Search

Thomas Brown

Examiner (ID: 19061)

Most Active Art Unit
2601
Art Unit(s)
2786, 2899, 2742, 2306, 2857, 2787, 2305, 2601, 2604
Total Applications
1242
Issued Applications
1062
Pending Applications
29
Abandoned Applications
151

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 16332190 [patent_doc_number] => 20200303156 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-09-24 [patent_title] => BEAM SPLITTER FOR A CHARGED PARTICLE DEVICE [patent_app_type] => utility [patent_app_number] => 16/359831 [patent_app_country] => US [patent_app_date] => 2019-03-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6230 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -20 [patent_words_short_claim] => 108 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16359831 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/359831
BEAM SPLITTER FOR A CHARGED PARTICLE DEVICE Mar 19, 2019 Abandoned
Array ( [id] => 14875081 [patent_doc_number] => 20190287782 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-09-19 [patent_title] => System and Method for Loading an Ion Trap [patent_app_type] => utility [patent_app_number] => 16/357488 [patent_app_country] => US [patent_app_date] => 2019-03-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7300 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -19 [patent_words_short_claim] => 123 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16357488 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/357488
System and method for loading an ion trap Mar 18, 2019 Issued
Array ( [id] => 15213625 [patent_doc_number] => 20190369499 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-12-05 [patent_title] => MULTI-SUBSTRATE PROCESSING ON DIGITAL LITHOGRAPHY SYSTEMS [patent_app_type] => utility [patent_app_number] => 16/358323 [patent_app_country] => US [patent_app_date] => 2019-03-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4620 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 38 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16358323 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/358323
Multi-substrate processing on digital lithography systems Mar 18, 2019 Issued
Array ( [id] => 16327057 [patent_doc_number] => 20200298022 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-09-24 [patent_title] => Pencil Beam Therapy with Fast Deflection Magnet [patent_app_type] => utility [patent_app_number] => 16/358044 [patent_app_country] => US [patent_app_date] => 2019-03-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11758 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 166 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16358044 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/358044
Pencil Beam Therapy with Fast Deflection Magnet Mar 18, 2019 Abandoned
Array ( [id] => 16609180 [patent_doc_number] => 10910193 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-02-02 [patent_title] => Particle detection assembly, system and method [patent_app_type] => utility [patent_app_number] => 16/356539 [patent_app_country] => US [patent_app_date] => 2019-03-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 20 [patent_figures_cnt] => 31 [patent_no_of_words] => 7107 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 128 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16356539 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/356539
Particle detection assembly, system and method Mar 17, 2019 Issued
Array ( [id] => 16280033 [patent_doc_number] => 10763072 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2020-09-01 [patent_title] => Apparatus, system and techniques for mass analyzed ion beam [patent_app_type] => utility [patent_app_number] => 16/354638 [patent_app_country] => US [patent_app_date] => 2019-03-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 14 [patent_no_of_words] => 5330 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 103 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16354638 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/354638
Apparatus, system and techniques for mass analyzed ion beam Mar 14, 2019 Issued
Array ( [id] => 17758066 [patent_doc_number] => 11398365 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2022-07-26 [patent_title] => Positioning samples for microscopy, inspection, or analysis [patent_app_type] => utility [patent_app_number] => 16/355704 [patent_app_country] => US [patent_app_date] => 2019-03-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 18 [patent_no_of_words] => 15216 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 152 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16355704 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/355704
Positioning samples for microscopy, inspection, or analysis Mar 14, 2019 Issued
Array ( [id] => 15296083 [patent_doc_number] => 20190391177 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-12-26 [patent_title] => Method and Apparatus for Resolution and Sensitivity Enhanced Atomic Force Microscope Based Infrared Spectroscopy [patent_app_type] => utility [patent_app_number] => 16/351223 [patent_app_country] => US [patent_app_date] => 2019-03-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 14417 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16351223 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/351223
Method and apparatus for resolution and sensitivity enhanced atomic force microscope based infrared spectroscopy Mar 11, 2019 Issued
Array ( [id] => 17803185 [patent_doc_number] => 11417496 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-08-16 [patent_title] => Stage device, charged particle beam apparatus, and vacuum apparatus [patent_app_type] => utility [patent_app_number] => 17/043950 [patent_app_country] => US [patent_app_date] => 2019-03-01 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 7041 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 126 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17043950 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/043950
Stage device, charged particle beam apparatus, and vacuum apparatus Feb 28, 2019 Issued
Array ( [id] => 17521431 [patent_doc_number] => 20220107280 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-04-07 [patent_title] => Defect Inspection Device and Defect Inspection Method [patent_app_type] => utility [patent_app_number] => 17/296828 [patent_app_country] => US [patent_app_date] => 2019-02-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7137 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -12 [patent_words_short_claim] => 92 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17296828 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/296828
Defect Inspection Device and Defect Inspection Method Feb 14, 2019 Abandoned
Array ( [id] => 14718211 [patent_doc_number] => 20190250169 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-08-15 [patent_title] => METHOD FOR ANALYZING MICROORGANISMS [patent_app_type] => utility [patent_app_number] => 16/274058 [patent_app_country] => US [patent_app_date] => 2019-02-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9440 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 47 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16274058 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/274058
Method for analyzing microorganisms Feb 11, 2019 Issued
Array ( [id] => 16241480 [patent_doc_number] => 20200258714 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-08-13 [patent_title] => DEVICE AND METHOD FOR OPERATING A CHARGED PARTICLE DEVICE WITH MULTIPLE BEAMLETS [patent_app_type] => utility [patent_app_number] => 16/273961 [patent_app_country] => US [patent_app_date] => 2019-02-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9088 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -19 [patent_words_short_claim] => 211 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16273961 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/273961
Device and method for operating a charged particle device with multiple beamlets Feb 11, 2019 Issued
Array ( [id] => 16593786 [patent_doc_number] => 10903063 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-01-26 [patent_title] => Methods for confirming charged-particle generation in an instrument, and related instruments [patent_app_type] => utility [patent_app_number] => 16/272621 [patent_app_country] => US [patent_app_date] => 2019-02-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 19 [patent_figures_cnt] => 23 [patent_no_of_words] => 10496 [patent_no_of_claims] => 23 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 72 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16272621 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/272621
Methods for confirming charged-particle generation in an instrument, and related instruments Feb 10, 2019 Issued
Array ( [id] => 14722213 [patent_doc_number] => 20190252170 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-08-15 [patent_title] => SAMPLE IONISATION USING A PULSED LASER SOURCE [patent_app_type] => utility [patent_app_number] => 16/272693 [patent_app_country] => US [patent_app_date] => 2019-02-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 10252 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -13 [patent_words_short_claim] => 102 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16272693 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/272693
Sample ionisation using a pulsed laser source Feb 10, 2019 Issued
Array ( [id] => 14722207 [patent_doc_number] => 20190252167 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-08-15 [patent_title] => METHODS FOR TESTING OR ADJUSTING A CHARGED-PARTICLE DETECTOR, AND RELATED DETECTION SYSTEMS [patent_app_type] => utility [patent_app_number] => 16/272537 [patent_app_country] => US [patent_app_date] => 2019-02-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8631 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -22 [patent_words_short_claim] => 46 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16272537 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/272537
Methods for testing or adjusting a charged-particle detector, and related detection systems Feb 10, 2019 Issued
Array ( [id] => 14752771 [patent_doc_number] => 20190259559 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-08-22 [patent_title] => PLASMA BRIDGE NEUTRALIZER FOR ION BEAM ETCHING [patent_app_type] => utility [patent_app_number] => 16/270440 [patent_app_country] => US [patent_app_date] => 2019-02-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7345 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -21 [patent_words_short_claim] => 110 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16270440 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/270440
PLASMA BRIDGE NEUTRALIZER FOR ION BEAM ETCHING Feb 6, 2019 Abandoned
Array ( [id] => 14691339 [patent_doc_number] => 20190244785 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-08-08 [patent_title] => ION IMPLANTATION APPARATUS AND MEASUREMENT DEVICE [patent_app_type] => utility [patent_app_number] => 16/270236 [patent_app_country] => US [patent_app_date] => 2019-02-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11140 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -21 [patent_words_short_claim] => 169 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16270236 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/270236
Ion implantation apparatus and measurement device Feb 6, 2019 Issued
Array ( [id] => 16249380 [patent_doc_number] => 10748755 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2020-08-18 [patent_title] => Electrostatic trap [patent_app_type] => utility [patent_app_number] => 16/262011 [patent_app_country] => US [patent_app_date] => 2019-01-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 17 [patent_no_of_words] => 9944 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 253 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16262011 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/262011
Electrostatic trap Jan 29, 2019 Issued
Array ( [id] => 14875041 [patent_doc_number] => 20190287762 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2019-09-19 [patent_title] => System and method of preparing integrated circuits for backside probing using charged particle beams [patent_app_type] => utility [patent_app_number] => 16/253786 [patent_app_country] => US [patent_app_date] => 2019-01-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6716 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 90 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16253786 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/253786
System and method of preparing integrated circuits for backside probing using charged particle beams Jan 21, 2019 Abandoned
Array ( [id] => 16201860 [patent_doc_number] => 10727038 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2020-07-28 [patent_title] => Ion flow guide devices and methods [patent_app_type] => utility [patent_app_number] => 16/252667 [patent_app_country] => US [patent_app_date] => 2019-01-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 9677 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 122 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16252667 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/252667
Ion flow guide devices and methods Jan 19, 2019 Issued
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