2020 Abandoned
Array ( [id] => 17803186 [patent_doc_number] => 11417497 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-08-16 [patent_title] => Method of examining a sample using a charged particle microscope, wherein an electron energy-loss spectroscopy (EELS) spectrum is acquired [patent_app_type] => utility [patent_app_number] => 16/901900 [patent_app_country] => US [patent_app_date] => 2020-06-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 6 [patent_no_of_words] => 5658 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 146 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16901900 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/901900
Method of examining a sample using a charged particle microscope, wherein an electron energy-loss spectroscopy (EELS) spectrum is acquired Jun 14, 2020 Issued
Array ( [id] => 17183944 [patent_doc_number] => 20210330829 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-10-28 [patent_title] => UV LIGHT AND STERILIZATION SYSTEM [patent_app_type] => utility [patent_app_number] => 16/897693 [patent_app_country] => US [patent_app_date] => 2020-06-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6167 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 56 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16897693 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/897693
UV light and sterilization system Jun 9, 2020 Issued
Array ( [id] => 17222813 [patent_doc_number] => 11175308 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-11-16 [patent_title] => Chip carrier exchanging device and atomic force microscopy apparatus having same [patent_app_type] => utility [patent_app_number] => 16/897091 [patent_app_country] => US [patent_app_date] => 2020-06-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 13 [patent_no_of_words] => 4381 [patent_no_of_claims] => 8 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 227 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16897091 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/897091
Chip carrier exchanging device and atomic force microscopy apparatus having same Jun 8, 2020 Issued
Array ( [id] => 20161272 [patent_doc_number] => 12387905 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-08-12 [patent_title] => Apparatus and method for detecting one or more scanning charged particle beams [patent_app_type] => utility [patent_app_number] => 17/615414 [patent_app_country] => US [patent_app_date] => 2020-06-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 2230 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 333 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17615414 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/615414
Apparatus and method for detecting one or more scanning charged particle beams Jun 2, 2020 Issued
Array ( [id] => 16658461 [patent_doc_number] => 20210055098 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-02-25 [patent_title] => Charged Particle Beam System and Overlay Shift Amount Measurement Method [patent_app_type] => utility [patent_app_number] => 16/887885 [patent_app_country] => US [patent_app_date] => 2020-05-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8445 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 147 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16887885 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/887885
Charged Particle Beam System and Overlay Shift Amount Measurement Method May 28, 2020 Pending
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