Search

Tim Miles

Examiner (ID: 12270)

Most Active Art Unit
1305
Art Unit(s)
1101, 2899, 1724, 3402, 1801, 1305
Total Applications
1774
Issued Applications
1552
Pending Applications
28
Abandoned Applications
194

Applications

Application numberTitle of the applicationFiling DateStatus
Array ( [id] => 15965625 [patent_doc_number] => 20200166564 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-05-28 [patent_title] => PROBE DEVICE, ELECTRICAL INSPECTION APPARATUS, AND ELECTRICAL INSPECTION METHOD [patent_app_type] => utility [patent_app_number] => 16/668093 [patent_app_country] => US [patent_app_date] => 2019-10-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 7816 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 70 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16668093 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/668093
Probe device, electrical inspection apparatus, and electrical inspection method Oct 29, 2019 Issued
Array ( [id] => 18110893 [patent_doc_number] => 20230003773 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2023-01-05 [patent_title] => SYSTEMS, CIRCUITS, AND METHODS FOR DETERMINING STATUS OF FUSE OR RELAY [patent_app_type] => utility [patent_app_number] => 17/772717 [patent_app_country] => US [patent_app_date] => 2019-10-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2505 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 85 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17772717 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/772717
Systems, circuits, and methods for determining status of fuse or relay Oct 28, 2019 Issued
Array ( [id] => 16779399 [patent_doc_number] => 20210116477 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-04-22 [patent_title] => Corded Probe with Interface [patent_app_type] => utility [patent_app_number] => 16/658272 [patent_app_country] => US [patent_app_date] => 2019-10-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 2741 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 59 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16658272 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/658272
Corded Probe with Interface Oct 20, 2019 Abandoned
Array ( [id] => 16986371 [patent_doc_number] => 11073536 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-07-27 [patent_title] => ID chip socket for test connector assembly, test connector assembly including ID chip socket, and test equipment set including test connector assembly [patent_app_type] => utility [patent_app_number] => 16/654437 [patent_app_country] => US [patent_app_date] => 2019-10-16 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 17 [patent_no_of_words] => 8961 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 103 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16654437 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/654437
ID chip socket for test connector assembly, test connector assembly including ID chip socket, and test equipment set including test connector assembly Oct 15, 2019 Issued
Array ( [id] => 17394237 [patent_doc_number] => 11243244 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2022-02-08 [patent_title] => Switched bypass capacitor for component characterization [patent_app_type] => utility [patent_app_number] => 16/598532 [patent_app_country] => US [patent_app_date] => 2019-10-10 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 7178 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 137 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16598532 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/598532
Switched bypass capacitor for component characterization Oct 9, 2019 Issued
Array ( [id] => 17135890 [patent_doc_number] => 11137441 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-10-05 [patent_title] => Device for testing electronic devices in adjustable and accurate simulation of real-world environments [patent_app_type] => utility [patent_app_number] => 16/596230 [patent_app_country] => US [patent_app_date] => 2019-10-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 1941 [patent_no_of_claims] => 14 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 165 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16596230 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/596230
Device for testing electronic devices in adjustable and accurate simulation of real-world environments Oct 7, 2019 Issued
Array ( [id] => 16550881 [patent_doc_number] => 10884035 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-01-05 [patent_title] => Semiconductor device, semiconductor system, and control method of semiconductor device [patent_app_type] => utility [patent_app_number] => 16/595635 [patent_app_country] => US [patent_app_date] => 2019-10-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 17 [patent_figures_cnt] => 18 [patent_no_of_words] => 8576 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 168 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16595635 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/595635
Semiconductor device, semiconductor system, and control method of semiconductor device Oct 7, 2019 Issued
Array ( [id] => 15771483 [patent_doc_number] => 20200116759 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-04-16 [patent_title] => TEST PROBE ASSEMBLY FOR HIGH FREQUENCY DEVICE CHARACTERIZATION [patent_app_type] => utility [patent_app_number] => 16/593200 [patent_app_country] => US [patent_app_date] => 2019-10-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 3150 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -20 [patent_words_short_claim] => 48 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16593200 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/593200
TEST PROBE ASSEMBLY FOR HIGH FREQUENCY DEVICE CHARACTERIZATION Oct 3, 2019 Abandoned
Array ( [id] => 17164203 [patent_doc_number] => 11150295 [patent_country] => US [patent_kind] => B1 [patent_issue_date] => 2021-10-19 [patent_title] => Relay circuit for reducing a voltage glitch during device testing [patent_app_type] => utility [patent_app_number] => 16/590581 [patent_app_country] => US [patent_app_date] => 2019-10-02 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 4 [patent_figures_cnt] => 4 [patent_no_of_words] => 6165 [patent_no_of_claims] => 19 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 133 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16590581 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/590581
Relay circuit for reducing a voltage glitch during device testing Oct 1, 2019 Issued
16/584863 Probes Having Improved Mechanical and/or Electrical Properties for Making Contact Between Electronic Circuit Elements and Methods for Making Sep 25, 2019 Abandoned
Array ( [id] => 17282542 [patent_doc_number] => 11199568 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-12-14 [patent_title] => Millimeter wave active load pull using low frequency phase and amplitude tuning [patent_app_type] => utility [patent_app_number] => 16/580553 [patent_app_country] => US [patent_app_date] => 2019-09-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3536 [patent_no_of_claims] => 31 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 159 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16580553 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/580553
Millimeter wave active load pull using low frequency phase and amplitude tuning Sep 23, 2019 Issued
Array ( [id] => 18275411 [patent_doc_number] => 11614350 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-03-28 [patent_title] => Sensor test apparatus [patent_app_type] => utility [patent_app_number] => 16/575732 [patent_app_country] => US [patent_app_date] => 2019-09-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 28 [patent_figures_cnt] => 33 [patent_no_of_words] => 15679 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 158 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16575732 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/575732
Sensor test apparatus Sep 18, 2019 Issued
Array ( [id] => 15683787 [patent_doc_number] => 20200096557 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-03-26 [patent_title] => INSPECTION APPARATUS AND INSPECTION METHOD [patent_app_type] => utility [patent_app_number] => 16/575552 [patent_app_country] => US [patent_app_date] => 2019-09-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6098 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -7 [patent_words_short_claim] => 149 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16575552 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/575552
Inspection apparatus and inspection method for inspecting electrical characteristic of electronic device Sep 18, 2019 Issued
Array ( [id] => 15713053 [patent_doc_number] => 20200103292 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-04-02 [patent_title] => TEMPERATURE DETECTION DEVICE AND METHOD [patent_app_type] => utility [patent_app_number] => 16/576377 [patent_app_country] => US [patent_app_date] => 2019-09-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6110 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -20 [patent_words_short_claim] => 68 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16576377 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/576377
Temperature detection device and method using sets of DC voltages Sep 18, 2019 Issued
Array ( [id] => 17157125 [patent_doc_number] => 20210318176 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2021-10-14 [patent_title] => ANALYZING AN OPERATION OF A POWER SEMICONDUCTOR DEVICE [patent_app_type] => utility [patent_app_number] => 17/276896 [patent_app_country] => US [patent_app_date] => 2019-09-19 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 5060 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -14 [patent_words_short_claim] => 112 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 17276896 [rel_patent_id] =>[rel_patent_doc_number] =>)
17/276896
Analyzing an operation of a power semiconductor device Sep 18, 2019 Issued
Array ( [id] => 15348073 [patent_doc_number] => 20200011928 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-01-09 [patent_title] => APPARATUS AND METHOD FOR PROVIDING A SUPPLY VOLTAGE TO A DEVICE UNDER TEST USING A CAPACITOR [patent_app_type] => utility [patent_app_number] => 16/574765 [patent_app_country] => US [patent_app_date] => 2019-09-18 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 12542 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -24 [patent_words_short_claim] => 177 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16574765 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/574765
Apparatus and method for providing a supply voltage to a device under test using a capacitor Sep 17, 2019 Issued
Array ( [id] => 18135577 [patent_doc_number] => 11561243 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2023-01-24 [patent_title] => Compliant organic substrate assembly for rigid probes [patent_app_type] => utility [patent_app_number] => 16/568596 [patent_app_country] => US [patent_app_date] => 2019-09-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 7 [patent_no_of_words] => 6105 [patent_no_of_claims] => 16 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 147 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16568596 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/568596
Compliant organic substrate assembly for rigid probes Sep 11, 2019 Issued
Array ( [id] => 17150426 [patent_doc_number] => 11143495 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-10-12 [patent_title] => Thickness measurement with inductive and optical displacement sensors [patent_app_type] => utility [patent_app_number] => 16/569214 [patent_app_country] => US [patent_app_date] => 2019-09-12 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 10 [patent_no_of_words] => 7714 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 148 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16569214 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/569214
Thickness measurement with inductive and optical displacement sensors Sep 11, 2019 Issued
Array ( [id] => 16299110 [patent_doc_number] => 20200284833 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2020-09-10 [patent_title] => IC TRAY AND TEST JIG [patent_app_type] => utility [patent_app_number] => 16/557172 [patent_app_country] => US [patent_app_date] => 2019-08-30 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 0 [patent_figures_cnt] => 0 [patent_no_of_words] => 6168 [patent_no_of_claims] => 0 [patent_no_of_ind_claims] => -17 [patent_words_short_claim] => 48 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16557172 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/557172
IC tray and test jig Aug 29, 2019 Issued
Array ( [id] => 17090936 [patent_doc_number] => 11119120 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2021-09-14 [patent_title] => Power probe including sensor for detecting current and voltage signals [patent_app_type] => utility [patent_app_number] => 16/555894 [patent_app_country] => US [patent_app_date] => 2019-08-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 8 [patent_no_of_words] => 8156 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 156 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 16555894 [rel_patent_id] =>[rel_patent_doc_number] =>)
16/555894
Power probe including sensor for detecting current and voltage signals Aug 28, 2019 Issued
Menu