Tim Miles

Array ( [id] => 11102215 [patent_doc_number] => 20160299184 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2016-10-13 [patent_title] => 'METHOD FOR DETECTING GROUND FAULT IN INVERTER' [patent_app_type] => utility [patent_app_number] => 15/063220 [patent_app_country] => US [patent_app_date] => 2016-03-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 3876 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15063220 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 12309294 [patent_doc_number] => 09939469 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2018-04-10 [patent_title] => Current measuring apparatus, image forming apparatus, conveyance apparatus and method for measuring current [patent_app_type] => utility [patent_app_number] => 15/063093 [patent_app_country] => US [patent_app_date] => 2016-03-07 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 14 [patent_figures_cnt] => 18 [patent_no_of_words] => 8113 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 204 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15063093 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 12289425 [patent_doc_number] => 09933478 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2018-04-03 [patent_title] => Probe card and having opposite surfaces with different directions and test apparatus including probe card thereof [patent_app_type] => utility [patent_app_number] => 15/060856 [patent_app_country] => US [patent_app_date] => 2016-03-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 1866 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 83 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15060856 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 11002621 [patent_doc_number] => 20160199570 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2016-07-14 [patent_title] => 'MEDICAL INFUSION PUMP WITH POWER SOURCE VOLTAGE LOGGING AND METHOD FOR LOGGING A POWER SOURCE VOLTAGE IN A MEDICAL INFUSION PUMP' [patent_app_type] => utility [patent_app_number] => 15/060916 [patent_app_country] => US [patent_app_date] => 2016-03-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 9001 [patent_no_of_claims] => 28 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15060916 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 11950695 [patent_doc_number] => 20170254846 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-09-07 [patent_title] => 'ON-CHIP LEAKAGE MEASUREMENT' [patent_app_type] => utility [patent_app_number] => 15/060497 [patent_app_country] => US [patent_app_date] => 2016-03-03 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 10 [patent_figures_cnt] => 10 [patent_no_of_words] => 6325 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15060497 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 11946490 [patent_doc_number] => 20170250641 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-08-31 [patent_title] => 'FLUX ESTIMATION FOR FAULT TOLERANT CONTROL OF PMSM MACHINES FOR EPS' [patent_app_type] => utility [patent_app_number] => 15/054554 [patent_app_country] => US [patent_app_date] => 2016-02-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 4342 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15054554 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 11055414 [patent_doc_number] => 20160252376 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2016-09-01 [patent_title] => 'Position Measurement System with Calibration Means' [patent_app_type] => utility [patent_app_number] => 15/054294 [patent_app_country] => US [patent_app_date] => 2016-02-26 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 3 [patent_no_of_words] => 4723 [patent_no_of_claims] => 11 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15054294 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 11055592 [patent_doc_number] => 20160252554 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2016-09-01 [patent_title] => 'TEST CHAMBER FOR ELECTROMAGNETIC COMPATIBILITY MEASUREMENT' [patent_app_type] => utility [patent_app_number] => 15/051885 [patent_app_country] => US [patent_app_date] => 2016-02-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 6015 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15051885 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 11422705 [patent_doc_number] => 20170030849 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-02-02 [patent_title] => 'FINFET ELECTRICAL CHARACTERIZATION WITH ENHANCED HALL EFFECT AND PROBE' [patent_app_type] => utility [patent_app_number] => 15/051791 [patent_app_country] => US [patent_app_date] => 2016-02-24 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 6 [patent_no_of_words] => 3146 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15051791 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 11041730 [patent_doc_number] => 20160238686 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2016-08-18 [patent_title] => 'METHOD FOR AUTO-CALIBRATING SEMICONDUCTOR COMPONENT TESTER' [patent_app_type] => utility [patent_app_number] => 15/018198 [patent_app_country] => US [patent_app_date] => 2016-02-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 9 [patent_figures_cnt] => 9 [patent_no_of_words] => 3802 [patent_no_of_claims] => 7 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15018198 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 11853104 [patent_doc_number] => 20170227595 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-08-10 [patent_title] => 'Systems and Methods for Determining a Fault Location in a Three-Phase Series-Compensated Power Transmission Line' [patent_app_type] => utility [patent_app_number] => 15/018470 [patent_app_country] => US [patent_app_date] => 2016-02-08 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 7373 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15018470 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 13198253 [patent_doc_number] => 10114042 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2018-10-30 [patent_title] => Vertical probe card [patent_app_type] => utility [patent_app_number] => 15/016745 [patent_app_country] => US [patent_app_date] => 2016-02-05 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 3 [patent_figures_cnt] => 8 [patent_no_of_words] => 2674 [patent_no_of_claims] => 17 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 329 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15016745 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 11853106 [patent_doc_number] => 20170227598 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-08-10 [patent_title] => 'INTEGRATED WAVEGUIDE STRUCTURE AND SOCKET STRUCTURE FOR MILLIMETER WAVEBAND TESTING' [patent_app_type] => utility [patent_app_number] => 15/016151 [patent_app_country] => US [patent_app_date] => 2016-02-04 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 22 [patent_figures_cnt] => 22 [patent_no_of_words] => 8647 [patent_no_of_claims] => 24 [patent_no_of_ind_claims] => 4 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15016151 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 12152912 [patent_doc_number] => 20180024176 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2018-01-25 [patent_title] => 'INHOMOGENEOUS TRANSMISSION LINE FOR DETERMINING THE PERMITTIVITY OF A DEVICE UNDER TEST IN A POSITION-RESOLVED MANNER' [patent_app_type] => utility [patent_app_number] => 15/547353 [patent_app_country] => US [patent_app_date] => 2016-01-29 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 8 [patent_no_of_words] => 5216 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15547353 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 11019341 [patent_doc_number] => 20160216294 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2016-07-28 [patent_title] => 'Electrical Spring Probe with Stabilization' [patent_app_type] => utility [patent_app_number] => 15/008227 [patent_app_country] => US [patent_app_date] => 2016-01-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 7 [patent_figures_cnt] => 7 [patent_no_of_words] => 6349 [patent_no_of_claims] => 21 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15008227 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 12335133 [patent_doc_number] => 09947712 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2018-04-17 [patent_title] => Matrix type integrated circuit with fault isolation capability [patent_app_type] => utility [patent_app_number] => 15/007312 [patent_app_country] => US [patent_app_date] => 2016-01-27 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 15 [patent_figures_cnt] => 15 [patent_no_of_words] => 9059 [patent_no_of_claims] => 25 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 108 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15007312 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 11365357 [patent_doc_number] => 20170003338 [patent_country] => US [patent_kind] => A1 [patent_issue_date] => 2017-01-05 [patent_title] => 'THRESHOLD VOLTAGE MEASURING DEVICE' [patent_app_type] => utility [patent_app_number] => 15/006038 [patent_app_country] => US [patent_app_date] => 2016-01-25 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 11 [patent_figures_cnt] => 11 [patent_no_of_words] => 4349 [patent_no_of_claims] => 20 [patent_no_of_ind_claims] => 2 [patent_words_short_claim] => 0 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => publication [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15006038 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 13242223 [patent_doc_number] => 10134316 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2018-11-20 [patent_title] => Array substrate, testing method, display panel and display apparatus [patent_app_type] => utility [patent_app_number] => 15/004843 [patent_app_country] => US [patent_app_date] => 2016-01-22 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 8 [patent_figures_cnt] => 11 [patent_no_of_words] => 6823 [patent_no_of_claims] => 9 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 325 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15004843 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 13142251 [patent_doc_number] => 10088452 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2018-10-02 [patent_title] => Method for detecting defects in conductive materials based on differences in magnetic field characteristics measured along the conductive materials [patent_app_type] => utility [patent_app_number] => 15/003145 [patent_app_country] => US [patent_app_date] => 2016-01-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 5 [patent_figures_cnt] => 5 [patent_no_of_words] => 8908 [patent_no_of_claims] => 15 [patent_no_of_ind_claims] => 1 [patent_words_short_claim] => 83 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15003145 [rel_patent_id] =>[rel_patent_doc_number] =>)

Array ( [id] => 12549474 [patent_doc_number] => 10012704 [patent_country] => US [patent_kind] => B2 [patent_issue_date] => 2018-07-03 [patent_title] => Magnetic low-pass filter [patent_app_type] => utility [patent_app_number] => 15/003176 [patent_app_country] => US [patent_app_date] => 2016-01-21 [patent_effective_date] => 0000-00-00 [patent_drawing_sheets_cnt] => 6 [patent_figures_cnt] => 9 [patent_no_of_words] => 8395 [patent_no_of_claims] => 10 [patent_no_of_ind_claims] => 3 [patent_words_short_claim] => 59 [patent_maintenance] => 1 [patent_no_of_assignments] => 0 [patent_current_assignee] =>[type] => patent [pdf_file] =>[firstpage_image] =>[orig_patent_app_number] => 15003176 [rel_patent_id] =>[rel_patent_doc_number] =>)