Tim Miles

Array ( [id] => 19266764 [patent_doc_number] => 20240210465 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-06-27 [patent_title] => METHOD FOR DETERMINING WEAR IN AN ELECTRONIC UNIT, AND TEST APPARATUS [patent_app_type] => utility [patent_app_number] => 18/556158 [patent_app_country] => US [patent_app_date] => 2022-04-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3810 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -9 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18556158 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 17961389 [patent_doc_number] => 20220341970 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-10-27 [patent_title] => CLAMP SENSOR AND MEASURING DEVICE [patent_app_type] => utility [patent_app_number] => 17/725864 [patent_app_country] => US [patent_app_date] => 2022-04-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 11019 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -19 [patent_words_short_claim] => 192 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17725864 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18997151 [patent_doc_number] => 11913987 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-02-27 [patent_title] => Automated test equipment comprising a device under test loopback and an automated test system with an automated test equipment comprising a device under test loopback [patent_app_type] => utility [patent_app_number] => 17/720980 [patent_app_country] => US [patent_app_date] => 2022-04-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 13 [patent_no_of_words] => 7901 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 269 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17720980 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18576754 [patent_doc_number] => 11733274 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2023-08-22 [patent_title] => Voltage sensing circuit [patent_app_type] => utility [patent_app_number] => 17/705819 [patent_app_country] => US [patent_app_date] => 2022-03-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 6631 [patent_no_of_claims] => 22 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 124 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17705819 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19204020 [patent_doc_number] => 20240175919 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-05-30 [patent_title] => INTEGRATED CIRCUIT TESTING [patent_app_type] => utility [patent_app_number] => 18/551920 [patent_app_country] => US [patent_app_date] => 2022-03-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8856 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 134 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18551920 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18385495 [patent_doc_number] => 11656271 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-05-23 [patent_title] => Wafer inspection system [patent_app_type] => utility [patent_app_number] => 17/699610 [patent_app_country] => US [patent_app_date] => 2022-03-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 9261 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 349 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17699610 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19659818 [patent_doc_number] => 20240426883 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-12-26 [patent_title] => CIRCUIT, METHOD, AND APPARATUS FOR ACQUIRING RESISTANCE VALUE OF RESISTOR [patent_app_type] => utility [patent_app_number] => 18/687909 [patent_app_country] => US [patent_app_date] => 2022-03-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7982 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 135 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18687909 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19114092 [patent_doc_number] => 20240125842 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-04-18 [patent_title] => METHOD FOR DETERMINING THE TEMPERATURE CHARACTERISTIC OF THE DRAIN-SOURCE ON-STATE RESISTANCE OF A MOSFET [patent_app_type] => utility [patent_app_number] => 18/263979 [patent_app_country] => US [patent_app_date] => 2022-03-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3119 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -8 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18263979 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18629595 [patent_doc_number] => 20230288480 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-09-14 [patent_title] => APPARATUS AND METHOD FOR CONTROLLING UNIT SPECIFIC JUNCTION TEMPERATURE WITH HIGH TEMPORAL RESOLUTION FOR CONCURRENT CENTRAL PROCESSING UNIT (CPU) CORE TESTING [patent_app_type] => utility [patent_app_number] => 17/692248 [patent_app_country] => US [patent_app_date] => 2022-03-11 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6026 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17692248 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18302873 [patent_doc_number] => 11624771 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-04-11 [patent_title] => Apparatus for inspecting illumination of lighting micro led [patent_app_type] => utility [patent_app_number] => 17/690114 [patent_app_country] => US [patent_app_date] => 2022-03-09 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 2784 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 166 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17690114 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19173819 [patent_doc_number] => 20240159793 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-05-16 [patent_title] => IC INSPECTION SOCKET [patent_app_type] => utility [patent_app_number] => 18/284077 [patent_app_country] => US [patent_app_date] => 2022-03-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 4316 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -5 [patent_words_short_claim] => 51 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18284077 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 17841221 [patent_doc_number] => 20220278527 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2022-09-01 [patent_title] => DETERMINATION OF PHASE CONNECTIONS IN A POWER GRID [patent_app_type] => utility [patent_app_number] => 17/682641 [patent_app_country] => US [patent_app_date] => 2022-02-28 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 9227 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -19 [patent_words_short_claim] => 78 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17682641 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19970706 [patent_doc_number] => 12339309 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-06-24 [patent_title] => Energization inspection apparatus, method for manufacturing semiconductor device, and energization method [patent_app_type] => utility [patent_app_number] => 18/255145 [patent_app_country] => US [patent_app_date] => 2022-02-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 12 [patent_figures_cnt] => 17 [patent_no_of_words] => 6842 [patent_no_of_claims] => 5 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 603 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18255145 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19055421 [patent_doc_number] => 20240097390 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2024-03-21 [patent_title] => Probes Having Improved Mechanical and/or Electrical Properties for Making Contact Between Electronic Circuit Elements and Methods for Making [patent_app_type] => utility [patent_app_number] => 17/680211 [patent_app_country] => US [patent_app_date] => 2022-02-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 21167 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17680211 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18765138 [patent_doc_number] => 11815534 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-11-14 [patent_title] => Current sensing [patent_app_type] => utility [patent_app_number] => 17/678345 [patent_app_country] => US [patent_app_date] => 2022-02-23 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 6 [patent_no_of_words] => 6779 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 108 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17678345 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19227799 [patent_doc_number] => 12007433 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-06-11 [patent_title] => Mechanical arm and mechanical arm assembly, test system and method, storage medium and electronic device [patent_app_type] => utility [patent_app_number] => 17/651887 [patent_app_country] => US [patent_app_date] => 2022-02-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 7401 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 336 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17651887 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18142819 [patent_doc_number] => 20230016663 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-01-19 [patent_title] => METHOD FOR DETECTING ABNORMITY, METHOD FOR REPAIRING AND SYSTEM FOR DETECTING ABNORMITY FOR MACHINE SLOT [patent_app_type] => utility [patent_app_number] => 17/651604 [patent_app_country] => US [patent_app_date] => 2022-02-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5214 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 221 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17651604 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 18568373 [patent_doc_number] => 20230258709 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-08-17 [patent_title] => INTEGRATED CIRCUIT WITH RESILIENT SYSTEM [patent_app_type] => utility [patent_app_number] => 17/672588 [patent_app_country] => US [patent_app_date] => 2022-02-15 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 8368 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -18 [patent_words_short_claim] => 2 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17672588 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 20439752 [patent_doc_number] => 12510585 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2025-12-30 [patent_title] => Test device and temperature control method with temperature sensors [patent_app_type] => utility [patent_app_number] => 18/546832 [patent_app_country] => US [patent_app_date] => 2022-02-14 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 10 [patent_no_of_words] => 0 [patent_no_of_claims] => 6 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 168 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18546832 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 19152210 [patent_doc_number] => 11977119 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2024-05-07 [patent_title] => Solenoid system with position and temperature detection [patent_app_type] => utility [patent_app_number] => 17/579574 [patent_app_country] => US [patent_app_date] => 2022-01-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 17 [patent_no_of_words] => 16846 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 162 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17579574 [rel_patent_id] =>[rel_patent_doc_number] =>)