
Thomas M. Dougherty
Examiner (ID: 16924, Phone: (571)272-2022 , Office: P/2837 )
| Most Active Art Unit | 2837 |
| Art Unit(s) | 2102, 3102, 2899, 2837, 2834 |
| Total Applications | 3722 |
| Issued Applications | 3182 |
| Pending Applications | 118 |
| Abandoned Applications | 430 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 4822607
[patent_doc_number] => 20080123080
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2008-05-29
[patent_title] => 'Method of Measuring Sub-Micron Trench Structures'
[patent_app_type] => utility
[patent_app_number] => 10/561467
[patent_app_country] => US
[patent_app_date] => 2004-06-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 2252
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0123/20080123080.pdf
[firstpage_image] =>[orig_patent_app_number] => 10561467
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/561467 | Method of measuring sub-micron trench structures | Jun 22, 2004 | Issued |
Array
(
[id] => 5020751
[patent_doc_number] => 20070146717
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-06-28
[patent_title] => 'Support with a surface structure for sensitive evanescent-field detection'
[patent_app_type] => utility
[patent_app_number] => 10/561469
[patent_app_country] => US
[patent_app_date] => 2004-06-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 12
[patent_no_of_words] => 10491
[patent_no_of_claims] => 26
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0146/20070146717.pdf
[firstpage_image] =>[orig_patent_app_number] => 10561469
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/561469 | Support with a surface structure for sensitive evanescent-field detection | Jun 13, 2004 | Issued |
Array
(
[id] => 7324824
[patent_doc_number] => 20040252295
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-12-16
[patent_title] => 'Surface inspection method and surface inspection apparatus'
[patent_app_type] => new
[patent_app_number] => 10/864062
[patent_app_country] => US
[patent_app_date] => 2004-06-09
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 8
[patent_no_of_words] => 9301
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 144
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0252/20040252295.pdf
[firstpage_image] =>[orig_patent_app_number] => 10864062
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/864062 | Surface inspection method and surface inspection apparatus | Jun 8, 2004 | Issued |
Array
(
[id] => 441007
[patent_doc_number] => 07259839
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-08-21
[patent_title] => 'Method and apparatus for examining a diamond'
[patent_app_type] => utility
[patent_app_number] => 10/861063
[patent_app_country] => US
[patent_app_date] => 2004-06-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 16
[patent_no_of_words] => 6976
[patent_no_of_claims] => 30
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 126
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/259/07259839.pdf
[firstpage_image] =>[orig_patent_app_number] => 10861063
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/861063 | Method and apparatus for examining a diamond | Jun 3, 2004 | Issued |
Array
(
[id] => 7328821
[patent_doc_number] => 20040253751
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-12-16
[patent_title] => 'Photothermal ultra-shallow junction monitoring system with UV pump'
[patent_app_type] => new
[patent_app_number] => 10/859846
[patent_app_country] => US
[patent_app_date] => 2004-06-03
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 13
[patent_figures_cnt] => 13
[patent_no_of_words] => 4112
[patent_no_of_claims] => 28
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 79
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0253/20040253751.pdf
[firstpage_image] =>[orig_patent_app_number] => 10859846
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/859846 | Photothermal ultra-shallow junction monitoring system with UV pump | Jun 2, 2004 | Abandoned |
Array
(
[id] => 7341957
[patent_doc_number] => 20040246597
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-12-09
[patent_title] => 'Optical system for micro analyzing system'
[patent_app_type] => new
[patent_app_number] => 10/859485
[patent_app_country] => US
[patent_app_date] => 2004-06-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 11
[patent_no_of_words] => 4857
[patent_no_of_claims] => 13
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 53
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0246/20040246597.pdf
[firstpage_image] =>[orig_patent_app_number] => 10859485
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/859485 | Optical system for micro analyzing system | Jun 1, 2004 | Issued |
Array
(
[id] => 920743
[patent_doc_number] => 07321426
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2008-01-22
[patent_title] => 'Optical metrology on patterned samples'
[patent_app_type] => utility
[patent_app_number] => 10/859637
[patent_app_country] => US
[patent_app_date] => 2004-06-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 21
[patent_figures_cnt] => 32
[patent_no_of_words] => 11214
[patent_no_of_claims] => 42
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 76
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/321/07321426.pdf
[firstpage_image] =>[orig_patent_app_number] => 10859637
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/859637 | Optical metrology on patterned samples | Jun 1, 2004 | Issued |
Array
(
[id] => 5767531
[patent_doc_number] => 20050264816
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-12-01
[patent_title] => 'Method and apparatus for verifying proper operation of a photometric device, such as a cell density probe'
[patent_app_type] => utility
[patent_app_number] => 10/856885
[patent_app_country] => US
[patent_app_date] => 2004-05-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 7171
[patent_no_of_claims] => 30
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0264/20050264816.pdf
[firstpage_image] =>[orig_patent_app_number] => 10856885
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/856885 | Method and apparatus for verifying proper operation of a photometric device, such as a cell density probe | May 26, 2004 | Issued |
Array
(
[id] => 798451
[patent_doc_number] => 07428043
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-09-23
[patent_title] => 'Apparatus for ascertaining the light power level of a light beam, and scanning microscope'
[patent_app_type] => utility
[patent_app_number] => 10/854987
[patent_app_country] => US
[patent_app_date] => 2004-05-27
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 3033
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 129
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/428/07428043.pdf
[firstpage_image] =>[orig_patent_app_number] => 10854987
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/854987 | Apparatus for ascertaining the light power level of a light beam, and scanning microscope | May 26, 2004 | Issued |
Array
(
[id] => 7255398
[patent_doc_number] => 20040239935
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2004-12-02
[patent_title] => 'Colorimeter measured value control system and colorimeter measured value control method thereof, and a color control information providing system and a color control information providing method thereof'
[patent_app_type] => new
[patent_app_number] => 10/851753
[patent_app_country] => US
[patent_app_date] => 2004-05-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 14
[patent_figures_cnt] => 14
[patent_no_of_words] => 17621
[patent_no_of_claims] => 40
[patent_no_of_ind_claims] => 6
[patent_words_short_claim] => 169
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0239/20040239935.pdf
[firstpage_image] =>[orig_patent_app_number] => 10851753
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/851753 | Colorimeter measured value control system and colorimeter measured value control method thereof, and a color control information providing system and a color control information providing method thereof | May 19, 2004 | Issued |
Array
(
[id] => 5870862
[patent_doc_number] => 20060164643
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-07-27
[patent_title] => 'Multispectral, multifusion, laser-polarimetric optical imaging system'
[patent_app_type] => utility
[patent_app_number] => 10/560293
[patent_app_country] => US
[patent_app_date] => 2004-05-13
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 6754
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0164/20060164643.pdf
[firstpage_image] =>[orig_patent_app_number] => 10560293
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/560293 | Multispectral, multifusion, laser-polarimetric optical imaging system | May 12, 2004 | Issued |
Array
(
[id] => 866477
[patent_doc_number] => 07369230
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2008-05-06
[patent_title] => 'Apparatus and method for measuring particulate flow rate'
[patent_app_type] => utility
[patent_app_number] => 10/837083
[patent_app_country] => US
[patent_app_date] => 2004-04-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 1
[patent_figures_cnt] => 1
[patent_no_of_words] => 2286
[patent_no_of_claims] => 32
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 83
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/369/07369230.pdf
[firstpage_image] =>[orig_patent_app_number] => 10837083
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/837083 | Apparatus and method for measuring particulate flow rate | Apr 29, 2004 | Issued |
Array
(
[id] => 5714039
[patent_doc_number] => 20060077402
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2006-04-13
[patent_title] => 'Co-ordinate-measuring instrument'
[patent_app_type] => utility
[patent_app_number] => 10/548264
[patent_app_country] => US
[patent_app_date] => 2004-04-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 2
[patent_no_of_words] => 1458
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0077/20060077402.pdf
[firstpage_image] =>[orig_patent_app_number] => 10548264
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/548264 | Co-ordinate measuring instrument | Apr 28, 2004 | Issued |
Array
(
[id] => 5044551
[patent_doc_number] => 20070263222
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2007-11-15
[patent_title] => 'Monitoring Road Reflectance and Street Lighting'
[patent_app_type] => utility
[patent_app_number] => 10/554470
[patent_app_country] => US
[patent_app_date] => 2004-04-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 5
[patent_no_of_words] => 5683
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0263/20070263222.pdf
[firstpage_image] =>[orig_patent_app_number] => 10554470
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/554470 | Monitoring Road Reflectance and Street Lighting | Apr 25, 2004 | Abandoned |
Array
(
[id] => 628046
[patent_doc_number] => 07136166
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2006-11-14
[patent_title] => 'Position sensor, method for detecting horizontal and vertical position, alignment apparatus including position sensor, and method for horizontal and vertical alignment'
[patent_app_type] => utility
[patent_app_number] => 10/827327
[patent_app_country] => US
[patent_app_date] => 2004-04-20
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 12
[patent_figures_cnt] => 22
[patent_no_of_words] => 4208
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 4
[patent_words_short_claim] => 36
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/136/07136166.pdf
[firstpage_image] =>[orig_patent_app_number] => 10827327
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/827327 | Position sensor, method for detecting horizontal and vertical position, alignment apparatus including position sensor, and method for horizontal and vertical alignment | Apr 19, 2004 | Issued |
Array
(
[id] => 6970437
[patent_doc_number] => 20050036147
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-02-17
[patent_title] => 'Method of determining analyte concentration in a sample using infrared transmission data'
[patent_app_type] => utility
[patent_app_number] => 10/825085
[patent_app_country] => US
[patent_app_date] => 2004-04-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 29
[patent_figures_cnt] => 29
[patent_no_of_words] => 34247
[patent_no_of_claims] => 49
[patent_no_of_ind_claims] => 7
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0036/20050036147.pdf
[firstpage_image] =>[orig_patent_app_number] => 10825085
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/825085 | Method of determining analyte concentration in a sample using infrared transmission data | Apr 14, 2004 | Issued |
Array
(
[id] => 7017506
[patent_doc_number] => 20050219524
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-10-06
[patent_title] => 'Calibration aid'
[patent_app_type] => utility
[patent_app_number] => 10/818693
[patent_app_country] => US
[patent_app_date] => 2004-04-06
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 2
[patent_figures_cnt] => 2
[patent_no_of_words] => 1831
[patent_no_of_claims] => 24
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0219/20050219524.pdf
[firstpage_image] =>[orig_patent_app_number] => 10818693
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/818693 | Calibration aid | Apr 5, 2004 | Issued |
Array
(
[id] => 429561
[patent_doc_number] => 07268877
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2007-09-11
[patent_title] => 'Method and apparatus for orienting semiconductor wafers in semiconductor fabrication'
[patent_app_type] => utility
[patent_app_number] => 10/816184
[patent_app_country] => US
[patent_app_date] => 2004-04-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 8
[patent_figures_cnt] => 11
[patent_no_of_words] => 6595
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 154
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/268/07268877.pdf
[firstpage_image] =>[orig_patent_app_number] => 10816184
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/816184 | Method and apparatus for orienting semiconductor wafers in semiconductor fabrication | Apr 1, 2004 | Issued |
Array
(
[id] => 7017514
[patent_doc_number] => 20050219532
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2005-10-06
[patent_title] => 'System and method for verifying and controlling the performance of a maskless lithography tool'
[patent_app_type] => utility
[patent_app_number] => 10/812977
[patent_app_country] => US
[patent_app_date] => 2004-03-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 10
[patent_figures_cnt] => 10
[patent_no_of_words] => 4882
[patent_no_of_claims] => 25
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 0
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] => publications/A1/0219/20050219532.pdf
[firstpage_image] =>[orig_patent_app_number] => 10812977
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/812977 | System and method for verifying and controlling the performance of a maskless lithography tool | Mar 30, 2004 | Issued |
Array
(
[id] => 858348
[patent_doc_number] => 07375806
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2008-05-20
[patent_title] => 'Method for inspecting the quality criteria of flat textile structures embodied in a multi-layer form according to a contour'
[patent_app_type] => utility
[patent_app_number] => 10/551269
[patent_app_country] => US
[patent_app_date] => 2004-03-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 17
[patent_no_of_words] => 3927
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 243
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] => patents/07/375/07375806.pdf
[firstpage_image] =>[orig_patent_app_number] => 10551269
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/551269 | Method for inspecting the quality criteria of flat textile structures embodied in a multi-layer form according to a contour | Mar 25, 2004 | Issued |