
Tim Miles
Examiner (ID: 12270)
| Most Active Art Unit | 1305 |
| Art Unit(s) | 1101, 2899, 1724, 3402, 1801, 1305 |
| Total Applications | 1774 |
| Issued Applications | 1552 |
| Pending Applications | 28 |
| Abandoned Applications | 194 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 20257168
[patent_doc_number] => 12429515
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-09-30
[patent_title] => System for determining leakage current of a field effect transistor over temperature
[patent_app_type] => utility
[patent_app_number] => 18/442662
[patent_app_country] => US
[patent_app_date] => 2024-02-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 11
[patent_no_of_words] => 0
[patent_no_of_claims] => 12
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 136
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18442662
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/442662 | System for determining leakage current of a field effect transistor over temperature | Feb 14, 2024 | Issued |
Array
(
[id] => 19602489
[patent_doc_number] => 20240393369
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-11-28
[patent_title] => REAL-EQUIVALENT-TIME OSCILLOSCOPE CLOCK DATA RECOVERY WITH SOFTWARE EQUALIZER
[patent_app_type] => utility
[patent_app_number] => 18/442359
[patent_app_country] => US
[patent_app_date] => 2024-02-15
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 4196
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -15
[patent_words_short_claim] => 115
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18442359
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/442359 | REAL-EQUIVALENT-TIME OSCILLOSCOPE CLOCK DATA RECOVERY WITH SOFTWARE EQUALIZER | Feb 14, 2024 | Pending |
Array
(
[id] => 19891397
[patent_doc_number] => 20250116709
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-04-10
[patent_title] => APPARATUS FOR INDICATING BATTERY STATE AND METHOD OF CONTROLLING THE SAME
[patent_app_type] => utility
[patent_app_number] => 18/429279
[patent_app_country] => US
[patent_app_date] => 2024-01-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 5329
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -10
[patent_words_short_claim] => 93
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18429279
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/429279 | APPARATUS FOR INDICATING BATTERY STATE AND METHOD OF CONTROLLING THE SAME | Jan 30, 2024 | Pending |
Array
(
[id] => 20137332
[patent_doc_number] => 20250244376
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-07-31
[patent_title] => INSULATION INSPECTION SYSTEM WITH VOLTAGE AND CURRENT BALANCING CIRCUIT
[patent_app_type] => utility
[patent_app_number] => 18/428537
[patent_app_country] => US
[patent_app_date] => 2024-01-31
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 2460
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -18
[patent_words_short_claim] => 97
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18428537
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/428537 | INSULATION INSPECTION SYSTEM WITH VOLTAGE AND CURRENT BALANCING CIRCUIT | Jan 30, 2024 | Pending |
Array
(
[id] => 19362187
[patent_doc_number] => 20240264221
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-08-08
[patent_title] => INDEPENDENT THERMAL CONTROLLER FOR MEMORY DEVICES AND DEVICE INTERFACE BOARDS
[patent_app_type] => utility
[patent_app_number] => 18/424501
[patent_app_country] => US
[patent_app_date] => 2024-01-26
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 7945
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -21
[patent_words_short_claim] => 76
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18424501
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/424501 | INDEPENDENT THERMAL CONTROLLER FOR MEMORY DEVICES AND DEVICE INTERFACE BOARDS | Jan 25, 2024 | Pending |
Array
(
[id] => 19710573
[patent_doc_number] => 20250020715
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-01-16
[patent_title] => INTEGRATED CIRCUIT PACKAGE WITH INTERNAL CIRCUITRY TO DETECT EXTERNAL COMPONENT PARAMETERS AND PARASITICS
[patent_app_type] => utility
[patent_app_number] => 18/420736
[patent_app_country] => US
[patent_app_date] => 2024-01-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 10937
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => 0
[patent_words_short_claim] => 89
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18420736
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/420736 | INTEGRATED CIRCUIT PACKAGE WITH INTERNAL CIRCUITRY TO DETECT EXTERNAL COMPONENT PARAMETERS AND PARASITICS | Jan 22, 2024 | Abandoned |
Array
(
[id] => 20122651
[patent_doc_number] => 20250237682
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-07-24
[patent_title] => MEASURING AN OPEN CIRCUIT VOLTAGE OF A BATTERY
[patent_app_type] => utility
[patent_app_number] => 18/420312
[patent_app_country] => US
[patent_app_date] => 2024-01-23
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 2172
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 51
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18420312
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/420312 | MEASURING AN OPEN CIRCUIT VOLTAGE OF A BATTERY | Jan 22, 2024 | Pending |
Array
(
[id] => 20122654
[patent_doc_number] => 20250237685
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-07-24
[patent_title] => PROTECTIVE EARTH MONITORING SYSTEM AND METHOD
[patent_app_type] => utility
[patent_app_number] => 18/417374
[patent_app_country] => US
[patent_app_date] => 2024-01-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 0
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -18
[patent_words_short_claim] => 125
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18417374
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/417374 | PROTECTIVE EARTH MONITORING SYSTEM AND METHOD | Jan 18, 2024 | Pending |
Array
(
[id] => 20086503
[patent_doc_number] => 20250216439
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-07-03
[patent_title] => CIRCUIT FOR MONITORING DEGRADATION OF A SEMICONDUCTOR DEVICE
[patent_app_type] => utility
[patent_app_number] => 18/402140
[patent_app_country] => US
[patent_app_date] => 2024-01-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 8908
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -21
[patent_words_short_claim] => 125
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18402140
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/402140 | CIRCUIT FOR MONITORING DEGRADATION OF A SEMICONDUCTOR DEVICE | Jan 1, 2024 | Pending |
Array
(
[id] => 19302193
[patent_doc_number] => 20240230770
[patent_country] => US
[patent_kind] => A9
[patent_issue_date] => 2024-07-11
[patent_title] => BATTERY MEASUREMENT METHOD AND APPARATUS
[patent_app_type] => utility
[patent_app_number] => 18/399074
[patent_app_country] => US
[patent_app_date] => 2023-12-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 12300
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -6
[patent_words_short_claim] => 274
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18399074
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/399074 | BATTERY MEASUREMENT METHOD AND APPARATUS | Dec 27, 2023 | Pending |
Array
(
[id] => 19302193
[patent_doc_number] => 20240230770
[patent_country] => US
[patent_kind] => A9
[patent_issue_date] => 2024-07-11
[patent_title] => BATTERY MEASUREMENT METHOD AND APPARATUS
[patent_app_type] => utility
[patent_app_number] => 18/399074
[patent_app_country] => US
[patent_app_date] => 2023-12-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 12300
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -6
[patent_words_short_claim] => 274
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18399074
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/399074 | BATTERY MEASUREMENT METHOD AND APPARATUS | Dec 27, 2023 | Pending |
Array
(
[id] => 20402866
[patent_doc_number] => 12492838
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-12-09
[patent_title] => Motor identification test
[patent_app_type] => utility
[patent_app_number] => 18/389640
[patent_app_country] => US
[patent_app_date] => 2023-12-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 1111
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 171
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18389640
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/389640 | Motor identification test | Dec 18, 2023 | Issued |
Array
(
[id] => 19114071
[patent_doc_number] => 20240125821
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-04-18
[patent_title] => WIDEBAND MEASUREMENT SYSTEM FOR MIXED-CONNECTED CAPACITIVE VOLTAGE TRANSFORMER BASED ON OPTICAL VOLTAGE SENSOR
[patent_app_type] => utility
[patent_app_number] => 18/544543
[patent_app_country] => US
[patent_app_date] => 2023-12-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 3894
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -9
[patent_words_short_claim] => 202
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18544543
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/544543 | WIDEBAND MEASUREMENT SYSTEM FOR MIXED-CONNECTED CAPACITIVE VOLTAGE TRANSFORMER BASED ON OPTICAL VOLTAGE SENSOR | Dec 18, 2023 | Issued |
Array
(
[id] => 19086686
[patent_doc_number] => 20240113487
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-04-04
[patent_title] => PROBES HAVING IMPROVED MECHANICAL AND/OR ELECTRICAL PROPERTIES FOR MAKING CONTACT BETWEEN ELECTRONIC CIRCUIT ELEMENTS AND METHODS FOR MAKING
[patent_app_type] => utility
[patent_app_number] => 18/540526
[patent_app_country] => US
[patent_app_date] => 2023-12-14
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 21179
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -27
[patent_words_short_claim] => 156
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18540526
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/540526 | PROBES HAVING IMPROVED MECHANICAL AND/OR ELECTRICAL PROPERTIES FOR MAKING CONTACT BETWEEN ELECTRONIC CIRCUIT ELEMENTS AND METHODS FOR MAKING | Dec 13, 2023 | Pending |
Array
(
[id] => 19978282
[patent_doc_number] => 12345756
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-07-01
[patent_title] => Integrated test cell using active thermal interposer (ATI) with parallel socket actuation
[patent_app_type] => utility
[patent_app_number] => 18/536029
[patent_app_country] => US
[patent_app_date] => 2023-12-11
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 9
[patent_figures_cnt] => 9
[patent_no_of_words] => 0
[patent_no_of_claims] => 18
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 140
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18536029
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/536029 | Integrated test cell using active thermal interposer (ATI) with parallel socket actuation | Dec 10, 2023 | Issued |
Array
(
[id] => 19818185
[patent_doc_number] => 20250076392
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-03-06
[patent_title] => APPARATUS FOR CORRECTING VOLTAGE OF BATTERY CELL AND METHOD THEREOF
[patent_app_type] => utility
[patent_app_number] => 18/533566
[patent_app_country] => US
[patent_app_date] => 2023-12-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 6433
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -16
[patent_words_short_claim] => 97
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18533566
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/533566 | APPARATUS FOR CORRECTING VOLTAGE OF BATTERY CELL AND METHOD THEREOF | Dec 7, 2023 | Pending |
Array
(
[id] => 19235073
[patent_doc_number] => 20240192267
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2024-06-13
[patent_title] => METHOD OF MONITORING A HEALTH STATE OF A POWER SEMICONDUCTOR DEVICE
[patent_app_type] => utility
[patent_app_number] => 18/523528
[patent_app_country] => US
[patent_app_date] => 2023-11-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 3334
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -11
[patent_words_short_claim] => 85
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18523528
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/523528 | METHOD OF MONITORING A HEALTH STATE OF A POWER SEMICONDUCTOR DEVICE | Nov 28, 2023 | Pending |
Array
(
[id] => 19932923
[patent_doc_number] => 12306126
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2025-05-20
[patent_title] => Enclosure detection for reliable optical failsafe
[patent_app_type] => utility
[patent_app_number] => 18/521585
[patent_app_country] => US
[patent_app_date] => 2023-11-28
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 11
[patent_figures_cnt] => 11
[patent_no_of_words] => 0
[patent_no_of_claims] => 17
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 63
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18521585
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/521585 | Enclosure detection for reliable optical failsafe | Nov 27, 2023 | Issued |
Array
(
[id] => 19985100
[patent_doc_number] => 20250123322
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-04-17
[patent_title] => VARIABLE TEMPERATURE TEST SYSTEM AND OPERATION METHOD THEREOF
[patent_app_type] => utility
[patent_app_number] => 18/518599
[patent_app_country] => US
[patent_app_date] => 2023-11-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 0
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -12
[patent_words_short_claim] => 92
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18518599
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/518599 | Variable temperature test system for providing different test environments and operation method thereof | Nov 23, 2023 | Issued |
Array
(
[id] => 19771366
[patent_doc_number] => 20250052792
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2025-02-13
[patent_title] => METHOD AND SYSTEM FOR OPTICAL CALCULATION IN RELAY PROTECTION BASED ON THE FARADAY MAGNETO-OPTICAL ROTATION EFFECT
[patent_app_type] => utility
[patent_app_number] => 18/517012
[patent_app_country] => US
[patent_app_date] => 2023-11-22
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 7382
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -12
[patent_words_short_claim] => 540
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 18517012
[rel_patent_id] =>[rel_patent_doc_number] =>) 18/517012 | Method and system for optical calculation in relay protection based on the faraday magneto-optical rotation effect | Nov 21, 2023 | Issued |