Thu Nguyet T. Le

Array ( [id] => 18818881 [patent_doc_number] => 20230393221 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-12-07 [patent_title] => METHODOLOGY TO MEASURE SENSITIVE MAGNETIC FIELDS THROUGH COUPLED PUMP/PROBE FIELDS [patent_app_type] => utility [patent_app_number] => 18/319269 [patent_app_country] => US [patent_app_date] => 2023-05-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6410 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -20 [patent_words_short_claim] => 138 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18319269 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18787319 [patent_doc_number] => 20230375600 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-11-23 [patent_title] => SPARK GAP STRUCTURES FOR DETECTION AND PROTECTION AGAINST ELECTRICAL OVERSTRESS EVENTS [patent_app_type] => utility [patent_app_number] => 18/317806 [patent_app_country] => US [patent_app_date] => 2023-05-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 45153 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => 0 [patent_words_short_claim] => 60 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18317806 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19355140 [patent_doc_number] => 12055575 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-08-06 [patent_title] => Method of monitoring static charge [patent_app_type] => utility [patent_app_number] => 18/312682 [patent_app_country] => US [patent_app_date] => 2023-05-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 8 [patent_no_of_words] => 5200 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 72 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18312682 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18598456 [patent_doc_number] => 20230273255 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-08-31 [patent_title] => METROLOGY APPARATUS AND METHOD FOR DETERMINING A CHARACTERISTIC OF ONE OR MORE STRUCTURES ON A SUBSTRATE [patent_app_type] => utility [patent_app_number] => 18/143825 [patent_app_country] => US [patent_app_date] => 2023-05-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 14867 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18143825 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18553294 [patent_doc_number] => 20230251306 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-08-10 [patent_title] => METHOD AND SYSTEM FOR WAFER-LEVEL TESTING [patent_app_type] => utility [patent_app_number] => 18/301274 [patent_app_country] => US [patent_app_date] => 2023-04-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5986 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 76 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18301274 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19475086 [patent_doc_number] => 12105167 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2024-10-01 [patent_title] => Buried utility locator auto-tuning apparatus and methods [patent_app_type] => utility [patent_app_number] => 18/135002 [patent_app_country] => US [patent_app_date] => 2023-04-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 13218 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 158 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18135002 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18940955 [patent_doc_number] => 20240036094 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-02-01 [patent_title] => Detecting Radio Frequency Electromagnetic Radiation Using Vapor Cell Sensors and Comb Spectra [patent_app_type] => utility [patent_app_number] => 18/296307 [patent_app_country] => US [patent_app_date] => 2023-04-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9815 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -27 [patent_words_short_claim] => 80 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18296307 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18693801 [patent_doc_number] => 20230324201 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-10-12 [patent_title] => AUTOMATIC MEASUREMENT LOCATION IDENTIFICATION OF A LOGGER [patent_app_type] => utility [patent_app_number] => 18/194945 [patent_app_country] => US [patent_app_date] => 2023-04-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2116 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -11 [patent_words_short_claim] => 68 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18194945 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 20387543 [patent_doc_number] => 12487268 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-12-02 [patent_title] => Equipment design and testing using in-situ on-die time-domain reflectometry [patent_app_type] => utility [patent_app_number] => 18/128942 [patent_app_country] => US [patent_app_date] => 2023-03-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 25 [patent_figures_cnt] => 37 [patent_no_of_words] => 1002 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 133 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18128942 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 20078766 [patent_doc_number] => 12352826 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-07-08 [patent_title] => Current measurement architecture [patent_app_type] => utility [patent_app_number] => 18/127871 [patent_app_country] => US [patent_app_date] => 2023-03-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 2955 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 44 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18127871 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18498691 [patent_doc_number] => 20230221406 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-07-13 [patent_title] => SENSOR RECEIVER HAVING RYDBERG CELL AND RF DATA RATE GREATER THAN RECIPROCAL OF TEMPORAL PULSE WIDTH AND ASSOCIATED METHODS [patent_app_type] => utility [patent_app_number] => 18/187783 [patent_app_country] => US [patent_app_date] => 2023-03-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9498 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -34 [patent_words_short_claim] => 65 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18187783 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19084143 [patent_doc_number] => 20240110944 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-04-04 [patent_title] => Electrical Circuits Testing Device and Method of Use [patent_app_type] => utility [patent_app_number] => 18/185713 [patent_app_country] => US [patent_app_date] => 2023-03-17 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3709 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 103 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18185713 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 20159328 [patent_doc_number] => 12385949 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-08-12 [patent_title] => Semi-automated oscilloscope noise compensation based on power spectral density characterization [patent_app_type] => utility [patent_app_number] => 18/121558 [patent_app_country] => US [patent_app_date] => 2023-03-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 8 [patent_no_of_words] => 0 [patent_no_of_claims] => 18 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 62 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18121558 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19450312 [patent_doc_number] => 20240310442 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-09-19 [patent_title] => THREE PHASE FREQUENCY SENSOR WITH OPEN/SHORT IMMUNITY [patent_app_type] => utility [patent_app_number] => 18/183664 [patent_app_country] => US [patent_app_date] => 2023-03-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3659 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 26 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18183664 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18831980 [patent_doc_number] => 20230400507 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-12-14 [patent_title] => INFORMATION PROCESSING APPARATUS AND DEGRADATION ESTIMATION METHOD [patent_app_type] => utility [patent_app_number] => 18/179689 [patent_app_country] => US [patent_app_date] => 2023-03-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8541 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -6 [patent_words_short_claim] => 67 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18179689 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19475051 [patent_doc_number] => 12105130 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-10-01 [patent_title] => Microwave sensor using Autler-Townes splitting [patent_app_type] => utility [patent_app_number] => 18/116698 [patent_app_country] => US [patent_app_date] => 2023-03-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 17 [patent_no_of_words] => 7211 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 121 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18116698 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18470376 [patent_doc_number] => 20230204661 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-06-29 [patent_title] => TEST CIRCUIT IN CHIP AND CIRCUIT TEST METHOD [patent_app_type] => utility [patent_app_number] => 18/176025 [patent_app_country] => US [patent_app_date] => 2023-02-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11590 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 164 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18176025 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19211821 [patent_doc_number] => 12000877 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-06-04 [patent_title] => Atom-based closed-loop control for electromagnetic radiation measurement, communications, and information processing [patent_app_type] => utility [patent_app_number] => 18/173290 [patent_app_country] => US [patent_app_date] => 2023-02-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 55 [patent_figures_cnt] => 94 [patent_no_of_words] => 56411 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 102 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18173290 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18453346 [patent_doc_number] => 20230194626 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-06-22 [patent_title] => METHOD FOR SELF-TESTING OF A PHASE OF A 3-LEVEL ANPC CONVERTER WITH LC FILTER [patent_app_type] => utility [patent_app_number] => 18/172358 [patent_app_country] => US [patent_app_date] => 2023-02-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3319 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 235 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18172358 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19833579 [patent_doc_number] => 20250085365 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2025-03-13 [patent_title] => MAGNETORESISTIVE ELEMENT HAVING THERMALLY ROBUST PERFORMANCES AFTER HIGH-FIELD EXPOSURE AND SENSOR COMPRISING THE MAGNETORESISTIVE ELEMENT [patent_app_type] => utility [patent_app_number] => 18/727425 [patent_app_country] => US [patent_app_date] => 2023-02-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4025 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -16 [patent_words_short_claim] => 11 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18727425 [rel_patent_id] =>[rel_patent_doc_number] =>)