
Tim Miles
Examiner (ID: 12270)
| Most Active Art Unit | 1305 |
| Art Unit(s) | 1101, 2899, 1724, 3402, 1801, 1305 |
| Total Applications | 1774 |
| Issued Applications | 1552 |
| Pending Applications | 28 |
| Abandoned Applications | 194 |
Applications
| Application number | Title of the application | Filing Date | Status |
|---|---|---|---|
Array
(
[id] => 15965625
[patent_doc_number] => 20200166564
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2020-05-28
[patent_title] => PROBE DEVICE, ELECTRICAL INSPECTION APPARATUS, AND ELECTRICAL INSPECTION METHOD
[patent_app_type] => utility
[patent_app_number] => 16/668093
[patent_app_country] => US
[patent_app_date] => 2019-10-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 7816
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -14
[patent_words_short_claim] => 70
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16668093
[rel_patent_id] =>[rel_patent_doc_number] =>) 16/668093 | Probe device, electrical inspection apparatus, and electrical inspection method | Oct 29, 2019 | Issued |
Array
(
[id] => 18110893
[patent_doc_number] => 20230003773
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2023-01-05
[patent_title] => SYSTEMS, CIRCUITS, AND METHODS FOR DETERMINING STATUS OF FUSE OR RELAY
[patent_app_type] => utility
[patent_app_number] => 17/772717
[patent_app_country] => US
[patent_app_date] => 2019-10-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 2505
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 85
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17772717
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/772717 | Systems, circuits, and methods for determining status of fuse or relay | Oct 28, 2019 | Issued |
Array
(
[id] => 16779399
[patent_doc_number] => 20210116477
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2021-04-22
[patent_title] => Corded Probe with Interface
[patent_app_type] => utility
[patent_app_number] => 16/658272
[patent_app_country] => US
[patent_app_date] => 2019-10-21
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 2741
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 59
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16658272
[rel_patent_id] =>[rel_patent_doc_number] =>) 16/658272 | Corded Probe with Interface | Oct 20, 2019 | Abandoned |
Array
(
[id] => 16986371
[patent_doc_number] => 11073536
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2021-07-27
[patent_title] => ID chip socket for test connector assembly, test connector assembly including ID chip socket, and test equipment set including test connector assembly
[patent_app_type] => utility
[patent_app_number] => 16/654437
[patent_app_country] => US
[patent_app_date] => 2019-10-16
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 17
[patent_figures_cnt] => 17
[patent_no_of_words] => 8961
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 103
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16654437
[rel_patent_id] =>[rel_patent_doc_number] =>) 16/654437 | ID chip socket for test connector assembly, test connector assembly including ID chip socket, and test equipment set including test connector assembly | Oct 15, 2019 | Issued |
Array
(
[id] => 17394237
[patent_doc_number] => 11243244
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2022-02-08
[patent_title] => Switched bypass capacitor for component characterization
[patent_app_type] => utility
[patent_app_number] => 16/598532
[patent_app_country] => US
[patent_app_date] => 2019-10-10
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 7178
[patent_no_of_claims] => 10
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 137
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16598532
[rel_patent_id] =>[rel_patent_doc_number] =>) 16/598532 | Switched bypass capacitor for component characterization | Oct 9, 2019 | Issued |
Array
(
[id] => 17135890
[patent_doc_number] => 11137441
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2021-10-05
[patent_title] => Device for testing electronic devices in adjustable and accurate simulation of real-world environments
[patent_app_type] => utility
[patent_app_number] => 16/596230
[patent_app_country] => US
[patent_app_date] => 2019-10-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 3
[patent_figures_cnt] => 3
[patent_no_of_words] => 1941
[patent_no_of_claims] => 14
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 165
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16596230
[rel_patent_id] =>[rel_patent_doc_number] =>) 16/596230 | Device for testing electronic devices in adjustable and accurate simulation of real-world environments | Oct 7, 2019 | Issued |
Array
(
[id] => 16550881
[patent_doc_number] => 10884035
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2021-01-05
[patent_title] => Semiconductor device, semiconductor system, and control method of semiconductor device
[patent_app_type] => utility
[patent_app_number] => 16/595635
[patent_app_country] => US
[patent_app_date] => 2019-10-08
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 17
[patent_figures_cnt] => 18
[patent_no_of_words] => 8576
[patent_no_of_claims] => 15
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 168
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16595635
[rel_patent_id] =>[rel_patent_doc_number] =>) 16/595635 | Semiconductor device, semiconductor system, and control method of semiconductor device | Oct 7, 2019 | Issued |
Array
(
[id] => 15771483
[patent_doc_number] => 20200116759
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2020-04-16
[patent_title] => TEST PROBE ASSEMBLY FOR HIGH FREQUENCY DEVICE CHARACTERIZATION
[patent_app_type] => utility
[patent_app_number] => 16/593200
[patent_app_country] => US
[patent_app_date] => 2019-10-04
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 3150
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -20
[patent_words_short_claim] => 48
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16593200
[rel_patent_id] =>[rel_patent_doc_number] =>) 16/593200 | TEST PROBE ASSEMBLY FOR HIGH FREQUENCY DEVICE CHARACTERIZATION | Oct 3, 2019 | Abandoned |
Array
(
[id] => 17164203
[patent_doc_number] => 11150295
[patent_country] => US
[patent_kind] => B1
[patent_issue_date] => 2021-10-19
[patent_title] => Relay circuit for reducing a voltage glitch during device testing
[patent_app_type] => utility
[patent_app_number] => 16/590581
[patent_app_country] => US
[patent_app_date] => 2019-10-02
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 4
[patent_figures_cnt] => 4
[patent_no_of_words] => 6165
[patent_no_of_claims] => 19
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 133
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16590581
[rel_patent_id] =>[rel_patent_doc_number] =>) 16/590581 | Relay circuit for reducing a voltage glitch during device testing | Oct 1, 2019 | Issued |
| 16/584863 | Probes Having Improved Mechanical and/or Electrical Properties for Making Contact Between Electronic Circuit Elements and Methods for Making | Sep 25, 2019 | Abandoned |
Array
(
[id] => 17282542
[patent_doc_number] => 11199568
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2021-12-14
[patent_title] => Millimeter wave active load pull using low frequency phase and amplitude tuning
[patent_app_type] => utility
[patent_app_number] => 16/580553
[patent_app_country] => US
[patent_app_date] => 2019-09-24
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 6
[patent_no_of_words] => 3536
[patent_no_of_claims] => 31
[patent_no_of_ind_claims] => 3
[patent_words_short_claim] => 159
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16580553
[rel_patent_id] =>[rel_patent_doc_number] =>) 16/580553 | Millimeter wave active load pull using low frequency phase and amplitude tuning | Sep 23, 2019 | Issued |
Array
(
[id] => 18275411
[patent_doc_number] => 11614350
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2023-03-28
[patent_title] => Sensor test apparatus
[patent_app_type] => utility
[patent_app_number] => 16/575732
[patent_app_country] => US
[patent_app_date] => 2019-09-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 28
[patent_figures_cnt] => 33
[patent_no_of_words] => 15679
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 158
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16575732
[rel_patent_id] =>[rel_patent_doc_number] =>) 16/575732 | Sensor test apparatus | Sep 18, 2019 | Issued |
Array
(
[id] => 15683787
[patent_doc_number] => 20200096557
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2020-03-26
[patent_title] => INSPECTION APPARATUS AND INSPECTION METHOD
[patent_app_type] => utility
[patent_app_number] => 16/575552
[patent_app_country] => US
[patent_app_date] => 2019-09-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 6098
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -7
[patent_words_short_claim] => 149
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16575552
[rel_patent_id] =>[rel_patent_doc_number] =>) 16/575552 | Inspection apparatus and inspection method for inspecting electrical characteristic of electronic device | Sep 18, 2019 | Issued |
Array
(
[id] => 15713053
[patent_doc_number] => 20200103292
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2020-04-02
[patent_title] => TEMPERATURE DETECTION DEVICE AND METHOD
[patent_app_type] => utility
[patent_app_number] => 16/576377
[patent_app_country] => US
[patent_app_date] => 2019-09-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 6110
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -20
[patent_words_short_claim] => 68
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16576377
[rel_patent_id] =>[rel_patent_doc_number] =>) 16/576377 | Temperature detection device and method using sets of DC voltages | Sep 18, 2019 | Issued |
Array
(
[id] => 17157125
[patent_doc_number] => 20210318176
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2021-10-14
[patent_title] => ANALYZING AN OPERATION OF A POWER SEMICONDUCTOR DEVICE
[patent_app_type] => utility
[patent_app_number] => 17/276896
[patent_app_country] => US
[patent_app_date] => 2019-09-19
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 5060
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -14
[patent_words_short_claim] => 112
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17276896
[rel_patent_id] =>[rel_patent_doc_number] =>) 17/276896 | Analyzing an operation of a power semiconductor device | Sep 18, 2019 | Issued |
Array
(
[id] => 15348073
[patent_doc_number] => 20200011928
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2020-01-09
[patent_title] => APPARATUS AND METHOD FOR PROVIDING A SUPPLY VOLTAGE TO A DEVICE UNDER TEST USING A CAPACITOR
[patent_app_type] => utility
[patent_app_number] => 16/574765
[patent_app_country] => US
[patent_app_date] => 2019-09-18
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 12542
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -24
[patent_words_short_claim] => 177
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16574765
[rel_patent_id] =>[rel_patent_doc_number] =>) 16/574765 | Apparatus and method for providing a supply voltage to a device under test using a capacitor | Sep 17, 2019 | Issued |
Array
(
[id] => 18135577
[patent_doc_number] => 11561243
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2023-01-24
[patent_title] => Compliant organic substrate assembly for rigid probes
[patent_app_type] => utility
[patent_app_number] => 16/568596
[patent_app_country] => US
[patent_app_date] => 2019-09-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 7
[patent_no_of_words] => 6105
[patent_no_of_claims] => 16
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 147
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16568596
[rel_patent_id] =>[rel_patent_doc_number] =>) 16/568596 | Compliant organic substrate assembly for rigid probes | Sep 11, 2019 | Issued |
Array
(
[id] => 17150426
[patent_doc_number] => 11143495
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2021-10-12
[patent_title] => Thickness measurement with inductive and optical displacement sensors
[patent_app_type] => utility
[patent_app_number] => 16/569214
[patent_app_country] => US
[patent_app_date] => 2019-09-12
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 5
[patent_figures_cnt] => 10
[patent_no_of_words] => 7714
[patent_no_of_claims] => 7
[patent_no_of_ind_claims] => 1
[patent_words_short_claim] => 148
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16569214
[rel_patent_id] =>[rel_patent_doc_number] =>) 16/569214 | Thickness measurement with inductive and optical displacement sensors | Sep 11, 2019 | Issued |
Array
(
[id] => 16299110
[patent_doc_number] => 20200284833
[patent_country] => US
[patent_kind] => A1
[patent_issue_date] => 2020-09-10
[patent_title] => IC TRAY AND TEST JIG
[patent_app_type] => utility
[patent_app_number] => 16/557172
[patent_app_country] => US
[patent_app_date] => 2019-08-30
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 0
[patent_figures_cnt] => 0
[patent_no_of_words] => 6168
[patent_no_of_claims] => 0
[patent_no_of_ind_claims] => -17
[patent_words_short_claim] => 48
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => publication
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16557172
[rel_patent_id] =>[rel_patent_doc_number] =>) 16/557172 | IC tray and test jig | Aug 29, 2019 | Issued |
Array
(
[id] => 17090936
[patent_doc_number] => 11119120
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2021-09-14
[patent_title] => Power probe including sensor for detecting current and voltage signals
[patent_app_type] => utility
[patent_app_number] => 16/555894
[patent_app_country] => US
[patent_app_date] => 2019-08-29
[patent_effective_date] => 0000-00-00
[patent_drawing_sheets_cnt] => 6
[patent_figures_cnt] => 8
[patent_no_of_words] => 8156
[patent_no_of_claims] => 20
[patent_no_of_ind_claims] => 2
[patent_words_short_claim] => 156
[patent_maintenance] => 1
[patent_no_of_assignments] => 0
[patent_current_assignee] =>[type] => patent
[pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16555894
[rel_patent_id] =>[rel_patent_doc_number] =>) 16/555894 | Power probe including sensor for detecting current and voltage signals | Aug 28, 2019 | Issued |