Search

Thomas M. Dougherty

Examiner (ID: 16924, Phone: (571)272-2022 , Office: P/2837 )

Most Active Art Unit
2837
Art Unit(s)
2102, 3102, 2899, 2837, 2834
Total Applications
3722
Issued Applications
3182
Pending Applications
118
Abandoned Applications
430

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 4822607 [patent_doc_number] => 20080123080 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2008-05-29 [patent_title] => 'Method of Measuring Sub-Micron Trench Structures' [patent_app_type] => utility [patent_app_number] => 10/561467 [patent_app_country] => US [patent_app_date] => 2004-06-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 2252 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0123/20080123080.pdf [firstpage_image] =>[orig_patent_app_number] => 10561467 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/561467
Method of measuring sub-micron trench structures Jun 22, 2004 Issued
Array ( [id] => 5020751 [patent_doc_number] => 20070146717 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-06-28 [patent_title] => 'Support with a surface structure for sensitive evanescent-field detection' [patent_app_type] => utility [patent_app_number] => 10/561469 [patent_app_country] => US [patent_app_date] => 2004-06-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 12 [patent_no_of_words] => 10491 [patent_no_of_claims] => 26 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0146/20070146717.pdf [firstpage_image] =>[orig_patent_app_number] => 10561469 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/561469
Support with a surface structure for sensitive evanescent-field detection Jun 13, 2004 Issued
Array ( [id] => 7324824 [patent_doc_number] => 20040252295 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-12-16 [patent_title] => 'Surface inspection method and surface inspection apparatus' [patent_app_type] => new [patent_app_number] => 10/864062 [patent_app_country] => US [patent_app_date] => 2004-06-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 9301 [patent_no_of_claims] => 12 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 144 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0252/20040252295.pdf [firstpage_image] =>[orig_patent_app_number] => 10864062 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/864062
Surface inspection method and surface inspection apparatus Jun 8, 2004 Issued
Array ( [id] => 441007 [patent_doc_number] => 07259839 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-08-21 [patent_title] => 'Method and apparatus for examining a diamond' [patent_app_type] => utility [patent_app_number] => 10/861063 [patent_app_country] => US [patent_app_date] => 2004-06-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 16 [patent_no_of_words] => 6976 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 126 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/259/07259839.pdf [firstpage_image] =>[orig_patent_app_number] => 10861063 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/861063
Method and apparatus for examining a diamond Jun 3, 2004 Issued
Array ( [id] => 7328821 [patent_doc_number] => 20040253751 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-12-16 [patent_title] => 'Photothermal ultra-shallow junction monitoring system with UV pump' [patent_app_type] => new [patent_app_number] => 10/859846 [patent_app_country] => US [patent_app_date] => 2004-06-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 13 [patent_figures_cnt] => 13 [patent_no_of_words] => 4112 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 79 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0253/20040253751.pdf [firstpage_image] =>[orig_patent_app_number] => 10859846 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/859846
Photothermal ultra-shallow junction monitoring system with UV pump Jun 2, 2004 Abandoned
Array ( [id] => 7341957 [patent_doc_number] => 20040246597 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-12-09 [patent_title] => 'Optical system for micro analyzing system' [patent_app_type] => new [patent_app_number] => 10/859485 [patent_app_country] => US [patent_app_date] => 2004-06-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 4857 [patent_no_of_claims] => 13 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 53 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0246/20040246597.pdf [firstpage_image] =>[orig_patent_app_number] => 10859485 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/859485
Optical system for micro analyzing system Jun 1, 2004 Issued
Array ( [id] => 920743 [patent_doc_number] => 07321426 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2008-01-22 [patent_title] => 'Optical metrology on patterned samples' [patent_app_type] => utility [patent_app_number] => 10/859637 [patent_app_country] => US [patent_app_date] => 2004-06-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 21 [patent_figures_cnt] => 32 [patent_no_of_words] => 11214 [patent_no_of_claims] => 42 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 76 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/321/07321426.pdf [firstpage_image] =>[orig_patent_app_number] => 10859637 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/859637
Optical metrology on patterned samples Jun 1, 2004 Issued
Array ( [id] => 5767531 [patent_doc_number] => 20050264816 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-12-01 [patent_title] => 'Method and apparatus for verifying proper operation of a photometric device, such as a cell density probe' [patent_app_type] => utility [patent_app_number] => 10/856885 [patent_app_country] => US [patent_app_date] => 2004-05-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 7171 [patent_no_of_claims] => 30 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0264/20050264816.pdf [firstpage_image] =>[orig_patent_app_number] => 10856885 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/856885
Method and apparatus for verifying proper operation of a photometric device, such as a cell density probe May 26, 2004 Issued
Array ( [id] => 798451 [patent_doc_number] => 07428043 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-09-23 [patent_title] => 'Apparatus for ascertaining the light power level of a light beam, and scanning microscope' [patent_app_type] => utility [patent_app_number] => 10/854987 [patent_app_country] => US [patent_app_date] => 2004-05-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 3033 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 129 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/428/07428043.pdf [firstpage_image] =>[orig_patent_app_number] => 10854987 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/854987
Apparatus for ascertaining the light power level of a light beam, and scanning microscope May 26, 2004 Issued
Array ( [id] => 7255398 [patent_doc_number] => 20040239935 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2004-12-02 [patent_title] => 'Colorimeter measured value control system and colorimeter measured value control method thereof, and a color control information providing system and a color control information providing method thereof' [patent_app_type] => new [patent_app_number] => 10/851753 [patent_app_country] => US [patent_app_date] => 2004-05-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 14 [patent_no_of_words] => 17621 [patent_no_of_claims] => 40 [patent_no_of_ind_claims] => 6 [patent_words_short_claim] => 169 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0239/20040239935.pdf [firstpage_image] =>[orig_patent_app_number] => 10851753 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/851753
Colorimeter measured value control system and colorimeter measured value control method thereof, and a color control information providing system and a color control information providing method thereof May 19, 2004 Issued
Array ( [id] => 5870862 [patent_doc_number] => 20060164643 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-07-27 [patent_title] => 'Multispectral, multifusion, laser-polarimetric optical imaging system' [patent_app_type] => utility [patent_app_number] => 10/560293 [patent_app_country] => US [patent_app_date] => 2004-05-13 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 6754 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0164/20060164643.pdf [firstpage_image] =>[orig_patent_app_number] => 10560293 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/560293
Multispectral, multifusion, laser-polarimetric optical imaging system May 12, 2004 Issued
Array ( [id] => 866477 [patent_doc_number] => 07369230 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2008-05-06 [patent_title] => 'Apparatus and method for measuring particulate flow rate' [patent_app_type] => utility [patent_app_number] => 10/837083 [patent_app_country] => US [patent_app_date] => 2004-04-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 1 [patent_figures_cnt] => 1 [patent_no_of_words] => 2286 [patent_no_of_claims] => 32 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 83 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/369/07369230.pdf [firstpage_image] =>[orig_patent_app_number] => 10837083 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/837083
Apparatus and method for measuring particulate flow rate Apr 29, 2004 Issued
Array ( [id] => 5714039 [patent_doc_number] => 20060077402 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2006-04-13 [patent_title] => 'Co-ordinate-measuring instrument' [patent_app_type] => utility [patent_app_number] => 10/548264 [patent_app_country] => US [patent_app_date] => 2004-04-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 1458 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0077/20060077402.pdf [firstpage_image] =>[orig_patent_app_number] => 10548264 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/548264
Co-ordinate measuring instrument Apr 28, 2004 Issued
Array ( [id] => 5044551 [patent_doc_number] => 20070263222 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2007-11-15 [patent_title] => 'Monitoring Road Reflectance and Street Lighting' [patent_app_type] => utility [patent_app_number] => 10/554470 [patent_app_country] => US [patent_app_date] => 2004-04-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 5683 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0263/20070263222.pdf [firstpage_image] =>[orig_patent_app_number] => 10554470 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/554470
Monitoring Road Reflectance and Street Lighting Apr 25, 2004 Abandoned
Array ( [id] => 628046 [patent_doc_number] => 07136166 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2006-11-14 [patent_title] => 'Position sensor, method for detecting horizontal and vertical position, alignment apparatus including position sensor, and method for horizontal and vertical alignment' [patent_app_type] => utility [patent_app_number] => 10/827327 [patent_app_country] => US [patent_app_date] => 2004-04-20 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 22 [patent_no_of_words] => 4208 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 36 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/136/07136166.pdf [firstpage_image] =>[orig_patent_app_number] => 10827327 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/827327
Position sensor, method for detecting horizontal and vertical position, alignment apparatus including position sensor, and method for horizontal and vertical alignment Apr 19, 2004 Issued
Array ( [id] => 6970437 [patent_doc_number] => 20050036147 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-02-17 [patent_title] => 'Method of determining analyte concentration in a sample using infrared transmission data' [patent_app_type] => utility [patent_app_number] => 10/825085 [patent_app_country] => US [patent_app_date] => 2004-04-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 29 [patent_figures_cnt] => 29 [patent_no_of_words] => 34247 [patent_no_of_claims] => 49 [patent_no_of_ind_claims] => 7 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0036/20050036147.pdf [firstpage_image] =>[orig_patent_app_number] => 10825085 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/825085
Method of determining analyte concentration in a sample using infrared transmission data Apr 14, 2004 Issued
Array ( [id] => 7017506 [patent_doc_number] => 20050219524 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-10-06 [patent_title] => 'Calibration aid' [patent_app_type] => utility [patent_app_number] => 10/818693 [patent_app_country] => US [patent_app_date] => 2004-04-06 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 2 [patent_figures_cnt] => 2 [patent_no_of_words] => 1831 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0219/20050219524.pdf [firstpage_image] =>[orig_patent_app_number] => 10818693 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/818693
Calibration aid Apr 5, 2004 Issued
Array ( [id] => 429561 [patent_doc_number] => 07268877 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2007-09-11 [patent_title] => 'Method and apparatus for orienting semiconductor wafers in semiconductor fabrication' [patent_app_type] => utility [patent_app_number] => 10/816184 [patent_app_country] => US [patent_app_date] => 2004-04-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 11 [patent_no_of_words] => 6595 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 154 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/268/07268877.pdf [firstpage_image] =>[orig_patent_app_number] => 10816184 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/816184
Method and apparatus for orienting semiconductor wafers in semiconductor fabrication Apr 1, 2004 Issued
Array ( [id] => 7017514 [patent_doc_number] => 20050219532 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2005-10-06 [patent_title] => 'System and method for verifying and controlling the performance of a maskless lithography tool' [patent_app_type] => utility [patent_app_number] => 10/812977 [patent_app_country] => US [patent_app_date] => 2004-03-31 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 4882 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] => publications/A1/0219/20050219532.pdf [firstpage_image] =>[orig_patent_app_number] => 10812977 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/812977
System and method for verifying and controlling the performance of a maskless lithography tool Mar 30, 2004 Issued
Array ( [id] => 858348 [patent_doc_number] => 07375806 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2008-05-20 [patent_title] => 'Method for inspecting the quality criteria of flat textile structures embodied in a multi-layer form according to a contour' [patent_app_type] => utility [patent_app_number] => 10/551269 [patent_app_country] => US [patent_app_date] => 2004-03-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 17 [patent_no_of_words] => 3927 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 243 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] => patents/07/375/07375806.pdf [firstpage_image] =>[orig_patent_app_number] => 10551269 [rel_patent_id] =>[rel_patent_doc_number] =>)
10/551269
Method for inspecting the quality criteria of flat textile structures embodied in a multi-layer form according to a contour Mar 25, 2004 Issued
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